JP2001276824A - Treatment method of drain containing tetraalkylammonium ion - Google Patents

Treatment method of drain containing tetraalkylammonium ion

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Publication number
JP2001276824A
JP2001276824A JP2000093656A JP2000093656A JP2001276824A JP 2001276824 A JP2001276824 A JP 2001276824A JP 2000093656 A JP2000093656 A JP 2000093656A JP 2000093656 A JP2000093656 A JP 2000093656A JP 2001276824 A JP2001276824 A JP 2001276824A
Authority
JP
Japan
Prior art keywords
ion
reverse osmosis
osmosis membrane
taa
wastewater
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000093656A
Other languages
Japanese (ja)
Inventor
Hiroshi Sugawara
広 菅原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Organo Corp
Original Assignee
Organo Corp
Japan Organo Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Organo Corp, Japan Organo Co Ltd filed Critical Organo Corp
Priority to JP2000093656A priority Critical patent/JP2001276824A/en
Publication of JP2001276824A publication Critical patent/JP2001276824A/en
Pending legal-status Critical Current

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Abstract

PROBLEM TO BE SOLVED: To provide an efficient treatment method of a drain containing tetraalkylammonium(TAA) ions, which involves subjecting such drain to concentration and volume reduction with a reverse osmosis membrane system(s) at a high water permeation rate and in a high TAA ion removal ratio. SOLUTION: This treatment method comprises supplying TAA-ion-containing drain which contains almost no photoresist and has an adjusted pH value of <=5 to <9, to a reverse osmosis membrane system under pressure, or, supplying TAA-ion-containing drain which also contains some photoresists and has an adjusted pH value of >=10, to a reverse osmosis membrane system or nano filtration membrane system under pressure, adjusting the pH value of the resulting liquid permeate to <=5 to <9 and then, supplying this liquid permeate to another reverse osmosis membrane system under pressure.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、LCD、LSI、
プリント基板等の電子産業部品の製造工程で発生するテ
トラアルキルアンモニウムイオン含有排水の処理方法に
関し、特にテトラアルキルアンモニウムイオン含有排水
からテトラアルキルアンモニウムイオン(以下、時に
「TAAイオン」と略称する)を除去する処理方法に関
する。
TECHNICAL FIELD The present invention relates to an LCD, an LSI,
The present invention relates to a method for treating wastewater containing tetraalkylammonium ions generated in the manufacturing process of electronic industrial components such as printed circuit boards, and particularly to removing tetraalkylammonium ions (hereinafter sometimes abbreviated as "TAA ions") from wastewater containing tetraalkylammonium ions. Related to the processing method.

【0002】LCD、LSI、プリント基板、カラーフ
ィルター等の製造工程における現像工程では、フォトレ
ジストと呼ばれる感光性樹脂をウェハやガラス板等の基
板上に塗り、例えば、現像パターンが描かれたマスクを
介するなどして、フォトレジストを露光して光反応さ
せ、現像液によりフォトレジストをエッチング(溶解)
することで現像パターンを形成するフォトリソグラフィ
ー法が用いられている。フォトレジストの種類として
は、露光された部分が現像液に可溶になる(エッチング
される)ポジ型フォトレジストや露光された部分が現像
液に不溶になるネガ型フォトレジストがある。現像液と
してはアルカリ水溶液が多く利用されるが、LCD、L
SIなどの電子産業分野ではメタル成分の混入を極めて
嫌うため水酸化テトラメチルアンモニウム(以下、時に
「TMAH」と略称する)やコリン等の水酸化テトラア
ルキルアンモニウム(以下、時に「TAAH」と略称す
る)の水溶液(有機アルカリ水溶液)が一般に使用され
ている。従って、LCD、LSIなどの電子産業分野の
現像工程においては、現像の際に生じる現像廃液にはT
AAH(特にTMAH)等の形のTAAイオンと溶解し
たフォトレジストが含まれ、基板の洗浄の際に生じる洗
浄排水には主にTAAH等の形のTAAイオンが含まれ
る。上記現像廃液も一種の排水であるから、本明細書で
は、洗浄排水のみならず、現像廃液も「TAAイオン含
有排水」として扱う。また、TAAHは電池等のアルカ
リ性電解質や分析試薬としても使われている。
[0002] In a developing process in a manufacturing process of LCDs, LSIs, printed boards, color filters, and the like, a photosensitive resin called a photoresist is applied on a substrate such as a wafer or a glass plate, and, for example, a mask on which a developed pattern is drawn is used. The photoresist is exposed to light and reacted by light, and the photoresist is etched (dissolved) by a developer.
In this case, a photolithography method for forming a development pattern is used. Types of photoresist include a positive photoresist in which exposed portions are soluble (etched) in a developer and a negative photoresist in which exposed portions are insoluble in a developer. Alkaline aqueous solution is often used as a developing solution.
In the electronic industry such as SI, metal components are extremely disliked, so that tetramethylammonium hydroxide (hereinafter sometimes abbreviated as "TMAH") or tetraalkylammonium hydroxide such as choline (hereinafter sometimes abbreviated as "TAAH"). )) (Organic alkali aqueous solution) is generally used. Therefore, in the development process in the field of the electronics industry such as LCD and LSI, the development waste liquid generated during the development includes T
It contains TAA ions in the form of AAH (especially TMAH) and a dissolved photoresist, and the cleaning wastewater generated when cleaning the substrate mainly contains TAA ions in the form of TAAH. Since the developing waste liquid is also a kind of wastewater, in the present specification, not only the washing wastewater but also the developing wastewater is treated as “TAA ion-containing wastewater”. TAAH is also used as an alkaline electrolyte for batteries and the like and an analytical reagent.

