IL173090A - Probe for an atomic force microscope - Google Patents

Probe for an atomic force microscope

Info

Publication number
IL173090A
IL173090A IL173090A IL17309006A IL173090A IL 173090 A IL173090 A IL 173090A IL 173090 A IL173090 A IL 173090A IL 17309006 A IL17309006 A IL 17309006A IL 173090 A IL173090 A IL 173090A
Authority
IL
Israel
Prior art keywords
probe
sample
force
tip
microscope
Prior art date
Application number
IL173090A
Other languages
English (en)
Other versions
IL173090A0 (en
Original Assignee
Univ Bristol
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0316577A external-priority patent/GB0316577D0/en
Priority claimed from GB0323229A external-priority patent/GB0323229D0/en
Priority claimed from GB0408234A external-priority patent/GB0408234D0/en
Application filed by Univ Bristol filed Critical Univ Bristol
Publication of IL173090A0 publication Critical patent/IL173090A0/en
Publication of IL173090A publication Critical patent/IL173090A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/44—SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/14—Particular materials
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
IL173090A 2003-07-15 2006-01-11 Probe for an atomic force microscope IL173090A (en)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB0316577A GB0316577D0 (en) 2003-07-15 2003-07-15 Atomic force microscope
GB0323229A GB0323229D0 (en) 2003-10-03 2003-10-03 Cantilever probe for an atomic force microscope
GB0408234A GB0408234D0 (en) 2004-04-13 2004-04-13 Probe for an atomic force microscope
PCT/GB2004/003065 WO2005008679A1 (fr) 2003-07-15 2004-07-15 Sonde pour microscope a forces atomiques

Publications (2)

Publication Number Publication Date
IL173090A0 IL173090A0 (en) 2006-06-11
IL173090A true IL173090A (en) 2011-10-31

Family

ID=34084176

Family Applications (1)

Application Number Title Priority Date Filing Date
IL173090A IL173090A (en) 2003-07-15 2006-01-11 Probe for an atomic force microscope

Country Status (6)

Country Link
US (1) US7596989B2 (fr)
EP (1) EP1644937A1 (fr)
JP (1) JP4832296B2 (fr)
KR (1) KR101195729B1 (fr)
IL (1) IL173090A (fr)
WO (1) WO2005008679A1 (fr)

