HK1069207A1 - Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems - Google Patents

Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems

Info

Publication number
HK1069207A1
HK1069207A1 HK05101723A HK05101723A HK1069207A1 HK 1069207 A1 HK1069207 A1 HK 1069207A1 HK 05101723 A HK05101723 A HK 05101723A HK 05101723 A HK05101723 A HK 05101723A HK 1069207 A1 HK1069207 A1 HK 1069207A1
Authority
HK
Hong Kong
Prior art keywords
controller
embedded
test
external
bist
Prior art date
Application number
HK05101723A
Other languages
English (en)
Inventor
Ricchetti Michael
Clark Christopher
Original Assignee
Intellitech Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intellitech Corp filed Critical Intellitech Corp
Publication of HK1069207A1 publication Critical patent/HK1069207A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318555—Control logic
HK05101723A 2001-12-04 2005-03-01 Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems HK1069207A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US33658601P 2001-12-04 2001-12-04
US10/142,556 US6957371B2 (en) 2001-12-04 2002-05-10 Method and apparatus for embedded built-in self-test (BIST) of electronic circuits and systems
PCT/US2002/036246 WO2003048794A1 (en) 2001-12-04 2002-11-12 Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems

Publications (1)

Publication Number Publication Date
HK1069207A1 true HK1069207A1 (en) 2005-05-13

Family

ID=26840211

Family Applications (1)

Application Number Title Priority Date Filing Date
HK05101723A HK1069207A1 (en) 2001-12-04 2005-03-01 Method and apparatus for embedded built-in self-test (bist) of electronic circuits and systems

Country Status (9)

Country Link
US (2) US6957371B2 (zh)
EP (1) EP1451599B1 (zh)
AT (1) ATE399331T1 (zh)
AU (1) AU2002352644A1 (zh)
CA (1) CA2468860C (zh)
DE (1) DE60227279D1 (zh)
HK (1) HK1069207A1 (zh)
TW (1) TWI230329B (zh)
WO (1) WO2003048794A1 (zh)

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Also Published As

Publication number Publication date
US20050210352A1 (en) 2005-09-22
EP1451599B1 (en) 2008-06-25
US20030106004A1 (en) 2003-06-05
AU2002352644A1 (en) 2003-06-17
WO2003048794A1 (en) 2003-06-12
US6957371B2 (en) 2005-10-18
DE60227279D1 (de) 2008-08-07
ATE399331T1 (de) 2008-07-15
EP1451599A1 (en) 2004-09-01
TWI230329B (en) 2005-04-01
TW200301420A (en) 2003-07-01
CA2468860A1 (en) 2003-06-12
US7467342B2 (en) 2008-12-16
CA2468860C (en) 2009-05-19
EP1451599A4 (en) 2005-05-18

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Legal Events

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PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20111112