【0003】TAAイオン含有排水中で、TAAイオン
は、上述したことより明らかな通り、通常は水酸化物イ
オンを対イオンとするものであるが、排水は工場によっ
て異なってくるものであり、何が混入してくるか分から
ず、また、場合によっては他の排水と混合されることが
あり得るので、他種のイオンを対イオンとする塩の形の
場合もあり得る。従って、上記の様なTAAイオン含有
排水の処理についての本明細書の一般的な説明では対イ
オンを特定せず、「イオン」と言う概念で捉えたもので
ある。しかし、上記排水中のTAAイオンは、上述の様
に、通常はTAAHとして存在するので、本明細書では
これを中心としてを説明する。
[0003] In the waste water containing TAA ions, as is clear from the above description, TAA ions usually have a hydroxide ion as a counter ion. However, the waste water differs depending on factories. It is not known whether or not is mixed in, and in some cases, it may be mixed with other wastewater, so that it may be in the form of a salt having another type of ion as a counter ion. Therefore, in the general description of the treatment of the TAA ion-containing wastewater as described above, the counter ion is not specified, but is captured by the concept of “ion”. However, as described above, the TAA ion in the wastewater usually exists as TAAH, and therefore, the description will be made mainly in this specification.

【0004】TAAイオン含有排水の処理方法として
は、活性汚泥法による生物分解処理、逆浸透膜法や蒸発
法による濃縮減容化、燃焼法などがある。活性汚泥法に
よる生物分解処理はTAAHが生物分解の容易でない物
質である為に大規模な処理施設を要し、蒸発法による濃
縮減容化や燃焼法はエネルギーコストが高く、それぞれ
の問題がある。
As a method of treating TAA ion-containing wastewater, there are a biodegradation treatment by an activated sludge method, a concentration reduction by a reverse osmosis membrane method and an evaporation method, and a combustion method. The biodegradation treatment by the activated sludge method requires a large-scale treatment facility because TAAH is a substance that is not easily biodegradable, and the concentration and volume reduction by the evaporation method and the combustion method have high energy costs, and each has its own problems. .

【0005】TAAイオン含有廃液(排水)を逆浸透膜
装置による逆浸透膜法で濃縮処理する技術としては、特
許第1810467号公報に開示されるpH9〜12の
条件下で逆浸透膜処理する方法、特開昭63−2949
89号公報に開示されるpH8〜13の条件で酸化分解
処理をした後逆浸透膜処理する方法、特開平7−136
651号公報に開示される酸化分解をした後pH6〜8
の条件下で逆浸透膜処理する方法等が報告されている。
As a technique for concentrating a TAA ion-containing waste liquid (drainage) by a reverse osmosis membrane method using a reverse osmosis membrane apparatus, a method of treating a reverse osmosis membrane under a pH 9 to 12 condition disclosed in Japanese Patent No. 1810467 is disclosed. JP-A-63-2949
No. 89-136, a method of performing oxidative decomposition treatment under conditions of pH 8 to 13 and then treating with reverse osmosis membrane.
No. 651 after oxidative decomposition disclosed in JP-A-651
A method for treating a reverse osmosis membrane under the above conditions has been reported.

【0006】これまで現像廃液と洗浄排水は一緒に混ざ
った状態で排出されて処理又は処分される場合が多かっ
たが、近年では水資源の有効利用や環境保全の観点か
ら、前述の現像工程から排出される現像廃液(濃厚TA
Aイオン含有排水)とその後の洗浄工程から生じる洗浄
排水(希薄TAAイオン含有排水)とを分別し、現像廃
液は特開平7−328642号公報等に開示の方法で現
像液として再利用するための処理が行われたり、洗浄排
水は冷却水等の雑用水として回収再利用されたりしてい
る。
Until now, development wastewater and washing wastewater have often been discharged and treated or disposed of in a mixed state. However, in recent years, from the viewpoint of effective use of water resources and environmental conservation, the development process has been carried out from the development step. Developed waste liquid (concentrated TA
(A-ion-containing wastewater) and washing wastewater (dilute TAA-ion-containing wastewater) generated from the subsequent washing step, and the developing wastewater is reused as a developing solution by the method disclosed in Japanese Patent Application Laid-Open No. 7-328642. Processing is performed, and washing wastewater is collected and reused as miscellaneous water such as cooling water.

