IT1236868B - Apparato e metodo di prove non distruttive per determinare irregolari-ta' di una parte mediante misura di correnti parassite - Google Patents

Apparato e metodo di prove non distruttive per determinare irregolari-ta' di una parte mediante misura di correnti parassite

Info

Publication number
IT1236868B
IT1236868B IT8721097A IT2109787A IT1236868B IT 1236868 B IT1236868 B IT 1236868B IT 8721097 A IT8721097 A IT 8721097A IT 2109787 A IT2109787 A IT 2109787A IT 1236868 B IT1236868 B IT 1236868B
Authority
IT
Italy
Prior art keywords
measurement
destructive tests
edge currents
determining irregular
irregular
Prior art date
Application number
IT8721097A
Other languages
English (en)
Other versions
IT8721097A0 (it
Inventor
Engmin James Chern
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of IT8721097A0 publication Critical patent/IT8721097A0/it
Application granted granted Critical
Publication of IT1236868B publication Critical patent/IT1236868B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
IT8721097A 1986-07-23 1987-06-29 Apparato e metodo di prove non distruttive per determinare irregolari-ta' di una parte mediante misura di correnti parassite IT1236868B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/887,303 US4755753A (en) 1986-07-23 1986-07-23 Eddy current surface mapping system for flaw detection

Publications (2)

Publication Number Publication Date
IT8721097A0 IT8721097A0 (it) 1987-06-29
IT1236868B true IT1236868B (it) 1993-04-26

Family

ID=25390866

Family Applications (1)

Application Number Title Priority Date Filing Date
IT8721097A IT1236868B (it) 1986-07-23 1987-06-29 Apparato e metodo di prove non distruttive per determinare irregolari-ta' di una parte mediante misura di correnti parassite

Country Status (6)

Country Link
US (1) US4755753A (it)
JP (1) JPS6381262A (it)
DE (1) DE3723609A1 (it)
FR (1) FR2602053B1 (it)
GB (1) GB2192993B (it)
IT (1) IT1236868B (it)

