GR3018639T3 - Procedure and apparatus for the examination of optical components, particularly ophthalmic components, and device for the illumination of transparent objects under examination - Google Patents

Procedure and apparatus for the examination of optical components, particularly ophthalmic components, and device for the illumination of transparent objects under examination

Info

Publication number
GR3018639T3
GR3018639T3 GR950403654T GR950403654T GR3018639T3 GR 3018639 T3 GR3018639 T3 GR 3018639T3 GR 950403654 T GR950403654 T GR 950403654T GR 950403654 T GR950403654 T GR 950403654T GR 3018639 T3 GR3018639 T3 GR 3018639T3
Authority
GR
Greece
Prior art keywords
examination
components
procedure
illumination
optical components
Prior art date
Application number
GR950403654T
Other languages
English (en)
Inventor
Peter Hoefer
Peter Dr Hagmann
Roland Dr Hauck
Wolfgang Geissler
Hubert Lutz
Original Assignee
Ciba Geigy Ag
Bodenseewerk Geraetetech
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19914124003 external-priority patent/DE4124003C2/de
Application filed by Ciba Geigy Ag, Bodenseewerk Geraetetech filed Critical Ciba Geigy Ag
Publication of GR3018639T3 publication Critical patent/GR3018639T3/el

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses
GR950403654T 1990-12-19 1996-01-11 Procedure and apparatus for the examination of optical components, particularly ophthalmic components, and device for the illumination of transparent objects under examination GR3018639T3 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH403290 1990-12-19
DE19914124003 DE4124003C2 (de) 1991-07-19 1991-07-19 Beleuchtungseinrichtung zum Beleuchten von klar-transparenten Prüfobjekten, für die Untersuchung der Prüfobjekte auf Fehler

Publications (1)

Publication Number Publication Date
GR3018639T3 true GR3018639T3 (en) 1996-04-30

Family

ID=25694472

Family Applications (1)

Application Number Title Priority Date Filing Date
GR950403654T GR3018639T3 (en) 1990-12-19 1996-01-11 Procedure and apparatus for the examination of optical components, particularly ophthalmic components, and device for the illumination of transparent objects under examination

Country Status (13)

Country Link
EP (1) EP0491663B1 (el)
JP (1) JPH04321186A (el)
KR (1) KR100202215B1 (el)
AT (1) ATE132971T1 (el)
AU (1) AU649291B2 (el)
CA (1) CA2057832A1 (el)
DE (1) DE59107249D1 (el)
DK (1) DK0491663T3 (el)
ES (1) ES2082178T3 (el)
GR (1) GR3018639T3 (el)
HK (1) HK1003125A1 (el)
IE (1) IE70436B1 (el)
PT (1) PT99855B (el)

