JP2000049459A - Manufacture of multilayer printed wiring board - Google Patents

Manufacture of multilayer printed wiring board

Info

Publication number
JP2000049459A
JP2000049459A JP21240498A JP21240498A JP2000049459A JP 2000049459 A JP2000049459 A JP 2000049459A JP 21240498 A JP21240498 A JP 21240498A JP 21240498 A JP21240498 A JP 21240498A JP 2000049459 A JP2000049459 A JP 2000049459A
Authority
JP
Japan
Prior art keywords
layer
via hole
insulating layer
layers
multilayer printed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP21240498A
Other languages
Japanese (ja)
Inventor
Daisuke Kanetani
大介 金谷
Isao Hirata
勲夫 平田
Masayuki Ishihara
政行 石原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP21240498A priority Critical patent/JP2000049459A/en
Publication of JP2000049459A publication Critical patent/JP2000049459A/en
Withdrawn legal-status Critical Current

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  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Manufacturing Of Printed Circuit Boards (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method of manufacturing a multilayer printed wiring board, which eliminates places in the lower ends of via holes where the thickness of plated layers is formed thin in comparison with the thickness of the plated layers on the peripheries of the places, and raises reliability in continuity of the board. SOLUTION: Conductor layers 1b under the bottoms of via holes 3 are etched, and, after the peripheral walls of the holes 3 are removed, plated layers 4 are respectively formed in the holes 3. The peripheral walls of the holes 3 are shaved to enable the layers 1b only under the bottoms of the holes 3 to protrude, the layers 4 are adhered to the protruding parts of conductor layers 1a, the continuity failure of a multilayer printed wiring board at places where the layers 4 are formed thin can be prevented, and the reliability in continuity of the board can be enhanced.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、例えば、電子機
器、電気機器、コンピューター、又は通信機器等に用い
られるプリント配線板の製造法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a printed wiring board used for, for example, electronic equipment, electric equipment, computers, communication equipment, and the like.

【0002】[0002]

【従来の技術】電子機器等に用いられるプリント配線板
は、板状の絶縁層の片面または両面に銅箔等の導電パタ
ーンを積層させて形成されるものである。近年の電子機
器の小型化、高機能化の要求に伴い、それに用いられる
プリント配線板も高密度化、薄型化が望まれるようにな
ってきた。そのような用途に対応するために、回路を形
成する導体層を絶縁層を介して複数層積層して形成され
る多層プリント配線板が用いられる。
2. Description of the Related Art A printed wiring board used for an electronic device or the like is formed by laminating a conductive pattern such as a copper foil on one or both sides of a plate-shaped insulating layer. 2. Description of the Related Art In recent years, with the demand for miniaturization and high performance of electronic devices, it has been desired that printed wiring boards used therein have higher density and thinner. In order to cope with such an application, a multilayer printed wiring board formed by laminating a plurality of conductor layers forming a circuit via an insulating layer is used.

【0003】特に多層プリント配線板においては、回路
を形成する導体層の上に絶縁層を積層し、レーザーを用
いて絶縁層にビアホールを形成して導体層を露出させ、
ビアホール内にメッキ層を設けて上下の導体層を接続さ
せるビルトアップ方式のプリント配線板が盛んに開発さ
れており、その形態・手法もさまざまである。
In particular, in a multilayer printed wiring board, an insulating layer is laminated on a conductive layer forming a circuit, and a via hole is formed in the insulating layer using a laser to expose the conductive layer.
A built-up type printed wiring board in which a plating layer is provided in a via hole to connect upper and lower conductor layers has been actively developed, and its form and method are various.

【0004】このビルトアップ方式では、ビアホール3
の形成の際に樹脂で形成される絶縁層2の一部がビアホ
ール3の底部の導体層1bの表面に残留し、デスミア処
理しても導体層1bの表面から残留物6が除去されない
という図1(d)に示すような状態になることがある。
その状態でビアホール3内にメッキを行っても、メッキ
層4と導体層1bとの間に電気絶縁物である残留物が介
在され、導通信頼性が保てないという問題が起こる。そ
のため、図1(e)に示すように、ビアホール3の底面
にある導体層1bの表層部をエッチングすることで残存
する絶縁層2の残留物6も完全に除去する方法がとられ
ている。
In this built-up system, via holes 3
FIG. 4 shows that a part of the insulating layer 2 formed of resin remains on the surface of the conductor layer 1b at the bottom of the via hole 3 when the substrate is formed, and the residue 6 is not removed from the surface of the conductor layer 1b even by desmearing. 1 (d) may occur.
Even if plating is performed in the via hole 3 in this state, a residue that is an electrical insulator is interposed between the plating layer 4 and the conductor layer 1b, and there is a problem that conduction reliability cannot be maintained. Therefore, as shown in FIG. 1E, a method of completely removing the residue 6 of the insulating layer 2 remaining by etching the surface layer portion of the conductor layer 1b on the bottom surface of the via hole 3 is adopted.

