HK1220770A1 - 測試裝置的校準方法 - Google Patents

測試裝置的校準方法

Info

Publication number
HK1220770A1
HK1220770A1 HK16108768.5A HK16108768A HK1220770A1 HK 1220770 A1 HK1220770 A1 HK 1220770A1 HK 16108768 A HK16108768 A HK 16108768A HK 1220770 A1 HK1220770 A1 HK 1220770A1
Authority
HK
Hong Kong
Prior art keywords
calibrating
test setup
setup
test
Prior art date
Application number
HK16108768.5A
Other languages
English (en)
Inventor
．齊茨
．哈爾克
Original Assignee
Rosenberger Hochfrequenztechnik Gmbh & Co Kg
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rosenberger Hochfrequenztechnik Gmbh & Co Kg filed Critical Rosenberger Hochfrequenztechnik Gmbh & Co Kg
Publication of HK1220770A1 publication Critical patent/HK1220770A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2846—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms
    • G01R31/2848—Fault-finding or characterising using hard- or software simulation or using knowledge-based systems, e.g. expert systems, artificial intelligence or interactive algorithms using simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31816—Soft error testing; Soft error rate evaluation; Single event testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/318357—Simulation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Medical Informatics (AREA)
  • Computer Hardware Design (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
HK16108768.5A 2013-08-26 2016-07-21 測試裝置的校準方法 HK1220770A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102013014175.3A DE102013014175B4 (de) 2013-08-26 2013-08-26 Verfahren zur Kalibrierung eines Messaufbaus
PCT/EP2014/002320 WO2015028139A1 (de) 2013-08-26 2014-08-25 Verfahren zur kalibrierung eines messaufbaus

Publications (1)

Publication Number Publication Date
HK1220770A1 true HK1220770A1 (zh) 2017-05-12

Family

ID=51483387

Family Applications (1)

Application Number Title Priority Date Filing Date
HK16108768.5A HK1220770A1 (zh) 2013-08-26 2016-07-21 測試裝置的校準方法

Country Status (10)

Country Link
US (1) US9921287B2 (zh)
EP (1) EP3039443B1 (zh)
JP (1) JP6499177B2 (zh)
KR (1) KR102054874B1 (zh)
CN (1) CN105492920B (zh)
CA (1) CA2921479C (zh)
DE (1) DE102013014175B4 (zh)
HK (1) HK1220770A1 (zh)
TW (1) TWI628444B (zh)
WO (1) WO2015028139A1 (zh)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102012006314A1 (de) * 2012-03-28 2013-10-02 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Zeitbereichsmessverfahren mit Kalibrierung im Frequenzbereich
CN104316785B (zh) * 2014-10-08 2017-03-01 中国电子科技集团公司第四十一研究所 一种天馈线测试仪及延伸器件误差修正方法
CN105044637B (zh) * 2015-05-08 2018-06-12 中国电子科技集团公司第四十一研究所 一种用于校准矢量网络分析仪的校准装置及校准方法
KR101852484B1 (ko) * 2016-10-17 2018-04-26 한국표준과학연구원 전자파 임피던스 측정 장치 및 전자파 임피던스 교정 방법
US11035949B2 (en) 2017-04-10 2021-06-15 The Government of the United States of America, as represented by the Secretary of Homeland Security Methods of obtaining error correction for reflection coefficient measurement systems
US10804605B2 (en) * 2018-01-12 2020-10-13 Bae Systems Information And Electronic Systems Integration Inc. Calibration using quaternionic scattering models
CN110907785A (zh) * 2018-09-14 2020-03-24 天津大学青岛海洋技术研究院 一种基于人工神经网络的s参数去嵌入法
CN109164406B (zh) * 2018-10-31 2021-01-12 中国电子科技集团公司第十三研究所 一种测试夹具的散射参数提取方法
US10890642B1 (en) * 2019-07-31 2021-01-12 Keysight Technologies, Inc. Calibrating impedance measurement device
CN111257813B (zh) * 2020-03-02 2022-07-08 国网江苏省电力有限公司电力科学研究院 一种非接触式电压测量系统现场标定方法及其标定装置
CN111257814A (zh) * 2020-03-05 2020-06-09 西北工业大学 矢量网络分析仪的直通-短路-短路校准方法
CN112051534B (zh) * 2020-08-31 2023-08-25 中电科思仪科技股份有限公司 一种提高微波网络测量与校准精度的外置式装置及方法
CN113504454B (zh) * 2021-06-07 2024-07-26 深圳市时代速信科技有限公司 一种分析仪的校准方法及芯片测试方法和系统
CN113281692B (zh) * 2021-06-30 2022-05-20 广东电网有限责任公司 一种直流互感器校验仪整检装置的误差自校准方法及系统
CN114201072B (zh) * 2021-11-29 2024-07-19 珠海市宏沛函电子技术有限公司 触控芯片的校准方法、装置、设备及存储介质
DE102021214761B3 (de) 2021-12-21 2023-05-25 Volkswagen Aktiengesellschaft Verfahren und Messanordnung zum Bestimmen von elektrischen Größen für ein Verhaltensmodell einer elektrischen oder elektronischen Störquelle
CN116073922B (zh) * 2023-01-17 2024-07-19 中国铁塔股份有限公司 一种耦合器校准方法及装置
CN116593874B (zh) * 2023-07-17 2023-10-13 宁波吉品科技有限公司 芯片测试方法

