FR2270596B1 - - Google Patents

Info

Publication number
FR2270596B1
FR2270596B1 FR757510340A FR7510340A FR2270596B1 FR 2270596 B1 FR2270596 B1 FR 2270596B1 FR 757510340 A FR757510340 A FR 757510340A FR 7510340 A FR7510340 A FR 7510340A FR 2270596 B1 FR2270596 B1 FR 2270596B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR757510340A
Other versions
FR2270596A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of FR2270596A1 publication Critical patent/FR2270596A1/fr
Application granted granted Critical
Publication of FR2270596B1 publication Critical patent/FR2270596B1/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318392—Generation of test inputs, e.g. test vectors, patterns or sequences for sequential circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318371—Methodologies therefor, e.g. algorithms, procedures
FR757510340A 1974-05-08 1975-03-25 Expired FR2270596B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/468,108 US3961250A (en) 1974-05-08 1974-05-08 Logic network test system with simulator oriented fault test generator

Publications (2)

Publication Number Publication Date
FR2270596A1 FR2270596A1 (fr) 1975-12-05
FR2270596B1 true FR2270596B1 (fr) 1981-03-06

Family

ID=23858461

Family Applications (1)

Application Number Title Priority Date Filing Date
FR757510340A Expired FR2270596B1 (fr) 1974-05-08 1975-03-25

Country Status (9)

