JP2001068607A - Cooling structure for electronic component - Google Patents

Cooling structure for electronic component

Info

Publication number
JP2001068607A
JP2001068607A JP24476099A JP24476099A JP2001068607A JP 2001068607 A JP2001068607 A JP 2001068607A JP 24476099 A JP24476099 A JP 24476099A JP 24476099 A JP24476099 A JP 24476099A JP 2001068607 A JP2001068607 A JP 2001068607A
Authority
JP
Japan
Prior art keywords
heat
circuit board
conductor
high thermal
electronic component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24476099A
Other languages
Japanese (ja)
Inventor
Kazuhito Ishida
一仁 石田
Koichi Hachiman
光一 八幡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi Automotive Systems Engineering Co Ltd
Original Assignee
Hitachi Ltd
Hitachi Car Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Car Engineering Co Ltd filed Critical Hitachi Ltd
Priority to JP24476099A priority Critical patent/JP2001068607A/en
Publication of JP2001068607A publication Critical patent/JP2001068607A/en
Pending legal-status Critical Current

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

PROBLEM TO BE SOLVED: To suppress warpage of a circuit board, to relax stress on soldered parts and to perform proper heat radiation even when a high heat conductor is interposed. SOLUTION: A circuit board 1 on which a semiconductor device 2 is mounted is fixed on bearing surfaces 5 formed on a heat radiating plate 3 by bolts 8, the distance 12 between a contact surface 3b formed on the heat radiating plate 3 and the substrate 1 is limited and a high heat conductor 4 whose thickness is limited is interposed in the gap. A concave part 3a for suppressing the loads imposed on the substrate 1 from the heat conductor 4 is provided on the contact surface 3b and an electronic component 7 is further disposed on the rear side of the circuit board 1 on the surface with which the heat conductor 4 is not in contact for suppressing the warpage of the substrate 1. Also, the state of the heat conductor 4 can be checked by a through hole 6 placed in the heat radiating plate 3 and the heat radiating plate 3 is connected to a housing to ensure a proper heat radiation.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体素子等の熱
を放熱部に熱伝導して発熱部を所定の温度に保つように
する電子部品の冷却構造に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a cooling structure for an electronic component which conducts heat of a semiconductor element or the like to a heat radiating portion to maintain the heat generating portion at a predetermined temperature.

【0002】[0002]

【従来の技術】電子部品の冷却を行なう従来の構造は、
特開平08-204070号公報に記載のように、電子回路基板
と平板状の放熱板を半導体素子より広い範囲で高熱伝導
体と接触させ、半導体素子等の発熱部と放熱板を熱伝導
により熱的に接続し、冷却する例が示されている。
2. Description of the Related Art A conventional structure for cooling electronic components is as follows.
As described in Japanese Patent Application Laid-Open No. 08-204070, an electronic circuit board and a flat heat sink are brought into contact with a high thermal conductor over a wider area than a semiconductor element, and a heat generating portion of the semiconductor element and the heat sink are heated by heat conduction. An example of connecting and cooling is shown.

【0003】[0003]

【発明が解決しようとする課題】電子機器装置の小形化
が進むに従って冷却に利用できる空間が減少し、狭い空
間で冷却性能を向上させるため、半導体素子等の発熱部
を冷却するため、柔軟性のある高熱伝導体を介して放熱
部へ熱伝導している。従来例で柔軟な高熱伝導体を介在
させた場合、放熱部へ接触を確保するため、回路基板と
放熱部で高熱伝導体を圧縮するため回路基板に荷重が加
わり、回路基板が撓み、回路基板上の半田付け部に応力
が加わるという問題があった。
As the size of electronic equipment is reduced, the space available for cooling is reduced, and the cooling performance is improved in a narrow space. It conducts heat to the heat radiating part through the high thermal conductor with the heat. When a flexible high thermal conductor is interposed in the conventional example, a load is applied to the circuit board to compress the high thermal conductor between the circuit board and the heat radiating section in order to secure contact with the heat radiating section, and the circuit board flexes, There was a problem that stress was applied to the upper soldered portion.

