HK3593A - Low temperature glass composition,paste and method of use - Google Patents

Low temperature glass composition,paste and method of use

Info

Publication number
HK3593A
HK3593A HK35/93A HK3593A HK3593A HK 3593 A HK3593 A HK 3593A HK 35/93 A HK35/93 A HK 35/93A HK 3593 A HK3593 A HK 3593A HK 3593 A HK3593 A HK 3593A
Authority
HK
Hong Kong
Prior art keywords
glass composition
paste
low temperature
temperature glass
tl2o3
Prior art date
Application number
HK35/93A
Other languages
English (en)
Inventor
Raymond L Dietz
Original Assignee
Diemat Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Diemat Inc filed Critical Diemat Inc
Publication of HK3593A publication Critical patent/HK3593A/xx

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/12Silica-free oxide glass compositions
    • C03C3/16Silica-free oxide glass compositions containing phosphorus
    • C03C3/21Silica-free oxide glass compositions containing phosphorus containing titanium, zirconium, vanadium, tungsten or molybdenum
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L24/83Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/02Frit compositions, i.e. in a powdered or comminuted form
    • C03C8/08Frit compositions, i.e. in a powdered or comminuted form containing phosphorus
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C8/00Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
    • C03C8/14Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
    • C03C8/18Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions containing free metals
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    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L24/28Structure, shape, material or disposition of the layer connectors prior to the connecting process
    • H01L24/29Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
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    • H01L2224/29001Core members of the layer connector
    • H01L2224/29099Material
    • H01L2224/291Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H01L2224/29101Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of less than 400°C
    • H01L2224/29111Tin [Sn] as principal constituent
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    • H01L2224/29198Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
    • H01L2224/29199Material of the matrix
    • H01L2224/2929Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
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    • H01L2224/29298Fillers
    • H01L2224/29299Base material
    • H01L2224/293Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
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    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
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    • H01L2224/8319Arrangement of the layer connectors prior to mounting
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    • H01L2224/83805Soldering or alloying involving forming a eutectic alloy at the bonding interface
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    • H01L2224/8389Bonding techniques using an inorganic non metallic glass type adhesive, e.g. solder glass
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    • H01L2924/097Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701Low temperature co-fired ceramic [LTCC]
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    • H01L2924/102Material of the semiconductor or solid state bodies
    • H01L2924/1025Semiconducting materials
    • H01L2924/10251Elemental semiconductors, i.e. Group IV
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    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/156Material
    • H01L2924/15786Material with a principal constituent of the material being a non metallic, non metalloid inorganic material
    • H01L2924/15787Ceramics, e.g. crystalline carbides, nitrides or oxides

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Organic Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Glass Compositions (AREA)
  • Die Bonding (AREA)
HK35/93A 1989-06-21 1993-01-21 Low temperature glass composition,paste and method of use HK3593A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/369,105 US4933030A (en) 1989-06-21 1989-06-21 Low temperature glass composition, paste and method of use

Publications (1)

Publication Number Publication Date
HK3593A true HK3593A (en) 1993-01-29

Family

ID=23454113

Family Applications (1)

Application Number Title Priority Date Filing Date
HK35/93A HK3593A (en) 1989-06-21 1993-01-21 Low temperature glass composition,paste and method of use

Country Status (7)

Country Link
US (1) US4933030A (xx)
EP (1) EP0404564A1 (xx)
KR (1) KR930006319B1 (xx)
CA (1) CA2019413A1 (xx)
GB (1) GB2235446B (xx)
HK (1) HK3593A (xx)
SG (1) SG110192G (xx)

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US5183784A (en) * 1990-02-21 1993-02-02 Johnson Matthey Inc. Silver-glass pastes
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US5334558A (en) * 1992-10-19 1994-08-02 Diemat, Inc. Low temperature glass with improved thermal stress properties and method of use
US5663109A (en) * 1992-10-19 1997-09-02 Quantum Materials, Inc. Low temperature glass paste with high metal to glass ratio
US5336644A (en) * 1993-07-09 1994-08-09 Johnson Matthey Inc. Sealing glass compositions
US5391604A (en) * 1993-07-30 1995-02-21 Diemat, Inc. Adhesive paste containing polymeric resin
US6111005A (en) * 1993-07-30 2000-08-29 Diemat, Inc. Polymeric adhesive paste
US6140402A (en) * 1993-07-30 2000-10-31 Diemat, Inc. Polymeric adhesive paste
US6265471B1 (en) 1997-03-03 2001-07-24 Diemat, Inc. High thermally conductive polymeric adhesive
US6165613A (en) * 1999-03-09 2000-12-26 National Starch And Chemical Investment Holding Corporation Adhesive paste for semiconductors
JP2001351929A (ja) * 2000-06-09 2001-12-21 Hitachi Ltd 半導体装置およびその製造方法
EP1435011A4 (en) * 2001-09-07 2005-04-27 Shipley Co Llc GLASS-LINKED FIBER NETWORK AND METHOD FOR PRODUCING THE SAME
JP3915586B2 (ja) * 2002-04-24 2007-05-16 株式会社デンソー 力学量検出装置の製造方法
JP4858538B2 (ja) * 2006-02-14 2012-01-18 株式会社村田製作所 多層セラミック電子部品、多層セラミック基板、および多層セラミック電子部品の製造方法
US7422707B2 (en) * 2007-01-10 2008-09-09 National Starch And Chemical Investment Holding Corporation Highly conductive composition for wafer coating
CA2696985A1 (en) * 2007-08-20 2009-02-26 Diemat, Inc. Adhesives with thermal conductivity enhanced by mixed silver fillers
TWI652694B (zh) 2014-01-17 2019-03-01 日商納美仕有限公司 導電性糊及使用該導電性糊製造半導體裝置之方法
EP3387653A4 (en) * 2015-12-10 2019-07-17 Sun Chemical Corporation SILVER CONDUCTIVE PASTE COMPOSITION

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GB2235446A (en) 1991-03-06
KR930006319B1 (ko) 1993-07-14
CA2019413A1 (en) 1990-12-21
US4933030A (en) 1990-06-12
SG110192G (en) 1992-12-24
GB9013824D0 (en) 1990-08-15
GB2235446B (en) 1992-09-23
EP0404564A1 (en) 1990-12-27
KR910000554A (ko) 1991-01-29

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