SG11201602776PA - System and method for inspection of wet ophthalmic lens - Google Patents

System and method for inspection of wet ophthalmic lens

Info

Publication number
SG11201602776PA
SG11201602776PA SG11201602776PA SG11201602776PA SG11201602776PA SG 11201602776P A SG11201602776P A SG 11201602776PA SG 11201602776P A SG11201602776P A SG 11201602776PA SG 11201602776P A SG11201602776P A SG 11201602776PA SG 11201602776P A SG11201602776P A SG 11201602776PA
Authority
SG
Singapore
Prior art keywords
inspection
ophthalmic lens
wet
wet ophthalmic
lens
Prior art date
Application number
SG11201602776PA
Inventor
Soon Wei Wong
Wen Sen Zhou
Sergey Smorgon
Kundapura Parameshwara Srinivas
Original Assignee
Emage Vision Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Emage Vision Pte Ltd filed Critical Emage Vision Pte Ltd
Priority to SG11201602776PA priority Critical patent/SG11201602776PA/en
Publication of SG11201602776PA publication Critical patent/SG11201602776PA/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/0008—Industrial image inspection checking presence/absence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0285—Testing optical properties by measuring material or chromatic transmission properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G02—OPTICS
    • G02C—SPECTACLES; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURES AS SPECTACLES; CONTACT LENSES
    • G02C7/00—Optical parts
    • G02C7/02—Lenses; Lens systems ; Methods of designing lenses
    • G02C7/04—Contact lenses for the eyes
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/60—Analysis of geometric attributes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/11—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths for generating image signals from visible and infrared light wavelengths
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/10—Beam splitting or combining systems
    • G02B27/14—Beam splitting or combining systems operating by reflection only
    • G02B27/141—Beam splitting or combining systems operating by reflection only using dichroic mirrors
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10048—Infrared image
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10141—Special mode during image acquisition
    • G06T2207/10152—Varying illumination
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
SG11201602776PA 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens SG11201602776PA (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
SG11201602776PA SG11201602776PA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SG2013076054 2013-10-08
SG11201602776PA SG11201602776PA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens
PCT/SG2014/000473 WO2015053712A1 (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens

Publications (1)

Publication Number Publication Date
SG11201602776PA true SG11201602776PA (en) 2016-05-30

Family

ID=52813427

Family Applications (3)

Application Number Title Priority Date Filing Date
SG11201602776PA SG11201602776PA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens
SG10201912059UA SG10201912059UA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens
SG10201802916QA SG10201802916QA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens

Family Applications After (2)

Application Number Title Priority Date Filing Date
SG10201912059UA SG10201912059UA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens
SG10201802916QA SG10201802916QA (en) 2013-10-08 2014-10-08 System and method for inspection of wet ophthalmic lens

Country Status (8)

Country Link
US (2) US10489901B2 (en)
JP (1) JP6654139B2 (en)
KR (1) KR102166189B1 (en)
DE (1) DE112014004645T5 (en)
MY (1) MY187200A (en)
SG (3) SG11201602776PA (en)
TW (1) TWI698628B (en)
WO (1) WO2015053712A1 (en)

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SG11201602776PA (en) * 2013-10-08 2016-05-30 Emage Vision Pte Ltd System and method for inspection of wet ophthalmic lens
WO2015174927A1 (en) 2014-05-15 2015-11-19 Emage Vision Pte. Ltd. System and method for inspecting opthalmic lenses
EP3191818B1 (en) * 2014-09-09 2022-05-04 Alcon Inc. Method for detecting the presence or absence of a contact lens within a receptacle
DE102015006015A1 (en) * 2015-05-13 2016-11-17 Trioptics GmbH optische Instrumente Apparatus for measuring a imaging property of an optical system
DE102015108839A1 (en) * 2015-06-03 2016-12-08 Rodenstock Gmbh Method for determining surface data and / or measurement data of a surface of an at least partially transparent object
US10600174B2 (en) 2015-12-29 2020-03-24 Test Research, Inc. Optical inspection apparatus
US10104223B2 (en) * 2016-01-11 2018-10-16 Motorola Mobility Llc Automatically applying modifications to a device in a liquid environment
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SG10201701099XA (en) * 2017-02-10 2018-09-27 Emage Vision Pte Ltd Contact lens inspection in a plastic shell
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EP3588048A1 (en) * 2018-06-21 2020-01-01 Essilor International (Compagnie Generale D'optique) Method for detecting a defect in a zone of interest of an optical lens
HUE063686T2 (en) * 2018-08-13 2024-01-28 Alcon Inc Method for optically inspecting a mold for manufacturing ophthalmic lenses for possible mold defects
JP2022508111A (en) * 2018-11-14 2022-01-19 コーニング インコーポレイテッド Systems and methods for automated evaluation of glass-based substrates for birefringence defects
DE102018222140B3 (en) * 2018-12-18 2020-02-06 Siemens Mobility GmbH Determining a transmission quality of an optical unit of a camera system
WO2020245799A1 (en) * 2019-06-07 2020-12-10 Alcon Inc. Method for determining whether a sealing area of a primary packaging container for an ophthalmic lens is unacceptable for properly sealing a foil thereto
DE102019128503A1 (en) 2019-10-22 2021-04-22 Krones Aktiengesellschaft Method and device for the optical inspection of containers
JP2022003332A (en) * 2020-06-16 2022-01-11 イメージ エーアイ プライベート リミテッドEmage AI Pte Ltd System and method for detecting refractive power of dry ophthalmic lenses
TW202235860A (en) * 2020-10-14 2022-09-16 新加坡商億美視覺私人有限公司 Contact lens defect analysis and tracing system
CN112945988B (en) * 2021-02-04 2023-11-07 宁波舜宇仪器有限公司 Lens defect detection system and detection method
US20230196547A1 (en) 2021-12-16 2023-06-22 Alcon Inc. Method and system for inspecting an ophthalmic lens in an automated lens manufacturing process

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Also Published As

Publication number Publication date
SG10201802916QA (en) 2018-05-30
TWI698628B (en) 2020-07-11
SG10201912059UA (en) 2020-02-27
MY187200A (en) 2021-09-09
US20170011507A1 (en) 2017-01-12
WO2015053712A8 (en) 2015-06-04
US20200074620A1 (en) 2020-03-05
DE112014004645T5 (en) 2016-08-18
US10949963B2 (en) 2021-03-16
WO2015053712A1 (en) 2015-04-16
KR102166189B1 (en) 2020-10-15
JP2016540994A (en) 2016-12-28
TW201522933A (en) 2015-06-16
JP6654139B2 (en) 2020-02-26
US10489901B2 (en) 2019-11-26
KR20160094372A (en) 2016-08-09

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