【0005】またビアホール3の導通信頼性において別
の課題がある。それはビアホール3の周壁に凹凸が発生
し、ビアホール3をメッキした場合、特にメッキ層4の
薄い部分が発生するということである。
There is another problem in the conduction reliability of the via hole 3. That is, irregularities are generated on the peripheral wall of the via hole 3, and when the via hole 3 is plated, particularly, a thin portion of the plating layer 4 is generated.

【0006】この原因としては、レーザー照射時のエネ
ルギーのバラツキや、照射角度のふらつきで端面に凹凸
ができ、メッキ層4の厚みが確保できない等のことも考
えられるが、主な原因としては、図1(d)に示すよう
にビアホール3を絶縁層2に形成した後、通常のメッキ
処理で実施される前処理(例えば、酸洗浄、ソフトエッ
チング)で、図1(e)に示すようにビアホール3の底
部の導体層1bが大きくエッチングされるにもかかわら
ず、絶縁層2の端面の下先端部は全く除去されずに取り
残される。従って、結果的に絶縁層2と導体層1bの境
界部において大きな凸部7が形成され、この凸部7にメ
ッキを施しても図4に示すようにメッキ層4が極めて薄
く、導体信頼性が極めて低くなるものである。
It is considered that this may be caused by variations in energy at the time of laser irradiation, irregularities in the end face due to fluctuations in the irradiation angle, and the inability to secure the thickness of the plating layer 4, and the like. After the via hole 3 is formed in the insulating layer 2 as shown in FIG. 1D, a pretreatment (for example, acid cleaning, soft etching) performed by a normal plating process is performed as shown in FIG. Although the conductor layer 1b at the bottom of the via hole 3 is largely etched, the lower tip of the end face of the insulating layer 2 is not removed at all and is left behind. Therefore, as a result, a large convex portion 7 is formed at the boundary between the insulating layer 2 and the conductor layer 1b. Even if this convex portion 7 is plated, the plating layer 4 is extremely thin as shown in FIG. Is extremely low.

【0007】[0007]

【発明が解決しようとする課題】本発明は上記の点に鑑
みてなされたものであり、ビアホール下端においてメッ
キ層の厚みが周囲に比べて薄い箇所をなくし、導通の信
頼性が良好な多層プリント配線板の製造方法を提供する
ことを目的とするものである。
SUMMARY OF THE INVENTION The present invention has been made in view of the above points, and eliminates a portion where a thickness of a plating layer is thinner than a surrounding portion at a lower end of a via hole, thereby providing a multilayer print having good conduction reliability. It is an object of the present invention to provide a method for manufacturing a wiring board.

【0008】[0008]

【課題を解決するための手段】本願の請求項1に係る多
層プリント板の製造方法は、複数の絶縁層2と複数の導
体層1を交互に積層して形成され、絶縁層2に設けたビ
アホール3の内周のメッキ層4で導体層1間の電気的接
続を行うことにより形成される多層プリント積層板の製
造方法であって、導体層1を被覆する絶縁層2にレーザ
ーを照射して、導体層1が露出するまで絶縁層2を除去
してビアホール3を形成し、ビアホール3の底部の導体
層1の表面に残存する絶縁層2の残留物6を除去し、次
いでビアホール3底部の導体層1の表層部をエッチング
除去し、ビアホール3の周壁をなす部分の絶縁層2を除
去した後、ビアホール3内にメッキを施して上記の導体
層1間の電気的接続を行うメッキ層4を形成することを
特徴とするものである。
According to a first aspect of the present invention, there is provided a method for manufacturing a multilayer printed circuit board, wherein a plurality of insulating layers and a plurality of conductor layers are alternately laminated and provided on the insulating layer. This is a method of manufacturing a multilayer printed circuit board formed by making electrical connection between conductor layers 1 by plating layers 4 on the inner periphery of via holes 3, wherein laser is applied to insulating layer 2 covering conductor layer 1. Then, the insulating layer 2 is removed until the conductive layer 1 is exposed to form a via hole 3, and the residue 6 of the insulating layer 2 remaining on the surface of the conductive layer 1 at the bottom of the via hole 3 is removed. After the surface layer of the conductor layer 1 is removed by etching and the insulating layer 2 forming the peripheral wall of the via hole 3 is removed, plating is performed in the via hole 3 to make an electrical connection between the conductor layers 1. 4 is characterized by forming That.

