IT1161844B - Apparato per il collaudo ci circuiti integrati - Google Patents

Apparato per il collaudo ci circuiti integrati

Info

Publication number
IT1161844B
IT1161844B IT21168/83A IT2116883A IT1161844B IT 1161844 B IT1161844 B IT 1161844B IT 21168/83 A IT21168/83 A IT 21168/83A IT 2116883 A IT2116883 A IT 2116883A IT 1161844 B IT1161844 B IT 1161844B
Authority
IT
Italy
Prior art keywords
testing
integrated circuit
circuit apparatus
integrated
circuit
Prior art date
Application number
IT21168/83A
Other languages
English (en)
Other versions
IT8321168A0 (it
Inventor
Dennis M Petrich
Christopher G Amick
Stanley L Gruenenwald
Original Assignee
Micro Component Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micro Component Technology Inc filed Critical Micro Component Technology Inc
Publication of IT8321168A0 publication Critical patent/IT8321168A0/it
Application granted granted Critical
Publication of IT1161844B publication Critical patent/IT1161844B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
IT21168/83A 1982-05-24 1983-05-18 Apparato per il collaudo ci circuiti integrati IT1161844B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/381,736 US4517512A (en) 1982-05-24 1982-05-24 Integrated circuit test apparatus test head

Publications (2)

Publication Number Publication Date
IT8321168A0 IT8321168A0 (it) 1983-05-18
IT1161844B true IT1161844B (it) 1987-03-18

Family

ID=23506182

Family Applications (1)

Application Number Title Priority Date Filing Date
IT21168/83A IT1161844B (it) 1982-05-24 1983-05-18 Apparato per il collaudo ci circuiti integrati

Country Status (6)

Country Link
US (1) US4517512A (it)
EP (1) EP0108790B1 (it)
CA (1) CA1208373A (it)
DE (1) DE3368467D1 (it)
IT (1) IT1161844B (it)
WO (1) WO1983004315A1 (it)

