IT1282940B1 - Mosfet di potenza con protezione da sovracorrente e da temperatura elevata e circuito di controllo disaccoppiato dal diodo della - Google Patents

Mosfet di potenza con protezione da sovracorrente e da temperatura elevata e circuito di controllo disaccoppiato dal diodo della

Info

Publication number
IT1282940B1
IT1282940B1 IT95MI001818A ITMI951818A IT1282940B1 IT 1282940 B1 IT1282940 B1 IT 1282940B1 IT 95MI001818 A IT95MI001818 A IT 95MI001818A IT MI951818 A ITMI951818 A IT MI951818A IT 1282940 B1 IT1282940 B1 IT 1282940B1
Authority
IT
Italy
Prior art keywords
overcurrent
diode
control circuit
high temperature
power mosfet
Prior art date
Application number
IT95MI001818A
Other languages
English (en)
Inventor
Nadd Bruno C
Houk Talbott M
Original Assignee
Int Rectifier Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Int Rectifier Corp filed Critical Int Rectifier Corp
Publication of ITMI951818A0 publication Critical patent/ITMI951818A0/it
Publication of ITMI951818A1 publication Critical patent/ITMI951818A1/it
Application granted granted Critical
Publication of IT1282940B1 publication Critical patent/IT1282940B1/it

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
    • H01L29/7803—Vertical DMOS transistors, i.e. VDMOS transistors structurally associated with at least one other device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/0203—Particular design considerations for integrated circuits
    • H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
    • H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0822—Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K2017/0806—Modifications for protecting switching circuit against overcurrent or overvoltage against excessive temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Ceramic Engineering (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Electronic Switches (AREA)
IT95MI001818A 1994-08-30 1995-08-29 Mosfet di potenza con protezione da sovracorrente e da temperatura elevata e circuito di controllo disaccoppiato dal diodo della IT1282940B1 (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/298,383 US5550701A (en) 1994-08-30 1994-08-30 Power MOSFET with overcurrent and over-temperature protection and control circuit decoupled from body diode

Publications (3)

Publication Number Publication Date
ITMI951818A0 ITMI951818A0 (it) 1995-08-29
ITMI951818A1 ITMI951818A1 (it) 1997-03-01
IT1282940B1 true IT1282940B1 (it) 1998-04-02

Family

ID=23150264

Family Applications (1)

Application Number Title Priority Date Filing Date
IT95MI001818A IT1282940B1 (it) 1994-08-30 1995-08-29 Mosfet di potenza con protezione da sovracorrente e da temperatura elevata e circuito di controllo disaccoppiato dal diodo della

Country Status (7)

Country Link
US (1) US5550701A (it)
JP (1) JP2988859B2 (it)
DE (1) DE19530664C2 (it)
FR (1) FR2725306A1 (it)
GB (1) GB2292834B (it)
IT (1) IT1282940B1 (it)
SG (1) SG34262A1 (it)