【0007】[0007]

【発明が解決しようとする課題】本発明は、上記の様な
現状に鑑み、TAAイオン含有排水を逆浸透膜装置で濃
縮減容化する際に、効果的な処理方法を提供することを
目的とする。
SUMMARY OF THE INVENTION In view of the above situation, an object of the present invention is to provide an effective treatment method when a TAA ion-containing wastewater is concentrated and reduced in volume in a reverse osmosis membrane device. And

【0008】[0008]

【課題を解決するための手段】本発明は、(1)テトラ
アルキルアンモニウムイオン含有排水をpH5以上且つ
9未満の条件下で逆浸透膜装置に加圧供給することを特
徴とするテトラアルキルアンモニウムイオン含有排水の
処理方法、並びに、(2)テトラアルキルアンモニウム
イオン含有排水をpH10以上の条件下で逆浸透膜装置
又はナノフィルトレーション膜装置に加圧供給し、得ら
れた透過液をpH5以上且つ9未満の条件下で逆浸透膜
装置に加圧供給することを特徴とするテトラアルキルア
ンモニウムイオン含有排水の処理方法を提供するもので
ある。
The present invention is characterized in that (1) a tetraalkylammonium ion wastewater containing a tetraalkylammonium ion is supplied under pressure to a reverse osmosis membrane device under a condition of pH 5 or more and less than 9; And (2) a tetraalkylammonium ion-containing wastewater is supplied under pressure to a reverse osmosis membrane device or a nanofiltration membrane device under a condition of pH 10 or more, and the obtained permeate is subjected to pH 5 or more and It is intended to provide a method for treating wastewater containing tetraalkylammonium ions, which is supplied under pressure to a reverse osmosis membrane device under a condition of less than 9.

【0009】理由は明らかではないが、TAAイオン含
有排水や上記透過液を逆浸透膜処理する場合、pH5以
上且つ9未満の条件下で処理することで、TAAイオン
の除去率及び透過水量が上昇することが分かった。
Although the reason is not clear, when the TAA ion-containing wastewater or the above-mentioned permeate is treated with a reverse osmosis membrane, the treatment is carried out at a pH of 5 or more and less than 9 to increase the TAA ion removal rate and the amount of permeated water. I found out.

【0010】本発明におけるTAAイオンとは、水酸化
テトラメチルアンモニウム(TMAH)、水酸化テトラ
エチルアンモニウム、水酸化テトラプロピルアンモニウ
ム、水酸化テトラブチルアンモニウム、水酸化メチルト
リエチルアンモニウム、水酸化トリメチルエチルアンモ
ニウム、水酸化ジメチルジエチルアンモニウム、水酸化
トリメチル(2−ヒドロキシエチル)アンモニウム(即
ち、コリン)、水酸化トリエチル(2−ヒドロキシエチ
ル)アンモニウム、水酸化ジメチルジ(2−ヒドロキシ
エチル)アンモニウム、水酸化ジエチルジ(2−ヒドロ
キシエチル)アンモニウム、水酸化メチルトリ(2−ヒ
ドロキシエチル)アンモニウム、水酸化エチルトリ(2
−ヒドロキシエチル)アンモニウム、水酸化テトラ(2
−ヒドロキシエチル)アンモニウムなど(特に前2者と
コリン)の水酸化テトラアルキルアンモニウムから由来
する。
In the present invention, TAA ion means tetramethylammonium hydroxide (TMAH), tetraethylammonium hydroxide, tetrapropylammonium hydroxide, tetrabutylammonium hydroxide, methyltriethylammonium hydroxide, trimethylethylammonium hydroxide, water Dimethyldiethylammonium oxide, trimethyl (2-hydroxyethyl) ammonium hydroxide (that is, choline), triethyl (2-hydroxyethyl) ammonium hydroxide, dimethyldi (2-hydroxyethyl) ammonium hydroxide, diethyldi (2-hydroxyethyl) ammonium hydroxide Ethyl) ammonium, methyl tri (2-hydroxyethyl) ammonium hydroxide, ethyl tri (2
-Hydroxyethyl) ammonium, tetra (2
(Hydroxyethyl) ammonium and the like (especially the former two and choline).