Families Citing this family (83)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5030911A (en) * 1980-10-19 1991-07-09 Baker Hughes Incorporated Method and apparatus for displaying defects in tubular members on a two-dimensional map in a variety of display modes
SE456611B (sv) * 1986-04-18 1988-10-17 Tornbloms Kvalitetskontroll Ab Anordning for signallagring och/eller signalbehandling av fran en givare erhallna signaler
JPH0282144A (ja) * 1988-09-19 1990-03-22 Omron Tateisi Electron Co 地合検査方法およびその装置
GB2224575B (en) * 1988-11-04 1993-07-14 Technical Software Consultants Electromagnetic microscope
US5028100A (en) * 1989-06-15 1991-07-02 Trustees Of The Thomas A. D. Gross 1988 Revocable Trust Methods for nondestructive eddy-current testing of structural members with automatic characterization of faults
GB2233763B (en) * 1989-07-07 1994-06-15 Univ Essex Non-destructive testing of metals
DE69015959T3 (de) * 1989-10-19 2000-05-31 Tuboscope Vetco Int Methode und Gerät zur Fehlerdarstellung in Rohren.
US5030912A (en) * 1989-12-21 1991-07-09 North American Philips Corp. Apparatus and method for mapping inhomogeneities on the surface of bulk and thin film superconductors
US5053705A (en) * 1989-12-27 1991-10-01 North American Philips Corp. Read/write coaxial magnetic head for use with apparatus for measuring the surface of superconductors
US5047719A (en) * 1990-05-25 1991-09-10 The Failure Group, Inc. Flexible coil assembly for reflectance-mode nondestructive eddy-current examination
CA2043347A1 (en) * 1990-05-30 1991-12-01 Yukio Kohmura Method and system for inspection of electroconductive film using eddy current and process and system for production of optical fibres using method and system
EP0536333A1 (en) * 1990-06-29 1993-04-14 Abb Amdata Inc. Eddy current imaging system
FR2666655B1 (fr) * 1990-09-06 1994-01-28 Aerospatiale Ste Nationale Indle Dispositif pour l'examen non destructif d'une pluralite de troncons de jonctions.
US5493517A (en) * 1991-06-03 1996-02-20 Hughes Missile Systems Company Cargo container mapping system
EP0518635B1 (en) * 1991-06-11 2003-05-21 Newt Holdings Limited Probe
US5334934A (en) * 1991-07-15 1994-08-02 General Electric Company Eddy current probe apparatus and interlaced scanning method for interior inspection of metal devices
JPH0820419B2 (ja) * 1991-09-05 1996-03-04 日精樹脂工業株式会社 金属分布測定方法及び測定装置
US5345514A (en) * 1991-09-16 1994-09-06 General Electric Company Method for inspecting components having complex geometric shapes
JPH05288719A (ja) * 1992-04-06 1993-11-02 Ishikawajima Harima Heavy Ind Co Ltd 渦流探傷装置
FR2696550B1 (fr) * 1992-10-07 1994-10-28 Commissariat Energie Atomique Procédé de traitement de signaux recueillis par un capteur ponctuel absolu à courants de Foucault.
US5648720A (en) * 1993-03-25 1997-07-15 International Business Machines Corporation Apparatus and method for producing a magnetic image of a conductive pattern using eddy currents
DE4320649A1 (de) * 1993-06-22 1995-01-05 Foerster Inst Dr Friedrich Vorrichtung zum Erfassen oberflächennaher Unregelmäßigkeiten von Werkstücken
US5698977A (en) * 1993-10-12 1997-12-16 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Eddy current method for fatigue testing
US5541510A (en) * 1995-04-06 1996-07-30 Kaman Instrumentation Corporation Multi-Parameter eddy current measuring system with parameter compensation technical field
US5698978A (en) * 1995-05-15 1997-12-16 Northrop Grumman Corporation System and method for measuring electromagnetic radiation absorption
US5666051A (en) * 1995-10-04 1997-09-09 Thermo King Corporation System and method for mapping residual surface stresses in a value ring
JP3459506B2 (ja) * 1995-11-17 2003-10-20 清水建設株式会社 鋼材の塑性化判別方法
JP2911828B2 (ja) * 1996-07-30 1999-06-23 カーマン・インスツルメンテーション・コーポレーション パラメータ補償付き複数パラメータうず電流計測システム
US6285183B1 (en) 1996-09-30 2001-09-04 Mcdonnell Douglas Corporation Method and system for measuring the volume loss of a metal substrate
US5895439A (en) * 1996-10-15 1999-04-20 Southwest Research Institute Method for generating and displaying complex data derived from non-destructive evaluation scanning
JPH11183115A (ja) * 1997-12-25 1999-07-09 Systemseiko Co Ltd 平坦度測定装置
US7069101B1 (en) 1999-07-29 2006-06-27 Applied Materials, Inc. Computer integrated manufacturing techniques
JP3758439B2 (ja) * 1999-12-20 2006-03-22 日本精工株式会社 曲面を有する被検査体の欠陥を曲面に沿って非接触で検出する方法
JP2001260021A (ja) * 2000-03-16 2001-09-25 Toshiba Mach Co Ltd ロール研削盤の数値制御装置
US7188142B2 (en) 2000-11-30 2007-03-06 Applied Materials, Inc. Dynamic subject information generation in message services of distributed object systems in a semiconductor assembly line facility
US6625515B2 (en) * 2000-12-21 2003-09-23 Dofasco Inc. Roll defect management process
US6933718B2 (en) * 2001-06-12 2005-08-23 The Boeing Company Quantification method and system for corrosion and damage assessment
US7698012B2 (en) 2001-06-19 2010-04-13 Applied Materials, Inc. Dynamic metrology schemes and sampling schemes for advanced process control in semiconductor processing
US6910947B2 (en) 2001-06-19 2005-06-28 Applied Materials, Inc. Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life
US20020192966A1 (en) * 2001-06-19 2002-12-19 Shanmugasundram Arulkumar P. In situ sensor based control of semiconductor processing procedure
US7047099B2 (en) * 2001-06-19 2006-05-16 Applied Materials Inc. Integrating tool, module, and fab level control