【0009】また、本願の請求項2に係る多層プリント
板の製造方法は、絶縁層2がエポキシ樹脂を主成分とす
る樹脂からなり、前記導体層1、及び導体層1間を接続
するメッキ層4が銅からなり、前記ビアホール3の底部
の導体層1の表面に残存する絶縁層2の残留物6を除去
する方法及び前記ビアホール3の周壁をなす部分の絶縁
層2を除去する方法が湿式の過マンガン酸塩による処理
であることを特徴とするものである。
According to a second aspect of the present invention, in the method of manufacturing a multilayer printed board, the insulating layer 2 is made of a resin containing an epoxy resin as a main component, and the conductive layer 1 and a plating layer connecting the conductive layers 1 are provided. The method of removing the residue 6 of the insulating layer 2 remaining on the surface of the conductor layer 1 at the bottom of the via hole 3 and the method of removing the insulating layer 2 at the portion forming the peripheral wall of the via hole 3 are wet methods. Characterized by a permanganate treatment.

【0010】また、本願の請求項3に係る多層プリント
板の製造方法は、本願の請求項2に係る多層プリント板
の製造方法の有する特徴に加えて、湿式の過マンガン酸
塩による処理が、界面活性剤によるビアホールの周壁の
樹脂成分の膨潤、過マンガン酸塩によるこの樹脂成分の
酸化、及びこの酸化で形成される酸化皮膜の除去からな
ることを特徴とするものである。
The method for manufacturing a multilayer printed circuit board according to claim 3 of the present application is characterized in that, in addition to the features of the method for manufacturing a multilayer printed circuit board according to claim 2 of the present application, the treatment with a wet permanganate is It is characterized by swelling of the resin component on the peripheral wall of the via hole by the surfactant, oxidation of the resin component by the permanganate, and removal of the oxide film formed by this oxidation.

【0011】また、本願の請求項4に係る多層プリント
板の製造方法は、本願の請求項1〜3に係る多層プリン
ト板の製造方法の有する特徴に加えて、導体層1bの表
層部をエッチング除去する方法が、湿式のエッチング処
理であることを特徴とするものである。
The method for manufacturing a multilayer printed circuit board according to claim 4 of the present application is characterized in that, in addition to the features of the method for manufacturing a multilayer printed circuit board according to claims 1 to 3, the surface layer portion of the conductor layer 1b is etched. The method for removing is a wet etching process.

【0012】また、本願の請求項5に係る多層プリント
板の製造方法は、本願の請求項4に係る多層プリント板
の製造方法の有する特徴に加えて、湿式のエッチング処
理が有機酸を用いる処理であることを特徴とするもので
ある。
The method for manufacturing a multilayer printed circuit board according to claim 5 of the present application is characterized in that, in addition to the features of the method for manufacturing a multilayer printed circuit board according to claim 4 of the present application, the wet etching treatment uses an organic acid. It is characterized by being.

【0013】[0013]

【発明の実施の形態】以下、本発明の実施の形態を説明
する。
Embodiments of the present invention will be described below.

【0014】図1(a)に示すような金属箔等の導体層
1と樹脂等の絶縁層2が交互に積層された多層板の表面
の導体層1aの一部8をエッチング除去する(図1
(b))。
A portion 8 of the conductor layer 1a on the surface of a multilayer board in which conductor layers 1 such as a metal foil and insulating layers 2 such as a resin as shown in FIG. 1
(B)).

【0015】表面の導体層1aが除去されて、露出した
絶縁層2をレーザーにより除去し、絶縁層2が次の導体
層1bに達するようなビアホール3を形成する。レーザ
ーによる絶縁層2の除去では、絶縁層2を完全に除去で
きず、図1(c)に示すように若干の残留物6が残存す
る。
The conductor layer 1a on the surface is removed, and the exposed insulating layer 2 is removed by a laser to form a via hole 3 so that the insulating layer 2 reaches the next conductor layer 1b. When the insulating layer 2 is removed by the laser, the insulating layer 2 cannot be completely removed, and a small residue 6 remains as shown in FIG.

【0016】次いで、残留物6をデスミア液を用いて、
デスミア処理を行い、図1(d)に示すように残留物6
の大部分を除去する。デスミア液としては過マンガン酸
ナトリウムが好ましい。
Next, the residue 6 is removed using a desmear solution.
A desmear treatment was performed, and as shown in FIG.
Remove most of As the desmear liquid, sodium permanganate is preferable.

【0017】次いで、ビアホール3の底面をなす導体層
1bの表層部のエッチングを行い、上記のデスミア処理
によっても除去されない導体層1bの表層部に付着する
残留物6を完全に除去する(図1(e))。前述したよ
うに、このとき導体層1bはその表層部がエッチングさ
れると共に、エッチング液により水平方向に削られ、導
体層1bとビアホールの周壁をなす絶縁層2との界面部
分において凸部7が形成される。このときの様子を図1
(e)の上部のビアホールの拡大図である図2(a)に
示す。
Next, the surface layer portion of the conductor layer 1b forming the bottom surface of the via hole 3 is etched to completely remove the residue 6 adhered to the surface layer portion of the conductor layer 1b which is not removed even by the above desmear treatment (FIG. 1). (E)). As described above, at this time, the surface layer portion of the conductor layer 1b is etched, and the conductor layer 1b is shaved in the horizontal direction by the etchant, so that the protrusion 7 is formed at the interface between the conductor layer 1b and the insulating layer 2 forming the peripheral wall of the via hole. It is formed. Figure 1 shows the situation at this time.
FIG. 2A is an enlarged view of the upper via hole of FIG.