【0004】本発明は、高熱伝導体を介在させた場合に
おいても、回路基板の撓みを抑え、半田付け部への応力
を緩和し、良好な放熱を行なうことを目的とする。
[0004] It is an object of the present invention to suppress bending of a circuit board, relieve stress on a soldered portion, and perform good heat radiation even when a high thermal conductor is interposed.

【0005】[0005]

【課題を解決するための手段】上記目的を達成するため
に、本発明の電子部品の冷却構造は、高熱伝導体と接触
部する放熱板の一部を凹部とすることにより、回路基板
に加わる荷重を抑え回路基板の撓みを低減させ、半田付
け部の応力を緩和するものである。
In order to achieve the above object, a cooling structure for an electronic component according to the present invention is applied to a circuit board by forming a part of a heat radiating plate in contact with a high thermal conductor into a concave portion. The purpose is to suppress the load, reduce the deflection of the circuit board, and alleviate the stress at the soldered portion.

【0006】また、回路基板または半導体素子と放熱板
の間隔と熱伝導体の厚さを制限、または、回路基板また
は半導体素子と放熱板の間隔と熱伝導体の厚さのどちら
かを制限することにより、回路基板に加わる荷重を抑え
回路基板の撓みを低減させ、半田付け部の応力を緩和す
るものである。
In addition, the distance between the circuit board or the semiconductor element and the heat sink and the thickness of the heat conductor are limited, or the distance between the circuit board or the semiconductor element and the heat sink or the thickness of the heat conductor is restricted. Thus, the load applied to the circuit board is suppressed, the bending of the circuit board is reduced, and the stress at the soldered portion is reduced.

【0007】また、回路基板の両面に電子部品を配置す
る場合、高熱伝導体と回路基板の接触面を避けて電子部
品を配置することにより、電子部品による高熱伝導体の
圧縮を回避し、余分な荷重を回路基板に加えないように
し回路基板に加わる荷重を抑え回路基板の撓みを低減さ
せ、半田付け部の応力を緩和するものである。
Further, when electronic components are arranged on both sides of the circuit board, the electronic components are arranged so as to avoid the contact surface between the high thermal conductor and the circuit board. This is to prevent a large load from being applied to the circuit board, reduce the load applied to the circuit board, reduce the deflection of the circuit board, and alleviate the stress at the soldered portion.

【0008】さらに、放熱板を金属筐体へ取付けること
により、良好な放熱を可能とし、放熱板の熱伝導体との
接触部に貫通孔を設けることにより、高熱伝導体の状態
を確認可能とした者である。
Further, by attaching the heat radiating plate to the metal housing, good heat radiation is enabled, and by providing a through hole at a contact portion of the heat radiating plate with the heat conductor, it is possible to confirm the state of the high thermal conductor. Who has done it.

【0009】[0009]

