GB9907643D0 - Measuring probe - Google Patents

Measuring probe

Info

Publication number
GB9907643D0
GB9907643D0 GBGB9907643.2A GB9907643A GB9907643D0 GB 9907643 D0 GB9907643 D0 GB 9907643D0 GB 9907643 A GB9907643 A GB 9907643A GB 9907643 D0 GB9907643 D0 GB 9907643D0
Authority
GB
United Kingdom
Prior art keywords
measuring probe
probe
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB9907643.2A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw PLC filed Critical Renishaw PLC
Priority to GBGB9907643.2A priority Critical patent/GB9907643D0/en
Publication of GB9907643D0 publication Critical patent/GB9907643D0/en
Priority to DE60015465T priority patent/DE60015465T2/de
Priority to EP04077945.6A priority patent/EP1505362B1/en
Priority to US09/701,335 priority patent/US6430833B1/en
Priority to PCT/GB2000/001309 priority patent/WO2000060307A1/en
Priority to EP00915298A priority patent/EP1086352B1/en
Priority to JP2000609757A priority patent/JP4726303B2/ja
Priority to US10/188,811 priority patent/US7146741B2/en
Priority to JP2007101061A priority patent/JP5210536B2/ja
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
    • G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
    • G01B11/007—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines feeler heads therefor
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S33/00—Geometrical instruments
    • Y10S33/03—Photoelectric

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Length Measuring Devices By Optical Means (AREA)
GBGB9907643.2A 1999-04-06 1999-04-06 Measuring probe Ceased GB9907643D0 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
GBGB9907643.2A GB9907643D0 (en) 1999-04-06 1999-04-06 Measuring probe
DE60015465T DE60015465T2 (de) 1999-04-06 2000-04-06 Messarm mit membranen (modulen)
EP04077945.6A EP1505362B1 (en) 1999-04-06 2000-04-06 Measuring probe with modules
US09/701,335 US6430833B1 (en) 1999-04-06 2000-04-06 Measuring probe with diaphragms and modules
PCT/GB2000/001309 WO2000060307A1 (en) 1999-04-06 2000-04-06 Measuring probe with diaphragms and modules
EP00915298A EP1086352B1 (en) 1999-04-06 2000-04-06 Measuring probe with diaphragms ( modules)
JP2000609757A JP4726303B2 (ja) 1999-04-06 2000-04-06 ダイアフラムおよびモジュールを備えた測定プローブ
US10/188,811 US7146741B2 (en) 1999-04-06 2002-07-05 Measuring probe with diaphragms and modules
JP2007101061A JP5210536B2 (ja) 1999-04-06 2007-04-06 測定プローブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9907643.2A GB9907643D0 (en) 1999-04-06 1999-04-06 Measuring probe

Publications (1)

Publication Number Publication Date
GB9907643D0 true GB9907643D0 (en) 1999-05-26

Family

ID=10850899

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB9907643.2A Ceased GB9907643D0 (en) 1999-04-06 1999-04-06 Measuring probe

Country Status (6)

Country Link
US (2) US6430833B1 (enExample)
EP (2) EP1505362B1 (enExample)
JP (2) JP4726303B2 (enExample)
DE (1) DE60015465T2 (enExample)
GB (1) GB9907643D0 (enExample)
WO (1) WO2000060307A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113937593A (zh) * 2021-09-23 2022-01-14 吾拾微电子(苏州)有限公司 一种探针卡针脚修复整形装置

Families Citing this family (33)

