IT1185020B - Elemento di condatto per adattatori di collaudo - Google Patents
Elemento di condatto per adattatori di collaudoInfo
- Publication number
- IT1185020B IT1185020B IT21120/85A IT2112085A IT1185020B IT 1185020 B IT1185020 B IT 1185020B IT 21120/85 A IT21120/85 A IT 21120/85A IT 2112085 A IT2112085 A IT 2112085A IT 1185020 B IT1185020 B IT 1185020B
- Authority
- IT
- Italy
- Prior art keywords
- test adapters
- conduct element
- conduct
- adapters
- test
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R11/00—Individual connecting elements providing two or more spaced connecting locations for conductive members which are, or may be, thereby interconnected, e.g. end pieces for wires or cables supported by the wire or cable and having means for facilitating electrical connection to some other wire, terminal, or conductive member, blocks of binding posts
- H01R11/11—End pieces or tapping pieces for wires, supported by the wire and for facilitating electrical connection to some other wire, terminal or conductive member
- H01R11/18—End pieces terminating in a probe
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19843421799 DE3421799A1 (de) | 1984-06-12 | 1984-06-12 | Kontaktelement fuer pruefadapter |
Publications (2)
Publication Number | Publication Date |
---|---|
IT8521120A0 IT8521120A0 (it) | 1985-06-12 |
IT1185020B true IT1185020B (it) | 1987-10-28 |
Family
ID=6238180
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT21120/85A IT1185020B (it) | 1984-06-12 | 1985-06-12 | Elemento di condatto per adattatori di collaudo |
Country Status (6)
Country | Link |
---|---|
US (1) | US4686465A (it) |
CH (1) | CH670175A5 (it) |
DE (1) | DE3421799A1 (it) |
FR (1) | FR2565697B1 (it) |
IT (1) | IT1185020B (it) |
NL (1) | NL8501689A (it) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4838801A (en) * | 1987-11-02 | 1989-06-13 | Augat Inc. | Leadless component socket |
US4881901A (en) * | 1988-09-20 | 1989-11-21 | Augat Inc. | High density backplane connector |
US5045780A (en) * | 1989-12-04 | 1991-09-03 | Everett/Charles Contact Products, Inc. | Electrical test probe contact tip |
US5159265A (en) * | 1991-09-19 | 1992-10-27 | Motorola, Inc. | Pivotable spring contact |
JPH0677467B2 (ja) * | 1992-12-25 | 1994-09-28 | 山一電機株式会社 | Icソケット |
US5417595A (en) * | 1993-04-22 | 1995-05-23 | Applied Robotics, Inc. | Method and apparatus for frequently connecting and disconnecting signal cables |
JP3659662B2 (ja) * | 1993-12-24 | 2005-06-15 | 株式会社デンソー | プローブコンタクト |
JPH09289371A (ja) * | 1996-04-22 | 1997-11-04 | Sony Corp | 手動式電子部品装着装置及び方法 |
US6335627B1 (en) * | 1998-04-13 | 2002-01-01 | Intel Corporation | Apparatus and method for testing an electronics package substrate |
US7389905B2 (en) * | 1999-02-25 | 2008-06-24 | Reiber Steven F | Flip chip bonding tool tip |
US20080197172A1 (en) * | 1999-02-25 | 2008-08-21 | Reiber Steven F | Bonding Tool |
US7124927B2 (en) * | 1999-02-25 | 2006-10-24 | Reiber Steven F | Flip chip bonding tool and ball placement capillary |
US20070131661A1 (en) * | 1999-02-25 | 2007-06-14 | Reiber Steven F | Solder ball placement system |
US20060261132A1 (en) * | 1999-02-25 | 2006-11-23 | Reiber Steven F | Low range bonding tool |
JP3520468B2 (ja) * | 2000-06-21 | 2004-04-19 | 日本航空電子工業株式会社 | コネクタ |
US6538424B1 (en) * | 2000-07-31 | 2003-03-25 | Le Croy Corporation | Notched electrical test probe tip |
US6331836B1 (en) * | 2000-08-24 | 2001-12-18 | Fast Location.Net, Llc | Method and apparatus for rapidly estimating the doppler-error and other receiver frequency errors of global positioning system satellite signals weakened by obstructions in the signal path |
US6541988B2 (en) * | 2001-06-12 | 2003-04-01 | Lucent Technologies Inc. | Circuit board test fixture with electrostatic discharge (ESD) protection |
US6992496B2 (en) * | 2002-03-05 | 2006-01-31 | Rika Electronics International, Inc. | Apparatus for interfacing electronic packages and test equipment |
US6905350B1 (en) * | 2002-04-05 | 2005-06-14 | Maxtor Corporation | Two-step electrical connector and method using high resistance path for electrostatic discharge |
US20030234660A1 (en) * | 2002-06-24 | 2003-12-25 | Jain Sunil K. | Direct landing technology for wafer probe |
JP3768183B2 (ja) * | 2002-10-28 | 2006-04-19 | 山一電機株式会社 | 狭ピッチicパッケージ用icソケット |