【0018】このエッチング処理はエッチング液を用い
る湿式で行うのが好ましく、エッチング液の成分として
は、硫酸などの無機酸、又はリンゴ酸やクエン酸等の有
機酸などの酸が用いられるが、有機酸が好ましい。
This etching treatment is preferably performed by a wet method using an etching solution. As a component of the etching solution, an acid such as an inorganic acid such as sulfuric acid or an organic acid such as malic acid or citric acid is used. Acids are preferred.

【0019】上記のデスミア液を用いてデスミア処理を
再び行い、図1(f)に示すように絶縁層2のビアホー
ル3の周壁をなす部分を除去していわゆるエッチバック
の状態とする。この結果、上記のエッチングで形成され
た凸部7は導体層1bのみで形成されるようになる。こ
のときの様子を図1(f)の上部のビアホールの拡大図
である図2(b)に示す。
The desmear treatment is performed again using the above desmear liquid, and as shown in FIG. 1 (f), the portion of the insulating layer 2 which forms the peripheral wall of the via hole 3 is removed to obtain a so-called etch back state. As a result, the protrusion 7 formed by the above-described etching is formed only by the conductor layer 1b. The state at this time is shown in FIG. 2B, which is an enlarged view of the upper via hole in FIG.

【0020】ビアホール3の内面と導体層1aにわたっ
て無電解メッキを施した後、この無電解メッキの層の上
に電解メッキを施し、メッキ層4を形成させる(図1
(g))。メッキ層4の被覆の様子の拡大図を図3に示
す。図3で示されるように、導体層1bだけで形成され
る凸部7の上にメッキ層4が形成されるため、この部分
の導通信頼性は良好なものとなる。
After performing electroless plating over the inner surface of the via hole 3 and the conductor layer 1a, electrolytic plating is performed on the electroless plated layer to form a plating layer 4 (FIG. 1).
(G)). FIG. 3 shows an enlarged view of the state of the coating of the plating layer 4. As shown in FIG. 3, since the plating layer 4 is formed on the protrusion 7 formed only by the conductor layer 1b, the conduction reliability in this portion is improved.

【0021】[0021]

【実施例】以下本発明を実施例によって具体的に説明す
る。 (実施例1)両面銅貼り積層板を回路状態に形成した
後、銅表面を黒化処理し、樹脂付き銅箔(松下電工社
製:R0880、銅箔厚み12μm、樹脂厚み60μ
m)を両面より積層プレスし、図1(a)に示すような
4層板である多層板を形成した。次いで、多層板の表面
にドライフィルムを貼着し、このドライフィルムをエッ
チングレジストとして加工するテンティング法を用いて
穴径150μmの円状に多層板の表面の導体層1である
銅箔を図1(b)に示すようにエッチングした。エッチ
ングされた部分8に炭酸ガスレーザーを照射し、穴径内
の絶縁層2であるエポキシ樹脂を除去し、図1(c)に
示すようにビアホール3を形成した。
The present invention will be described below in detail with reference to examples. (Example 1) After forming a double-sided copper-clad laminate in a circuit state, the copper surface was blackened and a resin-coated copper foil (R0880, manufactured by Matsushita Electric Works, copper foil thickness 12 µm, resin thickness 60 µm)
m) was laminated and pressed from both sides to form a multilayer plate as a four-layer plate as shown in FIG. Next, a copper film, which is a conductor layer 1 on the surface of the multilayer board, is formed in a circular shape with a hole diameter of 150 μm by using a tenting method in which a dry film is attached to the surface of the multilayer board and the dry film is processed as an etching resist. Etching was performed as shown in FIG. The etched portion 8 was irradiated with a carbon dioxide gas laser to remove the epoxy resin as the insulating layer 2 within the hole diameter, thereby forming a via hole 3 as shown in FIG.

【0022】次いで、ジエチレングリコールモノブチル
エーテルを10重量%含有する膨潤液に上記ビアホール
形成多層板を75℃で5分間浸漬して残留物のエポキシ
樹脂を膨潤させた後、過マンガン酸ナトリウムを50g
/L含有するデスミア液に80℃で10分間浸漬してエ
ポキシ樹脂の残留物6を除去し、硫酸を10%含有する
中和液に50℃で5分間浸漬して上記過マンガン酸ナト
リウムの酸化作用により成形される酸化皮膜の除去を行
った。
Next, the via-hole-formed multilayer board is immersed in a swelling liquid containing 10% by weight of diethylene glycol monobutyl ether at 75 ° C. for 5 minutes to swell the residual epoxy resin, and then 50 g of sodium permanganate is added.
/ L-containing desmear solution at 80 ° C for 10 minutes to remove the epoxy resin residue 6, and immersion in a neutralizing solution containing 10% sulfuric acid at 50 ° C for 5 minutes to oxidize the sodium permanganate. The oxide film formed by the action was removed.

