TW495127U - Improved structure for testing machine - Google Patents

Improved structure for testing machine

Info

Publication number
TW495127U
TW495127U TW88222255U TW88222255U TW495127U TW 495127 U TW495127 U TW 495127U TW 88222255 U TW88222255 U TW 88222255U TW 88222255 U TW88222255 U TW 88222255U TW 495127 U TW495127 U TW 495127U
Authority
TW
Taiwan
Prior art keywords
testing machine
improved structure
improved
testing
machine
Prior art date
Application number
TW88222255U
Other languages
Chinese (zh)
Inventor
Hung-Fang Chen
Original Assignee
Leton Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leton Technology Co Ltd filed Critical Leton Technology Co Ltd
Priority to TW88222255U priority Critical patent/TW495127U/en
Publication of TW495127U publication Critical patent/TW495127U/en

Links

TW88222255U 1999-12-28 1999-12-28 Improved structure for testing machine TW495127U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW88222255U TW495127U (en) 1999-12-28 1999-12-28 Improved structure for testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW88222255U TW495127U (en) 1999-12-28 1999-12-28 Improved structure for testing machine

Publications (1)

Publication Number Publication Date
TW495127U true TW495127U (en) 2002-07-11

Family

ID=21658045

Family Applications (1)

Application Number Title Priority Date Filing Date
TW88222255U TW495127U (en) 1999-12-28 1999-12-28 Improved structure for testing machine

Country Status (1)

Country Link
TW (1) TW495127U (en)

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Legal Events

Date Code Title Description
GD4K Issue of patent certificate for granted utility model filed before june 30, 2004