HK95791A - Integrated digital mos semiconductor circuit - Google Patents

Integrated digital mos semiconductor circuit

Info

Publication number
HK95791A
HK95791A HK957/91A HK95791A HK95791A HK 95791 A HK95791 A HK 95791A HK 957/91 A HK957/91 A HK 957/91A HK 95791 A HK95791 A HK 95791A HK 95791 A HK95791 A HK 95791A
Authority
HK
Hong Kong
Prior art keywords
signals
circuit
redundant
integrated digital
input
Prior art date
Application number
HK957/91A
Other languages
English (en)
Inventor
Willibald Dipl-Ing Meyer
Juergen Warwersig
Original Assignee
Siemens Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Ag filed Critical Siemens Ag
Publication of HK95791A publication Critical patent/HK95791A/xx

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31701—Arrangements for setting the Unit Under Test [UUT] in a test mode
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/46—Test trigger logic

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Logic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
HK957/91A 1983-05-20 1991-11-28 Integrated digital mos semiconductor circuit HK95791A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19833318564 DE3318564A1 (de) 1983-05-20 1983-05-20 Integrierte digitale mos-halbleiterschaltung

Publications (1)

Publication Number Publication Date
HK95791A true HK95791A (en) 1991-12-06

Family

ID=6199587

Family Applications (1)

Application Number Title Priority Date Filing Date
HK957/91A HK95791A (en) 1983-05-20 1991-11-28 Integrated digital mos semiconductor circuit

Country Status (6)

Country Link
US (1) US4588907A (xx)
EP (1) EP0127015B1 (xx)
JP (1) JPS59231794A (xx)
AT (1) ATE49078T1 (xx)
DE (2) DE3318564A1 (xx)
HK (1) HK95791A (xx)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3576755D1 (de) * 1984-12-28 1990-04-26 Siemens Ag Integrierter halbleiterspeicher.
JPS61258399A (ja) * 1985-05-11 1986-11-15 Fujitsu Ltd 半導体集積回路装置
JPS6238599A (ja) * 1985-08-13 1987-02-19 Mitsubishi Electric Corp 半導体記憶装置
DE3681666D1 (de) * 1985-09-11 1991-10-31 Siemens Ag Integrierter halbleiterspeicher.
JPS62293598A (ja) * 1986-06-12 1987-12-21 Toshiba Corp 半導体記憶装置
JPS6337269A (ja) * 1986-08-01 1988-02-17 Fujitsu Ltd モ−ド選定回路
EP0263312A3 (en) * 1986-09-08 1989-04-26 Kabushiki Kaisha Toshiba Semiconductor memory device with a self-testing function
US4716302A (en) * 1986-12-22 1987-12-29 Motorola, Inc. Identity circuit for an integrated circuit using a fuse and transistor enabled by a power-on reset signal
EP0327861B1 (de) * 1988-02-10 1993-03-31 Siemens Aktiengesellschaft Redundanzdekoder eines integrierten Halbleiterspeichers

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4071784A (en) * 1976-11-12 1978-01-31 Motorola, Inc. MOS input buffer with hysteresis
NL7704005A (nl) * 1977-04-13 1977-06-30 Philips Nv Geintegreerde schakeling.
US4350906A (en) * 1978-06-23 1982-09-21 Rca Corporation Circuit with dual-purpose terminal
US4318013A (en) * 1979-05-01 1982-03-02 Motorola, Inc. High voltage detection circuit
US4379974A (en) * 1980-09-10 1983-04-12 Mostek Corporation Delay stage for a clock generator
DE3044689C2 (de) * 1980-11-27 1982-08-26 Deutsche Itt Industries Gmbh, 7800 Freiburg Integrierte Schaltung mit nichtflüchtig programmierbaren Halbleiterspeichern
US4446534A (en) * 1980-12-08 1984-05-01 National Semiconductor Corporation Programmable fuse circuit
US4480199A (en) * 1982-03-19 1984-10-30 Fairchild Camera & Instrument Corp. Identification of repaired integrated circuits

Also Published As

Publication number Publication date
JPH0454320B2 (xx) 1992-08-31
EP0127015A2 (de) 1984-12-05
US4588907A (en) 1986-05-13
JPS59231794A (ja) 1984-12-26
EP0127015B1 (de) 1989-12-27
DE3480887D1 (de) 1990-02-01
EP0127015A3 (en) 1987-09-30
DE3318564A1 (de) 1984-11-22
ATE49078T1 (de) 1990-01-15

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)