JP2000031061A - 半導体薄膜蒸着装置 - Google Patents
半導体薄膜蒸着装置Info
- Publication number
- JP2000031061A JP2000031061A JP11136866A JP13686699A JP2000031061A JP 2000031061 A JP2000031061 A JP 2000031061A JP 11136866 A JP11136866 A JP 11136866A JP 13686699 A JP13686699 A JP 13686699A JP 2000031061 A JP2000031061 A JP 2000031061A
- Authority
- JP
- Japan
- Prior art keywords
- gas
- reactor block
- wafer
- plate
- exhaust
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 24
- 239000010409 thin film Substances 0.000 title abstract description 5
- 238000001704 evaporation Methods 0.000 title abstract 4
- 230000008020 evaporation Effects 0.000 title abstract 3
- 239000007789 gas Substances 0.000 claims abstract description 40
- 239000011261 inert gas Substances 0.000 claims abstract description 21
- 238000009792 diffusion process Methods 0.000 claims abstract description 15
- 230000002093 peripheral effect Effects 0.000 claims description 18
- 238000000427 thin-film deposition Methods 0.000 claims description 16
- 230000002265 prevention Effects 0.000 claims description 8
- 238000002347 injection Methods 0.000 claims description 4
- 239000007924 injection Substances 0.000 claims description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 3
- 229910001220 stainless steel Inorganic materials 0.000 claims description 3
- 239000010935 stainless steel Substances 0.000 claims description 3
- 238000007664 blowing Methods 0.000 abstract 1
- 239000012495 reaction gas Substances 0.000 description 16
- 239000000376 reactant Substances 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000000151 deposition Methods 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45502—Flow conditions in reaction chamber
- C23C16/45504—Laminar flow
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45519—Inert gas curtains
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/4558—Perforated rings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Fluid Mechanics (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
導体薄膜蒸着装置を提供する。 【解決手段】 半導体ウェーハが配置されるリアクター
ブロック10と、そのブロック10の上部に設けられウェー
ハに反応気体を供給するシャワーヘッド板20と、そのヘ
ッド板20に反応気体を供給する反応気体供給源と、ブロ
ック10に連結されて同ブロック10の内部の気体を外部に
排気する排気部27とを具備する半導体薄膜蒸着装置にお
いて、ヘッド板20に連結されて不活性気体を供給する不
活性気体供給源と、ヘッド板20に設けられ、不活性気体
供給源と連結される流路32と、その流路32と連結されて
ブロック10の内周面にガスカーテンを形成する不活性気
体を噴射させる多数のノズル31と、反応気体をウェーハ
に噴射する多数の噴射口33を有する拡散板30とを含む。
Description
膜を蒸着させるための半導体薄膜蒸着装置に関する。
薄膜蒸着装置は、ウェーハ8が収納される反応容器1に異
種の第1及び2反応気体を注入するための第1パイプ2及び
第2パイプ3と、反応気体を排気するための排気パイプ4
とが連結されている。第1パイプ2及び第2パイプ3には第
1弁5及び第2弁6がそれぞれ設けられており、排気パイプ
4にはポンプ7が設けられている。第1弁5及び第2弁6は制
御装置(図示せず)によって開閉される。
弁6を閉じ、第1弁5を開くと第1反応気体は第1弁5を通じ
て反応容器1に供給され、引続き排気パイプ4及びポンプ
7を通じて排気される。次いで、制御装置が第1弁5を閉
じ、第2弁6を開くと第2反応気体は第2弁6を通じて反応
容器1に供給され、引続き排気パイプ4及びポンプ7を通
じて排出される。
半導体薄膜蒸着装置において、反応容器の内部に流入さ
れた反応気体がウェーハだけでなく、反応気体に晒され
る反応容器の内部の全ての部分に蒸着する。従って、定
期的に反応容器の内部を掃除しなければならない。
けられているため、排気パイプ4に近接した部分と、そ