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IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
IL107605A (en) * 1992-12-21 1998-01-04 Johnson & Johnson Vision Prod Lens test system
GR1002574B (el) * 1992-12-21 1997-02-06 Johnson & Johnson Vision Products Inc. Παλλετα για την υποδοχη και μεταφορα δοχειων οφθαλμικων φακων.
NZ250453A (en) * 1992-12-21 1996-12-20 Johnson & Johnson Vision Prod Ophthalmic lens package; planar surface with concave bowl for containing lens, sealing sheet covering bowl with lens therein
IL107513A (en) * 1992-12-21 1997-07-13 Johnson & Johnson Vision Prod Ophthalmic lens inspection system and method
IL107602A0 (en) * 1992-12-21 1994-02-27 Johnson & Johnson Vision Prod Method of inspecting ophthalmic lenses
GR1002072B (en) * 1992-12-21 1995-11-30 Johnson & Johnson Vision Prod Illumination system for opthalmic lens inspection.
TW325744U (en) * 1993-07-21 1998-01-21 Ciba Geigy Ag Two-sided contact lens mold
WO1995004264A1 (en) 1993-07-29 1995-02-09 Wesley-Jessen Corporation Inspection system for optical components
JP3734512B2 (ja) * 1993-12-27 2006-01-11 株式会社メニコン コンタクトレンズ外観検査方法および外観検査装置
US5500732A (en) * 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
IL113945A0 (en) * 1994-06-10 1995-08-31 Johnson & Johnson Vision Prod System and method for inspecting lenses
JPH08105937A (ja) * 1994-10-06 1996-04-23 Advantest Corp デバイス・テスタ用オートハンドラ及びその装置のデバイス測定方法
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
AU698522B2 (en) * 1995-09-29 1998-10-29 Johnson & Johnson Vision Products, Inc. Lens parameter measurement using optical sectioning
US5818573A (en) * 1997-02-06 1998-10-06 Pbh, Inc. Opthalmic lens inspection system
US5801822A (en) * 1997-02-06 1998-09-01 Pbh, Inc. Ophthalmic lens inspection system
US6047082A (en) * 1997-11-14 2000-04-04 Wesley Jessen Corporation Automatic lens inspection system
US6201600B1 (en) * 1997-12-19 2001-03-13 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive objects having a lens portion
ATE433100T1 (de) * 1998-08-17 2009-06-15 Novartis Ag Prüfmodul zum prüfen von optischen teilen auf fehler
US6259518B1 (en) 1999-08-10 2001-07-10 Novartis Ag Wetcell device for inspection
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
US6246062B1 (en) 1998-11-05 2001-06-12 Johnson & Johnson Vision Care, Inc. Missing lens detection system and method
SG87848A1 (en) 1998-11-05 2002-04-16 Johnson & Johnson Vision Prod Missing lens detection system and method
DE29901791U1 (de) * 1999-02-02 2000-07-06 Novartis Ag Linsenmesseinrichtung
ATE370799T1 (de) * 2000-05-01 2007-09-15 Fujifilm Corp Vorrichtung zur abgabe eines fluids
JP4426080B2 (ja) * 2000-10-11 2010-03-03 株式会社メニコン 眼用レンズの汚れ検出方法及び装置
EP1203952B1 (en) * 2000-10-23 2012-02-08 Novartis AG Ultrasonic device for inspecting ophthalmic lenses
ATE545018T1 (de) 2000-10-23 2012-02-15 Novartis Ag Ultraschallvorrichtung zur inspektion von ophthalmischen linsen
US6577387B2 (en) 2000-12-29 2003-06-10 Johnson & Johnson Vision Care, Inc. Inspection of ophthalmic lenses using absorption
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection
JP2003042737A (ja) * 2001-07-26 2003-02-13 Toray Ind Inc 切削加工品の検査方法
BRPI0303222B1 (pt) * 2002-02-21 2017-03-28 Johnson & Johnson método e aparelho para inspecionar dispositivos óticos
WO2003087755A1 (fr) * 2002-04-12 2003-10-23 Menicon Co., Ltd. Systeme et procede d'assistance destine a des lentilles de contact
CN100465625C (zh) * 2005-10-21 2009-03-04 京元电子股份有限公司 晶片影像检视方法及系统
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
CN101650258B (zh) * 2008-08-14 2012-03-14 鸿富锦精密工业（深圳）有限公司 镜头模组检测装置
SG195400A1 (en) 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses
KR101334168B1 (ko) * 2012-09-19 2013-11-29 주식회사 케이피씨 엘이디 무영등의 복합 측정시험장치
GB2560951B (en) 2017-03-29 2020-06-17 Redlux Ltd Inspection of components for imperfections
CN110646169B (zh) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 曲面光学薄膜元件反射率测量方法
WO2023041659A1 (en) 2021-09-16 2023-03-23 Schneider Gmbh & Co. Kg Method and apparatus for quality control of ophthalmic lenses
CN114486939B (zh) * 2022-04-08 2022-07-22 欧普康视科技股份有限公司 一种镜片划痕检测系统及方法
CN116990450B (zh) * 2023-07-18 2024-04-26 欧几里德(苏州)医疗科技有限公司 一种角膜塑形镜的缺陷检测方法及系统

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DD138110A1 (de) * 1978-07-27 1979-10-10 Horst Riesenberg Auflicht-beleuchtungseinrichtung fuer mikroskope
DD145805B1 (de) * 1979-08-27 1982-06-30 Johannes Grosser Beleuchtungsanordnung fuer mikroskope
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DE3475566D1 (en) * 1984-05-14 1989-01-12 Ibm Deutschland Method and device for the inspection of surfaces
US4733360A (en) * 1984-06-14 1988-03-22 Dai Nippon Insatsu Kabushiki Kaisha Device and method for inspecting card-like articles
DE3432002A1 (de) * 1984-08-31 1986-03-06 Fa. Carl Zeiss, 7920 Heidenheim Verfahren und vorrichtung zur optischen untersuchung von kontaktlinsen
GB2171812B (en) * 1984-11-20 1988-08-17 Michael Roy Killpartrick Wet cell inspection of contact lenses
AU580642B2 (en) * 1984-11-29 1989-01-19 Unisearch Limited Lens zonometer
DE3620129A1 (de) * 1986-06-14 1987-12-17 Zeiss Carl Fa Vorrichtung zum pruefen von bauteilen aus transparentem material auf oberflaechenfehler und einschluesse
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JPH02257007A (ja) * 1989-03-30 1990-10-17 Seiko Epson Corp コンタクトレンズ外周欠け検査装置

Also Published As

Publication number Publication date
KR100202215B1 (ko) 1999-06-15
EP0491663A1 (de) 1992-06-24
JPH04321186A (ja) 1992-11-11
EP0491663B1 (de) 1996-01-10
HK1003125A1 (en) 1998-10-09
DE59107249D1 (de) 1996-02-22
ATE132971T1 (de) 1996-01-15
ES2082178T3 (es) 1996-03-16
PT99855A (pt) 1994-01-31
DK0491663T3 (da) 1996-02-05
AU649291B2 (en) 1994-05-19
KR920012892A (ko) 1992-07-28
PT99855B (pt) 1999-02-26
IE914411A1 (en) 1992-07-01
CA2057832A1 (en) 1992-06-20
IE70436B1 (en) 1996-11-27
AU8881691A (en) 1992-06-25

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