【0011】TAAイオン含有排水中のTAAイオン
(TAA)の対イオンは、上述したように水酸化物イ
オン(OH)であるのが通常であるが、現像液に或る
程度の緩衝作用を持たせる場合や工場によっては他の排
水と混合されたり中和される場合があるので、弗化物イ
オン、塩化物イオン、臭化物イオン、炭酸イオン、炭酸
水素イオン、硫酸イオン、硫酸水素イオン、硝酸イオ
ン、燐酸イオン、燐酸水素イオン、燐酸二水素イオン等
の無機陰イオン、及び、蟻酸イオン、酢酸イオン、蓚酸
イオン等の有機陰イオンから選ばれる少なくとも一種が
TAAイオンの対イオンの少なくとも一部となるのが一
般的である。特に炭酸イオン、炭酸水素イオンは、空気
中の炭酸ガスが現像廃液や洗浄排水中に溶け込んで少量
存在することが多い。
The counter ion of the TAA ion (TAA + ) in the waste water containing the TAA ion is usually a hydroxide ion (OH ) as described above, but it has a certain buffering effect on the developer. May be mixed with other wastewater or neutralized depending on the factory, so fluoride ion, chloride ion, bromide ion, carbonate ion, hydrogen carbonate ion, sulfate ion, hydrogen sulfate ion, nitric acid ion Ion, phosphate ion, hydrogen phosphate ion, inorganic anion such as dihydrogen phosphate ion, and at least one selected from organic anions such as formate ion, acetate ion, oxalate ion and at least a part of the counter ion of TAA ion. It is general. In particular, carbon dioxide and hydrogen carbonate are often present in small amounts as carbon dioxide in the air dissolves into the developing waste liquid and the washing wastewater.

【0012】TAAイオン含有排水又は逆浸透膜装置や
ナノフィルトレーション膜装置から得られるその透過液
のpH調整に用い得るpH調整剤としては、特に限定さ
れないが、例えば、塩酸、硫酸、硝酸、炭酸(ガス)等
の酸類を挙げることができ、これらの酸類は単独で使用
しても幾つか併用してもよい。また、本発明の方法
(2)においてTAAイオン含有排水のpHが10未満
の場合に逆浸透膜装置又はナノフィルトレーション膜装
置に加圧供給する前にpH調整するpH調整剤も特に限
定されず、水酸化ナトリウム、水酸化カリウム、TAA
H等のアルカリ類を用いることができる。なお、ナノフ
ィルトレーション膜とは、分画分子量が100〜100
0の範囲内で、且つ、0.2%(重量/容積)の塩化ナ
トリウム水溶液を被処理液として25℃で分離処理した
時の塩化ナトリウムの阻止率(除去率)が90%以下の
特性を有する分離膜である(特開平11−192481
号公報参照)。
The pH adjusting agent that can be used for adjusting the pH of the TAA ion-containing wastewater or the permeated liquid obtained from a reverse osmosis membrane device or a nanofiltration membrane device is not particularly limited, and examples thereof include hydrochloric acid, sulfuric acid, nitric acid, and the like. Acids such as carbonic acid (gas) can be mentioned, and these acids may be used alone or in combination. Further, in the method (2) of the present invention, when the pH of the TAA ion-containing wastewater is less than 10, the pH adjusting agent for adjusting the pH before pressurized supply to the reverse osmosis membrane device or the nanofiltration membrane device is also particularly limited. Sodium hydroxide, potassium hydroxide, TAA
An alkali such as H can be used. The nanofiltration membrane has a molecular weight cut off of 100 to 100.
0, and the rejection (removal) of sodium chloride is 90% or less when a separation treatment is performed at 25 ° C. using a 0.2% (weight / volume) aqueous solution of sodium chloride as a liquid to be treated. (Japanese Unexamined Patent Application Publication No. 11-192481)
Reference).

【0013】[0013]

【発明の実施の形態】以下、発明の実施の形態を説明す
るが、本発明はこれらに限定されるものではない。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiments of the present invention will be described below, but the present invention is not limited to these embodiments.

【0014】現像廃液(濃厚TAAイオン含有排水)
は、通常、pH12〜14のアルカリ性であるが、これ
を酸でpH10未満に中和すると現像廃液に多量に含ま
れる溶解フォトレジストが不溶化してSS成分(suspen
ded solids)として生成し、不溶化フォトレジストは濾
過が困難なSS成分であるので、そのままでは逆浸透膜
装置で処理することは好ましくない。そこで、フォトレ
ジストを多く含む現像廃液を処理する場合は、本発明の
方法(2)に従って前段でpH10以上の条件下で逆浸
透膜装置又はナノフィルトレーション膜装置に加圧供給
してフォトレジスト成分を除去し、得られた透過液をp
H5以上且つ9未満の条件下で後段の逆浸透膜装置に加
圧供給処理する。
Development waste liquid (concentrated TAA ion-containing wastewater)
Is usually alkaline having a pH of 12 to 14, but if this is neutralized to a pH of less than 10 with an acid, a large amount of dissolved photoresist contained in a developing waste solution is insolubilized and an SS component (suspen) is dissolved.
Since the insolubilized photoresist produced as ded solids is an SS component that is difficult to filter, it is not preferable to treat the photoresist as it is in a reverse osmosis membrane apparatus. Therefore, when treating a developing waste solution containing a large amount of photoresist, the photoresist is supplied to the reverse osmosis membrane device or the nanofiltration membrane device under pressure at a pH of 10 or more in the former stage according to the method (2) of the present invention. The components were removed and the resulting permeate was p
Under a condition of H5 or more and less than 9, a pressure supply process is performed to a reverse osmosis membrane device at a subsequent stage.