Country Link
US (1) US3961250A (fr)
JP (1) JPS5647509B2 (fr)
AU (1) AU8053975A (fr)
CA (1) CA1039813A (fr)
DE (1) DE2515297A1 (fr)
FR (1) FR2270596B1 (fr)
GB (1) GB1478438A (fr)
IT (1) IT1034642B (fr)
NL (1) NL7505441A (fr)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4066882A (en) * 1976-08-16 1978-01-03 Grumman Aerospace Corporation Digital stimulus generating and response measuring means
JPS53119642A (en) * 1977-03-29 1978-10-19 Fujitsu Ltd Testing equipment for logic circuit
US4176780A (en) * 1977-12-06 1979-12-04 Ncr Corporation Method and apparatus for testing printed circuit boards
US4242751A (en) * 1978-08-28 1980-12-30 Genrad, Inc. Automatic fault-probing method and apparatus for checking electrical circuits and the like
US4228537A (en) * 1978-08-29 1980-10-14 Genrad, Inc. Method of and apparatus for automatic fault diagnosis of electrical circuits employing on-line simulation of faults in such circuits during diagnosis
US4204633A (en) * 1978-11-20 1980-05-27 International Business Machines Corporation Logic chip test system with path oriented decision making test pattern generator
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
US4459695A (en) * 1979-11-07 1984-07-10 Davy Mcgee (Sheffield) Limited Fault finding in an industrial installation by means of a computer
FR2498849B1 (fr) * 1981-01-26 1986-04-25 Commissariat Energie Atomique Generateur de signaux logiques combines
FR2501867A1 (fr) * 1981-03-11 1982-09-17 Commissariat Energie Atomique Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
FR2531230A1 (fr) * 1982-07-27 1984-02-03 Rank Xerox Sa Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble
US4587625A (en) * 1983-07-05 1986-05-06 Motorola Inc. Processor for simulating digital structures
DE3485560D1 (de) * 1983-10-17 1992-04-16 British Telecomm System zur testerzeugung fuer digitalschaltungen.
US4594677A (en) * 1983-11-09 1986-06-10 International Business Machines Corporation System for detecting and diagnosing noise caused by simultaneous current switching
JPS61501800A (ja) * 1984-04-06 1986-08-21 アドバンスト・マイクロ・ディバイシズ・インコ−ポレ−テッド 回路の解を反復して求める電子回路シュミレ−タにおける数値収束を制御するアクティブな漏れ抵抗制御
US4633417A (en) * 1984-06-20 1986-12-30 Step Engineering Emulator for non-fixed instruction set VLSI devices
JPS6142040A (ja) * 1984-08-03 1986-02-28 Nec Corp 論理シミユレ−タ
US4716564A (en) * 1985-11-15 1987-12-29 Tektronix, Inc. Method for test generation
JPH0743733B2 (ja) * 1985-12-11 1995-05-15 株式会社日立製作所 論理シミュレーション方法
US4937770A (en) * 1986-02-07 1990-06-26 Teradyne, Inc. Simulation system
US4726023A (en) * 1986-05-14 1988-02-16 International Business Machines Corporation Determination of testability of combined logic end memory by ignoring memory
US5126966A (en) * 1986-06-25 1992-06-30 Ikos Systems, Inc. High speed logic simulation system with stimulus engine using independent event channels selectively driven by independent stimulus programs
US4759019A (en) * 1986-07-10 1988-07-19 International Business Machines Corporation Programmable fault injection tool
FR2605112B1 (fr) * 1986-10-10 1989-04-07 Thomson Csf Dispositif et procede de generation de vecteurs de test et procede de test pour circuit integre
US4792913A (en) * 1986-11-03 1988-12-20 Grumman Aerospace Corporation Simulator for systems having analog and digital portions
EP0308660B1 (fr) * 1987-09-22 1995-05-24 Siemens Aktiengesellschaft Dispositif de fabrication de systèmes systoliques VLSI configuration de redondance, compatible au test et tolérant largement les fautes
US5257268A (en) * 1988-04-15 1993-10-26 At&T Bell Laboratories Cost-function directed search method for generating tests for sequential logic circuits
US5095483A (en) * 1989-04-28 1992-03-10 International Business Machines Corporation Signature analysis in physical modeling
US5051938A (en) * 1989-06-23 1991-09-24 Hyduke Stanley M Simulation of selected logic circuit designs
US5341315A (en) * 1991-03-14 1994-08-23 Matsushita Electric Industrial Co., Ltd. Test pattern generation device
US5602856A (en) * 1993-04-06 1997-02-11 Nippon Telegraph And Telephone Corporation Test pattern generation for logic circuits with reduced backtracking operations
JPH06334513A (ja) * 1993-05-13 1994-12-02 Intel Corp データ処理装置
US5633813A (en) * 1994-05-04 1997-05-27 Srinivasan; Seshan R. Apparatus and method for automatic test generation and fault simulation of electronic circuits, based on programmable logic circuits
US5920485A (en) * 1996-12-05 1999-07-06 Hewlett-Packard Method of selecting gates for efficient code generation by a circuit compiler
US5896399A (en) * 1996-12-11 1999-04-20 International Business Machines Corporation System and method for testing self-timed memory arrays
JP2982741B2 (ja) 1997-05-13 1999-11-29 日本電気株式会社 集積回路の故障診断装置及びその記録媒体
JPH11154103A (ja) * 1997-11-20 1999-06-08 Mitsubishi Electric Corp 半導体集積回路装置
JP4488595B2 (ja) * 2000-06-08 2010-06-23 株式会社アドバンテスト テストパターン生成方法
US6618826B1 (en) * 2000-10-26 2003-09-09 Cadence Design Systems, Inc. Test sequences generated by automatic test pattern generation and applicable to circuits with embedded multi-port RAMs
GB2377517A (en) * 2001-07-13 2003-01-15 Sun Microsystems Inc Apparatus and method for testing computer equipment for use in networks
JP5056856B2 (ja) * 2007-10-18 2012-10-24 富士通株式会社 論理回路モデルの検証方法及び装置
JP7214440B2 (ja) * 2018-11-01 2023-01-30 三菱重工エンジニアリング株式会社 検証処理装置、検証処理方法及びプログラム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614608A (en) * 1969-05-19 1971-10-19 Ibm Random number statistical logic test system

Also Published As

Publication number Publication date
CA1039813A (fr) 1978-10-03
DE2515297A1 (de) 1975-11-20
JPS515935A (fr) 1976-01-19
FR2270596A1 (fr) 1975-12-05
AU8053975A (en) 1976-10-28
GB1478438A (en) 1977-06-29
JPS5647509B2 (fr) 1981-11-10
NL7505441A (nl) 1975-11-11
US3961250A (en) 1976-06-01
IT1034642B (it) 1979-10-10

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Legal Events

Date Code Title Description
ST Notification of lapse