IT1031904B - Componente semiconduttore di struttura iopologica formato da una pluralita di elementi parziali - Google Patents

Componente semiconduttore di struttura iopologica formato da una pluralita di elementi parziali

Info

Publication number
IT1031904B
IT1031904B IT20471/75A IT2047175A IT1031904B IT 1031904 B IT1031904 B IT 1031904B IT 20471/75 A IT20471/75 A IT 20471/75A IT 2047175 A IT2047175 A IT 2047175A IT 1031904 B IT1031904 B IT 1031904B
Authority
IT
Italy
Prior art keywords
iopological
structure formed
semiconductor component
partial elements
partial
Prior art date
Application number
IT20471/75A
Other languages
English (en)
Italian (it)
Original Assignee
Bosch Gmbh Robert
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bosch Gmbh Robert filed Critical Bosch Gmbh Robert
Application granted granted Critical
Publication of IT1031904B publication Critical patent/IT1031904B/it

Links

Classifications

    • H10P74/232—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/316—Testing of analog circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/006—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation at wafer scale level, i.e. wafer scale integration [WSI]
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10W20/493—

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
IT20471/75A 1974-02-22 1975-02-20 Componente semiconduttore di struttura iopologica formato da una pluralita di elementi parziali IT1031904B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2408540A DE2408540C2 (de) 1974-02-22 1974-02-22 Halbleiterbauelement aus einer Vielzahl mindestens annähernd gleicher Schaltungselemente und Verfahren zum Erkennen und Abtrennen defekter Schaltungselemente

Publications (1)

Publication Number Publication Date
IT1031904B true IT1031904B (it) 1979-05-10

Family

ID=5908165

Family Applications (1)

Application Number Title Priority Date Filing Date
IT20471/75A IT1031904B (it) 1974-02-22 1975-02-20 Componente semiconduttore di struttura iopologica formato da una pluralita di elementi parziali

Country Status (8)

Country Link
US (1) US4038677A (enExample)
JP (1) JPS50120583A (enExample)
BR (1) BR7501038A (enExample)
DE (1) DE2408540C2 (enExample)
FR (1) FR2262409B1 (enExample)
GB (1) GB1503935A (enExample)
IT (1) IT1031904B (enExample)
NL (1) NL173688C (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5393781A (en) * 1977-01-27 1978-08-17 Toshiba Corp Semiconductor device
JPS5685934A (en) * 1979-12-14 1981-07-13 Nippon Telegr & Teleph Corp <Ntt> Control signal generating circuit
JPS60117663A (ja) * 1983-11-29 1985-06-25 Mitsubishi Electric Corp 機能トリミング方法
DE3532383A1 (de) * 1985-09-11 1987-03-19 Bosch Gmbh Robert Multizellentransistor
US4639760A (en) * 1986-01-21 1987-01-27 Motorola, Inc. High power RF transistor assembly
JPH01500784A (ja) * 1986-09-17 1989-03-16 ザ　ゼネラル　エレクトリック　カンパニー，ピー．エル．シー． 集積回路の製造方法
DE3802794A1 (de) * 1988-01-30 1989-08-10 Bosch Gmbh Robert Leistungstransistor
IT1230895B (it) * 1989-06-22 1991-11-08 Sgs Thomson Microelectronics Transistore di potenza integrabile con ottimizzazione dei fenomeni di rottura secondaria diretta.
EP0433650B1 (en) * 1989-11-17 1998-03-04 Kabushiki Kaisha Toshiba Semiconductor device having bipolar-MOS composite element pellet suitable for pressure contacted structure
US5721144A (en) * 1995-04-27 1998-02-24 International Business Machines Corporation Method of making trimmable modular MOSFETs for high aspect ratio applications
US5737041A (en) * 1995-07-31 1998-04-07 Image Quest Technologies, Inc. TFT, method of making and matrix displays incorporating the TFT
US6246243B1 (en) * 2000-01-21 2001-06-12 Analog Devices, Inc. Semi-fusible link system
US6507264B1 (en) 2000-08-28 2003-01-14 Littelfuse, Inc. Integral fuse for use in semiconductor packages
JP2002171141A (ja) * 2000-11-30 2002-06-14 Mitsubishi Electric Corp 半導体装置
JP2009170903A (ja) * 2008-01-16 2009-07-30 Hynix Semiconductor Inc 複数のカッティング部を有するヒューズ及びこれを含むヒューズセット構造

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3553830A (en) * 1968-01-19 1971-01-12 Ibm Method for making integrated circuit apparatus
DE2256688B2 (de) * 1972-11-18 1976-05-06 Robert Bosch Gmbh, 7000 Stuttgart Verfahren zum auftrennen von leiterbahnen auf integrierten schaltkreisen

Also Published As

Publication number Publication date
DE2408540A1 (de) 1975-09-04
AU7703974A (en) 1976-07-01
JPS50120583A (enExample) 1975-09-20
US4038677A (en) 1977-07-26
DE2408540C2 (de) 1982-04-08
NL7502113A (nl) 1975-08-26
NL173688C (nl) 1984-02-16
GB1503935A (en) 1978-03-15
FR2262409B1 (enExample) 1978-10-06
BR7501038A (pt) 1975-12-02
FR2262409A1 (enExample) 1975-09-19

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