* Cited by examiner, † Cited by third party
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GB9907643D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Measuring probe
US6718647B2 (en) 2000-06-14 2004-04-13 Renishaw Plc Force sensing probe
GB0102324D0 (en) 2001-01-30 2001-03-14 Renishaw Plc Capacitance type displacement responsive device and a suspension system for a displacement responsive device
DE10122200A1 (de) † 2001-05-08 2002-11-14 Zeiss Carl Tastkopf für ein Koordinatenmeßgerät. Koordinatenmeßgerät, Kalibrierkörper für ein Koordinatenmeßgerät und Verfahren zum Kalibrieren eines Koordinatenmeßgerätes
GB0201845D0 (en) 2002-01-26 2002-03-13 Renishaw Plc Analogue probe
US20040125382A1 (en) * 2002-12-30 2004-07-01 Banks Anton G. Optically triggered probe
JP4436257B2 (ja) * 2003-01-31 2010-03-24 カール ツァイス インドゥストリーレ メステクニーク ゲーエムベーハー 座標測定機械用プローブヘッド
US6772527B1 (en) 2003-04-09 2004-08-10 Renishaw Plc Modular measurement device
US7281920B2 (en) * 2005-03-28 2007-10-16 Komag, Inc. Die set utilizing compliant gasket
JP4663378B2 (ja) * 2005-04-01 2011-04-06 パナソニック株式会社 形状測定装置及び方法
GB0508388D0 (en) 2005-04-26 2005-06-01 Renishaw Plc Surface sensing device with optical sensor
GB0508395D0 (en) * 2005-04-26 2005-06-01 Renishaw Plc Method for scanning the surface of a workpiece
DE102005036126A1 (de) * 2005-07-26 2007-02-01 Carl Zeiss Industrielle Messtechnik Gmbh Sensormodul für einen Tastkopf eines taktilen Koordinatenmessgerätes
GB0608998D0 (en) * 2006-05-08 2006-06-14 Renishaw Plc Contact sensing probe
JP5276803B2 (ja) * 2007-06-11 2013-08-28 パナソニック株式会社 形状測定方法
EP2028439A1 (en) * 2007-07-26 2009-02-25 Renishaw plc Deactivatable measurement apparatus
TWI417515B (zh) * 2007-08-03 2013-12-01 Hon Hai Prec Ind Co Ltd 高度儀
DE102008038134A1 (de) 2007-09-13 2009-04-16 Hexagon Metrology Gmbh Tastkopf
JP5221211B2 (ja) * 2008-06-02 2013-06-26 パナソニック株式会社 形状測定装置
JP5209440B2 (ja) * 2008-10-30 2013-06-12 独立行政法人理化学研究所 形状測定プローブ
JP2010160002A (ja) * 2009-01-07 2010-07-22 Mitsutoyo Corp 変位センサ、及び測定機
CN103562672B (zh) 2011-01-19 2016-09-28 瑞尼斯豪公司 用于机床设备的模拟测量探头
JP6063233B2 (ja) * 2012-12-05 2017-01-18 株式会社ミツトヨ 測定子支持機構及びプローブ
JP6049785B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6049786B2 (ja) * 2015-03-05 2016-12-21 株式会社ミツトヨ 測定プローブ
JP6039718B2 (ja) 2015-03-05 2016-12-07 株式会社ミツトヨ 測定プローブ
US9791262B2 (en) * 2015-12-17 2017-10-17 Mitutoyo Corporation Measurement device with multiplexed position signals
US9803972B2 (en) 2015-12-17 2017-10-31 Mitutoyo Corporation Optical configuration for measurement device
US10101141B2 (en) 2016-12-07 2018-10-16 Mitutoyo Corporation Trigger counter for measurement device with count values stored in flash memory
US11428589B2 (en) * 2017-10-16 2022-08-30 Saf-Holland, Inc. Displacement sensor utilizing ronchi grating interference
KR102522627B1 (ko) * 2020-09-17 2023-04-17 주식회사 제이시스메디칼 초음파 발생부의 집속 깊이의 변경이 가능한 초음파 의료 장치
CN112757631B (zh) * 2020-12-21 2022-11-11 深圳市创想三维科技股份有限公司 一种3d打印机的自动调平装置及3d打印机
JP2024507196A (ja) * 2021-02-17 2024-02-16 レニショウ パブリック リミテッド カンパニー 関節部材

Family Cites Families (44)

