JP2001311803A - 光学素子、光学素子の製造方法および光学系 - Google Patents

光学素子、光学素子の製造方法および光学系

Info

Publication number
JP2001311803A
JP2001311803A JP2000132897A JP2000132897A JP2001311803A JP 2001311803 A JP2001311803 A JP 2001311803A JP 2000132897 A JP2000132897 A JP 2000132897A JP 2000132897 A JP2000132897 A JP 2000132897A JP 2001311803 A JP2001311803 A JP 2001311803A
Authority
JP
Japan
Prior art keywords
optical
concave portion
optical material
optical element
flat surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2000132897A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001311803A5 (enExample
Inventor
Masahiro Yamada
正裕 山田
Akira Kochiyama
彰 河内山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP2000132897A priority Critical patent/JP2001311803A/ja
Priority to SG200102386A priority patent/SG96617A1/en
Priority to US09/842,021 priority patent/US6825995B2/en
Priority to KR1020010023016A priority patent/KR100793720B1/ko
Priority to DE60126444T priority patent/DE60126444T2/de
Priority to EP01401118A priority patent/EP1151796B1/en
Publication of JP2001311803A publication Critical patent/JP2001311803A/ja
Priority to US10/758,184 priority patent/US6985310B2/en
Priority to US10/758,182 priority patent/US6972912B2/en
Priority to US11/103,577 priority patent/US6992842B2/en
Priority to US11/223,947 priority patent/US7256950B2/en
Publication of JP2001311803A5 publication Critical patent/JP2001311803A5/ja
Abandoned legal-status Critical Current

Links

Landscapes

  • Lenses (AREA)
  • Optical Head (AREA)
JP2000132897A 2000-04-27 2000-04-27 光学素子、光学素子の製造方法および光学系 Abandoned JP2001311803A (ja)

Priority Applications (10)

Application Number Priority Date Filing Date Title
JP2000132897A JP2001311803A (ja) 2000-04-27 2000-04-27 光学素子、光学素子の製造方法および光学系
SG200102386A SG96617A1 (en) 2000-04-27 2001-04-26 Optical device, optical system, method of production of same, and mold for production of same
US09/842,021 US6825995B2 (en) 2000-04-27 2001-04-26 Optical device, optical system, method of production of same, and mold for production of same
EP01401118A EP1151796B1 (en) 2000-04-27 2001-04-27 Immersion lens, optical system incorporating same, method of production of same, and mold for production of same
DE60126444T DE60126444T2 (de) 2000-04-27 2001-04-27 Immersionslinse, optisches System mit dieser Linse, Herstellungsverfahren und Gussform für diese Linse
KR1020010023016A KR100793720B1 (ko) 2000-04-27 2001-04-27 광학 시스템
US10/758,184 US6985310B2 (en) 2000-04-27 2004-01-16 Optical device, optical system, method of production of same, and mold for production of same
US10/758,182 US6972912B2 (en) 2000-04-27 2004-01-16 Optical device, optical system, method of production of same, and mold for production of same
US11/103,577 US6992842B2 (en) 2000-04-27 2005-04-12 Optical device, optical system, method of production of same, and mold for production of same
US11/223,947 US7256950B2 (en) 2000-04-27 2005-09-13 Optical device, optical system, method of production of same, and mold for production of same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000132897A JP2001311803A (ja) 2000-04-27 2000-04-27 光学素子、光学素子の製造方法および光学系

Publications (2)

Publication Number Publication Date
JP2001311803A true JP2001311803A (ja) 2001-11-09
JP2001311803A5 JP2001311803A5 (enExample) 2007-04-19

Family

ID=18641504

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000132897A Abandoned JP2001311803A (ja) 2000-04-27 2000-04-27 光学素子、光学素子の製造方法および光学系

Country Status (1)

Country Link
JP (1) JP2001311803A (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002029450A1 (en) * 2000-10-04 2002-04-11 Sony Corporation Optical element, metal mold for producing optical element and production method for optical element
US6898027B2 (en) 2001-12-04 2005-05-24 Sony Corporation Optical element and manufacturing method for same
JP2018523850A (ja) * 2015-08-06 2018-08-23 クゥアルコム・インコーポレイテッドＱｕａｌｃｏｍｍ Ｉｎｃｏｒｐｏｒａｔｅｄ サブミクロンウェーハ位置合わせ
WO2021079574A1 (ja) * 2019-10-24 2021-04-29 浜松ホトニクス株式会社 固浸レンズユニット及び半導体検査装置

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002029450A1 (en) * 2000-10-04 2002-04-11 Sony Corporation Optical element, metal mold for producing optical element and production method for optical element
US6717738B2 (en) 2000-10-04 2004-04-06 Sony Corporation Optical element, metal mold for producing optical element and production method for optical element
US6898027B2 (en) 2001-12-04 2005-05-24 Sony Corporation Optical element and manufacturing method for same
US7064906B2 (en) 2001-12-04 2006-06-20 Sony Corporation Optical pickup device with shielding to limit incident or emitted light
JP2018523850A (ja) * 2015-08-06 2018-08-23 クゥアルコム・インコーポレイテッドＱｕａｌｃｏｍｍ Ｉｎｃｏｒｐｏｒａｔｅｄ サブミクロンウェーハ位置合わせ
WO2021079574A1 (ja) * 2019-10-24 2021-04-29 浜松ホトニクス株式会社 固浸レンズユニット及び半導体検査装置
JP2021067833A (ja) * 2019-10-24 2021-04-30 浜松ホトニクス株式会社 固浸レンズユニット及び半導体検査装置
CN114556183A (zh) * 2019-10-24 2022-05-27 浜松光子学株式会社 固体浸没式透镜单元及半导体检查装置
KR20220084274A (ko) * 2019-10-24 2022-06-21 하마마츠 포토닉스 가부시키가이샤 고침 렌즈 유닛 및 반도체 검사 장치
JP7280804B2 (ja) 2019-10-24 2023-05-24 浜松ホトニクス株式会社 固浸レンズユニット及び半導体検査装置
US12235433B2 (en) 2019-10-24 2025-02-25 Hamamatsu Photonics K.K. Solid immersion lens unit and semiconductor inspection device
KR102839637B1 (ko) * 2019-10-24 2025-07-29 하마마츠 포토닉스 가부시키가이샤 고침 렌즈 유닛 및 반도체 검사 장치

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