JP2001194284A5 - - Google Patents
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- Publication number
- JP2001194284A5 JP2001194284A5 JP2000006119A JP2000006119A JP2001194284A5 JP 2001194284 A5 JP2001194284 A5 JP 2001194284A5 JP 2000006119 A JP2000006119 A JP 2000006119A JP 2000006119 A JP2000006119 A JP 2000006119A JP 2001194284 A5 JP2001194284 A5 JP 2001194284A5
- Authority
- JP
- Japan
- Prior art keywords
- measurement
- units
- scanning
- case
- data points
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 2
- 238000013507 mapping Methods 0.000 description 1
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000006119A JP4243403B2 (ja) | 2000-01-11 | 2000-01-11 | 走査型プローブ顕微鏡の走査方法 |
| US09/754,651 US6571612B2 (en) | 2000-01-11 | 2001-01-04 | Probe scanning method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000006119A JP4243403B2 (ja) | 2000-01-11 | 2000-01-11 | 走査型プローブ顕微鏡の走査方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001194284A JP2001194284A (ja) | 2001-07-19 |
| JP2001194284A5 true JP2001194284A5 (https=) | 2005-06-09 |
| JP4243403B2 JP4243403B2 (ja) | 2009-03-25 |
Family
ID=18534701
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000006119A Expired - Fee Related JP4243403B2 (ja) | 2000-01-11 | 2000-01-11 | 走査型プローブ顕微鏡の走査方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6571612B2 (https=) |
| JP (1) | JP4243403B2 (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7473887B2 (en) * | 2002-07-04 | 2009-01-06 | University Of Bristol Of Senate House | Resonant scanning probe microscope |
| US20080130157A1 (en) * | 2004-11-17 | 2008-06-05 | Pioneer Corporation | Recording Medium, Recording Apparatus And Method, Reproducing Apparatus And Method, And Computer Program |
| JP4811568B2 (ja) * | 2005-06-17 | 2011-11-09 | 大日本印刷株式会社 | パターン寸法計測方法およびパターン寸法計測装置 |
| JP2009074987A (ja) * | 2007-09-21 | 2009-04-09 | Sii Nanotechnology Inc | 走査型プローブ顕微鏡及び表面情報測定方法 |
| JP2015040785A (ja) * | 2013-08-22 | 2015-03-02 | 株式会社東芝 | 走査型プローブ顕微鏡 |
| US10564180B2 (en) | 2015-04-14 | 2020-02-18 | Shimadzu Corporation | Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sample |
| KR101710337B1 (ko) * | 2015-06-02 | 2017-02-28 | 파크시스템스 주식회사 | 조정 가능한 스캔 속도를 가지는 측정 장치 및 측정 방법 |
| US10431419B2 (en) * | 2016-07-19 | 2019-10-01 | Battelle Memorial Institute | Sparse sampling methods and probe systems for analytical instruments |
| JP6631650B2 (ja) * | 2018-04-18 | 2020-01-15 | 株式会社島津製作所 | 走査型プローブ顕微鏡 |
| JP7255521B2 (ja) * | 2020-02-26 | 2023-04-11 | 株式会社島津製作所 | 走査型プローブ顕微鏡および走査型プローブ顕微鏡における光軸調整方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57123408A (en) * | 1981-01-26 | 1982-07-31 | Nissan Motor Co Ltd | Supplying method of position data |
| JPH041948A (ja) * | 1990-04-18 | 1992-01-07 | Canon Inc | 情報記録装置及び情報再生装置及び情報記録再生装置 |
| US5948972A (en) * | 1994-12-22 | 1999-09-07 | Kla-Tencor Corporation | Dual stage instrument for scanning a specimen |
| US5687487A (en) * | 1995-09-25 | 1997-11-18 | Dogwood Restorations | Flatness tester |
-
2000
- 2000-01-11 JP JP2000006119A patent/JP4243403B2/ja not_active Expired - Fee Related
-
2001
- 2001-01-04 US US09/754,651 patent/US6571612B2/en not_active Expired - Lifetime
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