HK1205354A1 - 塗層從金屬層的選擇性去除及其在太陽能電池上的應用 - Google Patents
塗層從金屬層的選擇性去除及其在太陽能電池上的應用Info
- Publication number
- HK1205354A1 HK1205354A1 HK15105440.8A HK15105440A HK1205354A1 HK 1205354 A1 HK1205354 A1 HK 1205354A1 HK 15105440 A HK15105440 A HK 15105440A HK 1205354 A1 HK1205354 A1 HK 1205354A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- coating
- metal layer
- solar cell
- selective removal
- cell applications
- Prior art date
Links
- 239000011248 coating agent Substances 0.000 title 1
- 238000000576 coating method Methods 0.000 title 1
- 239000002184 metal Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02167—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/02168—Coatings for devices characterised by at least one potential jump barrier or surface barrier for solar cells the coatings being antireflective or having enhancing optical properties for the solar cells
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
- B23K26/40—Removing material taking account of the properties of the material involved
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76886—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances
- H01L21/76892—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern
- H01L21/76894—Modifying permanently or temporarily the pattern or the conductivity of conductive members, e.g. formation of alloys, reduction of contact resistances modifying the pattern using a laser, e.g. laser cutting, laser direct writing, laser repair
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022433—Particular geometry of the grid contacts
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022441—Electrode arrangements specially adapted for back-contact solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
- H01L31/1868—Passivation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1884—Manufacture of transparent electrodes, e.g. TCO, ITO
- H01L31/1888—Manufacture of transparent electrodes, e.g. TCO, ITO methods for etching transparent electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1884—Manufacture of transparent electrodes, e.g. TCO, ITO
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/52—PV systems with concentrators
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Development (AREA)
- Electromagnetism (AREA)
- Sustainable Energy (AREA)
- Manufacturing & Machinery (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Photovoltaic Devices (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201261589459P | 2012-01-23 | 2012-01-23 | |
PCT/US2013/022674 WO2013112533A1 (en) | 2012-01-23 | 2013-01-23 | Selective removal of a coating from a metal layer, and solar cell applications thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1205354A1 true HK1205354A1 (zh) | 2015-12-11 |
Family
ID=48873846
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK15105440.8A HK1205354A1 (zh) | 2012-01-23 | 2015-06-08 | 塗層從金屬層的選擇性去除及其在太陽能電池上的應用 |
Country Status (8)
Country | Link |
---|---|
US (1) | US9634179B2 (zh) |
EP (1) | EP2807679A4 (zh) |
JP (1) | JP2015510692A (zh) |
KR (1) | KR20140126313A (zh) |
CN (1) | CN104205360B (zh) |
HK (1) | HK1205354A1 (zh) |
TW (1) | TWI615986B (zh) |
WO (1) | WO2013112533A1 (zh) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2011119910A2 (en) | 2010-03-26 | 2011-09-29 | Tetrasun, Inc. | Shielded electrical contact and doping through a passivating dielectric layer in a high-efficiency crystalline solar cell, including structure and methods of manufacture |
US10118712B2 (en) * | 2011-08-17 | 2018-11-06 | The Boeing Company | Electrical conductor pathway system and method of making the same |
WO2013185054A1 (en) * | 2012-06-08 | 2013-12-12 | Tetrasun, Inc. | Selective and/or faster removal of a coating from an underlying layer, and solar cell applications thereof |
US20150072515A1 (en) * | 2013-09-09 | 2015-03-12 | Rajendra C. Dias | Laser ablation method and recipe for sacrificial material patterning and removal |
US20150236175A1 (en) * | 2013-12-02 | 2015-08-20 | Solexel, Inc. | Amorphous silicon passivated contacts for back contact back junction solar cells |
