HK1044041A1 - 高角度解像和快速回應時間的表面電漿共振偵測 - Google Patents

高角度解像和快速回應時間的表面電漿共振偵測

Info

Publication number
HK1044041A1
HK1044041A1 HK02103974.2A HK02103974A HK1044041A1 HK 1044041 A1 HK1044041 A1 HK 1044041A1 HK 02103974 A HK02103974 A HK 02103974A HK 1044041 A1 HK1044041 A1 HK 1044041A1
Authority
HK
Hong Kong
Prior art keywords
response time
surface plasmon
plasmon resonance
fast response
angular resolution
Prior art date
Application number
HK02103974.2A
Other languages
English (en)
Chinese (zh)
Inventor
Tao Nongjian
Boussaad Salah
Huang Wenlue
Original Assignee
The Florida International Univ Board Of Trustees
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The Florida International Univ Board Of Trustees filed Critical The Florida International Univ Board Of Trustees
Publication of HK1044041A1 publication Critical patent/HK1044041A1/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
HK02103974.2A 1999-05-17 2002-05-28 高角度解像和快速回應時間的表面電漿共振偵測 HK1044041A1 (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13448299P 1999-05-17 1999-05-17
PCT/US2000/013283 WO2000070328A1 (en) 1999-05-17 2000-05-16 Surface plasmon resonance detection with high angular resolution and fast response time

Publications (1)

Publication Number Publication Date
HK1044041A1 true HK1044041A1 (zh) 2002-10-04

Family

ID=22463595

Family Applications (1)

Application Number Title Priority Date Filing Date
HK02103974.2A HK1044041A1 (zh) 1999-05-17 2002-05-28 高角度解像和快速回應時間的表面電漿共振偵測

Country Status (11)

Country Link
EP (1) EP1194763A4 (de)
JP (1) JP2002544516A (de)
CN (1) CN1216282C (de)
AU (1) AU5134100A (de)
CA (1) CA2373343A1 (de)
DE (1) DE1194763T1 (de)
ES (1) ES2177473T1 (de)
HK (1) HK1044041A1 (de)
IL (1) IL146207A (de)
RU (1) RU2226684C2 (de)
WO (1) WO2000070328A1 (de)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
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FR2817962B1 (fr) * 2000-12-13 2004-08-06 Inst Optique Theorique Et Appl Procede de caracterisation de surface, application et dispositif mettant en oeuvre le procede
AU2002219304A1 (en) 2000-12-13 2002-06-24 Institut D'optique Theorique Et Appliquee Method for characterising a surface, and device therefor
KR20040012384A (ko) * 2002-08-03 2004-02-11 이종협 고감도 표면 플라즈몬 공명장치와 이를 이용한 중금속의흡착과 선택도의 측정방법
CN1894576B (zh) * 2003-11-19 2010-04-28 比恩诺尔股份公司 用于执行表面等离子共振测量的方法和装置
ES2261009B1 (es) * 2004-06-11 2007-11-16 Consejo Superior De Investigaciones Cientificas. Dispositivo y metodo para detectar cambios en el indice de refraccion de un medio dielectrico.
CN101163957B (zh) * 2004-09-15 2011-07-13 新加坡科技研究局 表面等离子体共振和石英晶体微天平传感器
US7317519B2 (en) 2004-10-29 2008-01-08 Agilent Technologies, Inc. Swept-angle SPR measurement system
EP1891414A4 (de) * 2005-06-14 2010-04-21 Fujifilm Corp Sensor, mehrkanalsensor, wahrnehmungsvorrichtung und verfahren
JP4481967B2 (ja) * 2005-09-05 2010-06-16 キヤノン株式会社 センサ装置
CN100412528C (zh) * 2005-10-20 2008-08-20 汪胜前 气体和液体浓度检测传感器及检测系统
JP4663590B2 (ja) * 2006-06-14 2011-04-06 日本電信電話株式会社 ピーク位置変動量測定装置、その測定方法及びプログラム
WO2008009165A1 (fr) * 2006-07-03 2008-01-24 He Jian Technology(Suzhou)Co.Ltd. PROCÉDÉ D'INSPECTION OPTIQUE D'UN DEGRÉ DE TRAITEMENT AU PLASMA D'UN FILM DE SiON
CN100489500C (zh) * 2007-01-23 2009-05-20 中国科学院长春应用化学研究所 电化学原位时间分辨表面等离子体共振测量仪
KR100876608B1 (ko) * 2007-08-20 2008-12-31 한국생명공학연구원 회전거울을 이용한 표면 플라즈몬 공명 센서
JP5344828B2 (ja) 2008-02-28 2013-11-20 富士フイルム株式会社 センシング装置
WO2011066667A1 (zh) * 2009-12-01 2011-06-09 国家纳米科学中心 一种基于共振角度测量的spr传感器及其测量方法
CN103675053B (zh) * 2013-09-27 2016-05-11 中国科学院电子学研究所 一种基于表面等离子体谐振的局部电化学成像测试系统
WO2015121704A2 (en) * 2013-11-01 2015-08-20 Miller Marvin J Pathogen detection
JP6346040B2 (ja) * 2014-09-10 2018-06-20 日本電信電話株式会社 屈折率測定装置
CN105699335B (zh) * 2016-04-12 2019-01-04 岭南师范学院 一种多功能spr检测仪
CN109490279A (zh) * 2018-09-10 2019-03-19 桂林电子科技大学 D形微柱镜旋转式spr传感芯片
CN110133066A (zh) * 2019-05-24 2019-08-16 暨南大学 电化学等离子体光纤重金属检测系统及方法
CN110823835B (zh) * 2019-12-16 2022-02-25 长沙学院 一种波导耦合长程表面等离子共振传感器及其测量方法
RU2770648C1 (ru) * 2021-03-09 2022-04-19 Общество С Ограниченной Ответственностью "Микросенсор" Оптический сенсор на основе плазмон-индуцированной прозрачности и Фано-резонансов
RU2758779C1 (ru) * 2021-03-17 2021-11-01 Федеральное государственное бюджетное образовательное учреждение высшего образования «Сибирский государственный университет геосистем и технологий» Сенсор на основе поверхностно-плазмонного резонанса

