IL161648A0 - Apparatus and methods for multi-level sensing in a memory array - Google Patents

Apparatus and methods for multi-level sensing in a memory array

Info

Publication number
IL161648A0
IL161648A0 IL16164804A IL16164804A IL161648A0 IL 161648 A0 IL161648 A0 IL 161648A0 IL 16164804 A IL16164804 A IL 16164804A IL 16164804 A IL16164804 A IL 16164804A IL 161648 A0 IL161648 A0 IL 161648A0
Authority
IL
Israel
Prior art keywords
methods
memory array
level sensing
sensing
level
Prior art date
Application number
IL16164804A
Other languages
English (en)
Original Assignee
Saifun Semiconductors Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saifun Semiconductors Ltd filed Critical Saifun Semiconductors Ltd
Publication of IL161648A0 publication Critical patent/IL161648A0/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5642—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G11C16/28—Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Measurement Of Current Or Voltage (AREA)
IL16164804A 2003-04-29 2004-04-28 Apparatus and methods for multi-level sensing in a memory array IL161648A0 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US46606303P 2003-04-29 2003-04-29

Publications (1)

Publication Number Publication Date
IL161648A0 true IL161648A0 (en) 2004-09-27

Family

ID=32990980

Family Applications (1)

Application Number Title Priority Date Filing Date
IL16164804A IL161648A0 (en) 2003-04-29 2004-04-28 Apparatus and methods for multi-level sensing in a memory array

Country Status (6)

Country Link
EP (1) EP1473732A1 (xx)
JP (1) JP2004362749A (xx)
CN (1) CN1574078A (xx)
DE (1) DE102004021076A1 (xx)
IL (1) IL161648A0 (xx)
TW (1) TW200504761A (xx)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1699055B1 (en) 2005-03-03 2010-01-06 STMicroelectronics S.r.l. A memory device with time-shifting based emulation of reference cells
KR100824141B1 (ko) * 2006-09-29 2008-04-21 주식회사 하이닉스반도체 반도체 메모리 소자
CN101800081B (zh) * 2009-02-11 2012-05-02 北京兆易创新科技有限公司 一种用于mlc闪存的灵敏放大器和位线快速充电电路
US9830999B2 (en) 2014-06-05 2017-11-28 Micron Technology, Inc. Comparison operations in memory
CN112737356A (zh) * 2020-12-25 2021-04-30 中车永济电机有限公司 大功率永磁直驱货运机车牵引变流器

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5218569A (en) * 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
EP0740307B1 (en) * 1995-04-28 2001-12-12 STMicroelectronics S.r.l. Sense amplifier circuit for semiconductor memory devices
US5712815A (en) * 1996-04-22 1998-01-27 Advanced Micro Devices, Inc. Multiple bits per-cell flash EEPROM capable of concurrently programming and verifying memory cells and reference cells
TW367503B (en) * 1996-11-29 1999-08-21 Sanyo Electric Co Non-volatile semiconductor device
JP3039458B2 (ja) * 1997-07-07 2000-05-08 日本電気株式会社 不揮発性半導体メモリ
US6128226A (en) * 1999-02-04 2000-10-03 Saifun Semiconductors Ltd. Method and apparatus for operating with a close to ground signal
JP3348432B2 (ja) * 1999-09-14 2002-11-20 日本電気株式会社 半導体装置および半導体記憶装置
JP3653449B2 (ja) * 2000-06-15 2005-05-25 シャープ株式会社 不揮発性半導体記憶装置
US6469929B1 (en) * 2001-08-21 2002-10-22 Tower Semiconductor Ltd. Structure and method for high speed sensing of memory arrays

Also Published As

Publication number Publication date
EP1473732A1 (en) 2004-11-03
TW200504761A (en) 2005-02-01
DE102004021076A1 (de) 2004-11-25
JP2004362749A (ja) 2004-12-24
CN1574078A (zh) 2005-02-02

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IL161648A0 (en) Apparatus and methods for multi-level sensing in a memory array