JP2001141832A - X線撮像パネル用の増幅器オフセット及びゲイン補正システム - Google Patents
X線撮像パネル用の増幅器オフセット及びゲイン補正システムInfo
- Publication number
- JP2001141832A JP2001141832A JP2000260018A JP2000260018A JP2001141832A JP 2001141832 A JP2001141832 A JP 2001141832A JP 2000260018 A JP2000260018 A JP 2000260018A JP 2000260018 A JP2000260018 A JP 2000260018A JP 2001141832 A JP2001141832 A JP 2001141832A
- Authority
- JP
- Japan
- Prior art keywords
- amplifier
- offset
- gain
- real
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/617—Noise processing, e.g. detecting, correcting, reducing or removing noise for reducing electromagnetic interference, e.g. clocking noise
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/386,723 US6393098B1 (en) | 1999-08-31 | 1999-08-31 | Amplifier offset and gain correction system for X-ray imaging panel |
| US09/386723 | 1999-08-31 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001141832A true JP2001141832A (ja) | 2001-05-25 |
| JP2001141832A5 JP2001141832A5 (https=) | 2007-10-11 |
Family
ID=23526781
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000260018A Withdrawn JP2001141832A (ja) | 1999-08-31 | 2000-08-30 | X線撮像パネル用の増幅器オフセット及びゲイン補正システム |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6393098B1 (https=) |
| EP (1) | EP1081942A1 (https=) |
| JP (1) | JP2001141832A (https=) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7078693B2 (en) | 2003-05-16 | 2006-07-18 | Canon Kabushiki Kaisha | Radiation imaging apparatus |
| JP2007199090A (ja) * | 2007-05-10 | 2007-08-09 | Nagoya Electric Works Co Ltd | X線検査装置、x線検査方法およびx線検査装置の制御プログラム |
| WO2010125609A1 (ja) * | 2009-04-30 | 2010-11-04 | 株式会社島津製作所 | 光または放射線撮像装置 |
| JP2012047516A (ja) * | 2010-08-25 | 2012-03-08 | Sony Corp | 放射線撮像装置 |
| JP2022031480A (ja) * | 2016-11-08 | 2022-02-18 | ホロジック, インコーポレイテッド | 湾曲した圧迫要素を用いた撮像 |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7050098B2 (en) * | 2001-03-29 | 2006-05-23 | Canon Kabushiki Kaisha | Signal processing apparatus and method, and image sensing apparatus having a plurality of image sensing regions per image frame |
| EP1301031A1 (de) | 2001-09-29 | 2003-04-09 | Philips Corporate Intellectual Property GmbH | Verfahren zur Korrektur unterschiedlicher Umwandlungscharakteristiken von Bildsensoren |
| JP2003284707A (ja) * | 2002-03-27 | 2003-10-07 | Canon Inc | 撮影装置、ゲイン補正方法、記録媒体及びプログラム |
| US7065177B2 (en) | 2002-11-14 | 2006-06-20 | General Electric Company | Method and apparatus for correcting a retained image artifact |
| US6879660B2 (en) * | 2002-12-18 | 2005-04-12 | General Electric Company | Method and apparatus for reducing spectrally-sensitive artifacts |
| DE60333757D1 (de) | 2003-11-04 | 2010-09-23 | St Microelectronics Res & Dev | Verbesserungen in oder in Bezug auf Bildsensoren |
| US7081628B2 (en) * | 2003-11-10 | 2006-07-25 | Ge Medical Systems Global Technology Company, Llc | Spatially patterned light-blocking layers for radiation imaging detectors |
| US7105828B2 (en) * | 2004-02-10 | 2006-09-12 | Ge Medical Systems Global Technology Company, Llc | Hybrid x-ray detector |
| JP2006068512A (ja) * | 2004-08-06 | 2006-03-16 | Canon Inc | 撮像装置、撮像システム、撮像方法、およびコンピュータプログラム |
| US8411816B2 (en) | 2007-02-21 | 2013-04-02 | Konica Minolta Medical & Graphic, Inc. | Radiological image capturing apparatus and radiological image capturing system |
| WO2008102598A1 (ja) * | 2007-02-21 | 2008-08-28 | Konica Minolta Medical & Graphic, Inc. | 放射線画像撮影装置及び放射線画像撮影システム |
| JP2010527741A (ja) * | 2007-05-31 | 2010-08-19 | ジェネラル エレクトリック カンパニー | 画像再構成において利得変動の補正を容易にする方法及びシステム |