うでない部分における反応気体の分布が変わる。このよ
うな分布差は、反応容器1に供給される反応気体のウェ
ーハ上への均一な分布を阻害してウェーハ上の層流(lam
inar flow)の形成を妨害した。
れたものであって、反応気体に対して露出する領域を減
少して反応容器の内部の掃除周期を延ばすとともに、ウ
ェーハ上に流入する反応気体の層流を形成可能とする半
導体薄膜蒸着装置を提供することを目的とする。
に本発明に係る半導体薄膜蒸着装置は、半導体ウェーハ
が配置されるリアクターブロックと、前記リアクターブ
ロックの上部に設けられ前記ウェーハに反応気体を供給
するシャワーヘッド板と、前記シャワーヘッド板に反応
気体を供給する反応気体供給源と、前記リアクターブロ
ックに連結されてリアクターブロックの内部の気体を外
部に排気させる排気部とを具備する半導体薄膜蒸着装置
において、前記シャワーヘッド板に連結されて不活性気
体を供給する不活性気体供給源と、前記シャワーヘッド
板に設けられ、前記不活性気体供給源と連結される流路
と、その流路と連結されて前記リアクターブロックの内
周面にガスカーテンを形成するための不活性気体を噴射
する多数のノズルと、前記反応気体を前記ウェーハに噴
射する多数の噴射口を有する拡散板とを含むことを特徴
とする。
形成され、前記ノズルは前記拡散板の外周面から前記リ
アクターブロックの内周面に向かって傾斜している。ま
た、前記リアクターブロックの内周面にシールドをさら
に設けて、シールドの内周面に前記ガスカーテンが形成
されるようにする。
止シリンダと、前記流入防止シリンダが設けられ、前記
排気部と連通される少なくとも3つ以上の相互対称的な
排気孔を有する排気板が構成された排気手段をさらに含
む。
明の一実施形態に従う半導体薄膜蒸着装置を詳しく説明
する。
装置は、半導体ウェーハ(図示せず)が配置されるリアク
ターブロック10と、そのリアクターブロック10にヒンジ
29a、29bによりヒンジ結合されるシャワーヘッド板20を
具備する。シャワーヘッド板20はリアクターブロック10
を覆ってリアクターブロック10の内部を所定の圧力に一
定に保つ。前記シャワーヘッド板20の下方には反応気体
を噴射する拡散板30が設けられ、シャワーヘッド板20が
リアクターブロック10を覆った時、拡散板30はリアクタ
ーブロック10の内部に配置される。
流入する反応気体供給源(図示せず)に連結された第1
接続パイプ11及び第2接続パイプ12と、不活性気体が供
給される不活性気体供給源(図示せず)に接続される第
3接続パイプ13が設けられている。各パイプ11、12、13
は接続部14を通じてシャワーヘッド板20に設けられた第
1〜3連結パイプ21、22、23に接続される。接続部14には
Oリング14aが設けられているため、シャワーヘッド板20
がヒンジ29a、29bを中心に回転されてリアクターブロッ
ク10を閉じる時、接続パイプ11、12、13と連結パイプ2
1、22、23とを効率よく連結する。シャワーヘッド板20
がヒンジ29a、29bを中心に回転されてリアクターブロッ
ク10から分離される時にも接続パイプ11、12、13と連結
パイプ21、22、23とが効率よく分離される。また、流入
する不活性気体または/及び反応気体を排気可能な3つ
以上のリアクター排気孔18が相互対称的に形成されてい
る。
成された多数の流路32と、その流路32と連結され、拡
散板30の外周面からリアクターブロック10の内周面に向
かうように傾斜するノズル31を含む。不活性気体は第3
接続パイプ13→第3連結パイプ23→流路32→ノズル31を
通じてリアクターブロック10の内周面に噴射されてガス
カーテンを形成する。また、拡散板30の表面には第1接
続パイプ11または第2接続パイプ12と連結される多数の
噴射口33が均一に分布している。
気体に対して露出する領域を最小化するためのシールド
25が分離可能に設けられる。シールド25はアルミナ、ア
ルミニウム、ステンレススチールのような材料からなっ
ており、リアクターブロック10に設けられた時、リアク
ターブロックの内周面に密着する。シールド25が設けら
れた時、前記不活性気体はシールド25の内周面にガスカ
ーテンを形成する。
ェーハにおいて反応気体の層流のための排気手段27が分
離可能に設けられている。排気手段27はシールド25の内
部に配置される排気板27bと、その排気板27bの内周面に
形成され、ウェーハが配置される円筒状の流入防止シリ
ンダ27aとからなる。ここで、排気板27bには不活性気体
及び反応気体を排気できるように、排気部(図示せず)に
連結され、前記リアクター排気孔18に対応する排気孔28
が形成されている。このような排気手段27はアルミナ、
アルミニウム、ステンレススチールのような材料からな
っており、排気孔28を有する排気板27bはウェーハが配
置される地点より30mm〜50mm下方に位置することが望ま
しい。
孔15を通じて移送されたウェーハが流入防止シリンダ27
a内に配置された状態で、反応気体が第1接続パイプ11→
第1連結パイプ21または第2接続パイプ12→第2連結パイ
プ22を通じて拡散板30の噴射口33を通じてリアクターブ
ロック10の内部に噴射される。不活性気体は第3接続パ
イプ13→第3連結パイプ23→流路32→ノズル31を通じて
シールド25の内周面に噴射されてガスカーテンを形成す
る。不活性気体により形成されたガスカーテンは噴射さ
れる反応気体がシールド25に接触されることを防止す
る。
27a及び均一に分布された噴射口33によってウェーハ上
に反応気体の層流が形成される。このように、拡散板30
を通じて噴射される反応気体及び不活性気体は対称的に
形成された排気孔28及びリアクター排気孔18を通じて連
続的に排気される。
活性気体がリアクターブロックの内部のシールドの内周
面にガスカーテンを形成するため、反応気体がリアクタ
ーブロックやシールドに蒸着することを防止して掃除周
期を延ばすことができる。
れたウェーハ上に噴射される反応気体による層流が形成
され、以降に反応気体及び不活性気体が対称的に形成さ
れた排気孔を通じて一定で均一に排気されるので、異種
気体の連続的な流入を可能とする。
図面である。
図である。
て示す斜視図である。
Claims (8)
- 【請求項1】 半導体ウェーハが配置されるリアクター
ブロックと、前記リアクターブロックの上部に設けられ
前記ウェーハに反応気体を供給するシャワーヘッド板
と、前記シャワーヘッド板に反応気体を供給する反応気
