HK1066857A1 - Method and system for inspecting optical devices - Google Patents

Method and system for inspecting optical devices

Info

Publication number
HK1066857A1
HK1066857A1 HK04109934A HK04109934A HK1066857A1 HK 1066857 A1 HK1066857 A1 HK 1066857A1 HK 04109934 A HK04109934 A HK 04109934A HK 04109934 A HK04109934 A HK 04109934A HK 1066857 A1 HK1066857 A1 HK 1066857A1
Authority
HK
Hong Kong
Prior art keywords
optical devices
inspecting optical
inspecting
devices
optical
Prior art date
Application number
HK04109934A
Other languages
English (en)
Inventor
Anthony J Dispenza
Michael F Widman
Kevin H Giles
James Ebel
Original Assignee
Johnson & Johnson Vision Care
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Johnson & Johnson Vision Care filed Critical Johnson & Johnson Vision Care
Publication of HK1066857A1 publication Critical patent/HK1066857A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G01M11/0214—Details of devices holding the object to be tested

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK04109934A 2002-02-21 2004-12-14 Method and system for inspecting optical devices HK1066857A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US35907402P 2002-02-21 2002-02-21
PCT/US2003/005356 WO2003073061A2 (en) 2002-02-21 2003-02-21 Method and system for inspecting optical devices

Publications (1)

Publication Number Publication Date
HK1066857A1 true HK1066857A1 (en) 2005-04-01

Family

ID=27766039

Family Applications (2)

Application Number Title Priority Date Filing Date
HK04109934A HK1066857A1 (en) 2002-02-21 2004-12-14 Method and system for inspecting optical devices
HK05102609.4A HK1070131A1 (en) 2002-02-21 2005-03-29 Method and system for inspecting optical devices

Family Applications After (1)

Application Number Title Priority Date Filing Date
HK05102609.4A HK1070131A1 (en) 2002-02-21 2005-03-29 Method and system for inspecting optical devices

Country Status (13)

Country Link
US (1) US6882411B2 (zh)
EP (1) EP1476738B1 (zh)
JP (1) JP2005518537A (zh)
KR (1) KR100972945B1 (zh)
CN (3) CN1279341C (zh)
AU (2) AU2003225591B2 (zh)
BR (1) BRPI0303222B1 (zh)
CA (1) CA2444517C (zh)
DE (1) DE60323207D1 (zh)
HK (2) HK1066857A1 (zh)
SG (1) SG135070A1 (zh)
TW (1) TWI294031B (zh)
WO (1) WO2003073061A2 (zh)

Families Citing this family (28)

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Publication number Priority date Publication date Assignee Title
DE60130057T2 (de) * 2000-05-01 2008-05-15 Fujifilm Corp. Vorrichtung zur Abgabe eines Fluids
US20060066846A1 (en) * 2004-09-29 2006-03-30 Telco Testing Systems, Llc Apparatus and method for detection of contaminant particles or component defects
US20060244954A1 (en) * 2005-03-29 2006-11-02 Daley Wayne D System and method for inspecting packaging quality of a packaged food product
US20060232766A1 (en) * 2005-03-31 2006-10-19 Watterson Robert J Jr Methods of inspecting ophthalmic lenses
US8144330B2 (en) * 2006-09-08 2012-03-27 Dai Nippon Printing Co., Ltd. Evaluation method of fouling, fouling evaluation apparatus, production method of optical member, optical layered body, and display product
US8107696B2 (en) * 2006-10-02 2012-01-31 Johnson & Johnson Consumer Companies, Inc. Calibration apparatus and method for fluorescent imaging
US8122878B1 (en) * 2006-10-20 2012-02-28 Energy Innovations, Inc. Solar concentrator with camera alignment and tracking
SG173233A1 (en) * 2010-01-28 2011-08-29 Visionxtreme Pte Ltd Inspection of defects in a contact lens
US8358830B2 (en) * 2010-03-26 2013-01-22 The Boeing Company Method for detecting optical defects in transparencies
US8736828B2 (en) * 2011-02-23 2014-05-27 Visionxtreme Pte Ltd Method and apparatus for inspecting ophthalmic lens
EP2699892A1 (en) * 2011-04-18 2014-02-26 ISMECA Semiconductor Holding SA An inspection device
KR101823855B1 (ko) 2011-06-03 2018-02-01 존슨 앤드 존슨 비젼 케어, 인코포레이티드 안과용 렌즈의 다중 방사선 검사
US8634068B2 (en) 2011-06-16 2014-01-21 Johnson & Johnson Vision Care, Inc. Method of determining the optimal wavelength for inspecting ophthalmic lenses
US20120320374A1 (en) 2011-06-17 2012-12-20 Sites Peter W Method of imaging and inspecting the edge of an ophthalmic lens
CN103162940B (zh) * 2013-02-22 2016-01-06 宁波舜宇光电信息有限公司 一种手机摄像模组自动测试机
SG11201602776PA (en) * 2013-10-08 2016-05-30 Emage Vision Pte Ltd System and method for inspection of wet ophthalmic lens
WO2015134449A1 (en) * 2014-03-05 2015-09-11 Novartis Ag Method for automatic inspection of contact lenses
SG11201603018PA (en) 2014-05-15 2016-05-30 Emage Vision Pte Ltd System and method for inspecting opthalmic lenses
EP3062130B1 (de) * 2015-02-26 2022-03-30 Wincor Nixdorf International GmbH Verfahren zur steuerung mindestens einer lichtschranke, steuerungsschaltung und damit ausgestattetes selbstbedienungsterminal
FR3039660B1 (fr) * 2015-07-30 2017-09-08 Essilor Int Methode de verification d'une caracteristique geometrique et d'une caracteristique optique d'une lentille ophtalmique detouree et dispositif associe
SG10201509497VA (en) * 2015-11-18 2017-06-29 Emage Vision Pte Ltd Contact lens defect inspection using uv illumination
EP3309603B1 (en) * 2016-10-11 2019-01-02 Essilor International Method for determining a parameter of an optical equipment
EP3502769A1 (en) * 2017-12-21 2019-06-26 Essilor International A method for determining an optical parameter of a lens
CN111684266B (zh) * 2017-12-28 2024-08-06 光学转变有限公司 用于测量透明制品的光学特性的方法
US10634618B2 (en) * 2018-01-23 2020-04-28 Hong Kong Applied Science and Technology Research Institute Company Limited Apparatus and a method for inspecting a light transmissible optical component
KR20200134913A (ko) * 2019-05-24 2020-12-02 엘지이노텍 주식회사 액체 렌즈 제조 장치 및 방법
CN111855156B (zh) * 2020-07-29 2022-07-26 杭州海康微影传感科技有限公司 用于镜头检测的采样控制方法和测试装置以及采样工装
US12014480B2 (en) * 2021-10-19 2024-06-18 Johnson & Johnson Vision Care, Inc. Defect detection using synthetic data and machine learning