【0023】次いで、上記のデスミア処理した多層板を
メタンスルホン酸10%及び過硫酸ナトリウム10%を
含有するエッチング液に3分間浸漬し、図(e)に示す
ようにビアホール3底部に露出した銅箔(導体層1b)
の表層部をエッチング除去することにより、デスミア工
程でも除去されなかった銅箔(導体層1b)の表層部に
付着する残留物6を完全にエッチングした。
Next, the multilayer board subjected to the desmear treatment was immersed in an etching solution containing 10% of methanesulfonic acid and 10% of sodium persulfate for 3 minutes, and the copper exposed at the bottom of the via hole 3 as shown in FIG. Foil (conductor layer 1b)
Of the copper foil (conductor layer 1b), which was not removed in the desmear process, was completely etched.

【0024】次いで、再度ジエチレングリコールモノブ
チルエーテルを10重量%含有する膨潤液に上記エッチ
ング処理した多層板を75℃で5分間浸漬して膨潤させ
た後、過マンガン酸ナトリウムを50g/L含有するデ
スミア液に80℃で10分間浸漬してビアホール3の周
壁をなすエポキシ樹脂(絶縁層2)を除去した後、硫酸
を10%含有する中和液に50℃で5分間浸漬して酸化
皮膜の除去を行った。ビアホール3の周壁がエッチバッ
クされて図(f)に示すような状態となった。
Next, the etched multilayer board is immersed again in a swelling solution containing 10% by weight of diethylene glycol monobutyl ether at 75 ° C. for 5 minutes to swell, and then a desmear solution containing 50 g / L of sodium permanganate. After removing the epoxy resin (insulating layer 2) which forms the peripheral wall of the via hole 3 by immersion in a neutral solution containing 10% sulfuric acid at 50 ° C. for 5 minutes to remove the oxide film. went. The peripheral wall of the via hole 3 was etched back to be in a state as shown in FIG.

【0025】次いで、パラジウム−スズを触媒とする銅
メッキを触媒とする無電解銅メッキをビアホール3内面
に約0.5μm施した後、さらに無電解銅メッキ層の上
に電解銅メッキにより、20μmのメッキ層4を図1
(g)に示すように積層した。
Next, electroless copper plating using copper plating using palladium-tin as a catalyst is applied to the inner surface of the via hole 3 to a thickness of about 0.5 μm, and then 20 μm on the electroless copper plating layer by electrolytic copper plating. The plating layer 4 of FIG.
The layers were laminated as shown in (g).

【0026】得られた多層板を用いて、1シートあたり
2000個のビアホールを設けたものを50シート作製
した(計100,000個のビアホール)。これらのサンプル
を室温雰囲気内に置くことと260℃のオイルに浸漬す
ることとを10回繰り返して、ビアホール100,000個中
のいくつのビアホールの導通が不良であるかという導通
信頼性を調べた。本例の試験されたビアホール数200
0個×50シート(100、000個)の内、導通不良
は全く発生しなかった。 (実施例2)エッチング液の組成を、リンゴ酸10%、
過硫酸ナトリウム10%とした以外は、実施例1と同様
にして多層プリント配線板を得た。
Using the obtained multilayer board, 50 sheets having 2000 via holes per sheet were manufactured (100,000 via holes in total). These samples were placed in a room temperature atmosphere and immersed in 260 ° C. oil 10 times, and the conduction reliability of how many via holes out of 100,000 via holes were defective was examined. 200 tested via holes in this example
Out of 0 × 50 sheets (100,000), no conduction failure occurred at all. (Example 2) The composition of the etching solution was malic acid 10%,
A multilayer printed wiring board was obtained in the same manner as in Example 1 except that sodium persulfate was changed to 10%.

【0027】実施例1と同様の導通信頼性の試験を行っ
たところ、ビアホール数2000個×50シート(10
0、000個)の内、導通不良は全く発生しなかった。 (実施例3)エッチング液の組成を、クエン酸10%、
過硫酸ナトリウム10%とした以外は、実施例1と同様
にして多層プリント配線板を得た。
When a conduction reliability test was performed in the same manner as in Example 1, the number of via holes was 2,000 × 50 sheets (10
(0000 pieces), no conduction failure occurred at all. (Example 3) Citric acid 10%
A multilayer printed wiring board was obtained in the same manner as in Example 1 except that sodium persulfate was changed to 10%.

