HK1131663A1 - Hf measurement system, method for the calibration thereof, and method for determining scattering parameters with this hf measurement system - Google Patents
Hf measurement system, method for the calibration thereof, and method for determining scattering parameters with this hf measurement systemInfo
- Publication number
- HK1131663A1 HK1131663A1 HK09111550.0A HK09111550A HK1131663A1 HK 1131663 A1 HK1131663 A1 HK 1131663A1 HK 09111550 A HK09111550 A HK 09111550A HK 1131663 A1 HK1131663 A1 HK 1131663A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- measurement system
- positions
- scattering parameters
- calibration
- high frequency
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
- G01R27/32—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Radar Systems Or Details Thereof (AREA)
- Cash Registers Or Receiving Machines (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102006030630A DE102006030630B3 (de) | 2006-07-03 | 2006-07-03 | HF-Messvorrichtung, Verfahren zu deren Kalibrierung sowie Verfahren zum Bestimmen von Streuparametern mit dieser HF-Messvorrichtung |
PCT/EP2007/005393 WO2008003399A1 (de) | 2006-07-03 | 2007-06-19 | Hf-messvorrichtung, verfahren zu deren kalibrierung sowie verfahren zum bestimmen von streuparametern mit dieser hf-messvorrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1131663A1 true HK1131663A1 (en) | 2010-01-29 |
Family
ID=38508848
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK09111550.0A HK1131663A1 (en) | 2006-07-03 | 2009-12-09 | Hf measurement system, method for the calibration thereof, and method for determining scattering parameters with this hf measurement system |
Country Status (9)
Country | Link |
---|---|
US (1) | US8452565B2 (xx) |
EP (1) | EP2035843B1 (xx) |
JP (1) | JP5612306B2 (xx) |
CN (1) | CN101479614B (xx) |
AT (1) | ATE496309T1 (xx) |
CA (1) | CA2658101C (xx) |
DE (2) | DE102006030630B3 (xx) |
HK (1) | HK1131663A1 (xx) |
WO (1) | WO2008003399A1 (xx) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202008009469U1 (de) * | 2008-07-15 | 2008-09-11 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Messsonde |
CN101782637B (zh) * | 2010-03-16 | 2013-04-03 | 南京航空航天大学 | 基于电磁兼容分析与应用的射频电流探头特性校准方法 |
TWI463146B (zh) * | 2010-11-10 | 2014-12-01 | Univ Yuan Ze | Radiofrequency Scattering Parameter Measurement and Correction Method |
US8559885B2 (en) * | 2011-04-14 | 2013-10-15 | Accel Telecom Ltd. | System and method for measurement of parameters of radio-frequency transmission devices |
DE102012006314A1 (de) * | 2012-03-28 | 2013-10-02 | Rosenberger Hochfrequenztechnik Gmbh & Co. Kg | Zeitbereichsmessverfahren mit Kalibrierung im Frequenzbereich |
CN103048636B (zh) * | 2012-12-21 | 2015-07-08 | 深圳深爱半导体股份有限公司 | 晶体管筛选仪校准装置 |
CN104977556B (zh) * | 2015-06-30 | 2017-09-12 | 电子科技大学 | 基于死区时间测量的平均波形捕获率测试方法 |
CN105044642B (zh) * | 2015-06-30 | 2017-10-31 | 电子科技大学 | 基于随机信号的平均波形捕获率测试方法 |
CN105093157B (zh) * | 2015-09-08 | 2018-02-09 | 国家电网公司 | 基于iec61850采样值的参数算法的测试方法 |
CN105301367A (zh) * | 2015-11-27 | 2016-02-03 | 南方电网科学研究院有限责任公司 | 二端口电力设备传输参数获取方法及系统 |
EP3495808A1 (en) | 2017-12-05 | 2019-06-12 | Airbus Helicopters | A probe for non-intrusively detecting imperfections in a test object |