【発明の実施の形態】以下、本発明の好適な実施の形態
を説明する。図1は、本発明における実施の形態の断面
図を示したものである。本図は、半導体素子2を表面に
搭載した電子回路基板1を固定する座面5と座面5との
距離12を制限した接触面3bを放熱板3上に形成し、
座面5にボルト8により固定した基板1と接触面3bの
間に熱伝導体4を挟むことにより、基板1と放熱板3
は、熱的に結合する。熱伝導体4が確実に基板1と接触
面3bに接触するように座面5と接触面3bの距離12
を制限しているため、熱伝導体4は、圧縮され、その結
果、基板1には、熱伝導体4を圧縮するための荷重が加
わる。この荷重を軽減するため、接触面3bに凹部3a
を形成し、圧縮面積を減少させることにより基板1に加
わる荷重力を低減している。この電子部品の冷却構造
は、基板1が撓むことによる半田付部の応力を緩和でき
る。また、基板1の半導体素子2の取付面と異なる面に
配置する電子部品7は、基板1と熱伝導体4の接触面を
避けて配置する構造とし、電子部品7による熱伝導体4
の圧縮による基板1への荷重を低減している。また、放
熱板3を金属筐体9に接続することにより、金属筐体9
への放熱が増加するため、良好な放熱を行なうことがで
きる。また、放熱板3に貫通孔6を設け、熱伝導体4の
状態確認を可能としている。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of the present invention will be described below. FIG. 1 shows a sectional view of an embodiment of the present invention. This figure shows that a seating surface 5 for fixing an electronic circuit board 1 on which a semiconductor element 2 is mounted on a surface thereof, and a contact surface 3b in which a distance 12 between the seating surface 5 is limited is formed on a heat sink 3;
By sandwiching the heat conductor 4 between the substrate 1 fixed to the seat surface 5 with the bolts 8 and the contact surface 3b, the substrate 1 and the heat sink 3
Are thermally coupled. The distance 12 between the seating surface 5 and the contact surface 3b so that the heat conductor 4 can surely contact the substrate 1 and the contact surface 3b.
, The heat conductor 4 is compressed, and as a result, a load is applied to the substrate 1 to compress the heat conductor 4. In order to reduce this load, a concave portion 3a is formed on the contact surface 3b.
Is formed, and the load force applied to the substrate 1 is reduced by reducing the compression area. The cooling structure of the electronic component can relieve the stress of the soldered portion due to the bending of the substrate 1. The electronic component 7 arranged on the surface of the substrate 1 different from the mounting surface of the semiconductor element 2 is arranged so as to avoid the contact surface between the substrate 1 and the heat conductor 4.
To reduce the load on the substrate 1 due to the compression. Also, by connecting the heat sink 3 to the metal housing 9,
Since the heat radiation to the surface increases, good heat radiation can be performed. Further, a through hole 6 is provided in the heat sink 3 so that the state of the heat conductor 4 can be checked.

【0010】本実施の形態によれば、柔軟性熱伝導体4
は、ゴム状、ゲル状、熱伝導性グリース等の液状物質を
柔軟性のある袋内に封入したものである。熱伝導体4の
厚さT1、接触面3bと基板1の間隔T2、熱伝導体4
の圧縮量ΔT、熱伝導体4の面積A、単位面積の圧縮力
P、基板1に加わる荷重Cとすると、以下の様に表わせ
る。
According to the present embodiment, the flexible heat conductor 4
Is a liquid material such as rubber, gel, or heat conductive grease sealed in a flexible bag. Thickness T1 of thermal conductor 4, distance T2 between contact surface 3b and substrate 1, thermal conductor 4
, The area A of the heat conductor 4, the compressive force P per unit area, and the load C applied to the substrate 1, can be expressed as follows.

【0011】[0011]

【数1】ΔT=T1−T2 C=P*A*ΔT このように熱伝導体4の面積Aを一定とすると圧縮量に
比例した加重が作用し、撓みが発生する。ここで、圧縮
量ΔTを一定とした場合、接触面3bの面積を減少する
ことにより、熱伝導体4の面積Aを減少させた場合と同
様に基板1に加わる荷重Cを低下することができ、基板
1の撓みを抑え、半田付け部の応力を緩和できる。
## EQU1 ## Assuming that the area A of the heat conductor 4 is constant as described above, a load proportional to the amount of compression acts, and bending occurs. Here, when the compression amount ΔT is constant, the load C applied to the substrate 1 can be reduced by reducing the area of the contact surface 3b in the same manner as when the area A of the heat conductor 4 is reduced. In addition, the bending of the substrate 1 can be suppressed, and the stress at the soldered portion can be reduced.

【0012】図2は、本発明における第二の実施の形態
である。図1と同様の構成であるが、半導体素子2は、
スルーホール11により、取付部が電子回路基板1を貫
通して固定され、回路基板、半導体素子2の取付部に熱
伝導体4を接触させ、放熱板3と熱的に結合し、放熱が
行われる。接触面3bに設ける凹部は、接触面3bの中
央付近ではなく接触面3bの端部を凹ませた形状として
熱伝導体4の接触面積を減少させることにより、基板1
に加わる荷重を減少させ、基板1の撓みを抑え、半田付
け部の応力緩和を行なう。さらに、接触面3bに貫通孔
6を設け、熱伝導体4の状態確認を可能としている。本
図は、スルーホールを貫通して基板1上に搭載された半
導体素子2の冷却にも好適であることを示している。
FIG. 2 shows a second embodiment of the present invention. 1 has the same configuration as that of FIG.
The mounting portion is fixed through the electronic circuit board 1 by the through hole 11, and the heat conductor 4 is brought into contact with the mounting portion of the circuit board and the semiconductor element 2, and is thermally coupled to the heat radiating plate 3, thereby releasing heat. Will be The concave portion provided on the contact surface 3b has a shape in which the end of the contact surface 3b is dented instead of the vicinity of the center of the contact surface 3b, thereby reducing the contact area of the heat conductor 4 so that the substrate 1
, The bending of the substrate 1 is suppressed, and the stress at the soldered portion is relaxed. Further, a through-hole 6 is provided in the contact surface 3b so that the state of the heat conductor 4 can be checked. This figure shows that it is also suitable for cooling the semiconductor element 2 mounted on the substrate 1 through the through hole.

