HK1194150A1 - 曝光裝置、液體保持方法、及元件製造方法 - Google Patents

曝光裝置、液體保持方法、及元件製造方法

Info

Publication number
HK1194150A1
HK1194150A1 HK14107312.0A HK14107312A HK1194150A1 HK 1194150 A1 HK1194150 A1 HK 1194150A1 HK 14107312 A HK14107312 A HK 14107312A HK 1194150 A1 HK1194150 A1 HK 1194150A1
Authority
HK
Hong Kong
Prior art keywords
exposure apparatus
device manufacturing
liquid holding
holding method
liquid
Prior art date
Application number
HK14107312.0A
Other languages
English (en)
Inventor
長坂博之
Original Assignee
株式會社尼康
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式會社尼康 filed Critical 株式會社尼康
Publication of HK1194150A1 publication Critical patent/HK1194150A1/zh

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
HK14107312.0A 2011-08-25 2014-07-17 曝光裝置、液體保持方法、及元件製造方法 HK1194150A1 (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201161527333P 2011-08-25 2011-08-25
JP2012153959 2012-07-09
US13/593,079 US9256137B2 (en) 2011-08-25 2012-08-23 Exposure apparatus, liquid holding method, and device manufacturing method
PCT/JP2012/072086 WO2013027866A1 (en) 2011-08-25 2012-08-24 Exposure apparatus and method of confining a liquid

Publications (1)

Publication Number Publication Date
HK1194150A1 true HK1194150A1 (zh) 2014-10-10

Family

ID=47746594

Family Applications (2)

Application Number Title Priority Date Filing Date
HK14107312.0A HK1194150A1 (zh) 2011-08-25 2014-07-17 曝光裝置、液體保持方法、及元件製造方法
HK14111693.1A HK1198212A1 (zh) 2011-08-25 2014-11-19 曝光裝置和限制液體的方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
HK14111693.1A HK1198212A1 (zh) 2011-08-25 2014-11-19 曝光裝置和限制液體的方法

Country Status (8)

Country Link
US (2) US9256137B2 (zh)
EP (1) EP2748679A1 (zh)
JP (2) JP5949923B2 (zh)
KR (1) KR20140056284A (zh)
CN (1) CN103748519B (zh)
HK (2) HK1194150A1 (zh)
TW (1) TW201312293A (zh)
WO (1) WO2013027866A1 (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL2005655A (en) 2009-12-09 2011-06-14 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
JP6212884B2 (ja) * 2013-03-15 2017-10-18 株式会社ニコン 露光装置、露光方法、及びデバイス製造方法
CN110088686B (zh) * 2016-12-14 2021-11-16 Asml荷兰有限公司 光刻设备及器件制造方法

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1244018C (zh) 1996-11-28 2006-03-01 株式会社尼康 曝光方法和曝光装置
US6262796B1 (en) 1997-03-10 2001-07-17 Asm Lithography B.V. Positioning device having two object holders
US6897963B1 (en) 1997-12-18 2005-05-24 Nikon Corporation Stage device and exposure apparatus
US6208407B1 (en) 1997-12-22 2001-03-27 Asm Lithography B.V. Method and apparatus for repetitively projecting a mask pattern on a substrate, using a time-saving height measurement
WO2001035168A1 (en) 1999-11-10 2001-05-17 Massachusetts Institute Of Technology Interference lithography utilizing phase-locked scanning beams
US6452292B1 (en) 2000-06-26 2002-09-17 Nikon Corporation Planar motor with linear coil arrays
JP4714403B2 (ja) 2001-02-27 2011-06-29 エーエスエムエル ユーエス,インコーポレイテッド デュアルレチクルイメージを露光する方法および装置
TW529172B (en) 2001-07-24 2003-04-21 Asml Netherlands Bv Imaging apparatus
CN100462844C (zh) 2002-08-23 2009-02-18 株式会社尼康 投影光学系统、微影方法、曝光装置及使用此装置的方法
US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
KR101264936B1 (ko) * 2004-06-04 2013-05-15 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
CN103558737A (zh) 2004-06-09 2014-02-05 尼康股份有限公司 基板保持装置、具备其之曝光装置、方法
KR101485650B1 (ko) 2004-06-10 2015-01-23 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
US7701550B2 (en) * 2004-08-19 2010-04-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7522261B2 (en) * 2004-09-24 2009-04-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
KR101171808B1 (ko) * 2004-12-02 2012-08-13 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
TWI424260B (zh) 2005-03-18 2014-01-21 尼康股份有限公司 A board member, a substrate holding device, an exposure apparatus and an exposure method, and a device manufacturing method
US20070132976A1 (en) 2005-03-31 2007-06-14 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
JP4802604B2 (ja) 2005-08-17 2011-10-26 株式会社ニコン 露光装置、露光方法、及びデバイス製造方法
JP2007142366A (ja) * 2005-10-18 2007-06-07 Canon Inc 露光装置及びデバイス製造方法
EP2023378B1 (en) * 2006-05-10 2013-03-13 Nikon Corporation Exposure apparatus and device manufacturing method
JP2008034801A (ja) * 2006-06-30 2008-02-14 Canon Inc 露光装置およびデバイス製造方法
US8634053B2 (en) * 2006-12-07 2014-01-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2008147577A (ja) 2006-12-13 2008-06-26 Canon Inc 露光装置及びデバイス製造方法
US8004651B2 (en) * 2007-01-23 2011-08-23 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US8134685B2 (en) * 2007-03-23 2012-03-13 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US7924404B2 (en) 2007-08-16 2011-04-12 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN101408731B (zh) * 2008-11-04 2010-08-18 浙江大学 一种用于浸没式光刻机的浸没控制装置
US20100196832A1 (en) 2009-01-30 2010-08-05 Nikon Corporation Exposure apparatus, exposing method, liquid immersion member and device fabricating method
US20110134400A1 (en) * 2009-12-04 2011-06-09 Nikon Corporation Exposure apparatus, liquid immersion member, and device manufacturing method
US20110222031A1 (en) * 2010-03-12 2011-09-15 Nikon Corporation Liquid immersion member, exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
US20120162619A1 (en) * 2010-12-27 2012-06-28 Nikon Corporation Liquid immersion member, immersion exposure apparatus, exposing method, device fabricating method, program, and storage medium
US20120188521A1 (en) 2010-12-27 2012-07-26 Nikon Corporation Cleaning method, liquid immersion member, immersion exposure apparatus, device fabricating method, program and storage medium
US9823580B2 (en) * 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9651873B2 (en) * 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium

Also Published As

Publication number Publication date
JP5949923B2 (ja) 2016-07-13
CN103748519B (zh) 2016-04-20
JP2016157148A (ja) 2016-09-01
US20130059253A1 (en) 2013-03-07
WO2013027866A1 (en) 2013-02-28
KR20140056284A (ko) 2014-05-09
TW201312293A (zh) 2013-03-16
US9256137B2 (en) 2016-02-09
US20160124320A1 (en) 2016-05-05
HK1198212A1 (zh) 2015-03-13
JP2014524668A (ja) 2014-09-22
EP2748679A1 (en) 2014-07-02
CN103748519A (zh) 2014-04-23

Similar Documents

Publication Publication Date Title
HK1224024A1 (zh) 曝光裝置和器件製造方法
HK1256151A1 (zh) 曝光裝置及曝光方法、以及器件製造方法
HK1216357A1 (zh) 搬送系統、曝光裝置、搬送方法、曝光方法及器件製造方法、以及吸引裝置
IL230903A0 (en) Method and metrological device and method for manufacturing a device
IL220933A (en) Lithographic system and method for device production
IL228652A0 (en) Lithographic system, device for programming patterns and lithographic method
SG11201405431TA (en) Method and apparatus for manufacturing semiconductor device
EP2785284A4 (en) SUPPORT DEVICE AND METHOD OF USE
IL225971A0 (en) Metrological method and system and method for producing a standard
IL236753A0 (en) Test device and method, lithographic system and device manufacturing method
EP2613340A4 (en) DEVICE MANUFACTURING APPARATUS, AND ASSOCIATED METHOD
IL242526B (en) Inspection method and apparatus, substrates for use therein and device manufacturing method
IL232700A0 (en) Inspection method and facility, and lithography facility accordingly
IL210832A0 (en) Lithographic apparatus and device manufacturing method
EP2704220A4 (en) METHOD AND DEVICE FOR PRODUCING AN OPTICAL DEVICE
GB2496611B (en) Apparatus and method for wireless device
IL233540A0 (en) Device, lithographic device, method for directing radiation and method for manufacturing the device
EP2719223A4 (en) METHOD AND DEVICE FOR ADAPTING FLOW
IL230667A0 (en) Lithography device and device manufacturing method
IL232760A0 (en) A device and device for lithography and a method for their production
HK1181823A1 (zh) 成膜方法及成膜裝置
EP2654242A4 (en) DEVICE MANAGEMENT METHOD AND DEVICE
HK1221778A1 (zh) 曝光裝置及曝光方法
EP2695671A4 (en) RETENTION DEVICE FOR SUBSTANCE FOR RETENTION AND RETENTION METHOD
IL210697A0 (en) Lithographic apparatus and device manufacturing method

Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20230826