Families Citing this family (120)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4646299A (en) * 1983-08-01 1987-02-24 Fairchild Semiconductor Corporation Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
US4637020A (en) * 1983-08-01 1987-01-13 Fairchild Semiconductor Corporation Method and apparatus for monitoring automated testing of electronic circuits
US4635259A (en) * 1983-08-01 1987-01-06 Fairchild Semiconductor Corporation Method and apparatus for monitoring response signals during automated testing of electronic circuits
US4605894A (en) * 1983-08-29 1986-08-12 Genrad Semiconductor Test, Inc. High density test head
JPS6071966A (ja) * 1983-09-28 1985-04-23 Advantest Corp デジタルスペクトルアナライザ
GB2150696B (en) * 1983-11-25 1988-09-01 Mars Inc Automatic test equipment
EP0175995B1 (de) * 1984-09-21 1990-01-03 Siemens Aktiengesellschaft Einrichtung für die Funktionsprüfung integrierter Schaltkreise
US4860194A (en) * 1985-06-04 1989-08-22 Plus Development Corporation A method for using a modular unitary disk file subsystem
US4639863A (en) * 1985-06-04 1987-01-27 Plus Development Corporation Modular unitary disk file subsystem
US4701701A (en) * 1985-07-19 1987-10-20 Hewlett-Packard Company Apparatus for measuring characteristics of circuit elements
CA1256498A (fr) * 1986-02-19 1989-06-27 Jean Auger Appareil universel de detection de defectuosites dans des systemes a microprocesseur
US5126953A (en) * 1986-06-27 1992-06-30 Berger James K Printed circuit board assembly tester
US4841456A (en) * 1986-09-09 1989-06-20 The Boeing Company Test system and method using artificial intelligence control
FR2604260B1 (fr) * 1986-09-19 1988-12-30 Draxy Sarl Testeur de circuits electroniques
US4758780A (en) * 1986-12-08 1988-07-19 Ncr Corporation Circuit board test apparatus and method
US4862070A (en) * 1987-10-30 1989-08-29 Teradyne, Inc. Apparatus for testing input pin leakage current of a device under test
US4922492A (en) * 1988-05-13 1990-05-01 National Semiconductor Corp. Architecture and device for testable mixed analog and digital VLSI circuits
US5206582A (en) * 1988-05-18 1993-04-27 Hewlett-Packard Company Control system for automated parametric test equipment
JPH0789144B2 (ja) * 1988-06-01 1995-09-27 株式会社東芝 集積回路の検査方法
US4862075A (en) * 1988-09-01 1989-08-29 Photon Dynamics, Inc. High frequency test head using electro-optics
US4875006A (en) * 1988-09-01 1989-10-17 Photon Dynamics, Inc. Ultra-high-speed digital test system using electro-optic signal sampling
US5236259A (en) * 1988-12-29 1993-08-17 Compaq Computer Corporation Tower system unit with angled drive bay
US5208722A (en) * 1988-12-29 1993-05-04 Compaq Computer Corporation Tower system unit with angled drive bay
US5032789A (en) * 1989-06-19 1991-07-16 Hewlett-Packard Company Modular/concurrent board tester
US5056033A (en) * 1990-07-24 1991-10-08 Hewlett-Packard Company Microprocessor emulator active probe power supply
US5030869A (en) * 1990-07-25 1991-07-09 Intest Corporation Device testing system with cable pivot
US5200696A (en) * 1990-09-10 1993-04-06 Ltx Corporation Test system apparatus with Schottky diodes with programmable voltages
US5101150A (en) * 1991-02-22 1992-03-31 Genrad, Inc. Automatic circuit tester with separate instrument and scanner buses
US5132612A (en) * 1991-03-14 1992-07-21 The United States Of America As Represented By The Secretary Of The Air Force Apparatus for electrostatic discharge (ESD) stress/testing
US5506850A (en) * 1991-04-08 1996-04-09 Osann, Jr.; Robert Logic analyzer for high channel count applications
US5323107A (en) * 1991-04-15 1994-06-21 Hitachi America, Ltd. Active probe card
US5471153A (en) * 1991-04-26 1995-11-28 Vlsi Technologies, Inc. Methods and circuits for testing open collectors and open drains
US5216361A (en) * 1991-07-10 1993-06-01 Schlumberger Technologies, Inc. Modular board test system having wireless receiver
US5414712A (en) * 1991-07-23 1995-05-09 Progressive Computing, Inc. Method for transmitting data using a communication interface box
US5307012A (en) * 1991-12-03 1994-04-26 Intel Corporation Test substation for testing semi-conductor packages