体供給源と、前記リアクターブロックに連結されてリア
クターブロックの内部の気体を外部に排気させる排気部
とを具備する半導体薄膜蒸着装置において、 前記シャワーヘッド板に連結されて不活性気体を供給す
る不活性気体供給源と、 前記シャワーヘッド板に設けられ、前記不活性気体供給
源と連結される流路と、 その流路と連結されて前記リアクターブロックの内周面
にガスカーテンを形成するための不活性気体を噴射する
多数のノズルと、 前記反応気体を前記ウェーハに噴射する多数の噴射口を
有する拡散板とを含むことを特徴とする半導体薄膜蒸着
装置。 - 【請求項2】 前記流路は前記拡散板の中心から放射状
に形成されていることを特徴とする請求項1に記載の半
導体薄膜蒸着装置。 - 【請求項3】 前記ノズルは前記拡散板の外周面から前
記リアクターブロックの内周面に向かって傾斜している
ことを特徴とする請求項1に記載の半導体薄膜蒸着装
置。 - 【請求項4】 内周面に前記ガスカーテンが形成される
ように前記リアクターブロックの内周面に設けられるシ
ールドをさらに具備することを特徴とする請求項1に記
載の半導体薄膜蒸着装置。 - 【請求項5】 前記シールドはアルミナ、アルミニウム
およびステンレススチールのうち少なくとも何れか一つ
からなることを特徴とする請求項4に記載の半導体薄膜
蒸着装置。 - 【請求項6】 前記ウェーハが位置される円筒状の流入
防止シリンダと、前記流入防止シリンダが設けられ、前
記排気部と連通される少なくとも3つ以上の相互対称的
な排気孔を有する排気板が構成された排気手段をさらに
含むことを特徴とする請求項1に記載の半導体薄膜蒸着
装置。 - 【請求項7】 前記排気手段の排気板は前記ウェーハよ
り30〜50mm低く位置されることを特徴とする請求項6に
記載の半導体薄膜蒸着装置。 - 【請求項8】 前記シャワーヘッド板または前記リアク
ターブロックに設けられ、前記シャワーヘッド板に設け
られたパイプと前記リアクターブロックに設けられたパ
イプとを安全に接続及び分離させるためにOリングをさ
らに具備することを特徴とする請求項1に記載の半導体
薄膜蒸着装置。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR17858/1998 | 1998-05-18 | ||
KR1019980017858A KR100267885B1 (ko) | 1998-05-18 | 1998-05-18 | 반도체 박막증착장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2000031061A true JP2000031061A (ja) | 2000-01-28 |
JP3073489B2 JP3073489B2 (ja) | 2000-08-07 |
Family
ID=36580479
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11136866A Expired - Lifetime JP3073489B2 (ja) | 1998-05-18 | 1999-05-18 | 半導体薄膜蒸着装置 |
Country Status (6)
Country | Link |
---|---|
US (1) | US6183563B1 (ja) |
EP (1) | EP0959150B8 (ja) |
JP (1) | JP3073489B2 (ja) |
KR (1) | KR100267885B1 (ja) |
DE (1) | DE69927548T2 (ja) |
TW (1) | TW483051B (ja) |
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-
1999
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- 1999-05-18 EP EP99303880A patent/EP0959150B8/en not_active Expired - Lifetime
- 1999-05-18 US US09/313,765 patent/US6183563B1/en not_active Expired - Lifetime
- 1999-05-18 JP JP11136866A patent/JP3073489B2/ja not_active Expired - Lifetime
- 1999-05-18 DE DE69927548T patent/DE69927548T2/de not_active Expired - Fee Related
Cited By (3)
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KR100423953B1 (ko) * | 2001-03-19 | 2004-03-24 | 디지웨이브 테크놀러지스 주식회사 | 화학기상증착장치 |
JP2008277795A (ja) * | 2001-12-21 | 2008-11-13 | Sumco Corp | エピタキシャル成長用サセプタ |
US8926754B2 (en) | 2001-12-21 | 2015-01-06 | Sumitomo Mitsubishi Silicon Corporation | Epitaxial growth susceptor |
Also Published As
Publication number | Publication date |
---|---|
EP0959150A2 (en) | 1999-11-24 |
EP0959150B1 (en) | 2005-10-05 |
DE69927548T2 (de) | 2006-06-29 |
EP0959150B8 (en) | 2006-01-18 |
KR19990085443A (ko) | 1999-12-06 |
US6183563B1 (en) | 2001-02-06 |
TW483051B (en) | 2002-04-11 |
DE69927548D1 (de) | 2006-02-16 |
EP0959150A3 (en) | 2002-07-24 |
KR100267885B1 (ko) | 2000-11-01 |
JP3073489B2 (ja) | 2000-08-07 |
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