【0028】実施例1と同様の導通信頼性の試験を行っ
たところ、ビアホール数2000個×50シート(10
0、000個)の内、導通不良は全く発生しなかった。 (実施例4)エッチング液の組成を、硫酸10%、過硫
酸ナトリウム10%とした以外は、実施例1と同様にし
て多層プリント配線板を得た。
When a conduction reliability test was performed in the same manner as in Example 1, the number of via holes was 2,000 × 50 sheets (10
(0000 pieces), no conduction failure occurred at all. Example 4 A multilayer printed wiring board was obtained in the same manner as in Example 1 except that the composition of the etching solution was 10% sulfuric acid and 10% sodium persulfate.

【0029】実施例1と同様の導通信頼性の試験を行っ
たところ、ビアホール数2000個×50シート(10
0、000個)の内、導通不良のビアホールが13個発
生した。 (比較例)実施例1でのエッチング工程の後、2回目の
膨潤、デスミア液による処理、及び酸化皮膜の処理を行
わず、実施例1と同様のメッキを行い、多層プリント配
線板を得た。
When a conduction reliability test was performed in the same manner as in Example 1, the number of via holes was 2,000 × 50 sheets (10
Out of 0,000), 13 via holes with poor conduction occurred. (Comparative Example) After the etching step in Example 1, the same plating as in Example 1 was performed without performing the second swelling, treatment with the desmear solution, and the treatment of the oxide film to obtain a multilayer printed wiring board. .

【0030】実施例1と同様の導通信頼性の試験を行っ
たところ、ビアホール数2000個×50シート(10
0、000個)の内、導通不良のビアホールが75個発
生した。
When a conduction reliability test was performed in the same manner as in Example 1, the number of via holes was 2,000 × 50 sheets (10
Out of 000), 75 via holes with poor conduction occurred.

【0031】[0031]

【発明の効果】上記のように本発明は、複数の絶縁層と
複数の導体層を交互に積層して形成され、絶縁層に設け
たビアホールの内周のメッキ層で導体層間の電気的接続
を行うことにより形成される多層プリント積層板の製造
方法であって、導体層を被覆する絶縁層にレーザーを照
射して、導体層が露出するまで絶縁層を除去してビアホ
ールを形成し、ビアホールの底部の導体層の表面に残存
する絶縁層の残部を除去し、次いでビアホール底部の導
体層の表層部をエッチング除去し、ビアホールの周壁を
なす部分の絶縁層を除去した後、ビアホール内にメッキ
を施して上記の導体層間の電気的接続を行うメッキ層を
形成するため、ビアホールの周壁を削ってビアホール底
部の導体層のみを突出させることができ、ビアホール内
にメッキしてメッキ層を形成するにあたって、メッキ層
は導体層の突出部分に付着し、メッキ層の薄い箇所での
導通不良を防ぐことができ、ビアホール内部にメッキを
施した時の導通信頼性を良好にすることができるもので
ある。
As described above, according to the present invention, a plurality of insulating layers and a plurality of conductive layers are alternately laminated, and the electrical connection between the conductive layers is formed by a plating layer on the inner periphery of a via hole provided in the insulating layer. Forming a via hole by irradiating a laser to the insulating layer covering the conductive layer, removing the insulating layer until the conductive layer is exposed, and forming a via hole. After removing the remainder of the insulating layer remaining on the surface of the conductor layer at the bottom of the via hole, then removing the surface layer of the conductor layer at the bottom of the via hole by etching, removing the insulating layer that forms the peripheral wall of the via hole, and then plating inside the via hole In order to form a plating layer for making an electrical connection between the above conductor layers, the peripheral wall of the via hole can be shaved and only the conductor layer at the bottom of the via hole can be protruded. When forming the layer, the plating layer adheres to the protruding part of the conductor layer, which can prevent poor conduction at thin places of the plating layer, and improve the conduction reliability when plating inside the via hole Can be done.

【0032】本願の請求項2に記載の発明は、絶縁層が
エポキシ樹脂を主成分とする樹脂からなり、前記導体
層、及び導体層間を接続するメッキ層が銅からなり、前
記ビアホールの底部の導体層の表面に残存する絶縁層の
残留物を除去する方法及び前記ビアホールの周壁をなす
部分の絶縁層を除去する方法が湿式の過マンガン酸塩に
よる処理であるため、ビアホールの底部の導体層の表面
に残存する絶縁層の残部を除去することが良好に行うこ
とができ、さらにビアホールの周壁をなす部分の絶縁層
を除去を効果的に行い、ビアホール内部にメッキを施し
た時の導通信頼性をより良好にすることができるもので
ある。
According to a second aspect of the present invention, the insulating layer is made of a resin containing an epoxy resin as a main component, the conductor layer and a plating layer connecting the conductor layers are made of copper, and the bottom of the via hole is formed of copper. Since the method of removing the residue of the insulating layer remaining on the surface of the conductive layer and the method of removing the insulating layer in the portion forming the peripheral wall of the via hole are wet permanganate treatments, the conductive layer at the bottom of the via hole is used. The removal of the remainder of the insulating layer remaining on the surface of the via hole can be performed satisfactorily, and the insulating layer that forms the peripheral wall of the via hole is effectively removed, and the conduction reliability when plating is applied inside the via hole The property can be improved.