US5400343A (en) * 1992-02-28 1995-03-21 Intel Corporation Apparatus and method for defective column detection for semiconductor memories
JPH05256897A (ja) * 1992-03-11 1993-10-08 Nec Corp Ｉｃテストシステム
US5489852A (en) * 1992-11-06 1996-02-06 Advanced Micro Devices, Inc. System for interfacing wafer sort prober apparatus and packaged IC handler apparatus to a common test computer
US5311120A (en) * 1993-01-06 1994-05-10 Bartholomew Mark R Test fixture with test function feature
US5491611A (en) * 1993-09-10 1996-02-13 Compaq Computer Corporation Aligned quick connect cover for a computer system
US5653518A (en) * 1993-09-10 1997-08-05 Compaq Computer Corporation Quick release drive unit rail members
US6577148B1 (en) * 1994-08-31 2003-06-10 Motorola, Inc. Apparatus, method, and wafer used for testing integrated circuits formed on a product wafer
US5550466A (en) * 1994-09-30 1996-08-27 Hewlett-Packard Company Hinged conduit for routing cables in an electronic circuit tester
US5530367A (en) * 1995-01-06 1996-06-25 Fluke Corporaton Pulse based cable attenuation measurement system
US5719548A (en) 1995-01-09 1998-02-17 Brunswick Bowling & Billiards Corporation Bowling scoring console
US5608334A (en) * 1995-04-20 1997-03-04 Intest Corporation Device testing system with cable pivot and method of installation
US5546405A (en) * 1995-07-17 1996-08-13 Advanced Micro Devices, Inc. Debug apparatus for an automated semiconductor testing system
US5656942A (en) * 1995-07-21 1997-08-12 Electroglas, Inc. Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane
US5736850A (en) * 1995-09-11 1998-04-07 Teradyne, Inc. Configurable probe card for automatic test equipment
US5748642A (en) * 1995-09-25 1998-05-05 Credence Systems Corporation Parallel processing integrated circuit tester
US5834946A (en) * 1995-10-19 1998-11-10 Mosaid Technologies Incorporated Integrated circuit test head
WO1997027491A1 (fr) * 1996-01-22 1997-07-31 Advantest Corporation Tete d'essai pour dispositif d'essai de semi-conducteurs
FI102124B (fi) * 1996-03-07 1998-10-15 Nokia Telecommunications Oy Tilaajaliittymän kaukotestaus johdottoman tilaajaliittymän toteutettav assa radiojärjestelmässä
US6195772B1 (en) 1996-06-21 2001-02-27 Altera Corporaiton Electronic circuit testing methods and apparatus
JPH10227830A (ja) * 1996-07-31 1998-08-25 Ando Electric Co Ltd Ｉｃテスタ用テストボード
JPH1062489A (ja) * 1996-08-23 1998-03-06 Ando Electric Co Ltd Ｉｃテスタ用テスト・ヘッド
JPH10142298A (ja) * 1996-11-15 1998-05-29 Advantest Corp 集積回路デバイス試験装置
US6551844B1 (en) * 1997-01-15 2003-04-22 Formfactor, Inc. Test assembly including a test die for testing a semiconductor product die
US6589308B1 (en) * 1997-02-28 2003-07-08 Angelo Gianelo Cabinet for housing a computer workstation
US6040691A (en) * 1997-05-23 2000-03-21 Credence Systems Corporation Test head for integrated circuit tester arranging tester component circuit boards on three dimensions
US5986447A (en) * 1997-05-23 1999-11-16 Credence Systems Corporation Test head structure for integrated circuit tester
US6078187A (en) * 1997-05-23 2000-06-20 Credence Systems Corporation Hemispherical test head for integrated circuit tester employing radially distributed circuit cards
US6087841A (en) * 1997-10-01 2000-07-11 International Business Machines Corporation Contact test circuit
US6101458A (en) * 1997-10-30 2000-08-08 Lsi Logic Automatic ranging apparatus and method for precise integrated circuit current measurements
US6323694B1 (en) 1998-04-01 2001-11-27 Ltx Corporation Differential comparator with a programmable voltage offset for use in an automatic tester
US6167364A (en) * 1998-04-17 2000-12-26 Altera Corporation Methods and apparatus for automatically generating interconnect patterns in programmable logic devices
US6732053B1 (en) * 1998-09-30 2004-05-04 Intel Corporation Method and apparatus for controlling a test cell
US6275962B1 (en) * 1998-10-23 2001-08-14 Teradyne, Inc. Remote test module for automatic test equipment
US6499121B1 (en) 1999-03-01 2002-12-24 Formfactor, Inc. Distributed interface for parallel testing of multiple devices using a single tester channel