【0013】図3は、本発明における第3の実施形態で
ある。半導体素子2と電子部品10がスルーホール11
を貫通して搭載されている電子回路基板1が、座面5に
ボルト8によって固定され、放熱板3に形成された接触
面3bと回路基板1の間に高熱伝導体4を挟み込んでい
る。基板1へ加わる荷重を軽減するため接触面3bの一
部を凹部として形成している。また、接触面3bに貫通
孔6を設け熱伝導体4の状態確認を可能としている。図
2とほぼ同様であり、スルーホールを貫通して固定され
た半導体素子2、電子部品10の冷却にも好適であるこ
とを示している。 図4は、本発明における第4の実施
形態である。電子回路基板1上に搭載された半導体素子
2に対向する金属筐体等を放熱板3とし、半導体素子2
と放熱板3の間に柔軟な高熱伝導体4を介在させて熱的
に結合させる。本図においても図1と同様に熱伝導体4
を圧縮するため、放熱板3と熱伝導体4の接触面3bの
一部を凹部3aとすることで、熱伝導体4より、基板1
へ加わる加重が減少し、基板1の撓みを抑え、半田付け
部への応力を緩和できる。また、放熱板3の凹部3aに
貫通孔6を設けることで熱伝導体4の状態確認を可能と
している。本図は、半導体等の発熱素子側で柔軟な熱伝
導体を介して行なう半導体素子等の冷却にも適用できる
ことを示している。
FIG. 3 shows a third embodiment of the present invention. The semiconductor element 2 and the electronic component 10 are formed through holes 11
The electronic circuit board 1 is mounted on the seat surface 5 with bolts 8, and the high thermal conductor 4 is sandwiched between the contact surface 3 b formed on the heat sink 3 and the circuit board 1. In order to reduce the load applied to the substrate 1, a part of the contact surface 3b is formed as a recess. Further, a through hole 6 is provided in the contact surface 3b so that the state of the heat conductor 4 can be checked. This is almost the same as FIG. 2 and shows that the semiconductor device 2 and the electronic component 10 fixed through the through holes are also suitable for cooling. FIG. 4 shows a fourth embodiment of the present invention. A metal housing or the like facing the semiconductor element 2 mounted on the electronic circuit board 1 is used as a heat sink 3 and the semiconductor element 2
A flexible high thermal conductor 4 is interposed between the heat radiation plate 3 and the heat radiation plate 3 to thermally couple them. In this figure, as in FIG.
By compressing a part of the contact surface 3b between the heat radiating plate 3 and the heat conductor 4 into a concave portion 3a,
, The bending of the substrate 1 is suppressed, and the stress on the soldered portion can be reduced. In addition, by providing the through hole 6 in the concave portion 3a of the heat sink 3, the state of the heat conductor 4 can be checked. This figure shows that the present invention can be applied to cooling of a semiconductor element or the like performed through a flexible heat conductor on the side of a heating element such as a semiconductor.

【0014】[0014]

【発明の効果】本発明によれば、電子回路基板と放熱板
の間に高熱伝導体を挟んで放熱する場合、基板の撓みを
押さえて且つ発熱部から放熱部に効率よく熱伝導する。
According to the present invention, when heat is radiated by sandwiching a high thermal conductor between the electronic circuit board and the heat radiating plate, bending of the substrate is suppressed, and heat is efficiently conducted from the heat generating portion to the heat radiating portion.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係る一実施例の断面図。FIG. 1 is a sectional view of one embodiment according to the present invention.

