IT949829B - Dispositivo per la prova dei circuiti stampati - Google Patents

Dispositivo per la prova dei circuiti stampati

Info

Publication number
IT949829B
IT949829B IT21344/72A IT2134472A IT949829B IT 949829 B IT949829 B IT 949829B IT 21344/72 A IT21344/72 A IT 21344/72A IT 2134472 A IT2134472 A IT 2134472A IT 949829 B IT949829 B IT 949829B
Authority
IT
Italy
Prior art keywords
printed circuits
testing printed
testing
circuits
printed
Prior art date
Application number
IT21344/72A
Other languages
English (en)
Inventor
M Vinsani
Original Assignee
Honeywell Inf Systems
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Inf Systems filed Critical Honeywell Inf Systems
Priority to IT21344/72A priority Critical patent/IT949829B/it
Priority to US00335276A priority patent/US3824462A/en
Priority to FR7307563A priority patent/FR2174944B1/fr
Application granted granted Critical
Publication of IT949829B publication Critical patent/IT949829B/it

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0286—Programmable, customizable or modifiable circuits
    • H05K1/029—Programmable, customizable or modifiable circuits having a programmable lay-out, i.e. adapted for choosing between a few possibilities
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/14—Structural association of two or more printed circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007—Types of components
    • H05K2201/10212—Programmable component
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
    • H05K2201/10621—Components characterised by their electrical contacts
    • H05K2201/10689—Leaded Integrated Circuit [IC] package, e.g. dual-in-line [DIL]

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
IT21344/72A 1972-03-03 1972-03-03 Dispositivo per la prova dei circuiti stampati IT949829B (it)

Priority Applications (3)

Application Number Priority Date Filing Date Title
IT21344/72A IT949829B (it) 1972-03-03 1972-03-03 Dispositivo per la prova dei circuiti stampati
US00335276A US3824462A (en) 1972-03-03 1973-02-23 Device for testing printed circuit boards
FR7307563A FR2174944B1 (it) 1972-03-03 1973-03-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT21344/72A IT949829B (it) 1972-03-03 1972-03-03 Dispositivo per la prova dei circuiti stampati

Publications (1)

Publication Number Publication Date
IT949829B true IT949829B (it) 1973-06-11

Family

ID=11180397

Family Applications (1)

Application Number Title Priority Date Filing Date
IT21344/72A IT949829B (it) 1972-03-03 1972-03-03 Dispositivo per la prova dei circuiti stampati

Country Status (3)

Country Link
US (1) US3824462A (it)
FR (1) FR2174944B1 (it)
IT (1) IT949829B (it)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3942778A (en) * 1975-02-14 1976-03-09 Quality Research Engineering Corporation Automatic contour-conforming support pallet
NL180704C (nl) * 1976-06-14 Coulter Electronics Inrichting voor gelijktijdige optische meting van kenmerken van zich in een suspensie bevindende deeltjes.
US4165270A (en) * 1978-09-13 1979-08-21 Sperry Rand Corporation Circuit integrity tester
US4342958A (en) * 1980-03-28 1982-08-03 Honeywell Information Systems Inc. Automatic test equipment test probe contact isolation detection method
US4357575A (en) * 1980-06-17 1982-11-02 Dit-Mco International Corporation Apparatus for use in testing printed circuit process boards having means for positioning such boards in proper juxtaposition with electrical contacting assemblies
JPS5951109B2 (ja) * 1980-08-29 1984-12-12 富士通株式会社 エ−ジング装置における高温部と低温部の接続方法
US4517512A (en) * 1982-05-24 1985-05-14 Micro Component Technology, Inc. Integrated circuit test apparatus test head
CH656041A5 (de) * 1982-06-23 1986-05-30 Elektrowatt Ag Auf einer gemeinsamen tragschiene montierter apparatesatz.
US4608531A (en) * 1983-05-03 1986-08-26 Stephens Michael L Test set for testing as a unit an amplifier system having several modules
DE3340185A1 (de) * 1983-11-07 1985-05-15 Multitest Elektronische Systeme GmbH, 8200 Rosenheim Vorrichtung zum aufnehmen von bauteilen, insbesondere von integrierten chips, in einem eingangs- und/oder ausgangsmagazin einer bauteile-pruefmaschine
US4967147A (en) * 1988-05-26 1990-10-30 Zehntel, Inc. Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies
US4901013A (en) * 1988-08-19 1990-02-13 American Telephone And Telegraph Company, At&T Bell Laboratories Apparatus having a buckling beam probe assembly
US4950981A (en) * 1989-04-14 1990-08-21 Tektronix, Inc. Apparatus for testing a circuit board
US5220280A (en) * 1989-05-11 1993-06-15 Vlsi Technology, Inc. Method and an apparatus for testing the assembly of a plurality of electrical components on a substrate
US4947112A (en) * 1989-07-28 1990-08-07 At&T Bell Laboratories Apparatus and method for testing printed circuit boards
US6920416B1 (en) * 1989-08-28 2005-07-19 Texas Instruments Incorporated Electronic systems testing employing embedded serial scan generator
US6392427B1 (en) 1998-12-21 2002-05-21 Kaitech Engineering, Inc. Testing electronic devices
US7365552B2 (en) * 2006-07-28 2008-04-29 Research In Motion Limited Surface mount package fault detection apparatus
CN100582680C (zh) * 2006-12-05 2010-01-20 鸿富锦精密工业（深圳）有限公司 检测仪
JP2017072478A (ja) * 2015-10-07 2017-04-13 株式会社東海理化電機製作所 基板構造

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1586173A (it) * 1968-08-19 1970-02-13
GB1263644A (en) * 1969-08-07 1972-02-16 Olivetti & Co Spa Apparatus for automatically testing electronic circuits

Also Published As

Publication number Publication date
US3824462A (en) 1974-07-16
FR2174944A1 (it) 1973-10-19
FR2174944B1 (it) 1976-09-10

Similar Documents

Publication Publication Date Title
IT949829B (it) Dispositivo per la prova dei circuiti stampati
AT317442B (de) Testvorrichtung
BR7301184D0 (pt) Dispositivo anti-concepcional de aplicacao infra-uterina
IT979176B (it) Metodo perfezionato per provare dispositivi logici
BE794849A (fr) Plaque de circuit imprime
SE383028B (sv) Sperranordning for sneckvexel
IT986641B (it) Dispositivo di stampa
SE385163B (sv) Anordning for att detektera intrang
CH549785A (de) Vermessungsgeraet.
SE383420B (sv) Andedrekttestanordning
AT321766B (de) Steuerschaltung für eine Blockierschutzvorrichtung
SE403890B (sv) Utmatningsanordning for klistermedel
SE403075B (sv) Snabbspennanordning
AT327144B (de) Rakeleinrichtung
IT1051727B (it) Apparecchiatura per la stampa su tessuto
ATA524673A (de) Kurzschlussvorrichtung fuer generatorab- leitungen
AT333798B (de) Siebdruckvorrichtung
SE401323B (sv) Anordning for droppavskiljning
BR7308105D0 (pt) Aparelho medidor aperfeicoado
AT311825B (de) Steuerschaltung für eine Blockierschutzvorrichtung
SE391578B (sv) Anordning vid indikerande elektronisk mikrometer
CH550376A (de) Messgeraet zum messen von vertikalen dimensionen.
IT1021521B (it) Dispositivo a fusibile per circuiti elettrici
SE382540B (sv) Kretsanordning.
SE386867B (sv) Tillslutningsanordning for dunkar