HK1049435B - Wavefront sensor with off-axis illumination - Google Patents

Wavefront sensor with off-axis illumination Download PDF

Info

Publication number
HK1049435B
HK1049435B HK03100735.7A HK03100735A HK1049435B HK 1049435 B HK1049435 B HK 1049435B HK 03100735 A HK03100735 A HK 03100735A HK 1049435 B HK1049435 B HK 1049435B
Authority
HK
Hong Kong
Prior art keywords
light
eye
retina
beamsplitter
reflected
Prior art date
Application number
HK03100735.7A
Other languages
German (de)
English (en)
French (fr)
Chinese (zh)
Other versions
HK1049435A1 (en
Inventor
David R. Williams
Geun Young Yoon
Original Assignee
University Of Rochester
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University Of Rochester filed Critical University Of Rochester
Priority to HK06101762.8A priority Critical patent/HK1082168B/en
Priority to HK06101763.7A priority patent/HK1082169B/en
Publication of HK1049435A1 publication Critical patent/HK1049435A1/en
Publication of HK1049435B publication Critical patent/HK1049435B/en

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/14—Arrangements specially adapted for eye photography
    • A61B3/15—Arrangements specially adapted for eye photography with means for aligning, spacing or blocking spurious reflection ; with means for relaxing
    • A61B3/156—Arrangements specially adapted for eye photography with means for aligning, spacing or blocking spurious reflection ; with means for relaxing for blocking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Medical Informatics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Ophthalmology & Optometry (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Biophysics (AREA)
  • General Physics & Mathematics (AREA)
  • Eye Examination Apparatus (AREA)
HK03100735.7A 1999-10-21 2000-10-20 Wavefront sensor with off-axis illumination HK1049435B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
HK06101762.8A HK1082168B (en) 1999-10-21 2003-01-29 Wavefront sensor with off-axis illumination
HK06101763.7A HK1082169B (en) 1999-10-21 2003-01-29 Wavefront sensor with off-axis illumination

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/422,338 US6264328B1 (en) 1999-10-21 1999-10-21 Wavefront sensor with off-axis illumination
US09/422,338 1999-10-21
PCT/US2000/029008 WO2001028411A1 (en) 1999-10-21 2000-10-20 Wavefront sensor with off-axis illumination

Related Parent Applications (2)

Application Number Title Priority Date Filing Date
HK06101763.7A Division HK1082169B (en) 1999-10-21 2003-01-29 Wavefront sensor with off-axis illumination
HK06101762.8A Division HK1082168B (en) 1999-10-21 2003-01-29 Wavefront sensor with off-axis illumination

Related Child Applications (2)

Application Number Title Priority Date Filing Date
HK06101763.7A Addition HK1082169B (en) 1999-10-21 2003-01-29 Wavefront sensor with off-axis illumination
HK06101762.8A Addition HK1082168B (en) 1999-10-21 2003-01-29 Wavefront sensor with off-axis illumination

Publications (2)

Publication Number Publication Date
HK1049435A1 HK1049435A1 (en) 2003-05-16
HK1049435B true HK1049435B (en) 2007-01-05

Family

ID=23674453

Family Applications (1)

Application Number Title Priority Date Filing Date
HK03100735.7A HK1049435B (en) 1999-10-21 2000-10-20 Wavefront sensor with off-axis illumination

Country Status (12)

Country Link
US (1) US6264328B1 (https=)
EP (3) EP1561416B1 (https=)
JP (1) JP4656791B2 (https=)
KR (1) KR100734515B1 (https=)
CN (1) CN1220466C (https=)
AU (1) AU781573B2 (https=)
BR (1) BR0014924B1 (https=)
CA (1) CA2388775C (https=)
DE (3) DE60032528T2 (https=)
ES (3) ES2277306T3 (https=)
HK (1) HK1049435B (https=)
WO (1) WO2001028411A1 (https=)