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD145805B1 (de) * 1979-08-27 1982-06-30 Johannes Grosser Beleuchtungsanordnung fuer mikroskope
AU649291B2 (en) * 1990-12-19 1994-05-19 Bodenseewerk Geratetechnik Gmbh Process and apparatus for examining optical components, especially optical components for the eye and device for illuminating clear-transparent test-objects
DE4236928A1 (de) * 1992-10-31 1994-05-05 Bodenseewerk Geraetetech Verfahren und Vorrichtung zur Reihenprüfung von Bildinformationen
IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
US5649410A (en) * 1994-06-10 1997-07-22 Johnson & Johnson Vision Products, Inc. Post-hydration method and apparatus for transporting, inspecting and packaging contact lenses
US5500732A (en) * 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
US5578331A (en) * 1994-06-10 1996-11-26 Vision Products, Inc. Automated apparatus for preparing contact lenses for inspection and packaging
DE29901791U1 (de) * 1999-02-02 2000-07-06 Novartis Ag, Basel Linsenmesseinrichtung
JP3544892B2 (ja) * 1999-05-12 2004-07-21 株式会社東京精密 外観検査方法及び装置
EP1213568B1 (de) * 2000-12-08 2005-12-28 Gretag-Macbeth AG Vorrichtung zur bildelementweisen Ausmessung eines flächigen Messobjekts
US6577387B2 (en) 2000-12-29 2003-06-10 Johnson & Johnson Vision Care, Inc. Inspection of ophthalmic lenses using absorption
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection

Also Published As

Publication number Publication date
KR100972945B1 (ko) 2010-07-30
WO2003073061A2 (en) 2003-09-04
DE60323207D1 (de) 2008-10-09
CN1896708A (zh) 2007-01-17
CN1518662A (zh) 2004-08-04
CN1896708B (zh) 2010-08-04
SG135070A1 (en) 2007-09-28
TW200532166A (en) 2005-10-01
CN101793595B (zh) 2012-05-16
BRPI0303222B1 (pt) 2017-03-28
EP1476738A2 (en) 2004-11-17
JP2005518537A (ja) 2005-06-23
CN1279341C (zh) 2006-10-11
AU2008237532A1 (en) 2008-11-13
AU2008237532B2 (en) 2012-05-17
CA2444517C (en) 2011-01-11
HK1070131A1 (en) 2005-06-10
BR0303222A (pt) 2004-12-21
US6882411B2 (en) 2005-04-19
EP1476738B1 (en) 2008-08-27
AU2003225591B2 (en) 2008-12-11
CN101793595A (zh) 2010-08-04
AU2003225591A1 (en) 2003-09-09
US20040042003A1 (en) 2004-03-04
CA2444517A1 (en) 2003-09-04
WO2003073061A3 (en) 2003-10-30
TWI294031B (en) 2008-03-01
KR20040082271A (ko) 2004-09-24

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20200223