【0015】市販の多くの逆浸透膜(以下、RO膜と言
う)やナノフィルトレーション膜(以下、「NF膜」と
言う)は強アルカリ(高pH)に弱いと言われている
が、試験の結果、TAAHの除去率は徐々に低下するも
のの問題のない程度であり、フォトレジストの除去率に
ついては全く問題のないことが分かった。前段のRO膜
又はNF膜は、後段のRO膜処理の際のpH条件を5以
上且つ9未満にした時にSS成分が発生しない様にフォ
トレジストを除去することが目的である。
Many commercially available reverse osmosis membranes (hereinafter referred to as RO membranes) and nanofiltration membranes (hereinafter referred to as "NF membranes") are said to be weak against strong alkalis (high pH). As a result of the test, it was found that the removal rate of TAAH gradually decreased, but there was no problem, and the removal rate of the photoresist was completely satisfactory. The purpose of the RO film or NF film in the former stage is to remove the photoresist so that no SS component is generated when the pH condition in the RO film treatment in the latter stage is 5 or more and less than 9.

【0016】一方、現像工程の基板洗浄の際に生ずるT
AAイオンを含んだ洗浄排水(希薄TAAイオン含有排
水)は、通常、pH8〜12であるが、含まれるフォト
レジストはゼロ又は極少量のため、pH10未満に酸で
中和してもフォトレジストが不溶化してSS成分として
生成することはなく、本発明の方法(1)によりそのま
まpHを5以上且つ9未満に調整してRO膜処理するこ
とが可能である。
On the other hand, T which is generated when the substrate is washed in the developing process
Washing wastewater containing AA ions (dilute TAA ion-containing wastewater) usually has a pH of 8 to 12. However, since the contained photoresist is zero or a very small amount, even if the photoresist is neutralized with an acid to a pH of less than 10, the photoresist is not removed. It is not insolubilized and is not formed as an SS component, and it is possible to adjust the pH to 5 or more and less than 9 as it is by the method (1) of the present invention, and to treat the RO film.

【0017】RO膜には、表面電荷が負や正、そして中
性のものがあるが、一般に市販されているRO膜のいず
れも本発明において用いることができる。しかし、溶解
フォトレジストは陰イオン性のものが多いので、逆浸透
膜装置に用いるRO膜としては、表面電荷が負であるR
O膜を用いるのが膜寿命の観点からは安全で好ましい。
The RO film has a negative, positive or neutral surface charge, and any commercially available RO film can be used in the present invention. However, since many dissolved photoresists are anionic, an RO film used in a reverse osmosis membrane device has an R surface having a negative surface charge.
It is safe and preferable to use an O film from the viewpoint of film life.

【0018】LSI、VLSI、LCD、プリント基
板、カラーフィルター等の電子部品の製造工程等におけ
る現像工程でフォトレジストのアルカリ現像液としてT
AAHを用いた場合に現像の際や洗浄の際に排出される
現像廃液又は洗浄排水が本発明の方法に供し得るTAA
イオン含有排水であるのは勿論のことであるが、本発明
の方法は現像廃液の電気透析(特開平7−328642
号公報参照)又は電解(特開平5−17889号公報参
照)により生じる脱塩排水(TAAイオンの大部分が除
去された脱塩水)等にも適用できる。なお、電気透析や
電解では、「濃縮液」と「脱塩排水」が生じるが、これ
らはTAAH含有量が増加するか減少するかによって使
い分けられる用語であり、必ずしもどちらのTAAH濃
度が高いか低いかを示すものではない。また、TAAイ
オン含有現像廃液等のTAAイオン含有排水の電解を行
って得られる濃縮液では、必然的に水酸化物イオンが通
常TAAイオンの対イオンとなる。本発明の方法が適用
できるその他のTAAイオン含有排水の具体例として
は、現像廃液を活性炭処理する活性炭処理工程を経て得
られる処理液(特開昭58−30753号公報)、現像
廃液を中和し、不溶性となった分のフォトレジスト(T
AA塩の形のフォトレジストから酸の形に戻って不溶性
となる)を遠心分離や濾過等の固液分離により除去する
中和+固液分離工程を経て得られる処理液(中和剤とし
ての酸がTAAイオンと塩を形成する)を挙げることが
できる。また、現像廃液の電気透析(特開平7−328
642号公報)又は電解(特開平5−17889号公
報)により生じる濃縮液を現像液として再利用しない場
合は、これらの濃縮液を本発明の方法で処理してもよ
い。
In a developing process in a manufacturing process of electronic parts such as LSI, VLSI, LCD, printed circuit board, color filter, etc., T
When AAH is used, the development waste liquid or washing wastewater discharged during development or washing can be used for the method of the present invention.
It goes without saying that the wastewater is ion-containing wastewater, but the method of the present invention employs electrodialysis of a developing waste liquid (JP-A-7-328642).
For example, or desalination wastewater (demineralized water from which most of TAA ions have been removed) generated by electrolysis (see JP-A-5-17889). In the electrodialysis and electrolysis, “concentrate” and “desalted wastewater” are generated. These terms are used depending on whether the TAAH content increases or decreases, and which TAAH concentration is not necessarily higher or lower. It does not indicate. In a concentrated solution obtained by electrolyzing TAA ion-containing wastewater such as a TAA ion-containing developing waste solution, hydroxide ions necessarily become counter ions of the TAA ions. Other specific examples of the TAA ion-containing wastewater to which the method of the present invention can be applied include a treatment solution obtained through an activated carbon treatment step of treating a development waste solution with activated carbon (JP-A-58-30753), and neutralization of the development waste solution. And the photoresist (T
A treatment solution obtained through a neutralization + solid-liquid separation step of removing the insoluble AA salt from the photoresist in the form of an AA salt by returning to the acid form and becoming insoluble by centrifugation or filtration, etc. The acid forms a salt with the TAA ion). In addition, electrodialysis of a developing waste liquid (JP-A-7-328)
642) or electrolysis (JP-A-5-17889), when these are not reused as a developing solution, these concentrated solutions may be treated by the method of the present invention.

