HK1003125A1 - Procedure and apparatus for the examination of optical components particularly ophthalmic components and device for the illuminaion of transparent objects under examination - Google Patents

Procedure and apparatus for the examination of optical components particularly ophthalmic components and device for the illuminaion of transparent objects under examination

Info

Publication number
HK1003125A1
HK1003125A1 HK98102154A HK98102154A HK1003125A1 HK 1003125 A1 HK1003125 A1 HK 1003125A1 HK 98102154 A HK98102154 A HK 98102154A HK 98102154 A HK98102154 A HK 98102154A HK 1003125 A1 HK1003125 A1 HK 1003125A1
Authority
HK
Hong Kong
Prior art keywords
examination
procedure
components
illuminaion
optical components
Prior art date
Application number
HK98102154A
Inventor
Peter Hofer
Peter Hagmann
Roland Hauck
Wolfgang Geissler
Hubert Lutz
Original Assignee
Bodenseewerk Geraetetech
Novartis Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19914124003 external-priority patent/DE4124003C2/en
Application filed by Bodenseewerk Geraetetech, Novartis Ag filed Critical Bodenseewerk Geraetetech
Publication of HK1003125A1 publication Critical patent/HK1003125A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9511—Optical elements other than lenses, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

Abstract

A procedure and an apparatus for the examination, in particular quality inspection, of optical components, in which an image is produced of the respective components to be examined, and defects on the imaged object are detected by image analysis, as well as the integration of this examination procedure into the production of the component. The optical components can be ophthalmic components such as spectacle lenses, contact lenses, intraocular lenses and the like. <IMAGE>
HK98102154A 1990-12-19 1998-03-16 Procedure and apparatus for the examination of optical components particularly ophthalmic components and device for the illuminaion of transparent objects under examination HK1003125A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH403290 1990-12-19
DE19914124003 DE4124003C2 (en) 1991-07-19 1991-07-19 Lighting device for illuminating clear-transparent test objects, for examining the test objects for defects

Publications (1)

Publication Number Publication Date
HK1003125A1 true HK1003125A1 (en) 1998-10-09

Family

ID=25694472

Family Applications (1)

Application Number Title Priority Date Filing Date
HK98102154A HK1003125A1 (en) 1990-12-19 1998-03-16 Procedure and apparatus for the examination of optical components particularly ophthalmic components and device for the illuminaion of transparent objects under examination

Country Status (13)

Country Link
EP (1) EP0491663B1 (en)
JP (1) JPH04321186A (en)
KR (1) KR100202215B1 (en)
AT (1) ATE132971T1 (en)
AU (1) AU649291B2 (en)
CA (1) CA2057832A1 (en)
DE (1) DE59107249D1 (en)
DK (1) DK0491663T3 (en)
ES (1) ES2082178T3 (en)
GR (1) GR3018639T3 (en)
HK (1) HK1003125A1 (en)
IE (1) IE70436B1 (en)
PT (1) PT99855B (en)