【0033】本願の請求項3に記載の発明は、前記の湿
式の過マンガン酸塩による処理が、界面活性剤によるビ
アホールの周壁の樹脂成分の膨潤、過マンガン酸塩によ
るこの樹脂成分の酸化、及びこの酸化で形成される酸化
皮膜の除去からなるため、ビアホールの底部の導体層の
表面に残存する絶縁層の残部を除去することが良好に行
うことができ、さらにビアホールの周壁をなす部分の絶
縁層を除去を効果的に行い、ビアホール内部にメッキを
施した時の導通信頼性をより良好にすることができるも
のである。
[0033] The invention according to claim 3 of the present application is characterized in that the treatment with the wet permanganate is such that the surfactant swells the resin component on the peripheral wall of the via hole, the permanganate oxidizes the resin component. And the removal of the oxide film formed by this oxidation, the removal of the remainder of the insulating layer remaining on the surface of the conductor layer at the bottom of the via hole can be performed favorably, and furthermore, the removal of the portion forming the peripheral wall of the via hole It is possible to effectively remove the insulating layer and to improve conduction reliability when plating is performed inside the via hole.

【0034】本願の請求項4に記載の発明は、導体層の
表層部をエッチング除去する方法が、湿式のエッチング
処理であるため、導体層の表層部のエッチングを良好に
行うことができるものである。
According to the invention described in claim 4 of the present application, since the method of etching and removing the surface layer portion of the conductor layer is a wet etching process, the surface layer portion of the conductor layer can be favorably etched. is there.

【0035】本願の請求項5に記載の発明は、前記の湿
式のエッチング処理が有機酸を用いる処理であるため、
導体層の表層部のエッチングをより良好に行うことがで
きるものである。
In the invention according to claim 5 of the present application, since the wet etching treatment is a treatment using an organic acid,
The surface layer of the conductor layer can be more favorably etched.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施の形態を示すものであり、(a)
〜(g)は断面図である。
FIG. 1 shows an embodiment of the present invention, in which (a)
(G) is a sectional view.

【図2】本発明の実施の形態を示すものであり、(a)
及び(b)は拡大断面図である。
FIG. 2 shows an embodiment of the present invention, in which (a)
And (b) is an enlarged sectional view.

【図3】本発明の実施の形態を示す拡大断面図である。FIG. 3 is an enlarged sectional view showing the embodiment of the present invention.

【図4】従来例を示す拡大断面図である。FIG. 4 is an enlarged sectional view showing a conventional example.

【符号の説明】[Explanation of symbols]

1a 導体層 1b 導体層 2 絶縁層 3 ビアホール 4 メッキ層 6 残留物 1a conductor layer 1b conductor layer 2 insulating layer 3 via hole 4 plating layer 6 residue

フロントページの続き (72)発明者 石原 政行 大阪府門真市大字門真1048番地松下電工株 式会社内 Fターム(参考) 5E339 AB02 AC01 AD05 AE01 BC02 BD02 BD08 BE13 CD01 CD10 CE12 CE16 DD03 GG10 5E346 AA06 AA12 AA15 AA43 CC09 CC32 CC51 CC58 DD25 DD32 EE02 EE06 EE07 EE31 FF02 FF03 FF04 FF07 FF15 GG15 GG16 GG17 GG22 GG28 HH07Continued on the front page (72) Inventor Masayuki Ishihara 1048 Odakadoma, Kadoma-shi, Osaka F-term in Matsushita Electric Works, Ltd. (reference) 5E339 AB02 AC01 AD05 AE01 BC02 BD02 BD08 BE13 CD01 CD10 CE12 CE16 DD03 GG10 5E346 AA06 AA12 AA15 AA43 CC09 CC32 CC51 CC58 DD25 DD32 EE02 EE06 EE07 EE31 FF02 FF03 FF04 FF07 FF15 GG15 GG16 GG17 GG22 GG28 HH07