EP3495809A1 (en) | 2017-12-05 | 2019-06-12 | Airbus Helicopters | A method for non-intrusively detecting imperfections in a test object |
CN111579559B (zh) * | 2020-04-24 | 2023-05-12 | 北京现代汽车有限公司 | 电极头检测机的检测工装 |
KR102592534B1 (ko) * | 2021-06-30 | 2023-10-24 | 한국표준과학연구원 | 산란계수 측정오차 보정 방법 |
EP4170332A1 (en) | 2021-10-20 | 2023-04-26 | Airbus Helicopters | Apparatus and method for non-intrusively detecting imperfections in a test object |
CN116593874B (zh) * | 2023-07-17 | 2023-10-13 | 宁波吉品科技有限公司 | 芯片测试方法 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE4435559A1 (de) * | 1994-10-05 | 1996-04-11 | Holger Heuermann | Verfahren zur Durchführung elektrischer Präzisionsmessungen mit Selbstkontrolle |
US6529844B1 (en) * | 1998-09-02 | 2003-03-04 | Anritsu Company | Vector network measurement system |
US6300775B1 (en) * | 1999-02-02 | 2001-10-09 | Com Dev Limited | Scattering parameter calibration system and method |
US20030115008A1 (en) * | 2001-12-18 | 2003-06-19 | Yutaka Doi | Test fixture with adjustable pitch for network measurement |
JP3540797B2 (ja) * | 2002-01-18 | 2004-07-07 | 利幸 矢加部 | 7ポート型コリレータとその校正方法および7ポート型コリレータを用いたベクトル・ネットワーク・アナライザ装置 |
US6701265B2 (en) * | 2002-03-05 | 2004-03-02 | Tektronix, Inc. | Calibration for vector network analyzer |
DE10251551A1 (de) * | 2002-11-05 | 2004-05-19 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren zum Messen der Streuparameter eines Mehrtor-Meßobjektes mittels eines Mehrtor-Netzwerkanalysators mit nichtsinusförmigen Meßsignalen |
US6882160B2 (en) * | 2003-06-12 | 2005-04-19 | Anritsu Company | Methods and computer program products for full N-port vector network analyzer calibrations |
US7362106B2 (en) * | 2005-06-29 | 2008-04-22 | Agilent Technologies, Inc. | Methods and apparatus for non-contact testing and diagnosing of open connections on non-probed nodes |
US7235982B1 (en) * | 2006-03-31 | 2007-06-26 | Agilent Technologies, Inc. | Re-calculating S-parameter error terms after modification of a calibrated port |
-
2006
- 2006-07-03 DE DE102006030630A patent/DE102006030630B3/de active Active
-
2007
- 2007-06-19 EP EP07726079A patent/EP2035843B1/de active Active
- 2007-06-19 WO PCT/EP2007/005393 patent/WO2008003399A1/de active Application Filing
- 2007-06-19 JP JP2009516944A patent/JP5612306B2/ja active Active
- 2007-06-19 AT AT07726079T patent/ATE496309T1/de active
- 2007-06-19 CN CN2007800239646A patent/CN101479614B/zh active Active
- 2007-06-19 CA CA2658101A patent/CA2658101C/en active Active
- 2007-06-19 US US12/307,075 patent/US8452565B2/en active Active
- 2007-06-19 DE DE502007006317T patent/DE502007006317D1/de active Active
-
2009
- 2009-12-09 HK HK09111550.0A patent/HK1131663A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE102006030630B3 (de) | 2007-10-25 |
JP5612306B2 (ja) | 2014-10-22 |
US8452565B2 (en) | 2013-05-28 |
EP2035843A1 (de) | 2009-03-18 |
JP2009541753A (ja) | 2009-11-26 |
WO2008003399A1 (de) | 2008-01-10 |
EP2035843B1 (de) | 2011-01-19 |
CA2658101A1 (en) | 2008-01-10 |
CN101479614A (zh) | 2009-07-08 |
DE502007006317D1 (de) | 2011-03-03 |
ATE496309T1 (de) | 2011-02-15 |
CN101479614B (zh) | 2011-10-26 |
US20090319217A1 (en) | 2009-12-24 |
CA2658101C (en) | 2013-01-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20200623 |