US7160739B2 (en) 2001-06-19 2007-01-09 Applied Materials, Inc. Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
US6913938B2 (en) 2001-06-19 2005-07-05 Applied Materials, Inc. Feedback control of plasma-enhanced chemical vapor deposition processes
US7082345B2 (en) 2001-06-19 2006-07-25 Applied Materials, Inc. Method, system and medium for process control for the matching of tools, chambers and/or other semiconductor-related entities
US7101799B2 (en) 2001-06-19 2006-09-05 Applied Materials, Inc. Feedforward and feedback control for conditioning of chemical mechanical polishing pad
US7201936B2 (en) 2001-06-19 2007-04-10 Applied Materials, Inc. Method of feedback control of sub-atmospheric chemical vapor deposition processes
US7337019B2 (en) 2001-07-16 2008-02-26 Applied Materials, Inc. Integration of fault detection with run-to-run control
US6984198B2 (en) * 2001-08-14 2006-01-10 Applied Materials, Inc. Experiment management system, method and medium
WO2003023424A1 (fr) * 2001-09-07 2003-03-20 Chikayoshi Sumi Appareil pour evaluer un vecteur densite de courant et appareil pour evaluer une conductivite electrique
AU2002329471A1 (en) * 2001-10-17 2003-04-28 Aea Technology Plc Method and apparatus for measuring material properties and lift-off components of an object using a magnetic probe
JP2003149208A (ja) * 2001-11-09 2003-05-21 Japan Science & Technology Corp 非破壊検査装置
JP2003315173A (ja) * 2002-04-24 2003-11-06 Sanyo Special Steel Co Ltd 渦電流を利用した渦流探傷機による加工品の残留応力の検出方法
US7225047B2 (en) 2002-03-19 2007-05-29 Applied Materials, Inc. Method, system and medium for controlling semiconductor wafer processes using critical dimension measurements
US6999836B2 (en) 2002-08-01 2006-02-14 Applied Materials, Inc. Method, system, and medium for handling misrepresentative metrology data within an advanced process control system
CN1720490B (zh) 2002-11-15 2010-12-08 应用材料有限公司 用于控制具有多变量输入参数的制造工艺的方法和系统
US7333871B2 (en) 2003-01-21 2008-02-19 Applied Materials, Inc. Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools
US7205228B2 (en) 2003-06-03 2007-04-17 Applied Materials, Inc. Selective metal encapsulation schemes
US7272254B2 (en) * 2003-07-09 2007-09-18 General Electric Company System and method for analyzing and identifying flaws in a manufactured part
US7354332B2 (en) 2003-08-04 2008-04-08 Applied Materials, Inc. Technique for process-qualifying a semiconductor manufacturing tool using metrology data
JP2005189215A (ja) * 2003-12-26 2005-07-14 Fanuc Ltd 波形表示装置
US7356377B2 (en) 2004-01-29 2008-04-08 Applied Materials, Inc. System, method, and medium for monitoring performance of an advanced process control system
US20050226489A1 (en) 2004-03-04 2005-10-13 Glenn Beach Machine vision system for identifying and sorting projectiles and other objects
US9424634B2 (en) 2004-03-04 2016-08-23 Cybernet Systems Corporation Machine vision system for identifying and sorting projectiles and other objects
US7096085B2 (en) 2004-05-28 2006-08-22 Applied Materials Process control by distinguishing a white noise component of a process variance
US6961626B1 (en) 2004-05-28 2005-11-01 Applied Materials, Inc Dynamic offset and feedback threshold
WO2006007832A1 (de) * 2004-07-19 2006-01-26 Prüftechnik Dieter Busch AG Vorrichtung und verfahren zur erkennung von defekten an gegenständen oder zur ortung von metallischen objekten
US20060202688A1 (en) * 2004-12-01 2006-09-14 Woods Kirby D Detection system and method thereof
US7403872B1 (en) * 2007-04-13 2008-07-22 Gii Acquisition, Llc Method and system for inspecting manufactured parts and sorting the inspected parts
JP2009216559A (ja) * 2008-03-11 2009-09-24 Hitachi-Ge Nuclear Energy Ltd 渦電流検査装置
FI20085451L (fi) * 2008-05-14 2009-11-15 Metso Paper Inc Menetelmä ja laitejärjestely metallihihnan laadun tarkistamiseksi
US9177371B2 (en) * 2008-06-09 2015-11-03 Siemens Energy, Inc. Non-destructive examination data visualization and analysis
US8166821B2 (en) * 2008-07-14 2012-05-01 Eaton Corporation Non-destructive test evaluation of welded claddings on rods of hydraulic cylinders used for saltwater, brackish and freshwater applications
US9194687B1 (en) * 2010-02-04 2015-11-24 Textron Innovations Inc. System and method for measuring non-conductive coating thickness using eddy currents
JP5138713B2 (ja) * 2010-02-22 2013-02-06 日立Ｇｅニュークリア・エナジー株式会社 渦電流検査装置及び渦電流検査方法
DE102011111818A1 (de) * 2011-08-27 2013-02-28 Mtu Aero Engines Gmbh Verfahren und Vorrichtung zur generativen Herstellung eines Bauteils
CZ2014742A3 (cs) 2014-11-03 2016-04-20 Vysoké Učení Technické V Brně Způsob pro vyhodnocení rozložení, hustoty a orientace feromagnetických elektricky vodivých vláken v kompozitním materiálu a detekční zařízení k jeho provádění
JP6783601B2 (ja) * 2016-09-21 2020-11-11 川辺食品 株式会社 異物検出装置
RU182826U1 (ru) * 2017-08-21 2018-09-04 Дмитрий Сергеевич Крюков Устройство для поверки вихретокового измерительного преобразователя
RU185751U1 (ru) * 2018-04-09 2018-12-17 Российская Федерация, от имени которой выступает Государственная корпорация по атомной энергии "Росатом" (Госкорпорация "Росатом") Устройство неразрушающего контроля объектов
US11668773B2 (en) 2019-03-22 2023-06-06 Raytheon Technologies Corporation Automated inspection for internal corrosion
EP3961187A1 (en) * 2020-08-27 2022-03-02 Raytheon Technologies Corporation Automated inspection for internal corrosion
CN112051326A (zh) * 2020-09-29 2020-12-08 西安热工研究院有限公司 一种基于不规则面积计算的裂纹识别方法
CN113960158A (zh) * 2021-10-20 2022-01-21 西安交通大学 一种基于tmr传感器的高精度磁成像系统及方法