US6480978B1 (en) 1999-03-01 2002-11-12 Formfactor, Inc. Parallel testing of integrated circuit devices using cross-DUT and within-DUT comparisons
US6861246B2 (en) 1999-07-07 2005-03-01 Degussa Ag L-lysine-producing corynebacteria and process for the preparation of lysine
US6421793B1 (en) * 1999-07-22 2002-07-16 Siemens Information And Communication Mobile, Llc System and method for automated testing of electronic devices
DE19941478A1 (de) 1999-09-01 2001-03-08 Degussa Neue für das thrE-Gen codierende Nukleotidsequenzen und Verfahren zur fermentativen Herstellung von L-Threonin mit coryneformen Bakterien
US6713289B2 (en) 1999-10-05 2004-03-30 Degussa Ag Nucleotide sequences which code for the eno gene
DE10011922A1 (de) 1999-11-23 2001-05-31 Degussa Neue für das pfkA-Gen codierende Nukleotidsequenzen
DE19956131A1 (de) 1999-11-23 2001-05-31 Degussa Neue für das pfk-Gen codierende Nukleotidsequenzen
DE19956686A1 (de) 1999-11-25 2001-05-31 Degussa Neue für die Gene sucC und sucD codierende Nukleotidsequenzen
US6513231B1 (en) * 2000-04-12 2003-02-04 The Boeing Company System and method for assembly of large structures using modular traveling workstations
EP1156115A1 (en) 2000-05-12 2001-11-21 Degussa AG Corynebacterium glutamicum strain with enhanced secretion activity
US20020152046A1 (en) * 2001-04-13 2002-10-17 Velichko Sergey A. Concurrent control of semiconductor parametric testing
US7337088B2 (en) * 2001-05-23 2008-02-26 Micron Technology, Inc. Intelligent measurement modular semiconductor parametric test system
US7162386B2 (en) * 2002-04-25 2007-01-09 Micron Technology, Inc. Dynamically adaptable semiconductor parametric testing
US6590408B1 (en) * 2002-05-29 2003-07-08 Taiwan Semiconductor Manufacturing Co., Ltd. Microelectronic fabrication electrical test apparatus and method providing enhanced electrical test accuracy
US6999888B2 (en) * 2002-09-30 2006-02-14 Intel Corporation Automated circuit board test actuator system
US7154257B2 (en) * 2002-09-30 2006-12-26 Intel Corporation Universal automated circuit board tester
US6836136B2 (en) * 2002-12-18 2004-12-28 Teradyne, Inc. Pin driver for AC and DC semiconductor device testing
US7231573B2 (en) * 2002-12-20 2007-06-12 Verigy Pte. Ltd. Delay management system
US7287903B2 (en) * 2003-02-20 2007-10-30 Conductor Analysis Technologies, Inc. Method and apparatus for rapid thermal testing
US7010451B2 (en) * 2003-04-17 2006-03-07 Micron Technology, Inc. Dynamic creation and modification of wafer test maps during wafer testing
TWI235836B (en) * 2004-03-05 2005-07-11 Asustek Comp Inc Testing apparatus and testing method for testing whether electronic device connecting correctly with circuit board
TWI274166B (en) * 2004-06-18 2007-02-21 Unitest Inc Semiconductor test apparatus for simultaneously testing plurality of semiconductor devices
US7375542B2 (en) * 2004-06-30 2008-05-20 Teradyne, Inc. Automated test equipment with DIB mounted three dimensional tester electronics bricks
DE102004035052A1 (de) 2004-07-20 2006-02-16 Basf Ag Mikroorganismen zur Herstellung von schwefelhaltigen Verbindungen
US7489123B2 (en) * 2004-12-07 2009-02-10 Analog Devices, Inc. Calibration control for pin electronics of automatic testing equipment
US7237161B2 (en) * 2005-03-30 2007-06-26 Avago Technologies General Ip (Singapore) Pte. Ltd. Remote integrated circuit testing method and apparatus
EP2273279A1 (en) 2005-04-27 2011-01-12 Aehr Test Systems, Inc. Apparatus for testing electronic devices
US7262616B2 (en) * 2006-01-10 2007-08-28 Telco Testing Systems Llc Apparatus, method and system for testing electronic components
WO2007081324A1 (en) * 2006-01-10 2007-07-19 Telco Testing System Llc Apparatus, method and system for testing electronic components
US7378860B2 (en) * 2006-09-22 2008-05-27 Verigy (Singapore) Pte. Ltd. Wafer test head architecture and method of use
US7825650B2 (en) * 2006-12-15 2010-11-02 Verigy (Singapore) Ptd. Ltd. Automated loader for removing and inserting removable devices to improve load time for automated test equipment