Families Citing this family (83)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19938203A1 (de) * 1999-08-11 2001-02-15 Aesculap Meditec Gmbh Verfahren und Vorrichtung zur Korrektur von Sehfehlern des menschlichen Auges
DE19950792A1 (de) * 1999-10-21 2001-04-26 Technolas Gmbh Wellenfrontsensor mit Mehrleistungsstrahlmodi und unabhängiger Abgleichkamera
US6419671B1 (en) * 1999-12-23 2002-07-16 Visx, Incorporated Optical feedback system for vision correction
US6939434B2 (en) * 2000-08-11 2005-09-06 Applied Materials, Inc. Externally excited torroidal plasma source with magnetic control of ion distribution
US6491392B2 (en) * 2000-12-08 2002-12-10 Johnson & Johnson Vison Care, Inc. Dynamically stabilized contact lenses
UA59488C2 (uk) * 2001-10-03 2003-09-15 Василь Васильович Молебний Спосіб вимірювання хвильових аберацій ока та пристрій для його здійснення (варіанти)
US20020159621A1 (en) * 2001-04-26 2002-10-31 Memphis Eye & Cataract Associates Ambulatory Surgery Center (Dba Meca Laser And Surgery Center) System for automatically detecting eye corneal striae using projected and reflected shapes
US6766042B2 (en) 2001-04-26 2004-07-20 Memphis Eye & Contact Associates System to automatically detect eye corneal striae
US6746121B2 (en) * 2001-04-27 2004-06-08 Denwood F. Ross Defocus and astigmatism compensation in a wavefront aberration measurement system
IL143503A0 (en) * 2001-05-31 2002-04-21 Visionix Ltd Aberration correction spectacle lens
FR2828396B1 (fr) * 2001-08-12 2004-05-07 Samuel Henri Bucourt Dispositif de mesure des aberrations d'un systeme de type oeil
US6575572B2 (en) 2001-09-21 2003-06-10 Carl Zeiss Ophthalmic Systems, Inc. Method and apparatus for measuring optical aberrations of an eye
DE10154194A1 (de) * 2001-11-07 2003-05-22 Asclepion Meditec Ag Verfahren und Vorrichtung zur Messung des Dynamischen Verhaltens eines optischen Systems
US6736509B2 (en) * 2001-12-21 2004-05-18 Bausch And Lomb, Inc. Aberrometer illumination apparatus and method
KR100484389B1 (ko) * 2002-03-05 2005-04-20 최철명 빛 번짐 현상의 정량적 분석 장치 및 그 방법
US6736510B1 (en) * 2003-02-04 2004-05-18 Ware Tec Vision Systems, Inc. Ophthalmic talbot-moire wavefront sensor
US20040227932A1 (en) * 2003-02-13 2004-11-18 Geunyoung Yoon Large dynamic range shack-hartmann wavefront sensor
US7414712B2 (en) 2003-02-13 2008-08-19 University Of Rochester Large dynamic range Shack-Hartmann wavefront sensor
US6988801B2 (en) 2003-03-25 2006-01-24 University Of Rochester Compact portable wavefront sensor
US7341348B2 (en) * 2003-03-25 2008-03-11 Bausch & Lomb Incorporated Moiré aberrometer
US7556378B1 (en) 2003-04-10 2009-07-07 Tsontcho Ianchulev Intraoperative estimation of intraocular lens power
US7057806B2 (en) * 2003-05-09 2006-06-06 3M Innovative Properties Company Scanning laser microscope with wavefront sensor
US20040263779A1 (en) * 2003-06-12 2004-12-30 Visx, Inc. Hartmann-Shack wavefront measurement
CN100463646C (zh) * 2003-11-14 2009-02-25 欧弗搜尼克斯股份有限公司 眼科双目波前测量系统
AU2004291042B2 (en) * 2003-11-14 2010-10-14 Essilor International (Compagnie Generale D'optique) Ophthalmic binocular wafefront measurement system
EP2444021B8 (en) 2004-04-20 2018-04-18 Alcon Research, Ltd. Integrated surgical microscope and wavefront sensor
US7354772B2 (en) * 2004-05-03 2008-04-08 Naresh Menon Tag free bio sensing micro strip
US8142723B2 (en) * 2004-05-03 2012-03-27 Chromologic, LLC Tag free bio sensing micro strip
US7316478B2 (en) * 2004-07-15 2008-01-08 Parikumar Periasamy Dynamic multifocal spectacle frame
JP4630126B2 (ja) * 2005-05-16 2011-02-09 株式会社トプコン 眼光学特性測定装置
WO2007035334A2 (en) * 2005-09-19 2007-03-29 Advanced Vision Engineering, Inc. Methods and apparatus for comprehensive vision diagnosis
US10261321B2 (en) 2005-11-08 2019-04-16 Lumus Ltd. Polarizing optical system
KR100790689B1 (ko) * 2006-06-01 2008-01-02 삼성전기주식회사 샤크-하트만 파면 센서를 이용한 렌즈를 검사하는 방법
US20080084541A1 (en) * 2006-10-06 2008-04-10 Ming Lai Ophthalmic system and method
AU2008254747B2 (en) 2007-05-17 2013-10-24 Amo Development, Llc Customized laser epithelial ablation systems and methods
ES2656421T3 (es) 2007-08-21 2018-02-27 Visionix Ltd. Sistema multifuncional de medición oftálmica y procedimiento correspondiente
US8157378B2 (en) * 2007-08-23 2012-04-17 Bausch & Lomb Incorporated Eye illumination apparatus and method
US8333474B2 (en) 2007-10-19 2012-12-18 Wavetec Vision Systems, Inc. Optical instrument alignment system
