IT1034642B - Apparecchio per prova di reti logiche - Google Patents
Apparecchio per prova di reti logicheInfo
- Publication number
- IT1034642B IT1034642B IT21728/75A IT2172875A IT1034642B IT 1034642 B IT1034642 B IT 1034642B IT 21728/75 A IT21728/75 A IT 21728/75A IT 2172875 A IT2172875 A IT 2172875A IT 1034642 B IT1034642 B IT 1034642B
- Authority
- IT
- Italy
- Prior art keywords
- equipment
- testing logic
- logic networks
- networks
- testing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Data Exchanges In Wide-Area Networks (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/468,108 US3961250A (en) | 1974-05-08 | 1974-05-08 | Logic network test system with simulator oriented fault test generator |
Publications (1)
Publication Number | Publication Date |
---|---|
IT1034642B true IT1034642B (it) | 1979-10-10 |
Family
ID=23858461
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IT21728/75A IT1034642B (it) | 1974-05-08 | 1975-03-27 | Apparecchio per prova di reti logiche |
Country Status (9)
Country | Link |
---|---|
US (1) | US3961250A (it) |
JP (1) | JPS5647509B2 (it) |
AU (1) | AU8053975A (it) |
CA (1) | CA1039813A (it) |
DE (1) | DE2515297A1 (it) |
FR (1) | FR2270596B1 (it) |
GB (1) | GB1478438A (it) |
IT (1) | IT1034642B (it) |
NL (1) | NL7505441A (it) |
Families Citing this family (42)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4066882A (en) * | 1976-08-16 | 1978-01-03 | Grumman Aerospace Corporation | Digital stimulus generating and response measuring means |
JPS53119642A (en) * | 1977-03-29 | 1978-10-19 | Fujitsu Ltd | Testing equipment for logic circuit |
US4176780A (en) * | 1977-12-06 | 1979-12-04 | Ncr Corporation | Method and apparatus for testing printed circuit boards |
US4242751A (en) * | 1978-08-28 | 1980-12-30 | Genrad, Inc. | Automatic fault-probing method and apparatus for checking electrical circuits and the like |
US4228537A (en) * | 1978-08-29 | 1980-10-14 | Genrad, Inc. | Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis |
US4204633A (en) * | 1978-11-20 | 1980-05-27 | International Business Machines Corporation | Logic chip test system with path oriented decision making test pattern generator |
JPS5585265A (en) * | 1978-12-23 | 1980-06-27 | Toshiba Corp | Function test evaluation device for integrated circuit |
US4459695A (en) * | 1979-11-07 | 1984-07-10 | Davy Mcgee (Sheffield) Limited | Fault finding in an industrial installation by means of a computer |
FR2498849B1 (fr) * | 1981-01-26 | 1986-04-25 | Commissariat Energie Atomique | Generateur de signaux logiques combines |
FR2501867A1 (fr) * | 1981-03-11 | 1982-09-17 | Commissariat Energie Atomique | Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques |
FR2531230A1 (fr) * | 1982-07-27 | 1984-02-03 | Rank Xerox Sa | Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble |
US4587625A (en) * | 1983-07-05 | 1986-05-06 | Motorola Inc. | Processor for simulating digital structures |
DE3485560D1 (de) * | 1983-10-17 | 1992-04-16 | British Telecomm | System zur testerzeugung fuer digitalschaltungen. |
US4594677A (en) * | 1983-11-09 | 1986-06-10 | International Business Machines Corporation | System for detecting and diagnosing noise caused by simultaneous current switching |
EP0177572A4 (en) * | 1984-04-06 | 1986-09-22 | Advanced Micro Devices Inc | ACTIVE LEAK RESISTANCE CONTROL TO IMPROVE DIGITAL CONVERGENCE IN AN ELECTRONIC CIRCUIT SIMULATOR WHICH IS LOOKING FOR HYPERACTIVE CIRCUIT SOLUTIONS. |
US4633417A (en) * | 1984-06-20 | 1986-12-30 | Step Engineering | Emulator for non-fixed instruction set VLSI devices |
JPS6142040A (ja) * | 1984-08-03 | 1986-02-28 | Nec Corp | 論理シミユレ−タ |
US4716564A (en) * | 1985-11-15 | 1987-12-29 | Tektronix, Inc. | Method for test generation |
JPH0743733B2 (ja) * | 1985-12-11 | 1995-05-15 | 株式会社日立製作所 | 論理シミュレーション方法 |
US4937770A (en) * | 1986-02-07 | 1990-06-26 | Teradyne, Inc. | Simulation system |
US4726023A (en) * | 1986-05-14 | 1988-02-16 | International Business Machines Corporation | Determination of testability of combined logic end memory by ignoring memory |
US5126966A (en) * | 1986-06-25 | 1992-06-30 | Ikos Systems, Inc. | High speed logic simulation system with stimulus engine using independent event channels selectively driven by independent stimulus programs |
US4759019A (en) * | 1986-07-10 | 1988-07-19 | International Business Machines Corporation | Programmable fault injection tool |
FR2605112B1 (fr) * | 1986-10-10 | 1989-04-07 | Thomson Csf | Dispositif et procede de generation de vecteurs de test et procede de test pour circuit integre |
US4792913A (en) * | 1986-11-03 | 1988-12-20 | Grumman Aerospace Corporation | Simulator for systems having analog and digital portions |