US7821254B2 (en) * 2006-12-15 2010-10-26 Verigy (Singapore) Pte. Ltd. Method and apparatus for improving load time for automated test equipment
US8098073B2 (en) * 2007-09-27 2012-01-17 Lsi Corporation System for terminating high speed input/output buffers in an automatic test equipment environment to enable external loopback testing
JP4941253B2 (ja) * 2007-11-28 2012-05-30 横河電機株式会社 Ｉｃテスタ
US7800382B2 (en) 2007-12-19 2010-09-21 AEHR Test Ststems System for testing an integrated circuit of a device and its method of use
US7882406B2 (en) * 2008-05-09 2011-02-01 Lsi Corporation Built in test controller with a downloadable testing program
US8156391B2 (en) * 2008-05-27 2012-04-10 Lsi Corporation Data controlling in the MBIST chain architecture
US8046643B2 (en) * 2008-06-09 2011-10-25 Lsi Corporation Transport subsystem for an MBIST chain architecture
TWM343792U (en) * 2008-06-10 2008-11-01 Princeton Technology Corp Circuit testing apparatus
US7924035B2 (en) * 2008-07-15 2011-04-12 Formfactor, Inc. Probe card assembly for electronic device testing with DC test resource sharing
US9778068B2 (en) * 2008-08-14 2017-10-03 Simplure, Llc Systems and methods for conditioning and controlling power usage
US8542029B1 (en) * 2009-02-10 2013-09-24 Xilinx, Inc. Methods and apparatus for testing of integrated circuits
US8030957B2 (en) 2009-03-25 2011-10-04 Aehr Test Systems System for testing an integrated circuit of a device and its method of use
US8713333B1 (en) * 2011-03-24 2014-04-29 Western Digital Technologies, Inc. Apparatus and method to simulate a power trip to a disk drive
CN102338856A (zh) * 2011-06-17 2012-02-01 杭州炬华科技股份有限公司 用于自动化针床的工装电路
US20120324305A1 (en) * 2011-06-20 2012-12-20 Texas Instruments Incorporated Testing interposer method and apparatus
KR20140112135A (ko) * 2013-03-11 2014-09-23 삼성전자주식회사 디바이스 인터페이스 보드의 반도체 소자 및 이를 이용한 테스트 시스템
TWI683113B (zh) * 2014-10-20 2020-01-21 美商艾爾測試系統 用於裝置的測試器、操作開關電路的方法、以及測試裝置的方法
JP6512052B2 (ja) * 2015-09-29 2019-05-15 新東工業株式会社 テストシステム
KR20230021177A (ko) 2017-03-03 2023-02-13 에어 테스트 시스템즈 일렉트로닉스 테스터
CN116457670A (zh) 2020-10-07 2023-07-18 雅赫测试系统公司 电子测试器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA768761A (en) * 1962-12-12 1967-10-03 E. Jones Harold Automatic logic circuit tester
US3549995A (en) * 1964-09-02 1970-12-22 California Computer Products Multibridge comparison system for wiring testing
US3418573A (en) * 1965-08-25 1968-12-24 Texas Instruments Inc Universal electronic test system for automatically making static and dynamic tests on an electronic device
US3496464A (en) * 1968-02-02 1970-02-17 Aai Corp Automatic circuit testing apparatus including impedance matched coaxial signal transmission systems
US3676777A (en) * 1970-08-10 1972-07-11 Tektronix Inc Apparatus for automatically testing integrated circuit devices
IT949829B (it) * 1972-03-03 1973-06-11 Honeywell Inf Systems Dispositivo per la prova dei circuiti stampati
US3946310A (en) * 1974-10-03 1976-03-23 Fluke Trendar Corporation Logic test unit
US4064455A (en) * 1976-11-18 1977-12-20 Hopkins Manufacturing Corporation Fluid condition monitoring system
US4145620A (en) * 1977-10-05 1979-03-20 Serel Corporation Modular dynamic burn-in apparatus
US4196386A (en) * 1978-04-13 1980-04-01 Ncr Corporation Method and portable apparatus for testing digital printed circuit boards
GB2044468A (en) 1979-03-13 1980-10-15 Dukhovskoi Lv Device for measuring electrical parameters of electronic circuits
US4340858A (en) * 1979-08-13 1982-07-20 Philip M. Hinderstein Test fixture
US4354268A (en) * 1980-04-03 1982-10-12 Santek, Inc. Intelligent test head for automatic test system
US4335457A (en) * 1980-08-08 1982-06-15 Fairchild Camera & Instrument Corp. Method for semiconductor memory testing
US4348760A (en) * 1980-09-25 1982-09-07 Lockheed Corporation Digital-fault loop probe and system

Also Published As

Publication number Publication date
CA1208373A (en) 1986-07-22
US4517512A (en) 1985-05-14
EP0108790A4 (en) 1984-07-06
IT8321168A0 (it) 1983-05-18
EP0108790A1 (en) 1984-05-23
EP0108790B1 (en) 1986-12-17
WO1983004315A1 (en) 1983-12-08
DE3368467D1 (en) 1987-01-29

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