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CN1077227C (zh) * 1995-02-03 2002-01-02 罗伯特-博希股份公司 内燃机的起动装置
US5563759A (en) * 1995-04-11 1996-10-08 International Rectifier Corporation Protected three-pin mosgated power switch with separate input reset signal level
US5798538A (en) * 1995-11-17 1998-08-25 International Rectifier Corporation IGBT with integrated control
US5761020A (en) * 1996-01-29 1998-06-02 International Rectifier Corporation Fast switching smartfet
DE19745040C2 (de) * 1997-02-10 2003-03-27 Daimler Chrysler Ag Anordnung und Verfahren zum Messen einer Temperatur
US6066971A (en) * 1997-10-02 2000-05-23 Motorola, Inc. Integrated circuit having buffering circuitry with slew rate control
JP3758366B2 (ja) * 1998-05-20 2006-03-22 富士通株式会社 半導体装置
EP0977264B1 (en) * 1998-07-31 2006-04-26 Freescale Semiconductor, Inc. Semiconductor structure for driver circuits with level shifting
US6115151A (en) * 1998-12-30 2000-09-05 Digilens, Inc. Method for producing a multi-layer holographic device
DE69902877D1 (de) 1999-04-30 2002-10-17 St Microelectronics Srl Integrierter Schaltkreis mit einer Leistungsschaltung und einer Steuerschaltung, ohne parasitäre Ströme
JP3660566B2 (ja) * 2000-06-30 2005-06-15 新電元工業株式会社 過電流制限型半導体素子
GB2368210A (en) * 2000-10-21 2002-04-24 Trw Ltd Controllable current decay rate for hydraulic brake system solenoids
DE10103336C1 (de) * 2001-01-25 2002-12-05 Dialog Semiconductor Gmbh Lade-/Entlade-Schutzschaltung für eine wiederaufladbare Batterie
DE10123818B4 (de) * 2001-03-02 2006-09-07 Infineon Technologies Ag Anordnung mit Schutzfunktion für ein Halbleiterbauelement
DE10137875C1 (de) * 2001-08-02 2003-04-30 Dialog Semiconductor Gmbh Lade/Entlade-Schutzschaltung
JP2003100899A (ja) * 2001-09-27 2003-04-04 Mitsubishi Electric Corp 半導体装置およびその製造方法
US6410963B1 (en) * 2001-10-16 2002-06-25 Macronix International Co., Ltd. Electrostatic discharge protection circuits with latch-up prevention function
DE10241156A1 (de) * 2002-09-05 2004-03-18 Infineon Technologies Ag Verfahren zum Herstellen einer integrierten pin-Diode und zugehörige Schaltungsanordnung
DE10243956A1 (de) * 2002-09-20 2004-04-15 Carl Freudenberg Kg Schaltungsanordnung für ein pulsweitenmoduliert ansteuerbares elektromagnetisches Regenerierventil zur Tankentlüftung eines Kraftfahrzeugs
US8570699B2 (en) 2005-04-22 2013-10-29 Lear Corporation Relayless and fuseless junction box
US7468874B1 (en) 2005-11-08 2008-12-23 Yazaki North America, Inc. Protection circuit for digital power module
US20080062088A1 (en) * 2006-09-13 2008-03-13 Tpo Displays Corp. Pixel driving circuit and OLED display apparatus and electrionic device using the same
US7656634B2 (en) 2006-11-30 2010-02-02 Hamilton Sundstrand Corporation Increasing the system stability and lightning capability in a power distribution system that utilizes solid-state power controllers
US7511357B2 (en) * 2007-04-20 2009-03-31 Force-Mos Technology Corporation Trenched MOSFETs with improved gate-drain (GD) clamp diodes
US8063516B2 (en) * 2009-01-15 2011-11-22 Microsemi Corporation Four quadrant MOSFET based switch
US8800697B2 (en) 2009-09-01 2014-08-12 Ryno Motors, Inc. Electric-powered self-balancing unicycle with steering linkage between handlebars and wheel forks
US7940505B1 (en) 2009-12-01 2011-05-10 Texas Instruments Incorporated Low power load switch with protection circuitry
WO2014031904A2 (en) 2012-08-22 2014-02-27 Ryno Motors, Inc. Electric-powered self-balancing unicycle
US9413348B2 (en) 2014-07-29 2016-08-09 Semiconductor Components Industries, Llc Electronic circuit including a switch having an associated breakdown voltage and a method of using the same
JP6498787B2 (ja) 2015-12-28 2019-04-10 ローム株式会社 半導体装置
KR102676492B1 (ko) * 2016-11-30 2024-06-18 엘지디스플레이 주식회사 박막 트랜지스터 및 이를 이용한 표시패널
CN109301794A (zh) * 2018-11-08 2019-02-01 深圳市创鹏翔科技有限公司 一种可自动恢复的超高速短路保护电路
JP7324016B2 (ja) * 2019-03-07 2023-08-09 ローム株式会社 半導体装置
CN114551601B (zh) * 2022-04-26 2022-07-15 成都蓉矽半导体有限公司 高抗浪涌电流能力的集成栅控二极管的碳化硅mosfet

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5008725C2 (en) * 1979-05-14 2001-05-01 Internat Rectifer Corp Plural polygon source pattern for mosfet
JPH01147854A (ja) * 1987-12-04 1989-06-09 Nissan Motor Co Ltd 半導体装置
DE58900553D1 (de) * 1988-05-11 1992-01-23 Siemens Ag Schaltungsanordnung zum erfassen der uebertemperatur eines halbleiterbauelements.
US5077521A (en) * 1989-12-26 1991-12-31 Ncr Corporation Supply connection integrity monitor
EP0565807A1 (en) * 1992-04-17 1993-10-20 STMicroelectronics S.r.l. MOS power transistor device
DE69420327T2 (de) * 1993-06-22 2000-03-30 Koninkl Philips Electronics Nv Halbleiter-Leistungsschaltung
US5497285A (en) * 1993-09-14 1996-03-05 International Rectifier Corporation Power MOSFET with overcurrent and over-temperature protection
DE4429903B4 (de) * 1993-09-14 2004-02-05 International Rectifier Corp., El Segundo Leistungshalbleiteranordnung mit Überlastschutzschaltung

Also Published As

Publication number Publication date
SG34262A1 (en) 1996-12-06
GB2292834B (en) 1998-09-09
ITMI951818A0 (it) 1995-08-29
DE19530664A1 (de) 1996-03-07
GB2292834A (en) 1996-03-06
JP2988859B2 (ja) 1999-12-13
ITMI951818A1 (it) 1997-03-01
US5550701A (en) 1996-08-27
FR2725306A1 (fr) 1996-04-05
GB9517148D0 (en) 1995-10-25
DE19530664C2 (de) 1998-10-15
JPH08102539A (ja) 1996-04-16

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