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IL107601A (en) * 1992-12-21 1997-09-30 Johnson & Johnson Vision Prod Illumination and imaging subsystems for a lens inspection system
IL107605A (en) * 1992-12-21 1998-01-04 Johnson & Johnson Vision Prod Lens inspection system
GR1002574B (en) * 1992-12-21 1997-02-06 Johnson & Johnson Vision Products Inc. Pallet for receiving and transporting opthalmic lens containers.
NZ250453A (en) * 1992-12-21 1996-12-20 Johnson & Johnson Vision Prod Ophthalmic lens package; planar surface with concave bowl for containing lens, sealing sheet covering bowl with lens therein
NZ250042A (en) 1992-12-21 1997-01-29 Johnson & Johnson Vision Prod Robotic inspection of ophthalmic lenses
GR1002072B (en) * 1992-12-21 1995-11-30 Johnson & Johnson Vision Prod Illumination system for opthalmic lens inspection.
IL107513A (en) * 1992-12-21 1997-07-13 Johnson & Johnson Vision Prod Ophthalmic lens inspection system and method
IL107602A0 (en) * 1992-12-21 1994-02-27 Johnson & Johnson Vision Prod Method of inspecting ophthalmic lenses
IL107603A (en) * 1992-12-21 1997-01-10 Johnson & Johnson Vision Prod Ophthalmic lens inspection method and apparatus
TW325744U (en) * 1993-07-21 1998-01-21 Ciba Geigy Ag Two-sided contact lens mold
EP0711409B1 (en) 1993-07-29 1999-02-24 Wesley Jessen Corporation Inspection system for optical components
JP3734512B2 (en) * 1993-12-27 2006-01-11 株式会社メニコン Contact lens appearance inspection method and appearance inspection apparatus
IL113945A0 (en) * 1994-06-10 1995-08-31 Johnson & Johnson Vision Prod System and method for inspecting lenses
US5500732A (en) * 1994-06-10 1996-03-19 Johnson & Johnson Vision Products, Inc. Lens inspection system and method
JPH08105937A (en) * 1994-10-06 1996-04-23 Advantest Corp Automatic handler for device tester, and device measuring method thereof
US5633504A (en) * 1995-03-30 1997-05-27 Wesley-Jessen Corporation Inspection of optical components
AU698522B2 (en) * 1995-09-29 1998-10-29 Johnson & Johnson Vision Products, Inc. Lens parameter measurement using optical sectioning
US5801822A (en) * 1997-02-06 1998-09-01 Pbh, Inc. Ophthalmic lens inspection system
US5818573A (en) * 1997-02-06 1998-10-06 Pbh, Inc. Opthalmic lens inspection system
US6047082A (en) * 1997-11-14 2000-04-04 Wesley Jessen Corporation Automatic lens inspection system
US6201600B1 (en) * 1997-12-19 2001-03-13 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive objects having a lens portion
WO2000009980A1 (en) * 1998-08-17 2000-02-24 Novartis Ag Inspection module for inspecting optical parts for faults
US6259518B1 (en) 1999-08-10 2001-07-10 Novartis Ag Wetcell device for inspection
IL126809A (en) * 1998-10-29 2001-08-26 Sarin Technologies Ltd Apparatus and method of examining the shape of gemstones
US6246062B1 (en) 1998-11-05 2001-06-12 Johnson & Johnson Vision Care, Inc. Missing lens detection system and method
SG87848A1 (en) 1998-11-05 2002-04-16 Johnson & Johnson Vision Prod Missing lens detection system and method
DE29901791U1 (en) * 1999-02-02 2000-07-06 Novartis Ag Lens measuring device
ATE370799T1 (en) * 2000-05-01 2007-09-15 Fujifilm Corp DEVICE FOR DISPENSING A FLUID
JP4426080B2 (en) * 2000-10-11 2010-03-03 株式会社メニコン Method and apparatus for detecting dirt on ophthalmic lens
EP1203952B1 (en) * 2000-10-23 2012-02-08 Novartis AG Ultrasonic device for inspecting ophthalmic lenses
ATE545018T1 (en) 2000-10-23 2012-02-15 Novartis Ag ULTRASONIC DEVICE FOR INSPECTING OPHTHALMIC LENSES
US6577387B2 (en) 2000-12-29 2003-06-10 Johnson & Johnson Vision Care, Inc. Inspection of ophthalmic lenses using absorption
US6765661B2 (en) 2001-03-09 2004-07-20 Novartis Ag Lens inspection
JP2003042737A (en) * 2001-07-26 2003-02-13 Toray Ind Inc Cut workpiece inspecting method
AU2003225591B2 (en) * 2002-02-21 2008-12-11 Johnson & Johnson Vision Care, Inc. Method and system for inspecting optical devices
US7837327B2 (en) * 2002-04-12 2010-11-23 Menicon Co., Ltd. Contact lens user support system and support method
CN100465625C (en) * 2005-10-21 2009-03-04 京元电子股份有限公司 Viewing method and system for chip figure
US7416300B2 (en) * 2006-05-25 2008-08-26 Coopervision International Holding Company, Lp Measurement of lenses and lens molds using optical coherence tomography
CN101650258B (en) * 2008-08-14 2012-03-14 鸿富锦精密工业（深圳）有限公司 Lens module detector
SG195400A1 (en) 2012-05-10 2013-12-30 Menicon Singapore Pte Ltd Systems and methods for the inspection of contact lenses
KR101334168B1 (en) * 2012-09-19 2013-11-29 주식회사 케이피씨 Measuring and testing apparatus for led astral light
GB2560951B (en) * 2017-03-29 2020-06-17 Redlux Ltd Inspection of components for imperfections
CN110646169B (en) * 2019-10-28 2022-03-08 沈阳仪表科学研究院有限公司 Method for measuring reflectivity of curved surface optical film element
WO2023041659A1 (en) 2021-09-16 2023-03-23 Schneider Gmbh & Co. Kg Method and apparatus for quality control of ophthalmic lenses
CN114486939B (en) * 2022-04-08 2022-07-22 欧普康视科技股份有限公司 Lens scratch detection system and method

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Also Published As

Publication number Publication date
PT99855B (en) 1999-02-26
EP0491663A1 (en) 1992-06-24
ES2082178T3 (en) 1996-03-16
CA2057832A1 (en) 1992-06-20
JPH04321186A (en) 1992-11-11
ATE132971T1 (en) 1996-01-15
GR3018639T3 (en) 1996-04-30
EP0491663B1 (en) 1996-01-10
IE914411A1 (en) 1992-07-01
AU8881691A (en) 1992-06-25
AU649291B2 (en) 1994-05-19
DE59107249D1 (en) 1996-02-22
DK0491663T3 (en) 1996-02-05
KR100202215B1 (en) 1999-06-15
PT99855A (en) 1994-01-31
IE70436B1 (en) 1996-11-27
KR920012892A (en) 1992-07-28

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Legal Events

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PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)