US7100273B2 (en) * | 2003-03-03 | 2006-09-05 | Hewlett-Packard Development Company, L.P. | Interconnect validation instruments |
US6861862B1 (en) | 2003-03-17 | 2005-03-01 | John O. Tate | Test socket |
US20070085085A1 (en) * | 2005-08-08 | 2007-04-19 | Reiber Steven F | Dissipative pick and place tools for light wire and LED displays |
US7479794B2 (en) * | 2007-02-28 | 2009-01-20 | Sv Probe Pte Ltd | Spring loaded probe pin assembly |
KR101174007B1 (ko) * | 2008-02-01 | 2012-08-16 | 니혼 하츠쵸 가부시키가이샤 | 프로브 유닛 |
US20100194419A1 (en) * | 2009-02-05 | 2010-08-05 | Chan Edward K | Multi-contact probe assembly |
US20110018562A1 (en) * | 2009-07-21 | 2011-01-27 | Filippo Galluppi | High voltage capacitance probe |
US8905795B2 (en) * | 2011-10-12 | 2014-12-09 | Apple Inc. | Spring-loaded contacts |
DE102012101556A1 (de) * | 2012-02-27 | 2013-08-29 | Göpel electronic GmbH | Kontaktierungsanordnung zur elektrischen Kontaktierung von Testpunkten |
US20130330983A1 (en) | 2012-06-10 | 2013-12-12 | Apple Inc. | Spring-loaded contacts having sloped backside with retention guide |
US9124013B2 (en) * | 2012-10-16 | 2015-09-01 | Covidien Lp | Electrical contact pins for electrically coupling electronic devices, batteries, and/or battery chargers |
US9274166B2 (en) | 2013-08-26 | 2016-03-01 | Fujitsu Limited | Pin verification device and method |
US10450649B2 (en) * | 2014-01-29 | 2019-10-22 | Gtat Corporation | Reactor filament assembly with enhanced misalignment tolerance |
JP2018084438A (ja) * | 2016-11-21 | 2018-05-31 | 株式会社エンプラス | 電気接触子及び電気部品用ソケット |
DE102019220311A1 (de) * | 2019-12-19 | 2021-06-24 | Feinmetall Gesellschaft mit beschränkter Haftung | Kontakteinrichtung |
CN111965522A (zh) * | 2020-08-12 | 2020-11-20 | 东莞中探探针有限公司 | Pcb测试模组 |
US11437747B2 (en) | 2020-09-25 | 2022-09-06 | Apple Inc. | Spring-loaded contacts having capsule intermediate object |
US11942722B2 (en) | 2020-09-25 | 2024-03-26 | Apple Inc. | Magnetic circuit for magnetic connector |
DE102020128939A1 (de) | 2020-11-03 | 2022-05-05 | TenneT TSO GmbH | Hochspannungskontakt für eine für geometrische Imperfektionen tolerante Hochspannungsverbindung |
CN114019354A (zh) * | 2021-11-02 | 2022-02-08 | 环鸿电子(昆山)有限公司 | 电路板测试装置及电路板测试方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE8335245U1 (de) * | 1984-06-28 | Luther, Erich, Ing.(Grad.) | Adapter für ein Leiterplattenprüfgerät | |
GB975395A (en) * | 1959-10-13 | 1964-11-18 | Secr Aviation | Improvements in or relating to electrical connectors |
US3537000A (en) * | 1967-09-20 | 1970-10-27 | Vimm Research Dev Corp | Electrical probe including pivotable contact elements |
DE1903088A1 (de) * | 1969-01-22 | 1971-01-21 | Siemens Ag | Kontaktvorrichtung |
CH589947A5 (en) * | 1974-02-13 | 1977-07-29 | Ingun Ag | Test pin for printed circuit boards - with spring loaded shank in barrel and test end with conical hollow for boards test point |
ZA765772B (en) * | 1975-10-03 | 1977-08-31 | Anderson Power Products | Electrical connectors with tulip-butt contacts |
DE3312436A1 (de) * | 1982-10-29 | 1984-05-03 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung |
DE3249770C2 (en) * | 1982-11-05 | 1987-11-12 | Martin Maelzer | Device for testing electrical circuit boards |
US4535536A (en) * | 1983-11-03 | 1985-08-20 | Augat Inc. | Method of assembling adaptor for automatic testing equipment |
US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
US4560223A (en) * | 1984-06-29 | 1985-12-24 | Pylon Company, Inc. | Self-cleaning tri-cusp signal contact |
-
1984
- 1984-06-12 DE DE19843421799 patent/DE3421799A1/de active Granted
-
1985
- 1985-05-31 FR FR858508243A patent/FR2565697B1/fr not_active Expired
- 1985-06-04 CH CH2369/85A patent/CH670175A5/de not_active IP Right Cessation
- 1985-06-11 US US06/743,671 patent/US4686465A/en not_active Expired - Fee Related
- 1985-06-12 IT IT21120/85A patent/IT1185020B/it active
- 1985-06-12 NL NL8501689A patent/NL8501689A/nl not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
IT8521120A0 (it) | 1985-06-12 |
US4686465A (en) | 1987-08-11 |
DE3421799C2 (it) | 1988-04-28 |
CH670175A5 (it) | 1989-05-12 |
FR2565697B1 (fr) | 1989-02-03 |
DE3421799A1 (de) | 1985-12-12 |
NL8501689A (nl) | 1986-01-02 |
FR2565697A1 (fr) | 1985-12-13 |
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