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NL8700851A (nl) * 1987-04-10 1988-11-01 Tno Werkwijze en inrichting voor het detecteren van zeer lage concentraties van een in een meetmedium aanwezige chemische component onder toepassing van oppervlakte-plasmonresonantie en elektrochemisch gestimuleerde adsorptie.
GB9107796D0 (en) * 1991-04-12 1991-05-29 Nat Res Dev Methods of and apparatus for measurement using acousto-optic devices
GB9212416D0 (en) * 1992-06-11 1992-07-22 Medical Res Council Reversible binding substances
US5351127A (en) * 1992-06-17 1994-09-27 Hewlett-Packard Company Surface plasmon resonance measuring instruments
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JPH09292334A (ja) * 1996-04-30 1997-11-11 Fuji Photo Film Co Ltd 表面プラズモンセンサー
JPH10267841A (ja) * 1997-03-24 1998-10-09 Kokuritsu Shintai Shogaisha Rehabilitation Center Souchiyou 表面プラズモン共鳴センシングデバイス
US5986762A (en) * 1998-06-15 1999-11-16 Imation Corp. Optical sensor having optimized surface profile

Also Published As

Publication number Publication date
AU5134100A (en) 2000-12-05
WO2000070328A1 (en) 2000-11-23
IL146207A0 (en) 2002-07-25
CA2373343A1 (en) 2000-11-23
EP1194763A1 (de) 2002-04-10
DE1194763T1 (de) 2002-10-17
JP2002544516A (ja) 2002-12-24
IL146207A (en) 2005-05-17
ES2177473T1 (es) 2002-12-16
CN1364233A (zh) 2002-08-14
RU2226684C2 (ru) 2004-04-10
EP1194763A4 (de) 2006-01-11
CN1216282C (zh) 2005-08-24

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