IL118451A - Noise measurement test system - Google Patents

Noise measurement test system

Info

Publication number
IL118451A
IL118451A IL11845196A IL11845196A IL118451A IL 118451 A IL118451 A IL 118451A IL 11845196 A IL11845196 A IL 11845196A IL 11845196 A IL11845196 A IL 11845196A IL 118451 A IL118451 A IL 118451A
Authority
IL
Israel
Prior art keywords
test system
measurement test
noise measurement
noise
test
Prior art date
Application number
IL11845196A
Other languages
English (en)
Other versions
IL118451A0 (en
Original Assignee
Raytheon Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Raytheon Co filed Critical Raytheon Co
Publication of IL118451A0 publication Critical patent/IL118451A0/xx
Publication of IL118451A publication Critical patent/IL118451A/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26Measuring noise figure; Measuring signal-to-noise ratio

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Noise Elimination (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
IL11845196A 1995-06-06 1996-05-28 Noise measurement test system IL118451A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/471,812 US5608331A (en) 1995-06-06 1995-06-06 Noise measurement test system

Publications (2)

Publication Number Publication Date
IL118451A0 IL118451A0 (en) 1996-09-12
IL118451A true IL118451A (en) 2000-06-01

Family

ID=23873089

Family Applications (1)

Application Number Title Priority Date Filing Date
IL11845196A IL118451A (en) 1995-06-06 1996-05-28 Noise measurement test system

Country Status (7)

Country Link
US (1) US5608331A (xx)
EP (1) EP0747714A3 (xx)
JP (1) JP3236779B2 (xx)
KR (1) KR0158791B1 (xx)
AU (1) AU681826B2 (xx)
IL (1) IL118451A (xx)
PH (1) PH12013000151A1 (xx)

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US6005518A (en) * 1997-12-31 1999-12-21 Kallina; Henry D. Coaxial cable RF leakage detector
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US6088581A (en) * 1998-03-27 2000-07-11 Motorola, Inc. Method and apparatus for reducing amplitude modulated interference in a receiver
US6714898B1 (en) * 1998-09-02 2004-03-30 Anritsu Company Flexible noise figure measurement apparatus
DE19901750B4 (de) * 1999-01-18 2006-04-13 Rohde & Schwarz Gmbh & Co. Kg Anordnung zum Messen des Phasenrauschens des Ausgangssignals eines Meßobjektes
US6393372B1 (en) * 1999-05-17 2002-05-21 Eugene Rzyski Automated frequency stepping noise measurement system
US6172564B1 (en) 1999-07-30 2001-01-09 Eugene Rzyski Intermodulation product cancellation circuit
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US6459337B1 (en) 2000-07-05 2002-10-01 Teledyne Technologies Incorporated System and method for noise and spurious suppression in power amplifier systems
US6535060B2 (en) 2000-12-05 2003-03-18 Teledyne Technologies Incorporated System and method for noise and spurious supression in power amplifier systems
US6498532B2 (en) 2001-01-12 2002-12-24 Teledyne Technologies Incorporated System and method for linearizing vacuum electronic amplification
US7423987B2 (en) 2001-04-27 2008-09-09 The Directv Group, Inc. Feeder link configurations to support layered modulation for digital signals
US7209524B2 (en) * 2001-04-27 2007-04-24 The Directv Group, Inc. Layered modulation for digital signals
US7483505B2 (en) 2001-04-27 2009-01-27 The Directv Group, Inc. Unblind equalizer architecture for digital communication systems
US7245671B1 (en) * 2001-04-27 2007-07-17 The Directv Group, Inc. Preprocessing signal layers in a layered modulation digital signal system to use legacy receivers
US7639759B2 (en) * 2001-04-27 2009-12-29 The Directv Group, Inc. Carrier to noise ratio estimations from a received signal
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US7471735B2 (en) * 2001-04-27 2008-12-30 The Directv Group, Inc. Maximizing power and spectral efficiencies for layered and conventional modulations
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US8005035B2 (en) 2001-04-27 2011-08-23 The Directv Group, Inc. Online output multiplexer filter measurement
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US7778365B2 (en) * 2001-04-27 2010-08-17 The Directv Group, Inc. Satellite TWTA on-line non-linearity measurement
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US6900895B2 (en) * 2001-12-06 2005-05-31 Agilent Technologies, Inc. Phase noise compensation in an interferometric system
DE10214407C1 (de) * 2002-03-30 2003-06-18 Klippel Gmbh Anordnung und Verfahren zur Messung, Bewertung und Störungserkennung von Systemen
AU2003280499A1 (en) * 2002-07-01 2004-01-19 The Directv Group, Inc. Improving hierarchical 8psk performance
EP1529347B1 (en) * 2002-07-03 2016-08-24 The Directv Group, Inc. Method and apparatus for layered modulation
US6734734B2 (en) 2002-07-24 2004-05-11 Teledyne Technologies Incorporated Amplifier phase droop and phase noise systems and methods
US7463676B2 (en) * 2002-10-25 2008-12-09 The Directv Group, Inc. On-line phase noise measurement for layered modulation
US7529312B2 (en) * 2002-10-25 2009-05-05 The Directv Group, Inc. Layered modulation for terrestrial ATSC applications
EP1563620B1 (en) * 2002-10-25 2012-12-05 The Directv Group, Inc. Lower complexity layered modulation signal processor
US7474710B2 (en) * 2002-10-25 2009-01-06 The Directv Group, Inc. Amplitude and phase matching for layered modulation reception
US7502429B2 (en) * 2003-10-10 2009-03-10 The Directv Group, Inc. Equalization for traveling wave tube amplifier nonlinearity measurements
EP1564560B1 (en) * 2004-02-13 2008-10-08 Rohde & Schwarz GmbH & Co. KG Method and apparatus for determining the phase distortion of a device under test using a sprectrum analyser
JP3902185B2 (ja) * 2004-03-01 2007-04-04 日本電気株式会社 電源ノイズ測定装置
US7778315B2 (en) * 2004-04-14 2010-08-17 Tektronix, Inc. Measuring instantaneous signal dependent nonlinear distortion in response to varying frequency sinusoidal test signal
JP2005308511A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音を測定する方法および位相雑音測定装置
JP2005308510A (ja) * 2004-04-21 2005-11-04 Agilent Technol Inc 位相雑音測定装置および位相雑音測定システム
JP4761724B2 (ja) * 2004-04-21 2011-08-31 アジレント・テクノロジーズ・インク 位相雑音を測定する方法および位相雑音測定装置
US7885632B2 (en) * 2005-05-20 2011-02-08 Omniphase Research Laboratories, Inc. Automated noise measurement system
US8965727B2 (en) * 2005-05-20 2015-02-24 Omniphase Research Laboratories, Inc. Intelligent low noise design
JP2009510432A (ja) * 2005-09-30 2009-03-12 アジレント・テクノロジーズ・インク 試験装置内で自動レンジ調節を行うためのシステム及び方法
JP2010517016A (ja) * 2007-01-17 2010-05-20 オムニフェイズ・リサーチ・ラボラトリーズ・インコーポレイテッド 自動雑音測定システム
JP4941025B2 (ja) * 2007-03-14 2012-05-30 株式会社豊田中央研究所 Ofdm伝送方式における受信装置のc/n比演算方法及びその機能を有した受信装置
US7656236B2 (en) * 2007-05-15 2010-02-02 Teledyne Wireless, Llc Noise canceling technique for frequency synthesizer
US7919968B2 (en) * 2007-07-09 2011-04-05 Ltx Corporation System and method for distortion analysis
US8155913B2 (en) 2007-11-13 2012-04-10 Oewaves, Inc. Photonic-based cross-correlation homodyne detection with low phase noise
US8179045B2 (en) * 2008-04-22 2012-05-15 Teledyne Wireless, Llc Slow wave structure having offset projections comprised of a metal-dielectric composite stack
CA2772941C (en) * 2009-09-23 2016-04-26 Oewaves, Inc. Measuring phase noise in radio frequency, microwave or millimeter signals based on photonic delay
US8248297B1 (en) 2011-04-11 2012-08-21 Advanced Testing Technologies, Inc. Phase noise measurement system and method
CN102752061B (zh) * 2012-06-14 2014-09-03 北京无线电计量测试研究所 毫米波衰减测量系统锁相放大器参考信号产生装置及方法
US9202660B2 (en) 2013-03-13 2015-12-01 Teledyne Wireless, Llc Asymmetrical slow wave structures to eliminate backward wave oscillations in wideband traveling wave tubes
CN103472319B (zh) * 2013-09-27 2016-08-24 北京无线电计量测试研究所 一种基于查表补偿技术的近载频相位噪声修正装置
US9939479B2 (en) * 2014-04-24 2018-04-10 Keysight Technologies, Inc. Noise figure measurement using narrowband compensation
DE102016110344A1 (de) * 2016-06-03 2017-12-07 Infineon Technologies Ag Rf-empfänger mit eingebauter selbsttestfunktion
DE102018112092A1 (de) * 2018-01-10 2019-07-11 Infineon Technologies Ag Integrierte mehrkanal-hf-schaltung mit phasenerfassung

