IL79097A0 - Automatic optical inspection of printed circuit boards - Google Patents
Automatic optical inspection of printed circuit boardsInfo
- Publication number
- IL79097A0 IL79097A0 IL79097A IL7909786A IL79097A0 IL 79097 A0 IL79097 A0 IL 79097A0 IL 79097 A IL79097 A IL 79097A IL 7909786 A IL7909786 A IL 7909786A IL 79097 A0 IL79097 A0 IL 79097A0
- Authority
- IL
- Israel
- Prior art keywords
- printed circuit
- circuit boards
- optical inspection
- automatic optical
- automatic
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/001—Industrial image inspection using an image reference approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V30/00—Character recognition; Recognising digital ink; Document-oriented image-based pattern recognition
- G06V30/10—Character recognition
- G06V30/24—Character recognition characterised by the processing or recognition method
- G06V30/248—Character recognition characterised by the processing or recognition method involving plural approaches, e.g. verification by template match; Resolving confusion among similar patterns, e.g. "O" versus "Q"
- G06V30/2504—Coarse or fine approaches, e.g. resolution of ambiguities or multiscale approaches
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95607—Inspecting patterns on the surface of objects using a comparative method
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10016—Video; Image sequence
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30141—Printed circuit board [PCB]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Multimedia (AREA)
- Quality & Reliability (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US74576685A | 1985-06-17 | 1985-06-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
IL79097A0 true IL79097A0 (en) | 1986-09-30 |
Family
ID=24998169
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
IL79097A IL79097A0 (en) | 1985-06-17 | 1986-06-12 | Automatic optical inspection of printed circuit boards |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0206709A3 (xx) |
JP (1) | JPS61292510A (xx) |
IL (1) | IL79097A0 (xx) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01265368A (ja) * | 1988-04-15 | 1989-10-23 | Matsushita Electric Ind Co Ltd | 印刷パターンの検査装置 |
FR2647574B1 (fr) * | 1989-05-12 | 1991-09-06 | Automatisme Robotique Applique | Procedes et dispositifs pour effectuer des controles de fabrication visuels d'une serie de pieces identiques |
JP3163909B2 (ja) * | 1994-08-19 | 2001-05-08 | 株式会社富士通ゼネラル | 安全試験の自動化装置 |
GB9803179D0 (en) * | 1998-02-13 | 1998-04-08 | Scient Generics Ltd | PCB Inspection system |
US6707545B1 (en) | 1999-09-07 | 2004-03-16 | Applied Materials, Inc. | Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems |
US6813032B1 (en) * | 1999-09-07 | 2004-11-02 | Applied Materials, Inc. | Method and apparatus for enhanced embedded substrate inspection through process data collection and substrate imaging techniques |
US6693708B1 (en) | 1999-09-07 | 2004-02-17 | Applied Materials, Inc. | Method and apparatus for substrate surface inspection using spectral profiling techniques |
US7012684B1 (en) | 1999-09-07 | 2006-03-14 | Applied Materials, Inc. | Method and apparatus to provide for automated process verification and hierarchical substrate examination |
US6707544B1 (en) | 1999-09-07 | 2004-03-16 | Applied Materials, Inc. | Particle detection and embedded vision system to enhance substrate yield and throughput |
US6630995B1 (en) | 1999-09-07 | 2003-10-07 | Applied Materials, Inc. | Method and apparatus for embedded substrate and system status monitoring |
US6721045B1 (en) | 1999-09-07 | 2004-04-13 | Applied Materials, Inc. | Method and apparatus to provide embedded substrate process monitoring through consolidation of multiple process inspection techniques |
IL160477A0 (en) * | 2004-02-19 | 2004-07-25 | Camtek Ltd | A method and a system for real-time defects verification |
CN102938077A (zh) * | 2012-10-25 | 2013-02-20 | 渭南师范学院 | 基于双阈值二值化的在线式aoi图像检索方法 |
KR101444259B1 (ko) * | 2013-09-12 | 2014-10-30 | 주식회사 고영테크놀러지 | 기판 검사 시의 보상 매트릭스 생성방법 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4233625A (en) * | 1978-11-03 | 1980-11-11 | Teledyne, Inc. | Television monitoring system for automatically aligning semiconductor devices during manufacture |
EP0054596B1 (fr) * | 1980-12-18 | 1985-05-29 | International Business Machines Corporation | Procédé d'inspection et de tri automatique d'objets présentant des configurations avec des tolérances dimensionnelles et des critères de rejet variables selon l'emplacement, équipement et circuits de mise en oeuvre |
US4442542A (en) * | 1982-01-29 | 1984-04-10 | Sperry Corporation | Preprocessing circuitry apparatus for digital data |
US4500202A (en) * | 1982-05-24 | 1985-02-19 | Itek Corporation | Printed circuit board defect detection of detecting maximum line width violations |
JPS6015504A (ja) * | 1983-07-07 | 1985-01-26 | Mitsubishi Rayon Co Ltd | フオトマスク自動検査装置 |
GB8320016D0 (en) * | 1983-07-25 | 1983-08-24 | Lloyd Doyle Ltd | Apparatus for inspecting printed wiring boards |
-
1986
- 1986-06-12 IL IL79097A patent/IL79097A0/xx unknown
- 1986-06-16 EP EP86304611A patent/EP0206709A3/en not_active Withdrawn
- 1986-06-16 JP JP61138402A patent/JPS61292510A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
EP0206709A3 (en) | 1988-09-28 |
JPS61292510A (ja) | 1986-12-23 |
EP0206709A2 (en) | 1986-12-30 |
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