【図2】本発明に係る第二の実施例の断面図。FIG. 2 is a sectional view of a second embodiment according to the present invention.

【図3】本発明に係る第三の実施例の断面図。FIG. 3 is a sectional view of a third embodiment according to the present invention.

【図4】本発明に係る第四の実施例の断面図。FIG. 4 is a sectional view of a fourth embodiment according to the present invention.

【符号の説明】[Explanation of symbols]

1…電子回路基板、2…半導体素子、3…放熱板、3a
…凹部、3b…接触4…高熱伝導体、5…座面、6…貫
通孔、7…電子部品、8…ボルト、9…金属筐体、10
…電子部品、11…スルーホール、12…距離。
DESCRIPTION OF SYMBOLS 1 ... Electronic circuit board, 2 ... Semiconductor element, 3 ... Heat sink, 3a
... recess, 3b ... contact 4 ... high thermal conductor, 5 ... seat surface, 6 ... through-hole, 7 ... electronic parts, 8 ... bolt, 9 ... metal housing, 10
... electronic parts, 11 ... through holes, 12 ... distance.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 八幡 光一 茨城県ひたちなか市大字高場2520番地 株 式会社日立製作所自動車機器グループ内 Fターム(参考) 5F036 AA01 BB01 BB08 BB21 BC03 ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Koichi Yawata 2520 Oaza Takaba, Hitachinaka City, Ibaraki Prefecture F-term in the Automotive Equipment Group, Hitachi, Ltd. 5F036 AA01 BB01 BB08 BB21 BC03

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 半導体素子を搭載した電子回路基板であ
って、前記電子回路基板上の特定の半導体素子が搭載さ
れた面と異なる面と対向した放熱部材と前記半導体素子
が搭載された面と異なる面と前記放熱部材の間に柔軟な
高熱伝導体を備えた電子部品の冷却構造において、前記
高熱伝導体と接触する前記放熱部材の接触面の一部が凹
んでいることを特徴とする電子部品の冷却構造。
An electronic circuit board on which a semiconductor element is mounted, wherein a heat dissipating member facing a surface of the electronic circuit board different from a surface on which a specific semiconductor element is mounted, and a surface on which the semiconductor element is mounted. In a cooling structure for an electronic component having a flexible high heat conductor between different surfaces and the heat radiation member, a part of a contact surface of the heat radiation member that contacts the high heat conductor is concave. Parts cooling structure.
【請求項2】 半導体素子を搭載した電子回路基板であ
って前記電子回路基板上の特定の半導体素子と対向する
放熱部材と前記半導体素子と前記放熱部材の間に柔軟な
高熱伝導体を備えた電子部品の冷却構造において、前記
高熱伝導体と接触する前記高熱伝導体の接触面の一部が
凹んでいることを特徴とする電子部品の冷却構造。
2. An electronic circuit board on which a semiconductor element is mounted, comprising a heat radiating member facing a specific semiconductor element on the electronic circuit board, and a flexible high thermal conductor between the semiconductor element and the heat radiating member. A cooling structure for an electronic component, wherein a part of a contact surface of the high thermal conductor that contacts the high thermal conductor is recessed.
【請求項3】 請求項1において、前記電子回路基板の
取付座面と放熱部材上の前記高熱伝導体が接触する面の
間隔と前記高熱伝導素子の厚さを制限、または、前記電
子回路基板の取付座面と前記熱伝導体が接触する面の間
隔と前記高熱伝導素子の厚さのどちらかを制限すること
により、当該高熱伝導体の接触を確保したことを特徴と
する電子部品の冷却構造。
3. The electronic circuit board according to claim 1, wherein a distance between a mounting seat surface of the electronic circuit board and a surface of the heat radiating member on which the high thermal conductor is in contact and a thickness of the high thermal conductive element are limited. Cooling of the electronic component, wherein the contact of the high heat conductor is ensured by limiting either the distance between the mounting seat surface of the heat conductor and the surface contacting the heat conductor or the thickness of the high heat conduction element. Construction.
【請求項4】 請求項2において、前記半導体素子の面
と放熱部材の前記高熱伝導体が接触する面の間隔と前記
高熱伝導素子の厚さを制限、前記半導体素子の面と放熱
部材の前記高熱伝導体が接触する面の間隔と前記高熱伝
導素子の厚さのどちらかを制限することにより、当該高
熱伝導体の接触を確保したことを特徴とする電子部品の
冷却構造。
4. The semiconductor device according to claim 2, wherein a distance between a surface of the semiconductor element and a surface of the heat radiating member where the high thermal conductor contacts and a thickness of the high heat conductive element are limited. A cooling structure for an electronic component, wherein the contact of the high thermal conductor is ensured by limiting either the interval between the surfaces contacting the high thermal conductor or the thickness of the high thermal conductive element.
【請求項5】 請求項1において、前記電子回路基板の
前記半導体素子が搭載された面と異なる面に配置する電
子部品を前記高熱伝導体が接触する部分を避けて配置し
たことを特徴とする電子部品の冷却構造。
5. The electronic component according to claim 1, wherein an electronic component arranged on a surface of the electronic circuit board different from the surface on which the semiconductor element is mounted is arranged avoiding a portion where the high thermal conductor contacts. Cooling structure for electronic components.
【請求項6】 請求項1、2、3、4、5または6にお
いて、前記放熱板が、金属筐体に接続され、前記放熱板
を通して前記金属筐体に放熱することを特徴とする電子
部品の冷却構造。
6. The electronic component according to claim 1, wherein the heat radiating plate is connected to a metal housing and radiates heat to the metal housing through the heat radiating plate. Cooling structure.
【請求項7】 請求項1、2、3または4において、前
記放熱板の前記高熱伝導体接触部に貫通孔を設けたこと
を特徴とする電子部品の冷却構造。
7. The cooling structure for an electronic component according to claim 1, wherein a through hole is provided in said high heat conductor contact portion of said heat sink.
JP24476099A 1999-08-31 1999-08-31 Cooling structure for electronic component Pending JP2001068607A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24476099A JP2001068607A (en) 1999-08-31 1999-08-31 Cooling structure for electronic component