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3302105A (en) * 1964-08-26 1967-01-31 Hugo L Libby Eddy current nondestructive testing device using an oscilloscope to identify and locate irregularities in a test piece
US3475681A (en) * 1965-08-02 1969-10-28 Magnaflux Corp Apparatus display system for providing plural indications and threshold indications
US3737764A (en) * 1971-09-27 1973-06-05 Commissariat Energie Atomique Eddy-current test apparatus for detection of flaws in a metal seal placed within an electrically conductive tube
US3826132A (en) * 1973-06-01 1974-07-30 Bethlehem Steel Corp Device for producing a visual display of the transverse tension profile of a moving steel strip
DE2431173A1 (de) * 1974-06-28 1976-01-15 Graenges Staal Oxeloesund Verfahren und vorrichtung zum produzieren von metallischen rohlingen, insbesondere stahlbrammen, die zumindest in einem vorbestimmten oberflaechenbereich im wesentlichen keine fehler aufweisen
JPS52155593A (en) * 1976-06-18 1977-12-24 Sumitomo Metal Ind Automatic gain controlling device used in setting sensitivity of nonndestructive inspecting instrument
US4194149A (en) * 1977-12-15 1980-03-18 The Babcock & Wilcox Company Method for generating the eddy current signature of a flaw in a tube proximate a contiguous member which obscures the flaw signal
DE2909649A1 (de) * 1978-03-13 1979-09-27 Atomic Energy Authority Uk Wirbelstrom-pruefeinrichtung
US4268791A (en) * 1978-12-08 1981-05-19 The United States Of America As Represented By The Secretary Of The Air Force Dual trace automatic eddy current detection system for multilayer structures
FR2451032A1 (fr) * 1979-03-09 1980-10-03 Commissariat Energie Atomique Appareil numerique pour le controle de pieces par courants de foucault
US4481471A (en) * 1981-08-14 1984-11-06 Westinghouse Electric Corp. Method and apparatus for the detection of anomalies in rotating members
US4495587A (en) * 1981-12-08 1985-01-22 Bethlehem Steel Corporation Automatic nondestructive roll defect inspection system
US4476434A (en) * 1982-01-25 1984-10-09 The United States Of America As Represented By The United States Department Of Energy Non-destructive testing method and apparatus utilizing phase multiplication holography
US4596953A (en) * 1982-04-14 1986-06-24 Daidotokushuko Kabushikikaisha Apparatus for scanning a material for detection of flaws and having material axis deviation detection
US4641092A (en) * 1982-07-08 1987-02-03 Sumitomo Metal Industries, Ltd. Rotary probe apparatus for detecting flaws in a test object
JPS6193949A (ja) * 1984-10-15 1986-05-12 Hitachi Ltd 渦電流検査装置

Also Published As

Publication number Publication date
FR2602053A1 (fr) 1988-01-29
GB2192993A (en) 1988-01-27
US4755753A (en) 1988-07-05
GB8715369D0 (en) 1987-08-05
JPS6381262A (ja) 1988-04-12
FR2602053B1 (fr) 1994-04-29
GB2192993B (en) 1990-06-27
DE3723609A1 (de) 1988-01-28
IT8721097A0 (it) 1987-06-29

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