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
US7874674B2 (en) * 2007-12-12 2011-01-25 Allred Lloyd G Aberrometer having reduced noise
US8254724B2 (en) 2008-11-06 2012-08-28 Bausch & Lomb Incorporated Method and apparatus for making and processing aberration measurements
WO2010054268A2 (en) 2008-11-06 2010-05-14 Wavetec Vision Systems, Inc. Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
US7980698B2 (en) 2008-11-19 2011-07-19 Bausch & Lomb Incorporated Power-adjusted aberrometer
US8876290B2 (en) 2009-07-06 2014-11-04 Wavetec Vision Systems, Inc. Objective quality metric for ocular wavefront measurements
ES2524618T3 (es) 2009-07-14 2014-12-10 Wavetec Vision Systems, Inc. Determinación de la posición efectiva de la lente de una lente intraocular utilizando potencia refractiva afática
WO2011008609A1 (en) 2009-07-14 2011-01-20 Wavetec Vision Systems, Inc. Ophthalmic surgery measurement system
JP5517571B2 (ja) * 2009-11-18 2014-06-11 キヤノン株式会社 撮像装置および撮像方法
FR2971693B1 (fr) * 2011-02-22 2013-03-08 Imagine Eyes Methode et dispositif d'imagerie retinienne a haute resolution
EP2846679A1 (en) * 2012-04-30 2015-03-18 Clarity Medical Systems, Inc. Ophthalmic wavefront sensor operating in parallel sampling and lock-in detection mode
US9554889B2 (en) 2012-05-07 2017-01-31 Boston Foundation For Sight Customized wavefront-guided methods, systems, and devices to correct higher-order aberrations
WO2014018584A1 (en) * 2012-07-24 2014-01-30 Trustees Of Boston University Partitioned aperture wavefront imaging method and system
FI125445B (fi) 2012-09-12 2015-10-15 Trividi Oy Katseenohjausjärjestely
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
US9629541B2 (en) 2013-04-09 2017-04-25 Smart Vision Labs Portable wavefront aberrometer
KR20160140590A (ko) * 2013-12-31 2016-12-07 스마트 비전 랩스 휴대용 파면 수차계
CN104083145A (zh) * 2014-07-15 2014-10-08 温州雷蒙光电科技有限公司 一种眼底照相机
DE102014010667B4 (de) 2014-07-18 2017-07-13 Berliner Glas Kgaa Herbert Kubatz Gmbh & Co Verfahren und Vorrichtung zur Messung der Form einer Wellenfront eines optischen Strahlungsfeldes
CN104101487B (zh) * 2014-07-31 2017-01-18 中国科学院光电研究院 一种光学系统波像差测量装置与测量方法
CN107529983A (zh) 2015-01-09 2018-01-02 智能视觉实验室股份有限公司 具有开放场对准通道的便携式波前像差仪
IL237337B (en) 2015-02-19 2020-03-31 Amitai Yaakov A compact head-up display system with a uniform image
US10175102B2 (en) * 2015-05-26 2019-01-08 Advanced Systems & Technologies, Inc. Method and apparatus for beaconless adaptive optics system
AU2017311513A1 (en) 2016-08-10 2019-02-14 Amo Development, Llc Epithelial ablation systems and methods
JP7187022B2 (ja) 2016-10-09 2022-12-12 ルムス エルティーディー． 長方形導波路を使用する開口乗算器
US11500143B2 (en) 2017-01-28 2022-11-15 Lumus Ltd. Augmented reality imaging system
JP6980209B2 (ja) 2017-02-22 2021-12-15 ルムス エルティーディー． 光ガイド光学アセンブリ
US10585291B2 (en) * 2017-04-28 2020-03-10 Yonatan Gerlitz Eye safety system for lasers
JP7174929B2 (ja) 2017-07-19 2022-11-18 ルムス エルティーディー． Ｌｏｅを介するｌｃｏｓ照明
IL275615B (en) 2018-01-02 2022-08-01 Lumus Ltd Augmented reality representatives with active alignment and matching methods
IL259518B2 (en) 2018-05-22 2023-04-01 Lumus Ltd Optical system and method for improving light field uniformity
US11415812B2 (en) 2018-06-26 2022-08-16 Lumus Ltd. Compact collimating optical device and system
IL280934B2 (en) 2018-08-26 2023-10-01 Lumus Ltd Suppression of reflection in displays close to the eyes
TWM642752U (zh) 2018-11-08 2023-06-21 以色列商魯姆斯有限公司 用於將圖像顯示到觀察者的眼睛中的顯示器
WO2020174433A1 (en) 2019-02-28 2020-09-03 Lumus Ltd. Compact collimated image projector
IL289182B2 (en) 2019-07-04 2024-06-01 Lumus Ltd Figure waveguide with symmetric light beam multiplication
CN114207354B (zh) 2019-09-16 2024-06-21 鲁姆斯有限公司 具有光束倍增的图像显示系统
KR102939032B1 (ko) 2019-12-05 2026-03-16 루머스 리미티드 상보 코팅된 부분적 반사체를 채용하는 도광 광학 소자, 및 광산란을 감소시킨 도광 광학 소자
CA3155597C (en) 2019-12-08 2023-02-14 Lumus Ltd. Optical systems with compact image projector
IL294538B2 (en) 2020-02-24 2025-12-01 Lumus Ltd Mixed reality combiner
KR20230004553A (ko) 2020-04-30 2023-01-06 루머스 리미티드 광학 샘플 특성화
DE212021000276U1 (de) 2020-05-12 2022-11-03 Lumus Ltd. Drehbarer Lichtleiter
CN115176190B (zh) 2020-05-24 2024-07-09 鲁姆斯有限公司 复合光导光学元件
EP4158397A4 (en) 2020-06-01 2024-01-31 Lumus Ltd. Virtual image delivery system for near eye displays
US20230390866A1 (en) * 2020-12-08 2023-12-07 Electro Scientific Industries, Inc. Optical relay system and methods of use and manufacture