【0019】[0019]

【実施例】以下、実施例により本発明を具体的に説明す
るが、本発明はこれらに限定されるものではない。な
お、Lはリットルを表す。
EXAMPLES The present invention will now be described specifically with reference to examples, but the present invention is not limited to these examples. L represents liter.

【0020】実施例1 <SS測定>或る半導体工場から生じる多量の現像液主
成分(TMAH)を含む現像廃液と少量の現像液主成分
(TMAH)を含む洗浄排水のそれぞれに塩酸を添加し
てpHを調整したのちSS濃度を測定した。
Example 1 <SS Measurement> Hydrochloric acid was added to a developing waste liquid containing a large amount of a main component of a developing solution (TMAH) and a washing wastewater containing a small amount of a main component of a developing solution (TMAH) generated from a certain semiconductor factory. After adjusting the pH, the SS concentration was measured.

【0021】現像廃液は、pH12.5、TMAイオン
濃度は3800mg/L、フォトレジスト由来の波長2
90nmにおける光路長が1cmの石英セルでの吸光度
(Abs290nm)は1.02であった。
The development waste liquid has a pH of 12.5, a TMA ion concentration of 3800 mg / L, and a wavelength of 2
The absorbance (Abs 290 nm) of the quartz cell having an optical path length of 1 cm at 90 nm was 1.02.

【0022】また、洗浄排水はpH10.1、TMAイ
オン濃度は24mg/L、フォトレジスト由来の波長2
90nmにおける光路長が1cmの石英セルでの吸光度
(Abs290nm)は0.01以下であった。
The washing wastewater had a pH of 10.1, a TMA ion concentration of 24 mg / L, and a wavelength of 2 nm derived from photoresist.
The absorbance (Abs 290 nm) in a quartz cell having an optical path length of 1 cm at 90 nm was 0.01 or less.

【0023】SS濃度は、JIS規格(K0102)の
分析方法に従って求めた。結果を図1に示す。現像廃液
はpH10付近からSS成分の生成が見られたが、洗浄
排水では見られなかった。従って、現像廃液をpH10
未満の条件でRO膜に通水することは好ましくないが、
洗浄排水をpH5〜10の条件でRO膜に通水すること
は、SS成分と関連する問題は無いことが分かる。
The SS concentration was determined according to the analysis method of JIS (K0102). The results are shown in FIG. In the developing waste liquid, formation of SS component was observed from around pH 10, but was not observed in the washing wastewater. Therefore, the development waste liquid is adjusted to pH 10
Although it is not preferable to pass water through the RO membrane under the following conditions,
It is understood that passing the washing wastewater through the RO membrane under the condition of pH 5 to 10 has no problem related to the SS component.

【0024】<RO膜試験>日東電工(株)製のRO膜
(商品名:759HR)を組み込んだ逆浸透膜装置に上
記現像廃液をそのまま濾過圧1.5MPaで供給して3
ヶ月間運転した。試験初期と終期の性能を表1に示す。
<RO Membrane Test> The above developing waste liquid was supplied as it was at a filtration pressure of 1.5 MPa to a reverse osmosis membrane device incorporating an RO membrane (product name: 759 HR) manufactured by Nitto Denko Corporation.
Driving for months. Table 1 shows the performance at the beginning and end of the test.

