HK1038795A1 - Scan test machine for densely spaced test sites - Google Patents
Scan test machine for densely spaced test sitesInfo
- Publication number
- HK1038795A1 HK1038795A1 HK01109061A HK01109061A HK1038795A1 HK 1038795 A1 HK1038795 A1 HK 1038795A1 HK 01109061 A HK01109061 A HK 01109061A HK 01109061 A HK01109061 A HK 01109061A HK 1038795 A1 HK1038795 A1 HK 1038795A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- densely spaced
- test
- sites
- scan
- machine
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/496,878 US6268719B1 (en) | 1998-09-23 | 2000-02-02 | Printed circuit board test apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1038795A1 true HK1038795A1 (en) | 2002-03-28 |
Family
ID=23974557
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK01109061A HK1038795A1 (en) | 2000-02-02 | 2001-12-27 | Scan test machine for densely spaced test sites |
Country Status (6)
Country | Link |
---|---|
US (1) | US6268719B1 (xx) |
EP (1) | EP1122546B1 (xx) |
JP (1) | JP4216482B2 (xx) |
DE (1) | DE60134688D1 (xx) |
HK (1) | HK1038795A1 (xx) |
TW (1) | TW594031B (xx) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
IL124961A (en) * | 1998-06-16 | 2006-10-05 | Orbotech Ltd | Contactless test method and system |
US6788078B2 (en) * | 2001-11-16 | 2004-09-07 | Delaware Capital Formation, Inc. | Apparatus for scan testing printed circuit boards |
JP2004264035A (ja) * | 2003-01-27 | 2004-09-24 | Agilent Technol Inc | プローブ装置及びそれを用いたディスプレイ基板の試験装置 |
EP1612571A4 (en) * | 2003-04-04 | 2010-03-03 | Advantest Corp | CONNECTION UNIT, TEST HEAD AND TEST UNIT |
GB0308550D0 (en) * | 2003-04-10 | 2003-05-21 | Barker Colin | Improvements to an automatic test machine |
US7224173B2 (en) * | 2003-10-01 | 2007-05-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Electrical bias electrical test apparatus and method |
US7227365B2 (en) * | 2004-10-28 | 2007-06-05 | Hewlett-Packard Development Company, L.P. | Connector insertion apparatus for connecting a testing apparatus to a unit under test |
US7301356B2 (en) * | 2004-10-28 | 2007-11-27 | Hewlett-Packard Development Company, L.P. | Support for a receptacle block of a unit under test |
US7463042B2 (en) * | 2005-06-30 | 2008-12-09 | Northrop Grumman Corporation | Connector probing system |
US7355417B1 (en) * | 2005-09-20 | 2008-04-08 | Emc Corporation | Techniques for obtaining electromagnetic data from a circuit board |
DE102006006255A1 (de) * | 2006-02-10 | 2007-08-23 | Atg Test Systems Gmbh | Fingertester zum Prüfen von unbestückten Leiterplatten und Verfahren zum Prüfen unbestückter Leiterplatten mit einem Fingertester |
US7443179B2 (en) * | 2006-11-30 | 2008-10-28 | Electro Scientific Industries, Inc. | Zero motion contact actuation |
DE102010023187A1 (de) * | 2010-06-09 | 2011-12-15 | Dtg International Gmbh | Vorrichtung und Verfahren zum Untersuchen von Leiterplatten |
US8742777B2 (en) | 2010-12-29 | 2014-06-03 | The Board Of Trustees Of The University Of Alabama For And On Behalf Of The University Of Alabama | Method and system for testing an electric circuit |
US9274643B2 (en) | 2012-03-30 | 2016-03-01 | Synaptics Incorporated | Capacitive charge measurement |
US10948534B2 (en) * | 2017-08-28 | 2021-03-16 | Teradyne, Inc. | Automated test system employing robotics |
CN111836533B (zh) * | 2019-04-15 | 2022-11-25 | 中兴通讯股份有限公司 | 一种叠放系统和方法 |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61274278A (ja) | 1985-05-30 | 1986-12-04 | Nec Corp | 基板の導通測定治具 |
