IN2014CN04514A - - Google Patents

Info

Publication number
IN2014CN04514A
IN2014CN04514A IN4514CHN2014A IN2014CN04514A IN 2014CN04514 A IN2014CN04514 A IN 2014CN04514A IN 4514CHN2014 A IN4514CHN2014 A IN 4514CHN2014A IN 2014CN04514 A IN2014CN04514 A IN 2014CN04514A
Authority
IN
India
Prior art keywords
scintillation light
detection apparatus
detection
detected
detecting
Prior art date
Application number
Other languages
English (en)
Inventor
Cornelis Reinder Ronda
Roland Proksa
Axel Thran
Original Assignee
Koninkl Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Nv filed Critical Koninkl Philips Nv
Publication of IN2014CN04514A publication Critical patent/IN2014CN04514A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
IN4514CHN2014 2011-12-05 2012-11-23 IN2014CN04514A (cg-RX-API-DMAC10.html)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201161566752P 2011-12-05 2011-12-05
PCT/IB2012/056684 WO2013084106A2 (en) 2011-12-05 2012-11-23 Detection apparatus for detecting radiation

Publications (1)

Publication Number Publication Date
IN2014CN04514A true IN2014CN04514A (cg-RX-API-DMAC10.html) 2015-09-11

Family

ID=47599134

Family Applications (1)

Application Number Title Priority Date Filing Date
IN4514CHN2014 IN2014CN04514A (cg-RX-API-DMAC10.html) 2011-12-05 2012-11-23

Country Status (8)

Country Link
US (1) US9958554B2 (cg-RX-API-DMAC10.html)
EP (1) EP2748637B1 (cg-RX-API-DMAC10.html)
JP (1) JP6291416B2 (cg-RX-API-DMAC10.html)
CN (1) CN103988095B (cg-RX-API-DMAC10.html)
BR (1) BR112014013362A2 (cg-RX-API-DMAC10.html)
IN (1) IN2014CN04514A (cg-RX-API-DMAC10.html)
RU (1) RU2607719C2 (cg-RX-API-DMAC10.html)
WO (1) WO2013084106A2 (cg-RX-API-DMAC10.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI531233B (zh) * 2012-12-13 2016-04-21 財團法人工業技術研究院 感測裝置及其像素結構
US20160216382A1 (en) * 2013-08-26 2016-07-28 Teledyne Dalsa B.V. A radiation detector and a method thereof
US20150092912A1 (en) * 2013-10-02 2015-04-02 General Electric Company Systems and methods for filtering emissions from scintillators
US11156727B2 (en) * 2015-10-02 2021-10-26 Varian Medical Systems, Inc. High DQE imaging device
WO2021145260A1 (ja) * 2020-01-15 2021-07-22 株式会社小糸製作所 シンチレータおよびシンチレータの製造方法
CN111190216B (zh) * 2020-01-23 2023-03-24 中国工程物理研究院激光聚变研究中心 一种辐射流探测器阵列

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3002571B2 (ja) * 1991-08-13 2000-01-24 株式会社日立製作所 放射線検出器
JPH0784054A (ja) * 1993-09-16 1995-03-31 Toshiba Corp 放射線検出器および放射線測定装置
JP3302463B2 (ja) * 1993-09-20 2002-07-15 富士写真フイルム株式会社 放射線検出器およびその使用方法
EP0746778A1 (en) * 1994-02-25 1996-12-11 Massachusetts Institute Of Technology Methods and apparatus for detecting and imaging particles
JPH09152485A (ja) * 1995-11-30 1997-06-10 Hitachi Metals Ltd 放射線検出器
US6031234A (en) * 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager
EP1016881B1 (en) * 1998-12-28 2005-12-21 Kabushiki Kaisha Toshiba Radiation detecting apparatus
JP4303393B2 (ja) * 2000-03-10 2009-07-29 富士通株式会社 分光強度分布測定方法および分光強度分布測定装置
JP4274839B2 (ja) * 2002-06-04 2009-06-10 株式会社日立メディコ Ｘ線検出器用シンチレータ、その製造方法並びにそれを用いたｘ線検出器及びｘ線ｃｔ装置
JP4451112B2 (ja) * 2003-10-24 2010-04-14 株式会社日立メディコ 放射線検出器及びそれを用いた放射線画像診断装置
US7138633B1 (en) * 2004-01-23 2006-11-21 Saint-Gobain Ceramics & Plastics, Inc. Apparatus employing a filtered scintillator and method of using same
US7388208B2 (en) 2006-01-11 2008-06-17 Ruvin Deych Dual energy x-ray detector
RU2009129973A (ru) * 2007-01-05 2011-02-10 Конинклейке Филипс Электроникс Н.В. (Nl) Быстродействующий детектор излучения
JP5045468B2 (ja) 2008-02-01 2012-10-10 株式会社アドヴィックス 制動制御装置
CN102137913B (zh) * 2008-08-07 2013-11-27 皇家飞利浦电子股份有限公司 闪烁材料
US20100072376A1 (en) * 2008-09-22 2010-03-25 Koninklijke Philips Electronics N.V. Spectral filter for use with lutetium-based scintillators
RU2407437C2 (ru) * 2009-01-22 2010-12-27 Общество с ограниченной ответственностью "Унискан" Способ регистрации рентгеновского изображения объекта в различных диапазонах спектра рентгеновского излучения
US8363917B2 (en) 2009-10-14 2013-01-29 General Electric Company System and method of image artifact reduction in fast kVp switching CT
DE202012012506U1 (de) * 2011-02-11 2013-03-22 Koninklijke Philips Electronics N.V. Verbesserte SPECT-Bewegungskorrektur
JP5911274B2 (ja) * 2011-11-28 2016-04-27 キヤノン株式会社 放射線検出装置及び放射線撮像システム

Also Published As

Publication number Publication date
EP2748637A2 (en) 2014-07-02
WO2013084106A2 (en) 2013-06-13
WO2013084106A3 (en) 2013-11-21
US9958554B2 (en) 2018-05-01
EP2748637B1 (en) 2016-10-26
JP2015505038A (ja) 2015-02-16
CN103988095B (zh) 2018-04-06
CN103988095A (zh) 2014-08-13
BR112014013362A2 (pt) 2017-06-13
US20140321617A1 (en) 2014-10-30
RU2607719C2 (ru) 2017-01-10
RU2014124932A (ru) 2016-02-10
JP6291416B2 (ja) 2018-03-14

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