【0025】[0025]

【表1】 [Table 1]

【0026】TMAイオン除去率は低下したものの透過
水量とフォトレジスト除去率は変化しなかった。なお、
TMAイオン除去率の低下は高pHの影響による膜の劣
化であると考えられる。
Although the TMA ion removal rate decreased, the amount of permeated water and the photoresist removal rate did not change. In addition,
It is considered that the decrease in the TMA ion removal rate is due to the deterioration of the membrane due to the influence of the high pH.

【0027】次いで、前記現像廃液のRO膜透過液をp
H5〜11の条件に塩酸を用いて調整し、日東電工
(株)製のRO膜(商品名:759HR)を組み込んだ
逆浸透膜装置に濾過圧1.5MPaで供給して運転し
た。各pHにおける膜性能を表2及び図2(透過水量)
と図3(TMAイオン除去率)に示す。なお、原水であ
る前記現像廃液のRO膜透過液の水質は、pH11.
1、TMAイオン濃度は160mg/L、フォトレジス
ト由来の波長290nmにおける光路長が1cmの石英
セルでの吸光度(Abs290nm)は0.01以下
で、フォトレジストは殆ど含まれていなかったのでpH
調整後のRO膜透過液のフォトレジスト測定は行わなか
った。pH9未満から透過水量が増加傾向になることが
分かる。
Next, the permeated solution of the development waste liquid permeated through the RO membrane is added
The solution was adjusted to the conditions of H5 to 11 using hydrochloric acid, and supplied at a filtration pressure of 1.5 MPa to a reverse osmosis membrane device incorporating an RO membrane (product name: 759 HR) manufactured by Nitto Denko Corporation for operation. Table 2 and FIG. 2 (permeated water amount) show the membrane performance at each pH.
And FIG. 3 (TMA ion removal rate). The water quality of the RO permeated liquid of the development waste liquid, which is raw water, is pH 11.1.
1. The absorbance (Abs 290 nm) of a TMA ion concentration of 160 mg / L in a quartz cell having a light path length of 1 cm at a wavelength of 290 nm derived from a photoresist was 0.01 or less, and almost no photoresist was contained.
The photoresist measurement of the adjusted RO membrane permeate was not performed. It can be seen that the amount of permeated water tends to increase from pH <9.

【0028】[0028]

【表2】 [Table 2]

【0029】pH5以上且つ9未満の範囲では、pH1
1の時よりTMAイオン除去率が良く、特にpH7近辺
の中性域でTMAイオン除去率が良い。
In the range of pH 5 or more and less than 9, pH 1
1, the TMA ion removal rate is better, especially in the neutral region around pH7.

【0030】pH9未満の範囲でpHを低下させるにし
たがって透過水量が大きくなる。TMAイオン除去率は
中性(pH7)で最も良い。しかし、pH5〜9でも十
分に高いTMAイオン除去率を示す。
As the pH is lowered in the range of less than pH 9, the amount of permeated water increases. TMA ion removal is best at neutral (pH 7). However, it shows a sufficiently high TMA ion removal rate even at pH 5 to 9.

【0031】pHを5未満にすることで更なる透過水量
の増加も見込まれるが、TMAイオン除去率の低下が見
込まれる。また、pHを下げるには酸の添加が必要なの
で、pH5未満とする利点も無く、pH5以上且つ9未
満の範囲が好適である。
By setting the pH to less than 5, a further increase in the amount of permeated water is expected, but a decrease in the TMA ion removal rate is expected. Further, since the addition of an acid is necessary to lower the pH, there is no advantage of making the pH less than 5, and the range of pH 5 or more and less than 9 is preferable.

【0032】[0032]

【発明の効果】本発明によれば、TAAイオン含有排水
又はその透過液(逆浸透膜装置又はナノフィルトレーシ
ョン膜装置からの透過液)を逆浸透膜装置で処理するに
際してTAAイオンの除去率及び透過水量が上昇する。
逆浸透膜装置で処理された透過水は、純水製造用原水や
現像工程の洗浄水としても回収再利用できる。また、放
流するための後処理(生物処理、陽イオン交換樹脂処理
等)を更に行う場合にも、本発明の方法は後処理の負荷
を低減することができる。また、逆浸透膜装置で処理さ
れた濃縮水は、現像液の回収・再利用に廻すことも可能
である。
According to the present invention, the removal rate of TAA ions when treating wastewater containing TAA ions or its permeate (permeate from a reverse osmosis membrane device or a nanofiltration membrane device) with a reverse osmosis membrane device. And the amount of permeated water increases.
The permeated water treated by the reverse osmosis membrane device can be recovered and reused as raw water for producing pure water or washing water in the developing step. The method of the present invention can also reduce the load of the post-treatment when post-treatment (biological treatment, cation exchange resin treatment, etc.) for releasing is further performed. Further, the concentrated water treated by the reverse osmosis membrane device can be used for collecting and reusing the developer.

