IT991007B - Metodo di trattamento di lastrine monocristalline mediante riscalda mento su di un suscettore riscalda to per induzione ad alta frequenza dispositivo e suscettore per lo svolgimento di tale metodo e prodot ti ottenuti con l ausilio del metodo stesso - Google Patents

Metodo di trattamento di lastrine monocristalline mediante riscalda mento su di un suscettore riscalda to per induzione ad alta frequenza dispositivo e suscettore per lo svolgimento di tale metodo e prodot ti ottenuti con l ausilio del metodo stesso

Info

Publication number
IT991007B
IT991007B IT26018/73A IT2601873A IT991007B IT 991007 B IT991007 B IT 991007B IT 26018/73 A IT26018/73 A IT 26018/73A IT 2601873 A IT2601873 A IT 2601873A IT 991007 B IT991007 B IT 991007B
Authority
IT
Italy
Prior art keywords
susceptor
aid
heating
carrying
treatment
Prior art date
Application number
IT26018/73A
Other languages
English (en)
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Application granted granted Critical
Publication of IT991007B publication Critical patent/IT991007B/it

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C30—CRYSTAL GROWTH
    • C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
    • C30B25/02—Epitaxial-layer growth
    • C30B25/12—Substrate holders or susceptors
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
    • C23C16/4582—Rigid and flat substrates, e.g. plates or discs
    • C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)
  • Recrystallisation Techniques (AREA)
IT26018/73A 1972-07-01 1973-06-28 Metodo di trattamento di lastrine monocristalline mediante riscalda mento su di un suscettore riscalda to per induzione ad alta frequenza dispositivo e suscettore per lo svolgimento di tale metodo e prodot ti ottenuti con l ausilio del metodo stesso IT991007B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7209297A NL7209297A (it) 1972-07-01 1972-07-01

Publications (1)

Publication Number Publication Date
IT991007B true IT991007B (it) 1975-07-30

Family

ID=19816454

Family Applications (1)

Application Number Title Priority Date Filing Date
IT26018/73A IT991007B (it) 1972-07-01 1973-06-28 Metodo di trattamento di lastrine monocristalline mediante riscalda mento su di un suscettore riscalda to per induzione ad alta frequenza dispositivo e suscettore per lo svolgimento di tale metodo e prodot ti ottenuti con l ausilio del metodo stesso

Country Status (9)

Country Link
US (1) US3892940A (it)
JP (1) JPS5320351B2 (it)
BE (1) BE801749A (it)
CA (1) CA995565A (it)
DE (1) DE2331664C3 (it)
FR (1) FR2190525B1 (it)
GB (1) GB1425965A (it)
IT (1) IT991007B (it)
NL (1) NL7209297A (it)