JPS62285072A (ja) | 1986-06-04 | 1987-12-10 | Hitachi Ltd | プリント基板の配線パタ−ン検査装置 |
US4771230A (en) * | 1986-10-02 | 1988-09-13 | Testamatic Corporation | Electro-luminescent method and testing system for unpopulated printed circuit boards, ceramic substrates, and the like having both electrical and electro-optical read-out |
JP2767593B2 (ja) | 1988-11-11 | 1998-06-18 | 東京エレクトロン株式会社 | プリント配線基板検査方法および検査装置 |
US4970461A (en) * | 1989-06-26 | 1990-11-13 | Lepage Andrew J | Method and apparatus for non-contact opens/shorts testing of electrical circuits |
US5032788A (en) * | 1989-06-26 | 1991-07-16 | Digital Equipment Corp. | Test cell for non-contact opens/shorts testing of electrical circuits |
JP2881860B2 (ja) | 1989-11-09 | 1999-04-12 | 日本電気株式会社 | フライング・プローブ・ヘッド |
US5124660A (en) * | 1990-12-20 | 1992-06-23 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
US5113133A (en) | 1990-12-20 | 1992-05-12 | Integri-Test Corporation | Circuit board test probe |
JPH04259862A (ja) | 1991-02-15 | 1992-09-16 | Fujitsu Ltd | プリント基板試験装置 |
EP0508062B1 (de) * | 1991-04-10 | 1995-07-19 | atg test systems GmbH | Verfahren und Vorrichtung zur Prüfung einer elektrischen Leiteranordnung |
US5469064A (en) * | 1992-01-14 | 1995-11-21 | Hewlett-Packard Company | Electrical assembly testing using robotic positioning of probes |
IL101063A (en) | 1992-02-25 | 1995-03-30 | Orbotech Ltd | Verification and repair station for pcbs |
US5202623A (en) * | 1992-02-26 | 1993-04-13 | Digital Equipment Corporation | Laser-activated plasma chamber for non-contact testing |
GB2265224B (en) | 1992-03-20 | 1996-04-10 | Centalic Tech Dev Ltd | Testing apparatus |
JPH0792227A (ja) | 1993-09-24 | 1995-04-07 | Toyota Motor Corp | 回路基板の検査装置及び検査方法 |
US5508627A (en) * | 1994-05-11 | 1996-04-16 | Patterson; Joseph M. | Photon assisted sub-tunneling electrical probe, probe tip, and probing method |
JPH0815361A (ja) | 1994-06-30 | 1996-01-19 | Matsushita Electric Works Ltd | プリント配線板の検査方法 |
GB9503953D0 (en) | 1995-02-28 | 1995-04-19 | Plessey Semiconductors Ltd | An mcm-d probe tip |
KR100197936B1 (ko) | 1995-03-31 | 1999-06-15 | 전주범 | 카오디오의 회로기판 접점 청소장치 |
US5587664A (en) * | 1995-07-12 | 1996-12-24 | Exsight Ltd. | Laser-induced metallic plasma for non-contact inspection |
US5773988A (en) | 1996-10-29 | 1998-06-30 | Hewlett-Packard Company | Standard- and limited-access hybrid test fixture |
KR20010043017A (ko) * | 1998-04-27 | 2001-05-25 | 야코브 레비 | 상호 연결된 회로망을 테스트하는 방법 및 장치 |
-
2000
- 2000-02-02 US US09/496,878 patent/US6268719B1/en not_active Expired - Fee Related
-
2001
- 2001-02-02 EP EP01250038A patent/EP1122546B1/en not_active Expired - Lifetime
- 2001-02-02 DE DE60134688T patent/DE60134688D1/de not_active Expired - Fee Related
- 2001-02-02 JP JP2001026872A patent/JP4216482B2/ja not_active Expired - Fee Related
- 2001-03-13 TW TW090102087A patent/TW594031B/zh not_active IP Right Cessation
- 2001-12-27 HK HK01109061A patent/HK1038795A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1122546A3 (en) | 2004-04-21 |
TW594031B (en) | 2004-06-21 |
JP4216482B2 (ja) | 2009-01-28 |
DE60134688D1 (de) | 2008-08-21 |
JP2001272431A (ja) | 2001-10-05 |
EP1122546B1 (en) | 2008-07-09 |
US6268719B1 (en) | 2001-07-31 |
EP1122546A2 (en) | 2001-08-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PC | Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee) |
Effective date: 20120202 |