IT8822367A0 - Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota - Google Patents

Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota

Info

Publication number
IT8822367A0
IT8822367A0 IT8822367A IT2236788A IT8822367A0 IT 8822367 A0 IT8822367 A0 IT 8822367A0 IT 8822367 A IT8822367 A IT 8822367A IT 2236788 A IT2236788 A IT 2236788A IT 8822367 A0 IT8822367 A0 IT 8822367A0
Authority
IT
Italy
Prior art keywords
photodides
single photon
shutdown circuit
photon avalanche
avalanche semiconductor
Prior art date
Application number
IT8822367A
Other languages
English (en)
Other versions
IT1229945B (it
Inventor
Sergio Cova
Original Assignee
Consiglio Nazionale Ricerche
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Consiglio Nazionale Ricerche filed Critical Consiglio Nazionale Ricerche
Priority to IT8822367A priority Critical patent/IT1229945B/it
Publication of IT8822367A0 publication Critical patent/IT8822367A0/it
Priority to EP19890202618 priority patent/EP0365095A3/en
Priority to US07/422,899 priority patent/US4963727A/en
Priority to JP1271887A priority patent/JPH02170477A/ja
Application granted granted Critical
Publication of IT1229945B publication Critical patent/IT1229945B/it

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/74—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/941—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated using an optical detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G01J2001/4466—Avalanche
IT8822367A 1988-10-20 1988-10-20 Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota IT1229945B (it)

Priority Applications (4)

Application Number Priority Date Filing Date Title
IT8822367A IT1229945B (it) 1988-10-20 1988-10-20 Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota
EP19890202618 EP0365095A3 (en) 1988-10-20 1989-10-17 Single photon semiconductor avalanche photodiode and active quenching circuit assembly
US07/422,899 US4963727A (en) 1988-10-20 1989-10-18 Active quenching circuit for avalanche photodiodes
JP1271887A JPH02170477A (ja) 1988-10-20 1989-10-20 能動クエンチング回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT8822367A IT1229945B (it) 1988-10-20 1988-10-20 Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota

Publications (2)

Publication Number Publication Date
IT8822367A0 true IT8822367A0 (it) 1988-10-20
IT1229945B IT1229945B (it) 1991-09-17

Family

ID=11195308

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8822367A IT1229945B (it) 1988-10-20 1988-10-20 Circuito di spegnimento attivo per fotodiodi a semiconduttore a valanga per singoli fotoni, adatto per il funzionamento con fotodiodo in posizione remota

Country Status (4)

Country Link
US (1) US4963727A (it)
EP (1) EP0365095A3 (it)
JP (1) JPH02170477A (it)
IT (1) IT1229945B (it)

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CN112444315A (zh) * 2020-10-15 2021-03-05 良业科技集团股份有限公司 一种被动淬灭电路
CN113253088A (zh) * 2021-06-25 2021-08-13 上海瞻芯电子科技有限公司 晶体管栅氧测试装置及系统