Families Citing this family (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51135363A (en) * 1975-05-19 1976-11-24 Matsushita Electric Ind Co Ltd Method of manufacturing semiconductors and its equipment
JPS5271171A (en) * 1975-12-10 1977-06-14 Matsushita Electronics Corp Production of epitaxial wafer
JPS5277590A (en) * 1975-12-24 1977-06-30 Toshiba Corp Semiconductor producing device
SE7710800L (sv) * 1976-10-05 1978-04-06 Western Electric Co Forfarande for astadkommande av ett epitaxiellt skikt pa ett substrat
US4099041A (en) * 1977-04-11 1978-07-04 Rca Corporation Susceptor for heating semiconductor substrates
JPS5529174U (it) * 1978-08-17 1980-02-25
JPS55110044U (it) * 1979-01-30 1980-08-01
JPS55143455U (it) * 1979-03-16 1980-10-14
US4386255A (en) * 1979-12-17 1983-05-31 Rca Corporation Susceptor for rotary disc reactor
JPS56131324A (en) * 1980-03-17 1981-10-14 Mitsubishi Monsanto Chem Mulching cultivation
JPS56131322A (en) * 1980-03-17 1981-10-14 Mitsubishi Monsanto Chem Cultivation of useful plant
JPS56157965U (it) * 1980-04-21 1981-11-25
US4322592A (en) * 1980-08-22 1982-03-30 Rca Corporation Susceptor for heating semiconductor substrates
JPS5820855U (ja) * 1981-08-04 1983-02-08 前原　信良 太陽熱蓄熱及び放熱体
JPS58122951U (ja) * 1982-02-17 1983-08-22 株式会社展建築設計事務所 農業用ビニ−ル・ハウス
US5242501A (en) * 1982-09-10 1993-09-07 Lam Research Corporation Susceptor in chemical vapor deposition reactors
US4488507A (en) * 1982-09-30 1984-12-18 Jackson Jr David A Susceptors for organometallic vapor-phase epitaxial (OMVPE) method
JPS60116229U (ja) * 1984-01-10 1985-08-06 日本電気株式会社 半導体ウエ−ハの発熱担体
JPS6169116A (ja) * 1984-09-13 1986-04-09 Toshiba Ceramics Co Ltd シリコンウエハ−の連続ｃｖｄコ−テイング用サセプター
US4794217A (en) * 1985-04-01 1988-12-27 Qing Hua University Induction system for rapid heat treatment of semiconductor wafers
US5119540A (en) * 1990-07-24 1992-06-09 Cree Research, Inc. Apparatus for eliminating residual nitrogen contamination in epitaxial layers of silicon carbide and resulting product
US6217662B1 (en) * 1997-03-24 2001-04-17 Cree, Inc. Susceptor designs for silicon carbide thin films
US8603248B2 (en) * 2006-02-10 2013-12-10 Veeco Instruments Inc. System and method for varying wafer surface temperature via wafer-carrier temperature offset
US8164028B2 (en) * 2008-01-18 2012-04-24 Momentive Performance Materials Inc. Resistance heater
US8993939B2 (en) * 2008-01-18 2015-03-31 Momentive Performance Materials Inc. Resistance heater
EP2562291A1 (en) * 2008-08-29 2013-02-27 Veeco Instruments Inc. Wafer carrier with varying thermal resistance
CN102828169A (zh) * 2011-06-13 2012-12-19 北京北方微电子基地设备工艺研究中心有限责任公司 一种载片托盘、托盘装置和结晶膜生长设备
DE102011055061A1 (de) * 2011-11-04 2013-05-08 Aixtron Se CVD-Reaktor bzw. Substrathalter für einen CVD-Reaktor
KR101928356B1 (ko) * 2012-02-16 2018-12-12 엘지이노텍 주식회사 반도체 제조 장치
US10316412B2 (en) 2012-04-18 2019-06-11 Veeco Instruments Inc. Wafter carrier for chemical vapor deposition systems
US10167571B2 (en) 2013-03-15 2019-01-01 Veeco Instruments Inc. Wafer carrier having provisions for improving heating uniformity in chemical vapor deposition systems
JP2015067878A (ja) * 2013-09-30 2015-04-13 東京エレクトロン株式会社 熱処理装置及び熱処理方法
US10145013B2 (en) 2014-01-27 2018-12-04 Veeco Instruments Inc. Wafer carrier having retention pockets with compound radii for chemical vapor desposition systems
ITUB20154925A1 (it) * 2015-11-03 2017-05-03 L P E S P A Suscettore con recessi asimmetrici, reattore per deposizione epitassiale e metodo di produzione
JP7018744B2 (ja) * 2017-11-24 2022-02-14 昭和電工株式会社 ＳｉＣエピタキシャル成長装置

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1360497A (fr) * 1963-06-12 1964-05-08 Siemens Ag Procédé pour réaliser des couches cristallines en des substances peu volatiles, notamment des substances semi-conductrices
GB1121860A (en) * 1964-11-21 1968-07-31 Tokushu Denki Kabushiki Kaisha A heating rotary drum apparatus
DE1262244B (de) * 1964-12-23 1968-03-07 Siemens Ag Verfahren zum epitaktischen Abscheiden einer kristallinen Schicht, insbesondere aus Halbleitermaterial
US3539759A (en) * 1968-11-08 1970-11-10 Ibm Susceptor structure in silicon epitaxy
NL7103019A (it) * 1971-03-06 1972-09-08

Also Published As

Publication number Publication date
FR2190525A1 (it) 1974-02-01
DE2331664C3 (de) 1979-06-07
GB1425965A (en) 1976-02-25
JPS4945681A (it) 1974-05-01
US3892940A (en) 1975-07-01
DE2331664B2 (de) 1978-10-19
BE801749A (fr) 1974-01-02
DE2331664A1 (de) 1974-03-14
JPS5320351B2 (it) 1978-06-26
CA995565A (en) 1976-08-24
NL7209297A (it) 1974-01-03
FR2190525B1 (it) 1976-09-17

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