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Publication Number Publication Date
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Country Link
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Publication number Priority date Publication date Assignee Title
JP2007243109A (en) * 2006-03-13 2007-09-20 Toyota Industries Corp Electronic apparatus
US7821125B2 (en) 2007-06-08 2010-10-26 Opnext Japan, Inc. Semiconductor device
JP2015088556A (en) * 2013-10-29 2015-05-07 富士電機株式会社 Electronic module
JP2016036013A (en) * 2014-07-31 2016-03-17 株式会社デンソー Electronic device and drive apparatus using the same, and manufacturing method of electronic device
WO2018016144A1 (en) * 2016-07-21 2018-01-25 Kyb株式会社 Heat dissipating structure
JP2019134647A (en) * 2018-02-02 2019-08-08 株式会社豊田自動織機 Semiconductor device
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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007243109A (en) * 2006-03-13 2007-09-20 Toyota Industries Corp Electronic apparatus
US7821125B2 (en) 2007-06-08 2010-10-26 Opnext Japan, Inc. Semiconductor device
JP2015088556A (en) * 2013-10-29 2015-05-07 富士電機株式会社 Electronic module
JP2016036013A (en) * 2014-07-31 2016-03-17 株式会社デンソー Electronic device and drive apparatus using the same, and manufacturing method of electronic device
DE102015214459B4 (en) * 2014-07-31 2020-08-20 Denso Corporation Electronic device, the electronic device having control device and method for manufacturing the electronic device
WO2018016144A1 (en) * 2016-07-21 2018-01-25 Kyb株式会社 Heat dissipating structure
JP2018014415A (en) * 2016-07-21 2018-01-25 Kyb株式会社 Heat radiation structure
JP2019134647A (en) * 2018-02-02 2019-08-08 株式会社豊田自動織機 Semiconductor device
US20220377931A1 (en) * 2019-11-13 2022-11-24 Lg Innotek Co., Ltd. Converter
EP4318570A4 (en) * 2021-03-30 2024-10-09 Daikin Ind Ltd Electrical component and refrigeration device

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