KR101867855B1 (ko) * | 2014-03-17 | 2018-06-15 | 엘지전자 주식회사 | 태양 전지 |
US9673341B2 (en) | 2015-05-08 | 2017-06-06 | Tetrasun, Inc. | Photovoltaic devices with fine-line metallization and methods for manufacture |
JP6405285B2 (ja) * | 2015-05-27 | 2018-10-17 | 信越化学工業株式会社 | 太陽電池の製造方法 |
CN105537772A (zh) * | 2016-02-03 | 2016-05-04 | 中国科学院合肥物质科学研究院 | 一种激光直写氧化铝基板材料形成图形化铝导电层的方法 |
CN106312300A (zh) * | 2016-09-28 | 2017-01-11 | 中国科学院半导体研究所 | 一种激光对铝化物基板金属化的方法及铝化物基板 |
CN108055016A (zh) * | 2017-12-29 | 2018-05-18 | 应达利电子股份有限公司 | 具有低等效串联电阻的小型石英晶片的制作方法 |
CN108512518A (zh) * | 2018-03-28 | 2018-09-07 | 应达利电子股份有限公司 | 一种低等效串联电阻小型晶片制作方法及系统 |
CN112171068B (zh) * | 2020-08-28 | 2022-03-22 | 江苏大学 | 一种高效率大面积去除厚涂层的方法及其应用 |
CN112687755B (zh) * | 2020-12-28 | 2023-03-28 | 正泰新能科技有限公司 | 一种N型TopCOn太阳能电池的背面金属电极及制备方法和电池 |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04259285A (ja) * | 1991-02-13 | 1992-09-14 | Nec Corp | 配線基板の製造方法 |
US5265114C1 (en) * | 1992-09-10 | 2001-08-21 | Electro Scient Ind Inc | System and method for selectively laser processing a target structure of one or more materials of a multimaterial multilayer device |
JP2755223B2 (ja) * | 1995-09-20 | 1998-05-20 | 日本電気株式会社 | バイアホール形成方法および装置 |
JP2000312016A (ja) * | 1999-04-27 | 2000-11-07 | Kyocera Corp | 太陽電池の製造方法 |
US6524880B2 (en) * | 2001-04-23 | 2003-02-25 | Samsung Sdi Co., Ltd. | Solar cell and method for fabricating the same |
JP2004165068A (ja) * | 2002-11-14 | 2004-06-10 | Sanyo Electric Co Ltd | 有機電界発光パネルの製造方法 |
US20080105303A1 (en) * | 2003-01-03 | 2008-05-08 | Bp Corporation North America Inc. | Method and Manufacturing Thin Film Photovoltaic Modules |
US7405033B2 (en) | 2003-01-17 | 2008-07-29 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing resist pattern and method for manufacturing semiconductor device |
KR20060100108A (ko) | 2005-03-16 | 2006-09-20 | 한국과학기술원 | 집적형 박막 태양전지용 투명전극의 가공 방법과 그 구조,그 투명전극이 형성된 투명기판 |
JP4981020B2 (ja) * | 2005-03-16 | 2012-07-18 | コリア アドバンスト インスティテュート オブ サイエンス アンド テクノロジー | 集積型薄膜太陽電池、その製造方法と集積型薄膜太陽電池用透明電極の加工方法、その構造及びその透明電極が形成された透明基板 |
JP4449857B2 (ja) * | 2005-08-17 | 2010-04-14 | ソニー株式会社 | 表示装置の製造方法 |
DE102006040352B3 (de) | 2006-08-29 | 2007-10-18 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zum Aufbringen von elektrischen Kontakten auf halbleitende Substrate, halbleitendes Substrat und Verwendung des Verfahrens |
GB2451497A (en) * | 2007-07-31 | 2009-02-04 | Renewable Energy Corp Asa | Contact for solar cell |
JP4703687B2 (ja) | 2008-05-20 | 2011-06-15 | 三菱電機株式会社 | 太陽電池セルの製造方法および太陽電池モジュールの製造方法 |
KR101498619B1 (ko) * | 2009-06-05 | 2015-03-05 | 엘지전자 주식회사 | 태양전지의 전극 형성 방법 및 이를 이용한 태양전지 |
JP2011114194A (ja) * | 2009-11-27 | 2011-06-09 | Alps Electric Co Ltd | 透明電極パターンの形成方法 |
KR101108720B1 (ko) * | 2010-06-21 | 2012-02-29 | 삼성전기주식회사 | 도전성 전극 패턴의 형성 방법 및 이를 포함하는 태양전지의 제조 방법 |
US8975177B2 (en) | 2013-03-14 | 2015-03-10 | Intel Corporation | Laser resist removal for integrated circuit (IC) packaging |
-
2013
- 2013-01-23 KR KR1020147021542A patent/KR20140126313A/ko not_active Application Discontinuation
- 2013-01-23 TW TW102102428A patent/TWI615986B/zh not_active IP Right Cessation
- 2013-01-23 JP JP2014554790A patent/JP2015510692A/ja active Pending
- 2013-01-23 US US14/373,938 patent/US9634179B2/en not_active Expired - Fee Related
- 2013-01-23 WO PCT/US2013/022674 patent/WO2013112533A1/en active Application Filing
- 2013-01-23 EP EP13741480.1A patent/EP2807679A4/en not_active Withdrawn
- 2013-01-23 CN CN201380008602.5A patent/CN104205360B/zh not_active Expired - Fee Related
-
2015
- 2015-06-08 HK HK15105440.8A patent/HK1205354A1/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
TW201347203A (zh) | 2013-11-16 |
TWI615986B (zh) | 2018-02-21 |
US9634179B2 (en) | 2017-04-25 |
CN104205360B (zh) | 2017-02-22 |
US20150027528A1 (en) | 2015-01-29 |
JP2015510692A (ja) | 2015-04-09 |
KR20140126313A (ko) | 2014-10-30 |
WO2013112533A1 (en) | 2013-08-01 |
EP2807679A4 (en) | 2015-08-05 |
EP2807679A1 (en) | 2014-12-03 |
CN104205360A (zh) | 2014-12-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20220125 |