【図面の簡単な説明】[Brief description of the drawings]

【図1】図1は、実施例1における現像廃液(濃厚TA
Aイオン含有排水)と洗浄排水(希薄TAAイオン含有
排水)のpH対SS濃度の関係を示すグラフ図である。
FIG. 1 is a diagram illustrating a waste developer (concentrated TA) in Example 1.
It is a graph which shows the relationship between pH and SS concentration of washing wastewater (a wastewater containing a dilute TAA ion) and washing wastewater (a wastewater containing a dilute TAA ion).

【図2】図2は、実施例1において、現像廃液を逆浸透
膜装置に通水して得られた透過液を逆浸透膜装置に通水
する際のpH対透過水量の関係を示すグラフ図である。
FIG. 2 is a graph showing the relationship between the pH and the amount of permeated water when a permeate obtained by passing a developing waste solution through a reverse osmosis membrane device is passed through a reverse osmosis membrane device in Example 1. FIG.

【図3】図3は、実施例1において、現像廃液を逆浸透
膜装置に通水して得られた透過液を逆浸透膜装置に通水
する際のpH対TMAイオン除去率の関係を示すグラフ
図である。
FIG. 3 shows the relationship between the pH and the TMA ion removal rate when passing a permeate obtained by passing a developing waste solution through a reverse osmosis membrane device through a reverse osmosis membrane device in Example 1. FIG.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 テトラアルキルアンモニウムイオン含有
排水をpH5以上且つ9未満の条件下で逆浸透膜装置に
加圧供給することを特徴とするテトラアルキルアンモニ
ウムイオン含有排水の処理方法。
1. A method for treating tetraalkylammonium ion-containing wastewater, comprising supplying a tetraalkylammonium ion-containing wastewater to a reverse osmosis membrane device under pressure at a pH of 5 or more and less than 9.
【請求項2】 テトラアルキルアンモニウムイオン含有
排水をpH10以上の条件下で逆浸透膜装置又はナノフ
ィルトレーション膜装置に加圧供給し、得られた透過液
をpH5以上且つ9未満の条件下で逆浸透膜装置に加圧
供給することを特徴とするテトラアルキルアンモニウム
イオン含有排水の処理方法。
2. A tetraalkylammonium ion-containing wastewater is pressurized and supplied to a reverse osmosis membrane device or a nanofiltration membrane device under the condition of pH 10 or more, and the obtained permeate is subjected to the condition of pH 5 or more and less than 9 A method for treating wastewater containing tetraalkylammonium ions, which is supplied under pressure to a reverse osmosis membrane device.
【請求項3】 前記逆浸透膜装置に用いる逆浸透膜の表
面電荷が負であることを特徴とする請求項1又は2に記
載のテトラアルキルアンモニウムイオン含有排水の処理
方法。
3. The method for treating a tetraalkylammonium ion-containing wastewater according to claim 1, wherein the surface charge of the reverse osmosis membrane used in the reverse osmosis membrane device is negative.
JP2000093656A 2000-03-30 2000-03-30 Treatment method of drain containing tetraalkylammonium ion Pending JP2001276824A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000093656A JP2001276824A (en) 2000-03-30 2000-03-30 Treatment method of drain containing tetraalkylammonium ion

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000093656A JP2001276824A (en) 2000-03-30 2000-03-30 Treatment method of drain containing tetraalkylammonium ion

Publications (1)

Publication Number Publication Date
JP2001276824A true JP2001276824A (en) 2001-10-09

Family

ID=18608811

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP2001276824A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102560536A (en) * 2012-03-01 2012-07-11 郴州市金贵银业股份有限公司 Silver electrolyte purifying method
JP2017087211A (en) * 2017-02-09 2017-05-25 栗田工業株式会社 Organic wastewater treatment method
WO2020080008A1 (en) * 2018-10-19 2020-04-23 オルガノ株式会社 System for treating tetraalkylammonium-hydroxide-containing liquid, and method for treating same

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102560536A (en) * 2012-03-01 2012-07-11 郴州市金贵银业股份有限公司 Silver electrolyte purifying method
JP2017087211A (en) * 2017-02-09 2017-05-25 栗田工業株式会社 Organic wastewater treatment method
WO2020080008A1 (en) * 2018-10-19 2020-04-23 オルガノ株式会社 System for treating tetraalkylammonium-hydroxide-containing liquid, and method for treating same
JPWO2020080008A1 (en) * 2018-10-19 2021-09-09 オルガノ株式会社 Treatment system and treatment method for tetraalkylammonium hydroxide-containing liquid
US11524261B2 (en) 2018-10-19 2022-12-13 Organo Corporation System for treating tetraalkylammonium hydroxide-containing liquid and method for treating same
JP7357635B2 (en) 2018-10-19 2023-10-06 オルガノ株式会社 Treatment system and method for liquid containing tetraalkylammonium hydroxide

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