EP0308660B1 (de) * | 1987-09-22 | 1995-05-24 | Siemens Aktiengesellschaft | Vorrichtung zur Herstellung einer testkompatiblen, weitgehend fehlertoleranten Konfiguration von redundant implementierten systolischen VLSI-Systemen |
US5257268A (en) * | 1988-04-15 | 1993-10-26 | At&T Bell Laboratories | Cost-function directed search method for generating tests for sequential logic circuits |
US5095483A (en) * | 1989-04-28 | 1992-03-10 | International Business Machines Corporation | Signature analysis in physical modeling |
US5051938A (en) * | 1989-06-23 | 1991-09-24 | Hyduke Stanley M | Simulation of selected logic circuit designs |
DE69212673T2 (de) * | 1991-03-14 | 1997-03-13 | Matsushita Electric Ind Co Ltd | Prüfmustererzeugungseinrichtung |
US5602856A (en) * | 1993-04-06 | 1997-02-11 | Nippon Telegraph And Telephone Corporation | Test pattern generation for logic circuits with reduced backtracking operations |
JPH06334513A (ja) * | 1993-05-13 | 1994-12-02 | Intel Corp | データ処理装置 |
US5633813A (en) * | 1994-05-04 | 1997-05-27 | Srinivasan; Seshan R. | Apparatus and method for automatic test generation and fault simulation of electronic circuits, based on programmable logic circuits |
US5920485A (en) * | 1996-12-05 | 1999-07-06 | Hewlett-Packard | Method of selecting gates for efficient code generation by a circuit compiler |
US5896399A (en) * | 1996-12-11 | 1999-04-20 | International Business Machines Corporation | System and method for testing self-timed memory arrays |
JP2982741B2 (ja) * | 1997-05-13 | 1999-11-29 | 日本電気株式会社 | 集積回路の故障診断装置及びその記録媒体 |
JPH11154103A (ja) * | 1997-11-20 | 1999-06-08 | Mitsubishi Electric Corp | 半導体集積回路装置 |
JP4488595B2 (ja) * | 2000-06-08 | 2010-06-23 | 株式会社アドバンテスト | テストパターン生成方法 |
US6618826B1 (en) * | 2000-10-26 | 2003-09-09 | Cadence Design Systems, Inc. | Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMs |
GB2377517A (en) * | 2001-07-13 | 2003-01-15 | Sun Microsystems Inc | Apparatus and method for testing computer equipment for use in networks |
WO2009050805A1 (ja) * | 2007-10-18 | 2009-04-23 | Fujitsu Limited | 論理回路モデルの検証方法及び装置 |
JP7214440B2 (ja) * | 2018-11-01 | 2023-01-30 | 三菱重工エンジニアリング株式会社 | 検証処理装置、検証処理方法及びプログラム |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3614608A (en) * | 1969-05-19 | 1971-10-19 | Ibm | Random number statistical logic test system |
-
1974
- 1974-05-08 US US05/468,108 patent/US3961250A/en not_active Expired - Lifetime
-
1975
- 1975-03-21 CA CA222,989A patent/CA1039813A/en not_active Expired
- 1975-03-25 FR FR757510340A patent/FR2270596B1/fr not_active Expired
- 1975-03-27 IT IT21728/75A patent/IT1034642B/it active
- 1975-04-08 DE DE19752515297 patent/DE2515297A1/de not_active Withdrawn
- 1975-04-08 JP JP4191675A patent/JPS5647509B2/ja not_active Expired
- 1975-04-17 GB GB1577275A patent/GB1478438A/en not_active Expired
- 1975-04-24 AU AU80539/75A patent/AU8053975A/en not_active Expired
- 1975-05-07 NL NL7505441A patent/NL7505441A/xx not_active Application Discontinuation
Also Published As
Publication number | Publication date |
---|---|
JPS5647509B2 (it) | 1981-11-10 |
GB1478438A (en) | 1977-06-29 |
AU8053975A (en) | 1976-10-28 |
US3961250A (en) | 1976-06-01 |
FR2270596B1 (it) | 1981-03-06 |
DE2515297A1 (de) | 1975-11-20 |
NL7505441A (nl) | 1975-11-11 |
CA1039813A (en) | 1978-10-03 |
JPS515935A (it) | 1976-01-19 |
FR2270596A1 (it) | 1975-12-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
IT1034642B (it) | Apparecchio per prova di reti logiche | |
IT1043512B (it) | Apparecchiatura per provare matricicincassate | |
IT1031940B (it) | Apparecchio manipolatore | |
IT1039025B (it) | Wafer dielettrico perfezionato | |
IT1044539B (it) | Incastellatura per equipaggiamenti elettronici | |
IT1048663B (it) | Indicatore elettrico di guasti | |
IT1048789B (it) | Apparecchiatura di prova per circuiti di comunicazione | |
IT1037286B (it) | Apparecchiatura di imballaggio | |
FR2296968A1 (fr) | Reseaux de circuits logiques | |
NL7612746A (nl) | Testapparaat. | |
AT347600B (de) | Testeinrichtungen | |
IT1034402B (it) | Rete per comunicazoni circolari | |
BE836302A (nl) | Heiinrichting | |
LU88312I2 (de) | Tenoxicam (Tilcotil / Alganex) | |
DK145725C (da) | Boreudrustning | |
IT1049776B (it) | Dispositivo per la prova di ripetitori di telecomunicazione | |
IT1033884B (it) | Apparecchio di retroproiezione | |
IT1037132B (it) | Apparecchio di collaudo dell alileneamento di routo | |
IT1031551B (it) | Apparecchio di collaudo dell allineamento di ruote | |
IT1040152B (it) | Equipaggiamento di radionavigazione | |
AT347244B (de) | Kinogeraet | |
AT331284B (de) | Kuhlanlage | |
SE7514000L (sv) | Horisontalcentreringskrets | |
IT1033599B (it) | Apparecchio per salpare automaticamente le reti | |
IT1043000B (it) | Apparecchiatura di risca damento |