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5663781A (en) 1988-06-29 1997-09-02 G. Rodenstock Instrumente Gmbh Apparatus for the examination of objects and the determination of topography
US4991953A (en) * 1989-02-09 1991-02-12 Eye Research Institute Of Retina Foundation Scanning laser vitreous camera
DE4222395A1 (de) 1992-07-08 1994-01-13 Amtech Ges Fuer Angewandte Mic Vorrichtung und Verfahren zur Messung der Augenrefraktion
JP3476219B2 (ja) * 1993-07-30 2003-12-10 株式会社ニデック 眼屈折力測定装置
US5506634A (en) 1994-07-05 1996-04-09 Carl Zeiss, Inc. Fundus illumination apparatus formed from three, separated radiation path systems
US5777719A (en) 1996-12-23 1998-07-07 University Of Rochester Method and apparatus for improving vision and the resolution of retinal images
JP3684462B2 (ja) * 1997-02-12 2005-08-17 株式会社トプコン 光学特性測定装置

Also Published As

Publication number Publication date
WO2001028411A1 (en) 2001-04-26
ES2269198T3 (es) 2007-04-01
CN1220466C (zh) 2005-09-28
JP4656791B2 (ja) 2011-03-23
EP1561417B1 (en) 2006-12-20
DE60029991D1 (de) 2006-09-21
KR20030007378A (ko) 2003-01-23
DE60032650D1 (de) 2007-02-08
EP1235508A1 (en) 2002-09-04
BR0014924B1 (pt) 2009-01-13
EP1235508B1 (en) 2006-08-09
BR0014924A (pt) 2002-07-23
EP1561417A1 (en) 2005-08-10
WO2001028411B1 (en) 2001-10-25
DE60029991T2 (de) 2007-03-29
CN1384720A (zh) 2002-12-11
DE60032650T2 (de) 2007-11-15
DE60032528T2 (de) 2007-09-27
JP2003532449A (ja) 2003-11-05
EP1561416A1 (en) 2005-08-10
AU781573B2 (en) 2005-06-02
ES2279465T3 (es) 2007-08-16
AU1435401A (en) 2001-04-30
CA2388775A1 (en) 2001-04-26
EP1561416B1 (en) 2006-12-27
ES2277306T3 (es) 2007-07-01
DE60032528D1 (de) 2007-02-01
KR100734515B1 (ko) 2007-07-03
US6264328B1 (en) 2001-07-24
HK1049435A1 (en) 2003-05-16
CA2388775C (en) 2007-09-18

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Legal Events

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PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20181020