HK1046167B - 檢測來自試樣的光線的方法 - Google Patents

檢測來自試樣的光線的方法

Info

Publication number
HK1046167B
HK1046167B HK02106587.4A HK02106587A HK1046167B HK 1046167 B HK1046167 B HK 1046167B HK 02106587 A HK02106587 A HK 02106587A HK 1046167 B HK1046167 B HK 1046167B
Authority
HK
Hong Kong
Prior art keywords
sample
detecting
light coming
coming
light
Prior art date
Application number
HK02106587.4A
Other languages
English (en)
Chinese (zh)
Other versions
HK1046167A1 (en
Inventor
Reinhard Janka
Volker Jüngel
Tilo Jankowski
Frank Hecht
Original Assignee
Zeiss Carl Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=7632205&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=HK1046167(B) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Zeiss Carl Jena Gmbh filed Critical Zeiss Carl Jena Gmbh
Publication of HK1046167A1 publication Critical patent/HK1046167A1/xx
Publication of HK1046167B publication Critical patent/HK1046167B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/16—Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
HK02106587.4A 2000-02-22 2002-09-06 檢測來自試樣的光線的方法 HK1046167B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10008594.6A DE10008594B4 (de) 2000-02-22 2000-02-22 Einrichtung und Verfahren zur ortsaufgelösten Fluoreszenz-Korrelations-Spektroskopie
PCT/EP2001/001663 WO2001063259A1 (de) 2000-02-22 2001-02-15 Verfahren und anordnung zur detektion des von einer probe kommenden lichtes

Publications (2)

Publication Number Publication Date
HK1046167A1 HK1046167A1 (en) 2002-12-27
HK1046167B true HK1046167B (zh) 2007-07-06

Family

ID=7632205

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02106587.4A HK1046167B (zh) 2000-02-22 2002-09-06 檢測來自試樣的光線的方法

Country Status (6)

Country Link
US (1) US7456026B2 (de)
EP (1) EP1183525B1 (de)
JP (1) JP2003524180A (de)
DE (2) DE10008594B4 (de)
HK (1) HK1046167B (de)
WO (1) WO2001063259A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10222359B4 (de) * 2002-05-21 2005-01-05 Max Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Verfahren zur spektral differenzierenden, bildgebenden Messung von Fluoreszenzlicht
CN1662810A (zh) * 2002-06-21 2005-08-31 奥林巴斯株式会社 生物分子分析装置
JP2004347562A (ja) * 2003-05-26 2004-12-09 Olympus Corp 測定装置
JP2004361086A (ja) * 2003-05-30 2004-12-24 Olympus Corp 生体分子解析装置
DE10327531B4 (de) 2003-06-17 2006-11-30 Leica Microsystems Cms Gmbh Verfahren zur Messung von Fluoreszenzkorrelationen in Gegenwart von langsamen Signalschwankungen
DE10327987A1 (de) * 2003-06-21 2005-01-20 MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. Konfokales optisches System
JP4815349B2 (ja) 2004-06-24 2011-11-16 オリンパス株式会社 蛍光相関分光装置
DE102004034961A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102004034987A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop und Verwendung
JP4425098B2 (ja) * 2004-09-06 2010-03-03 浜松ホトニクス株式会社 蛍光顕微鏡および蛍光相関分光解析装置
WO2006049180A1 (ja) * 2004-11-01 2006-05-11 Olympus Corporation 発光測定装置及び発光測定方法
WO2006087727A1 (en) * 2005-02-15 2006-08-24 Tata Institute Of Fundamental Research Fluorescence correlation microscopy with real-time alignment readout
DE102005009188A1 (de) * 2005-03-01 2006-09-07 Carl Zeiss Jena Gmbh Punktscannendes Laser-Scanning-Mikroskop sowie Verfahren zur Einstellung eines Mikroskopes
DE102006034905B4 (de) * 2006-07-28 2015-07-30 Carl Zeiss Microscopy Gmbh Anordnung zur Signalverarbeitung am Ausgang eines Mehrkanaldetektors
EP2246724A1 (de) * 2008-02-22 2010-11-03 Nikon Corporation Laserrastermikroskop

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5079169A (en) * 1990-05-22 1992-01-07 The Regents Of The Stanford Leland Junior University Method for optically manipulating polymer filaments
DE59405644D1 (de) 1993-01-18 1998-05-14 Evotec Biosystems Gmbh Verfahren und vorrichtung zur bewertung der fitness von biopolymeren
DE19533092A1 (de) * 1995-09-07 1997-03-13 Basf Ag Vorrichtung zur parallelisierten Zweiphotonen-Fluoreszenz-Korrelations-Spektroskopie (TPA-FCS) und deren Verwendung zum Wirkstoff-Screening
DE19702914C2 (de) * 1997-01-28 1998-12-24 Max Planck Gesellschaft Verfahren und Anordnung zum Bestimmen vorgegebener Eigenschaften von Zielpartikeln eines Probenmediums
DE19649605A1 (de) * 1996-11-29 1998-06-04 Deutsches Krebsforsch Fluoreszenzkorrelationsspektroskopiemodul für ein Mikroskop
DE19757740C2 (de) * 1997-12-23 2000-04-13 Evotec Biosystems Ag Verfahren zum Nachweis von Assoziations-, Dissoziations-, Verknüpfungs- oder Spaltreaktionen sowie Konformationsänderungen mittels Koinzidenzanalyse
DE19840489A1 (de) * 1998-09-04 2000-03-09 Basf Ag Wirkstoffzubereitungen sowie ein Verfahren zu deren Herstellung

Also Published As

Publication number Publication date
JP2003524180A (ja) 2003-08-12
HK1046167A1 (en) 2002-12-27
EP1183525A1 (de) 2002-03-06
US7456026B2 (en) 2008-11-25
DE50111035D1 (de) 2006-11-02
US20050271549A1 (en) 2005-12-08
EP1183525B1 (de) 2006-09-20
DE10008594B4 (de) 2018-09-20
WO2001063259A1 (de) 2001-08-30
DE10008594A1 (de) 2001-08-23

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20110215