| US7963697B2 (en) * | 2009-01-20 | 2011-06-21 | General Electric Company | Gain calibration and correction technique for digital imaging systems |
| JP6887812B2 (ja) * | 2017-01-18 | 2021-06-16 | キヤノン株式会社 | 放射線撮像装置及び放射線撮像システム |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2531477A1 (de) * | 1975-07-15 | 1977-02-03 | Philips Patentverwaltung | Anordnung zur ermittlung der absorption oder der emission einer strahlung |
| JPH04113766A (ja) | 1990-09-04 | 1992-04-15 | Canon Inc | 固体撮像装置 |
| JP2931088B2 (ja) | 1990-11-30 | 1999-08-09 | キヤノン株式会社 | マルチチップ型光電変換装置 |
| JPH04286464A (ja) * | 1991-03-15 | 1992-10-12 | Rohm Co Ltd | イメージセンサの出力回路 |
| US5340988A (en) | 1993-04-05 | 1994-08-23 | General Electric Company | High resolution radiation imaging system |
| US5430785A (en) * | 1994-04-11 | 1995-07-04 | General Electric Company | Detector channel gain calibration using focal spot wobble |
| US5430298A (en) | 1994-06-21 | 1995-07-04 | General Electric Company | CT array with improved photosensor linearity and reduced crosstalk |
| US5579358A (en) | 1995-05-26 | 1996-11-26 | General Electric Company | Compensation for movement in computed tomography equipment |
| US5610404A (en) | 1995-09-05 | 1997-03-11 | General Electric Company | Flat panel imaging device with ground plane electrode |
| US5724095A (en) | 1995-10-03 | 1998-03-03 | Omnivision Technologies Inc. | Charge amplifier for MOS imaging array and method of making same |
| EP0773669B1 (en) | 1995-10-31 | 2000-01-12 | Interuniversitair Micro-Elektronica Centrum Vzw | Circuit, pixel, device and method for reducing fixed pattern noise in solid state imaging devices |
| US5736732A (en) | 1996-12-23 | 1998-04-07 | General Electric Company | Induced charge prevention in semiconductor imaging devices |
| US6194696B1 (en) * | 1998-03-10 | 2001-02-27 | Photobit Corporation | Active pixel sensor with current mode readout |
| US6002277A (en) * | 1998-04-06 | 1999-12-14 | Intersil Corporation | Sample-and-hold circuit having reduced parasitic diode effects and related methods |
-
1999
- 1999-08-31 US US09/386,723 patent/US6393098B1/en not_active Expired - Fee Related
-
2000
- 2000-08-16 EP EP00307006A patent/EP1081942A1/en not_active Withdrawn
- 2000-08-30 JP JP2000260018A patent/JP2001141832A/ja not_active Withdrawn
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7078693B2 (en) | 2003-05-16 | 2006-07-18 | Canon Kabushiki Kaisha | Radiation imaging apparatus |
| JP2007199090A (ja) * | 2007-05-10 | 2007-08-09 | Nagoya Electric Works Co Ltd | X線検査装置、x線検査方法およびx線検査装置の制御プログラム |
| WO2010125609A1 (ja) * | 2009-04-30 | 2010-11-04 | 株式会社島津製作所 | 光または放射線撮像装置 |
| JP2012047516A (ja) * | 2010-08-25 | 2012-03-08 | Sony Corp | 放射線撮像装置 |
| CN102420945A (zh) * | 2010-08-25 | 2012-04-18 | 索尼公司 | 放射线图像拾取设备 |
| US8859978B2 (en) | 2010-08-25 | 2014-10-14 | Sony Corporation | Radiation image pickup device |
| CN102420945B (zh) * | 2010-08-25 | 2017-12-26 | 索尼半导体解决方案公司 | 放射线图像拾取设备 |
| JP2022031480A (ja) * | 2016-11-08 | 2022-02-18 | ホロジック, インコーポレイテッド | 湾曲した圧迫要素を用いた撮像 |
| JP7499745B2 (ja) | 2016-11-08 | 2024-06-14 | ホロジック, インコーポレイテッド | 湾曲した圧迫要素を用いた撮像 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6393098B1 (en) | 2002-05-21 |
| EP1081942A1 (en) | 2001-03-07 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070827 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070827 |
|
| A761 | Written withdrawal of application |
Free format text: JAPANESE INTERMEDIATE CODE: A761 Effective date: 20080227 |