HK1211343A1 - Method and device for performing an x-ray fluorescence analysis x- - Google Patents

Method and device for performing an x-ray fluorescence analysis x-

Info

Publication number
HK1211343A1
HK1211343A1 HK15112057.8A HK15112057A HK1211343A1 HK 1211343 A1 HK1211343 A1 HK 1211343A1 HK 15112057 A HK15112057 A HK 15112057A HK 1211343 A1 HK1211343 A1 HK 1211343A1
Authority
HK
Hong Kong
Prior art keywords
ray fluorescence
fluorescence analysis
analysis
ray
fluorescence
Prior art date
Application number
HK15112057.8A
Other languages
English (en)
Chinese (zh)
Inventor
Jens Kessler
Original Assignee
Helmut Fischer Gmbh Inst Fr Elektronik Und Mes
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmut Fischer Gmbh Inst Fr Elektronik Und Mes filed Critical Helmut Fischer Gmbh Inst Fr Elektronik Und Mes
Publication of HK1211343A1 publication Critical patent/HK1211343A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/313—Accessories, mechanical or electrical features filters, rotating filter disc
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/61—Specific applications or type of materials thin films, coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/633—Specific applications or type of materials thickness, density, surface weight (unit area)

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
HK15112057.8A 2012-11-29 2015-12-08 Method and device for performing an x-ray fluorescence analysis x- HK1211343A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102012111572 2012-11-29
PCT/EP2013/072001 WO2014082795A1 (de) 2012-11-29 2013-10-22 Verfahren und vorrichtung zur durchführung einer röntgenfluoreszenzanalyse

Publications (1)

Publication Number Publication Date
HK1211343A1 true HK1211343A1 (en) 2016-05-20

Family

ID=49485712

Family Applications (1)

Application Number Title Priority Date Filing Date
HK15112057.8A HK1211343A1 (en) 2012-11-29 2015-12-08 Method and device for performing an x-ray fluorescence analysis x-

Country Status (8)

Country Link
US (1) US9513238B2 (ja)
EP (1) EP2926124B1 (ja)
JP (1) JP6343621B2 (ja)
KR (1) KR102140602B1 (ja)
CN (1) CN104956211B (ja)
HK (1) HK1211343A1 (ja)
RU (1) RU2623689C2 (ja)
WO (1) WO2014082795A1 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9567630B2 (en) 2013-10-23 2017-02-14 Genia Technologies, Inc. Methods for forming lipid bilayers on biochips
JP6831006B2 (ja) 2016-05-10 2021-02-17 譜光儀器股▲ふん▼有限公司Ａｃｒｏｍａｓｓ Ｔｅｃｈｎｏｌｏｇｉｅｓ，Ｉｎｃ． 荷電粒子を検出するためのデバイス及び、それを組み込んだ質量分析用の装置
DE102017003517A1 (de) * 2017-04-11 2018-10-11 Universität Hamburg Verfahren und Messvorrichtung zur Röntgenfluoreszenz-Messung
CN112638261A (zh) * 2018-09-04 2021-04-09 斯格瑞公司 利用滤波的x射线荧光的系统和方法
US11079222B2 (en) 2019-01-30 2021-08-03 Ndc Technologies Inc. Radiation-based thickness gauge
CN109975342A (zh) * 2019-04-03 2019-07-05 成都理工大学 一种x射线管的光谱稳定性校正方法及装置

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JPS5786030A (en) * 1980-11-17 1982-05-28 Idemitsu Kosan Co Ltd Method and apparatus for analysis of fluorescence x-rays
US4393512A (en) * 1981-07-07 1983-07-12 The United States Of America As Represented By The United States Department Of Energy Hyper-filter-fluorescer spectrometer for x-rays above 120 keV
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US5497008A (en) * 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
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DE4407278A1 (de) * 1994-03-04 1995-09-07 Siemens Ag Röntgen-Analysegerät
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US20050067581A1 (en) * 2001-12-20 2005-03-31 Koninklijke Philips Electronics N.V Method of determining the background corrected counts of radiation quanta in an x-ray energy spectrum
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KR100862332B1 (ko) * 2007-03-28 2008-10-23 주식회사 아이에스피 엑스선 형광분석장치 및 그 장치를 이용한 엑스선 형광분석방법
EP1978354A1 (en) * 2007-04-05 2008-10-08 Panalytical B.V. Wavelength dispersive X-ray Fluorescence Apparatus with energy dispersive detector in the form of a silicon drift detector to improve background supression
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Also Published As

Publication number Publication date
WO2014082795A1 (de) 2014-06-05
JP6343621B2 (ja) 2018-06-13
RU2015124496A (ru) 2017-01-11
US20150300966A1 (en) 2015-10-22
KR102140602B1 (ko) 2020-08-05
CN104956211B (zh) 2019-01-11
KR20150088833A (ko) 2015-08-03
EP2926124B1 (de) 2019-01-09
US9513238B2 (en) 2016-12-06
CN104956211A (zh) 2015-09-30
RU2623689C2 (ru) 2017-06-28
EP2926124A1 (de) 2015-10-07
JP2015535610A (ja) 2015-12-14

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20231024