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 複数の絶縁層と複数の導体層を交互に積
層して形成され、絶縁層に設けたビアホールの内周のメ
ッキ層で導体層間の電気的接続を行うことにより形成さ
れる多層プリント積層板の製造方法であって、導体層を
被覆する絶縁層にレーザーを照射して、導体層が露出す
るまで絶縁層を除去してビアホールを形成し、ビアホー
ルの底部の導体層の表面に残存する絶縁層の残留物を除
去し、次いでビアホール底部の導体層の表層部をエッチ
ング除去し、ビアホールの周壁をなす部分の絶縁層を除
去した後、ビアホール内にメッキを施して上記の導体層
間の電気的接続を行うメッキ層を形成することを特徴と
する多層プリント配線板の製造方法。
1. A multilayer formed by alternately laminating a plurality of insulating layers and a plurality of conductor layers, and forming an electrical connection between the conductor layers with a plating layer on an inner periphery of a via hole provided in the insulating layer. A method of manufacturing a printed laminated board, which comprises irradiating a laser to an insulating layer covering a conductive layer, removing the insulating layer until the conductive layer is exposed, forming a via hole, and forming a via hole on the surface of the conductive layer at the bottom of the via hole. The residue of the remaining insulating layer is removed, then the surface layer of the conductor layer at the bottom of the via hole is removed by etching, and the insulating layer forming the peripheral wall of the via hole is removed. A method for manufacturing a multilayer printed wiring board, comprising forming a plating layer for making an electrical connection.
【請求項2】 前記絶縁層がエポキシ樹脂を主成分とす
る樹脂からなり、前記導体層、及び導体層間を接続する
メッキ層が銅からなり、前記ビアホールの底部の導体層
の表面に残存する絶縁層の残留物を除去する方法及び前
記ビアホールの周壁をなす部分の絶縁層を除去する方法
が湿式の過マンガン酸塩による処理であることを特徴と
する請求項1に記載の多層プリント配線板の製造方法。
2. The insulating layer is made of a resin containing an epoxy resin as a main component, the conductive layer and a plating layer connecting the conductive layers are made of copper, and the insulating layer remaining on the surface of the conductive layer at the bottom of the via hole is provided. 2. The multilayer printed wiring board according to claim 1, wherein the method of removing the residue of the layer and the method of removing the insulating layer in the portion forming the peripheral wall of the via hole are wet permanganate treatments. Production method.
【請求項3】 前記の湿式の過マンガン酸塩による処理
が、界面活性剤によるビアホールの周壁の樹脂成分の膨
潤、過マンガン酸塩によるこの樹脂成分の酸化、及びこ
の酸化で形成される酸化皮膜の除去からなることを特徴
とする請求項2に記載の多層プリント配線板の製造方
法。
3. The wet treatment with a permanganate comprises swelling the resin component on the peripheral wall of the via hole with a surfactant, oxidizing the resin component with a permanganate, and an oxide film formed by this oxidation. The method for producing a multilayer printed wiring board according to claim 2, comprising removing.
【請求項4】 前記の導体層の表層部をエッチング除去
する方法が、湿式のエッチング処理であることを特徴と
する請求項1〜3のいずれかに記載の多層プリント配線
板の製造方法。
4. The method for manufacturing a multilayer printed wiring board according to claim 1, wherein the method of etching and removing the surface layer portion of the conductor layer is a wet etching process.
【請求項5】 前記の湿式のエッチング処理が有機酸を
用いる処理であることを特徴とする請求項4に記載の多
層プリント配線板の製造方法。
5. The method according to claim 4, wherein the wet etching process is a process using an organic acid.
JP21240498A 1998-07-28 1998-07-28 Manufacture of multilayer printed wiring board Withdrawn JP2000049459A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21240498A JP2000049459A (en) 1998-07-28 1998-07-28 Manufacture of multilayer printed wiring board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21240498A JP2000049459A (en) 1998-07-28 1998-07-28 Manufacture of multilayer printed wiring board

Publications (1)

Publication Number Publication Date
JP2000049459A true JP2000049459A (en) 2000-02-18

Family

ID=16622034

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21240498A Withdrawn JP2000049459A (en) 1998-07-28 1998-07-28 Manufacture of multilayer printed wiring board

Country Status (1)

Country Link
JP (1) JP2000049459A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007150348A (en) * 2007-02-05 2007-06-14 Kyocera Corp Wiring substrate and electronic component mounting structure
WO2009034857A1 (en) * 2007-09-11 2009-03-19 Ajinomoto Co., Inc. Film for metal film transfer and adhesive film with metal film
JP2015185639A (en) * 2014-03-24 2015-10-22 Dowaメタルテック株式会社 Metal-ceramic circuit board and manufacturing method of the same
KR20160079413A (en) * 2014-12-26 2016-07-06 삼성전기주식회사 Printed circuit board and method of manufacturing the same

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007150348A (en) * 2007-02-05 2007-06-14 Kyocera Corp Wiring substrate and electronic component mounting structure
WO2009034857A1 (en) * 2007-09-11 2009-03-19 Ajinomoto Co., Inc. Film for metal film transfer and adhesive film with metal film
JP2015185639A (en) * 2014-03-24 2015-10-22 Dowaメタルテック株式会社 Metal-ceramic circuit board and manufacturing method of the same
KR20160079413A (en) * 2014-12-26 2016-07-06 삼성전기주식회사 Printed circuit board and method of manufacturing the same
KR102356809B1 (en) * 2014-12-26 2022-01-28 삼성전기주식회사 Printed circuit board and method of manufacturing the same

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