HK1003448A1 - Normalizing analyzer systems to a standard analyzer - Google Patents

Normalizing analyzer systems to a standard analyzer

Info

Publication number
HK1003448A1
HK1003448A1 HK98102333A HK98102333A HK1003448A1 HK 1003448 A1 HK1003448 A1 HK 1003448A1 HK 98102333 A HK98102333 A HK 98102333A HK 98102333 A HK98102333 A HK 98102333A HK 1003448 A1 HK1003448 A1 HK 1003448A1
Authority
HK
Hong Kong
Prior art keywords
analyzer
normalizing
standard
systems
analyzer systems
Prior art date
Application number
HK98102333A
Other languages
English (en)
Inventor
Paul Arthur Kilda-Brandt
Thomas Allan Weber
Charles Edward Heckler
Original Assignee
Ortho Clinical Diagnostics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ortho Clinical Diagnostics Inc filed Critical Ortho Clinical Diagnostics Inc
Publication of HK1003448A1 publication Critical patent/HK1003448A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
HK98102333A 1991-03-21 1998-03-19 Normalizing analyzer systems to a standard analyzer HK1003448A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US67297691A 1991-03-21 1991-03-21
US07/836,694 US5257212A (en) 1991-03-21 1992-02-18 Normalizing analyzer systems to a standard analyzer

Publications (1)

Publication Number Publication Date
HK1003448A1 true HK1003448A1 (en) 1998-10-30

Family

ID=27100858

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98102333A HK1003448A1 (en) 1991-03-21 1998-03-19 Normalizing analyzer systems to a standard analyzer

Country Status (6)

Country Link
US (1) US5257212A (ko)
EP (1) EP0505003B1 (ko)
JP (1) JP3172241B2 (ko)
KR (1) KR960016173B1 (ko)
DE (1) DE69229756T2 (ko)
HK (1) HK1003448A1 (ko)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994019689A1 (en) * 1993-02-23 1994-09-01 The General Hospital Corporation A computer system and method for measuring an analyte concentration with an affinity assay
JP3504750B2 (ja) * 1993-12-22 2004-03-08 オルソ−クリニカル ダイアグノスティクス,インコーポレイティド 検量関係式の再校正法及び定量試験キット
US5532941A (en) * 1994-07-08 1996-07-02 Lin; Lawrence I. Inter-laboratory performance monitoring system
US7273591B2 (en) 2003-08-12 2007-09-25 Idexx Laboratories, Inc. Slide cartridge and reagent test slides for use with a chemical analyzer, and chemical analyzer for same
US7588733B2 (en) 2003-12-04 2009-09-15 Idexx Laboratories, Inc. Retaining clip for reagent test slides
US9116129B2 (en) 2007-05-08 2015-08-25 Idexx Laboratories, Inc. Chemical analyzer
US20100219085A1 (en) * 2009-02-27 2010-09-02 Edwards Lifesciences Corporation Analyte Sensor Offset Normalization
US9797916B2 (en) 2014-01-10 2017-10-24 Idexx Laboratories, Inc. Chemical analyzer
CA2900201A1 (en) * 2014-08-25 2016-02-25 Alireza Ebrahim Value assignment for customizable quality controls
WO2018005945A1 (en) * 2016-06-30 2018-01-04 Beckman Coulter, Inc. Core calibration of analyzers
US11977091B2 (en) 2020-07-10 2024-05-07 Idexx Laboratories Inc. Point-of-care medical diagnostic analyzer and devices, systems, and methods for medical diagnostic analysis of samples

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56155835A (en) * 1980-05-02 1981-12-02 Olympus Optical Co Ltd Component analyzing method
JPS58109837A (ja) * 1981-12-24 1983-06-30 Olympus Optical Co Ltd 検量線補正方法
US4581714A (en) * 1983-09-09 1986-04-08 Sensormedics Corporation Method of calibrating and linearizing the output of fluid measuring instruments
US4627014A (en) * 1984-04-09 1986-12-02 Eastman Kodak Company Method and apparatus for determination of an analyte and method of calibrating such apparatus
JPH0718853B2 (ja) * 1984-05-15 1995-03-06 住友化学工業株式会社 クロマトグラフイ−におけるデ−タ処理方法
JPH0629852B2 (ja) * 1985-08-26 1994-04-20 富士写真フイルム株式会社 偏倚乾式分析要素を用いた液体試料中の被検物質の定量分析方法
US4866644A (en) * 1986-08-29 1989-09-12 Shenk John S Optical instrument calibration system
US4847793A (en) * 1986-09-24 1989-07-11 The Babcock & Wilcox Company Updating physical property correlations with laboratory data
JPH01124751A (ja) * 1987-11-10 1989-05-17 Konica Corp 変換式の作成方法
US4947355A (en) * 1988-05-05 1990-08-07 John Fluke Mfg. Co., Inc. Modular electronic instrument system having automated calibration capability
US4864842A (en) * 1988-07-29 1989-09-12 Troxler Electronic Laboratories, Inc. Method and system for transferring calibration data between calibrated measurement instruments
JP2654682B2 (ja) * 1989-02-17 1997-09-17 富士写真フイルム株式会社 生化学分析装置、生化学分析補正方法及び補正値記録体
US5126952A (en) * 1991-01-22 1992-06-30 Eastman Kodak Company Bar coding calibration

Also Published As

Publication number Publication date
JP3172241B2 (ja) 2001-06-04
EP0505003A3 (en) 1995-05-24
EP0505003B1 (en) 1999-08-11
DE69229756T2 (de) 2000-01-13
EP0505003A2 (en) 1992-09-23
KR960016173B1 (ko) 1996-12-04
DE69229756D1 (de) 1999-09-16
JPH0627116A (ja) 1994-02-04
US5257212A (en) 1993-10-26
KR920018482A (ko) 1992-10-22

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Legal Events

Date Code Title Description
PF Patent in force
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20060318