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US4002970A (en) * 1976-01-26 1977-01-11 The United States Of America As Represented By The Secretary Of The Army Optimum threshold transmission line discriminator
US4144491A (en) * 1977-10-03 1979-03-13 Raytheon Company Frequency measuring apparatus
SU864137A1 (ru) * 1979-12-21 1981-09-15 Пензенский Политехнический Институт Многофункциональный аналогоцифровой преобразователь
SU875292A1 (ru) * 1980-02-08 1981-10-23 Предприятие П/Я Г-4273 Цифровое устройство дл измерени частоты сигнала
SU1352398A2 (ru) * 1986-02-26 1987-11-15 Серпуховское высшее военное командно-инженерное училище ракетных войск им.Ленинского комсомола Фазометр дл исследовани систем автоматического управлени
US4918373A (en) * 1988-03-18 1990-04-17 Hughes Aircraft Company R.F. phase noise test set using fiber optic delay line
US5263185A (en) * 1990-12-10 1993-11-16 Trilithic, Inc. AM distortion measurement method and apparatus usable on active audio carriers
JP3134412B2 (ja) * 1991-09-27 2001-02-13 ソニー株式会社 アンテナレベル測定装置
AUPM587094A0 (en) * 1994-05-25 1994-06-16 Poseidon Scientific Instruments Pty Ltd Microwave loop oscillators

Also Published As

Publication number Publication date
PH12013000151A1 (en) 2014-12-10
AU5458396A (en) 1996-12-19
JPH09119957A (ja) 1997-05-06
KR970002346A (ko) 1997-01-24
EP0747714A3 (en) 1997-03-26
US5608331A (en) 1997-03-04
KR0158791B1 (ko) 1999-03-20
AU681826B2 (en) 1997-09-04
EP0747714A2 (en) 1996-12-11
IL118451A0 (en) 1996-09-12
JP3236779B2 (ja) 2001-12-10

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Legal Events

Date Code Title Description
HK Corrigendum

Free format text: JOURNAL 6/96 P. 1493, PATENT APPLICATION NO. 118345 CORRECT THE NUMBER OF THE FOREIGN APPLICATION TO 484736 P. 1514 PATENT APPLICATION NO. 118145, CORRECT THE APPLICATION NUMBER TO 118451

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