JP6291416B2 - 放射線を検出する検出装置 - Google Patents

放射線を検出する検出装置 Download PDF

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Publication number
JP6291416B2
JP6291416B2 JP2014545399A JP2014545399A JP6291416B2 JP 6291416 B2 JP6291416 B2 JP 6291416B2 JP 2014545399 A JP2014545399 A JP 2014545399A JP 2014545399 A JP2014545399 A JP 2014545399A JP 6291416 B2 JP6291416 B2 JP 6291416B2
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Japan
Prior art keywords
radiation
light
optical filter
scintillation light
detection
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Expired - Fee Related
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JP2014545399A
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English (en)
Japanese (ja)
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JP2015505038A (ja
JP2015505038A5 (cg-RX-API-DMAC10.html
Inventor
レインデル ロンダ，コルネリス
レインデル ロンダ，コルネリス
プロクサ，ロラント
トラン，アクセル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
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Koninklijke Philips NV
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2002—Optical details, e.g. reflecting or diffusing layers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2006—Measuring radiation intensity with scintillation detectors using a combination of a scintillator and photodetector which measures the means radiation intensity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20183—Arrangements for preventing or correcting crosstalk, e.g. optical or electrical arrangements for correcting crosstalk
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP2014545399A 2011-12-05 2012-11-23 放射線を検出する検出装置 Expired - Fee Related JP6291416B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161566752P 2011-12-05 2011-12-05
US61/566,752 2011-12-05
PCT/IB2012/056684 WO2013084106A2 (en) 2011-12-05 2012-11-23 Detection apparatus for detecting radiation

Publications (3)

Publication Number Publication Date
JP2015505038A JP2015505038A (ja) 2015-02-16
JP2015505038A5 JP2015505038A5 (cg-RX-API-DMAC10.html) 2015-12-17
JP6291416B2 true JP6291416B2 (ja) 2018-03-14

Family

ID=47599134

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2014545399A Expired - Fee Related JP6291416B2 (ja) 2011-12-05 2012-11-23 放射線を検出する検出装置

Country Status (8)

Country Link
US (1) US9958554B2 (cg-RX-API-DMAC10.html)
EP (1) EP2748637B1 (cg-RX-API-DMAC10.html)
JP (1) JP6291416B2 (cg-RX-API-DMAC10.html)
CN (1) CN103988095B (cg-RX-API-DMAC10.html)
BR (1) BR112014013362A2 (cg-RX-API-DMAC10.html)
IN (1) IN2014CN04514A (cg-RX-API-DMAC10.html)
RU (1) RU2607719C2 (cg-RX-API-DMAC10.html)
WO (1) WO2013084106A2 (cg-RX-API-DMAC10.html)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI531233B (zh) * 2012-12-13 2016-04-21 財團法人工業技術研究院 感測裝置及其像素結構
US20160216382A1 (en) * 2013-08-26 2016-07-28 Teledyne Dalsa B.V. A radiation detector and a method thereof
US20150092912A1 (en) * 2013-10-02 2015-04-02 General Electric Company Systems and methods for filtering emissions from scintillators
US11156727B2 (en) * 2015-10-02 2021-10-26 Varian Medical Systems, Inc. High DQE imaging device
WO2021145260A1 (ja) * 2020-01-15 2021-07-22 株式会社小糸製作所 シンチレータおよびシンチレータの製造方法
CN111190216B (zh) * 2020-01-23 2023-03-24 中国工程物理研究院激光聚变研究中心 一种辐射流探测器阵列

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3002571B2 (ja) * 1991-08-13 2000-01-24 株式会社日立製作所 放射線検出器
JPH0784054A (ja) * 1993-09-16 1995-03-31 Toshiba Corp 放射線検出器および放射線測定装置
JP3302463B2 (ja) * 1993-09-20 2002-07-15 富士写真フイルム株式会社 放射線検出器およびその使用方法
EP0746778A1 (en) * 1994-02-25 1996-12-11 Massachusetts Institute Of Technology Methods and apparatus for detecting and imaging particles
JPH09152485A (ja) * 1995-11-30 1997-06-10 Hitachi Metals Ltd 放射線検出器
US6031234A (en) * 1997-12-08 2000-02-29 General Electric Company High resolution radiation imager
EP1016881B1 (en) * 1998-12-28 2005-12-21 Kabushiki Kaisha Toshiba Radiation detecting apparatus
JP4303393B2 (ja) * 2000-03-10 2009-07-29 富士通株式会社 分光強度分布測定方法および分光強度分布測定装置
JP4274839B2 (ja) * 2002-06-04 2009-06-10 株式会社日立メディコ Ｘ線検出器用シンチレータ、その製造方法並びにそれを用いたｘ線検出器及びｘ線ｃｔ装置
JP4451112B2 (ja) * 2003-10-24 2010-04-14 株式会社日立メディコ 放射線検出器及びそれを用いた放射線画像診断装置
US7138633B1 (en) * 2004-01-23 2006-11-21 Saint-Gobain Ceramics & Plastics, Inc. Apparatus employing a filtered scintillator and method of using same
US7388208B2 (en) 2006-01-11 2008-06-17 Ruvin Deych Dual energy x-ray detector
RU2009129973A (ru) * 2007-01-05 2011-02-10 Конинклейке Филипс Электроникс Н.В. (Nl) Быстродействующий детектор излучения
JP5045468B2 (ja) 2008-02-01 2012-10-10 株式会社アドヴィックス 制動制御装置
CN102137913B (zh) * 2008-08-07 2013-11-27 皇家飞利浦电子股份有限公司 闪烁材料
US20100072376A1 (en) * 2008-09-22 2010-03-25 Koninklijke Philips Electronics N.V. Spectral filter for use with lutetium-based scintillators
RU2407437C2 (ru) * 2009-01-22 2010-12-27 Общество с ограниченной ответственностью "Унискан" Способ регистрации рентгеновского изображения объекта в различных диапазонах спектра рентгеновского излучения
US8363917B2 (en) 2009-10-14 2013-01-29 General Electric Company System and method of image artifact reduction in fast kVp switching CT
DE202012012506U1 (de) * 2011-02-11 2013-03-22 Koninklijke Philips Electronics N.V. Verbesserte SPECT-Bewegungskorrektur
JP5911274B2 (ja) * 2011-11-28 2016-04-27 キヤノン株式会社 放射線検出装置及び放射線撮像システム

Also Published As

Publication number Publication date
EP2748637A2 (en) 2014-07-02
WO2013084106A2 (en) 2013-06-13
WO2013084106A3 (en) 2013-11-21
US9958554B2 (en) 2018-05-01
EP2748637B1 (en) 2016-10-26
JP2015505038A (ja) 2015-02-16
CN103988095B (zh) 2018-04-06
CN103988095A (zh) 2014-08-13
BR112014013362A2 (pt) 2017-06-13
US20140321617A1 (en) 2014-10-30
RU2607719C2 (ru) 2017-01-10
RU2014124932A (ru) 2016-02-10
IN2014CN04514A (cg-RX-API-DMAC10.html) 2015-09-11

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