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5313166A (en) * 1990-11-11 1994-05-17 Rohde & Schwarz Gmbh & Co. Kg Method of calibrating a network analyzer
JP4252113B2 (ja) * 1993-08-30 2009-04-08 ローデ ウント シユバルツ ゲーエムベーハー ウント コンパニー カーゲー ネットワークアナライザー
DE4401068C2 (de) * 1993-08-30 1997-04-10 Rohde & Schwarz Netzwerkanalysator und Verfahren zum Kalibrieren
GB2382662B (en) * 2001-11-29 2003-12-10 Univ Cardiff High frequency circuit analyzer
WO2003087856A1 (fr) * 2002-04-17 2003-10-23 Advantest Corporation Analyseur de reseau, procede d'analyse de reseau, correcteur automatique, procede de correction, programme, et support d'enregistrement
US6917892B2 (en) 2002-09-16 2005-07-12 Anritsu Company Single port single connection VNA calibration apparatus
US6836743B1 (en) * 2002-10-15 2004-12-28 Agilent Technologies, Inc. Compensating for unequal load and source match in vector network analyzer calibration
US6839125B2 (en) * 2003-02-11 2005-01-04 Asml Netherlands B.V. Method for optimizing an illumination source using full resist simulation and process window response metric
US7002335B2 (en) * 2004-05-24 2006-02-21 Agilent Technologies, Inc. Method for measuring a three-port device using a two-port vector network analyzer
US7030625B1 (en) * 2005-01-18 2006-04-18 Agilent Technologies, Inc. Method and apparatus for performing a minimum connection multiport through-reflect-line calibration and measurement
US7924025B2 (en) * 2005-07-25 2011-04-12 University Of Florida Research Foundation, Inc. System, device, and method for embedded S-parameter measurement
DE102006015039A1 (de) * 2006-01-10 2007-07-12 Rohde & Schwarz Gmbh & Co. Kg Verfahren zur Durchführung eines Frequenzwechsels
US7235982B1 (en) * 2006-03-31 2007-06-26 Agilent Technologies, Inc. Re-calculating S-parameter error terms after modification of a calibrated port
US7652484B2 (en) 2007-02-22 2010-01-26 Agilent Technologies, Inc. Self calibration apparatus and methods
JP5213124B2 (ja) * 2009-02-04 2013-06-19 中央電子株式会社 線形マルチポートのシステムパラメータの測定方法及びベクトルネットワークアナライザを用いた測定方法
US20120109566A1 (en) 2010-11-02 2012-05-03 Ate Systems, Inc. Method and apparatus for calibrating a test system for measuring a device under test
KR20130117841A (ko) * 2011-01-31 2013-10-28 가부시키가이샤 무라타 세이사쿠쇼 측정 오차의 보정방법 및 전자부품 특성 측정장치
CN102279376B (zh) * 2011-06-20 2014-06-11 南京航空航天大学 基于10项误差模型的二端口矢量网络分析仪校准方法
DE102012006314A1 (de) * 2012-03-28 2013-10-02 Rosenberger Hochfrequenztechnik Gmbh & Co. Kg Zeitbereichsmessverfahren mit Kalibrierung im Frequenzbereich
CN102981135B (zh) 2012-11-13 2014-12-10 哈尔滨工业大学 非线性矢量网络分析仪双端口校准方法
US10042029B2 (en) * 2013-04-16 2018-08-07 Keysight Technologies, Inc. Calibration of test instrument over extended operating range

Also Published As

Publication number Publication date
DE102013014175B4 (de) 2018-01-11
CA2921479A1 (en) 2015-03-05
TW201514505A (zh) 2015-04-16
CA2921479C (en) 2020-07-07
JP6499177B2 (ja) 2019-04-10
DE102013014175A1 (de) 2015-02-26
US9921287B2 (en) 2018-03-20
EP3039443A1 (de) 2016-07-06
JP2016528515A (ja) 2016-09-15
WO2015028139A1 (de) 2015-03-05
CN105492920A (zh) 2016-04-13
TWI628444B (zh) 2018-07-01
US20160209488A1 (en) 2016-07-21
CN105492920B (zh) 2017-04-26
KR102054874B1 (ko) 2019-12-11
KR20160048112A (ko) 2016-05-03
EP3039443B1 (de) 2017-12-27

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20210831