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US6696887B2 (en) * 2001-09-27 2004-02-24 Matthew S. Taubman Transistor-based interface circuitry
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DE102005051571B4 (de) * 2005-10-21 2013-06-20 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Photodioden-Chip hoher Grenzfrequenz
US7897906B2 (en) * 2007-03-23 2011-03-01 Excelitas Canada Inc. Double quench circuit for an avalanche current device
CN101170362B (zh) * 2007-11-08 2011-01-12 华东师范大学 一种apd单光子探测的电路模块
US8803075B2 (en) * 2008-04-18 2014-08-12 Saint-Gobain Ceramics & Plastics, Inc. Radiation detector device
CN101923173B (zh) * 2009-06-10 2014-10-01 圣戈本陶瓷及塑料股份有限公司 闪烁体以及检测器组件
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DE102010060527B3 (de) * 2010-11-12 2012-04-19 Picoquant Gmbh Schaltungsanordnung zum Nachweis einzelner Photonen
US9442201B2 (en) 2013-09-12 2016-09-13 Siemens Medical Solutions Usa, Inc. CMOS SPAD array with mixed timing pick-off for time-of-flight positron emission tomography
US10128398B1 (en) 2014-05-23 2018-11-13 Stc.Unm Resonance avalanche photodiodes for dynamic biasing
CN104218917A (zh) * 2014-07-24 2014-12-17 安徽问天量子科技股份有限公司 用于消除apd雪崩信号输出端的尖峰噪声的自差分滤波装置
CN104198058B (zh) * 2014-08-05 2017-06-06 清华大学 单光子雪崩二极管的淬灭和读出电路
CN104990632A (zh) * 2015-07-14 2015-10-21 华中科技大学 一种门控差分单光子探测系统
US9671284B1 (en) 2016-01-14 2017-06-06 Kiskeya Microsystems Llc Single-photon avalanche diode circuit with variable hold-off time and dual delay regime
CN106482840B (zh) * 2016-09-27 2019-03-08 山东大学 一种用于单光子探测器的主动猝灭电路及其工作方法
US10340408B1 (en) 2018-05-17 2019-07-02 Hi Llc Non-invasive wearable brain interface systems including a headgear and a plurality of self-contained photodetector units configured to removably attach to the headgear
US10158038B1 (en) 2018-05-17 2018-12-18 Hi Llc Fast-gated photodetector architectures comprising dual voltage sources with a switch configuration
WO2019221799A1 (en) 2018-05-17 2019-11-21 Hi Llc Stacked photodetector assemblies
US10420498B1 (en) 2018-06-20 2019-09-24 Hi Llc Spatial and temporal-based diffusive correlation spectroscopy systems and methods
US11213206B2 (en) 2018-07-17 2022-01-04 Hi Llc Non-invasive measurement systems with single-photon counting camera
US11006876B2 (en) 2018-12-21 2021-05-18 Hi Llc Biofeedback for awareness and modulation of mental state using a non-invasive brain interface system and method
JP7278821B2 (ja) 2019-03-22 2023-05-22 株式会社東芝 センサ及び距離計測装置
JP2022533553A (ja) 2019-05-06 2022-07-25 エイチアイ エルエルシー 時間相関単一光子計数法向けの光検出器アーキテクチャ
US11081611B2 (en) 2019-05-21 2021-08-03 Hi Llc Photodetector architectures for efficient fast-gating comprising a control system controlling a current drawn by an array of photodetectors with a single photon avalanche diode
WO2020247185A1 (en) 2019-06-06 2020-12-10 Hi Llc Photodetector systems with low-power time-to-digital converter architectures
US11105679B2 (en) 2019-12-12 2021-08-31 Stmicroelectronics (Research & Development) Limited Extended hold-off time for SPAD quench assistance
US11162839B2 (en) * 2019-12-12 2021-11-02 Stmicroelectronics (Research & Development) Limited Photodetection circuit with extended hold-off time for SPAD quench assistance
US11096620B1 (en) 2020-02-21 2021-08-24 Hi Llc Wearable module assemblies for an optical measurement system
US11950879B2 (en) 2020-02-21 2024-04-09 Hi Llc Estimation of source-detector separation in an optical measurement system
WO2021167892A1 (en) 2020-02-21 2021-08-26 Hi Llc Wearable devices and wearable assemblies with adjustable positioning for use in an optical measurement system
WO2021167876A1 (en) 2020-02-21 2021-08-26 Hi Llc Methods and systems for initiating and conducting a customized computer-enabled brain research study
US11969259B2 (en) 2020-02-21 2024-04-30 Hi Llc Detector assemblies for a wearable module of an optical measurement system and including spring-loaded light-receiving members
US11771362B2 (en) 2020-02-21 2023-10-03 Hi Llc Integrated detector assemblies for a wearable module of an optical measurement system
US11883181B2 (en) 2020-02-21 2024-01-30 Hi Llc Multimodal wearable measurement systems and methods
US11877825B2 (en) 2020-03-20 2024-01-23 Hi Llc Device enumeration in an optical measurement system
US11607132B2 (en) 2020-03-20 2023-03-21 Hi Llc Temporal resolution control for temporal point spread function generation in an optical measurement system
US11864867B2 (en) 2020-03-20 2024-01-09 Hi Llc Control circuit for a light source in an optical measurement system by applying voltage with a first polarity to start an emission of a light pulse and applying voltage with a second polarity to stop the emission of the light pulse
US11187575B2 (en) 2020-03-20 2021-11-30 Hi Llc High density optical measurement systems with minimal number of light sources
WO2021188485A1 (en) 2020-03-20 2021-09-23 Hi Llc Maintaining consistent photodetector sensitivity in an optical measurement system
US11245404B2 (en) 2020-03-20 2022-02-08 Hi Llc Phase lock loop circuit based signal generation in an optical measurement system
US11857348B2 (en) 2020-03-20 2024-01-02 Hi Llc Techniques for determining a timing uncertainty of a component of an optical measurement system
WO2021188496A1 (en) 2020-03-20 2021-09-23 Hi Llc Photodetector calibration of an optical measurement system
US11645483B2 (en) 2020-03-20 2023-05-09 Hi Llc Phase lock loop circuit based adjustment of a measurement time window in an optical measurement system

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112444315A (zh) * 2020-10-15 2021-03-05 良业科技集团股份有限公司 一种被动淬灭电路
CN113253088A (zh) * 2021-06-25 2021-08-13 上海瞻芯电子科技有限公司 晶体管栅氧测试装置及系统

Also Published As

Publication number Publication date
EP0365095A2 (en) 1990-04-25
JPH02170477A (ja) 1990-07-02
US4963727A (en) 1990-10-16
IT1229945B (it) 1991-09-17
EP0365095A3 (en) 1991-02-06

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TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19941027