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KR100971467B1 (ko) * 2007-09-11 2010-08-03 (주)티에프에스글로발 탐침의 강도를 가변하는 장치와 이를 이용한 전기기계장치
GB0801900D0 (en) * 2008-02-01 2008-03-12 Imp Innovations Ltd Scanning probe microscopy
JP5438750B2 (ja) * 2008-03-24 2014-03-12 本田技研工業株式会社 原子間力顕微鏡を利用したナノ構造の堆積のための装置
WO2009147450A1 (fr) 2008-06-06 2009-12-10 Infinitesima Ltd Système de détection de sondes
KR101823954B1 (ko) * 2008-11-13 2018-01-31 브루커 나노, 인코퍼레이션. 탐침형 원자 현미경 작동 방법 및 장치
US8650660B2 (en) 2008-11-13 2014-02-11 Bruker Nano, Inc. Method and apparatus of using peak force tapping mode to measure physical properties of a sample
US8955161B2 (en) 2008-11-13 2015-02-10 Bruker Nano, Inc. Peakforce photothermal-based detection of IR nanoabsorption
CN102272610B (zh) * 2008-12-11 2015-02-25 因菲尼泰西马有限公司 动态探针检测系统
US20110041224A1 (en) * 2009-08-06 2011-02-17 Purdue Research Foundation Atomic force microscope including accelerometer
JP5281992B2 (ja) * 2009-08-28 2013-09-04 株式会社日立製作所 走査型プローブ顕微鏡及びそれを用いた計測方法
JP6203494B2 (ja) 2009-12-01 2017-09-27 ブルカー ナノ インコーポレイテッドＢｒｕｋｅｒ Ｎａｎｏ，Ｉｎｃ． 走査型プローブ顕微鏡を動作させる方法
WO2012078415A2 (fr) * 2010-11-29 2012-06-14 Bruker Nano, Inc. Procédé et appareil pour utiliser un mode peak force tapping afin de mesurer des propriétés physiques d'un échantillon
US8533861B2 (en) * 2011-08-15 2013-09-10 The Board Of Trustees Of The University Of Illinois Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
US8914911B2 (en) 2011-08-15 2014-12-16 The Board Of Trustees Of The University Of Illinois Magnetic actuation and thermal cantilevers for temperature and frequency dependent atomic force microscopy
CN102506785B (zh) * 2011-09-23 2013-11-06 哈尔滨工业大学 三自由度一体化粘滑式直线定位装置
CN103207035B (zh) * 2013-05-14 2015-07-15 南京因艾生生物科技有限公司 一种用于测量分子间作用力的力谱仪
CN103336147B (zh) * 2013-06-27 2015-05-27 西安交通大学 一种扫描离子电导显微镜的高频振动夹持器
US9110094B2 (en) * 2014-01-17 2015-08-18 Schlumberger Technology Corporation Measurement of surface energy components and wettability of reservoir rock utilizing atomic force microscopy
EP2913681A1 (fr) * 2014-02-28 2015-09-02 Infinitesima Limited Système de sonde avec plusieures locations d'actionnement
EP2913682A1 (fr) * 2014-02-28 2015-09-02 Infinitesima Limited Système d'actionnement d'une sonde avec un controlleur de feedback
TWI681193B (zh) * 2014-10-06 2020-01-01 荷蘭商荷蘭Ｔｎｏ自然科學組織公司 掃描探針顯微鏡
WO2016185518A1 (fr) * 2015-05-15 2016-11-24 オリンパス株式会社 Procédé d'acquisition d'informations pour microscope à force atomique
CN105807792B (zh) * 2016-03-09 2018-08-10 西安交通大学 扫描离子电导显微镜的片上化控制器及控制方法
KR102457857B1 (ko) 2016-08-22 2022-10-24 브루커 나노, 아이엔씨. 진동 모드를 이용한 샘플의 적외선 특성
JP6963338B2 (ja) * 2017-03-28 2021-11-05 株式会社日立ハイテクサイエンス 走査型プローブ顕微鏡
JP6885585B2 (ja) * 2017-03-28 2021-06-16 株式会社日立ハイテクサイエンス 走査型プローブ顕微鏡、及びその走査方法
CN110526203A (zh) * 2019-08-02 2019-12-03 上海师范大学 基于afm直写式力电耦合刻蚀加工准三维微纳米结构的方法
US12091313B2 (en) 2019-08-26 2024-09-17 The Research Foundation For The State University Of New York Electrodynamically levitated actuator
RU2740872C1 (ru) * 2020-07-27 2021-01-21 Федеральное государственное бюджетное учреждение "Национальный медицинский исследовательский центр трансплантологии и искусственных органов имени академика В.И. Шумакова" Министерства здравоохранения Российской Федерации (ФГБУ "НМИЦ ТИО им. ак. В.И. Шумакова" Минздрава России) Подложка для исследования биологического образца методом сканирующей зондовой нанотомографии и способ ее получения
WO2022144271A1 (fr) 2020-12-29 2022-07-07 Institut National de la Santé et de la Recherche Médicale Procédé d'excitation de la micropoutre d'un microscope à force atomique à haute vitesse

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US5670712A (en) 1994-08-15 1997-09-23 The Regents Of The University Of California Method and apparatus for magnetic force control of a scanning probe
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US6185991B1 (en) * 1998-02-17 2001-02-13 Psia Corporation Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode
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JP3235786B2 (ja) * 1998-06-30 2001-12-04 技術研究組合オングストロームテクノロジ研究機構 走査プローブの力制御方法
US6330824B1 (en) * 1999-02-19 2001-12-18 The University Of North Carolina At Chapel Hill Photothermal modulation for oscillating mode atomic force microscopy in solution
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JP4497753B2 (ja) * 2001-05-31 2010-07-07 エスアイアイ・ナノテクノロジー株式会社 走査型プローブ顕微鏡の物理特性測定方法及びプログラムならびに走査型プローブ顕微鏡装置
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Also Published As

Publication number Publication date
US20070024295A1 (en) 2007-02-01
US7596989B2 (en) 2009-10-06
KR101195729B1 (ko) 2012-10-29
WO2005008679A1 (fr) 2005-01-27
KR20060033798A (ko) 2006-04-19
EP1644937A1 (fr) 2006-04-12
JP2007530915A (ja) 2007-11-01
JP4832296B2 (ja) 2011-12-07
IL173090A0 (en) 2006-06-11

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