ITMI911124A0 - Transistor ad effetto di campo avente regioni di impurita' di profondita' diverse e procedimento di fabbricazione di esso - Google Patents

Transistor ad effetto di campo avente regioni di impurita' di profondita' diverse e procedimento di fabbricazione di esso

Info

Publication number
ITMI911124A0
ITMI911124A0 IT91MI1124A ITMI911124A ITMI911124A0 IT MI911124 A0 ITMI911124 A0 IT MI911124A0 IT 91MI1124 A IT91MI1124 A IT 91MI1124A IT MI911124 A ITMI911124 A IT MI911124A IT MI911124 A0 ITMI911124 A0 IT MI911124A0
Authority
IT
Italy
Prior art keywords
field effect
effect transistor
impurity regions
manufacturing procedure
different depth
Prior art date
Application number
IT91MI1124A
Other languages
English (en)
Inventor
Hideaki Arima
Makoto Ohi
Natsuo Ajika
Atsushi Hachisuka
Tomonori Okudaira
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of ITMI911124A0 publication Critical patent/ITMI911124A0/it
Publication of ITMI911124A1 publication Critical patent/ITMI911124A1/it
Application granted granted Critical
Publication of IT1247295B publication Critical patent/IT1247295B/it

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/01Manufacture or treatment
    • H10B12/02Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
    • H10B12/05Making the transistor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/77Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
    • H01L21/78Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
    • H01L21/82Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
    • H01L21/822Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
    • H01L21/8232Field-effect technology
    • H01L21/8234MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
    • H01L21/823468MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type with a particular manufacturing method of the gate sidewall spacers, e.g. double spacers, particular spacer material or shape

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Semiconductor Memories (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
ITMI911124A 1990-04-27 1991-04-23 Transistor ad effetto di campo avente regioni di impurita' di profondita' diverse e procedimento di fabbricazione di esso IT1247295B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2113634A JPH0817225B2 (ja) 1990-04-27 1990-04-27 電界効果トランジスタを有する半導体装置およびその製造方法

Publications (3)

Publication Number Publication Date
ITMI911124A0 true ITMI911124A0 (it) 1991-04-23
ITMI911124A1 ITMI911124A1 (it) 1992-10-23
IT1247295B IT1247295B (it) 1994-12-12

Family

ID=14617209

Family Applications (1)

Application Number Title Priority Date Filing Date
ITMI911124A IT1247295B (it) 1990-04-27 1991-04-23 Transistor ad effetto di campo avente regioni di impurita' di profondita' diverse e procedimento di fabbricazione di esso

Country Status (3)

Country Link
JP (1) JPH0817225B2 (it)
KR (1) KR940005887B1 (it)
IT (1) IT1247295B (it)

Also Published As

Publication number Publication date
KR910019229A (ko) 1991-11-30
IT1247295B (it) 1994-12-12
KR940005887B1 (ko) 1994-06-24
JPH0410652A (ja) 1992-01-14
JPH0817225B2 (ja) 1996-02-21
ITMI911124A1 (it) 1992-10-23

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19970429