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Publication number Priority date Publication date Assignee Title
GB1551218A (en) 1975-05-13 1979-08-22 Rolls Royce Probe for use in displacement measuring apparatus
US4110611A (en) * 1975-12-17 1978-08-29 Candid Logic, Inc. Optical position transducer
US4158919A (en) 1976-03-24 1979-06-26 Rolls-Royce Limited Apparatus for measuring displacement in at least two orthogonal dimensions
GB1593682A (en) * 1977-01-20 1981-07-22 Rolls Royce Probe for use in mearusing apparatus
US4187614A (en) 1978-08-04 1980-02-12 Mitsubishi Jukogyo Kabushiki Kaisha Tracer head
US4443946A (en) * 1980-07-01 1984-04-24 Renishaw Electrical Limited Probe for measuring workpieces
US4523383A (en) 1982-07-28 1985-06-18 Renishaw Electrical Limited Position sensing apparatus
DE3229992C2 (de) * 1982-08-12 1986-02-06 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
DE3234471C1 (de) * 1982-09-17 1983-08-25 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Mehrkoordinaten-Tastkopf
JPH0617766B2 (ja) * 1984-08-23 1994-03-09 株式会社ミツトヨ タッチ信号プロ−ブ
US4625417A (en) * 1985-06-17 1986-12-02 Gte Valeron Corporation Probe with stylus pressure adjustment
US4734994A (en) * 1986-12-22 1988-04-05 Gte Valeron Corporation Probe having a plurality of hinged plates
US4752166A (en) * 1987-01-02 1988-06-21 Manuflex Corp. Probing device
US5154002A (en) * 1987-02-26 1992-10-13 Klaus Ulbrich Probe, motion guiding device, position sensing apparatus, and position sensing method
GB8728500D0 (en) * 1987-12-05 1988-01-13 Renishaw Plc Position sensing probe
CH674485A5 (enExample) * 1988-03-11 1990-06-15 Saphirwerk Ind Prod
GB8815984D0 (en) * 1988-07-05 1988-08-10 Univ Brunel Probes
DE3824548A1 (de) * 1988-07-20 1990-01-25 Zeiss Carl Fa Verfahren und einrichtung fuer den betrieb eines tastkopfes vom schaltenden typ
DE3834117A1 (de) * 1988-10-07 1990-04-12 Zeiss Carl Fa Koordinatenmessgeraet mit einem optischen tastkopf
DE68914148T2 (de) 1988-10-11 1994-07-07 Renishaw Plc Messsonde mit Lagern, deren Rollelemente zentralisiert sind.
US4896543A (en) * 1988-11-15 1990-01-30 Sri International, Inc. Three-axis force measurement stylus
JPH0789045B2 (ja) * 1988-12-15 1995-09-27 富山県 三次元変位量測定器
US5209131A (en) 1989-11-03 1993-05-11 Rank Taylor Hobson Metrology
US5010773A (en) * 1990-01-24 1991-04-30 Wisconsin Alumni Research Foundation Sensor tip for a robotic gripper and method of manufacture
GB9001682D0 (en) * 1990-01-25 1990-03-28 Renishaw Plc Position sensing probe
US5339535A (en) * 1990-02-23 1994-08-23 Renishaw Metrology Limited Touch probe
US5491904A (en) * 1990-02-23 1996-02-20 Mcmurtry; David R. Touch probe
GB9004117D0 (en) * 1990-02-23 1990-04-18 Renishaw Plc Touch probe
US5390423A (en) * 1991-01-22 1995-02-21 Renishaw Plc Analogue probe
EP0501710B1 (en) 1991-02-25 1995-04-12 Renishaw Metrology Limited Touch probe
GB9111382D0 (en) * 1991-05-25 1991-07-17 Renishaw Metrology Ltd Improvements in measuring probes
DE59208088D1 (de) * 1991-06-07 1997-04-10 Saphirwerk Ind Prod Tastmesskopf
GB9116044D0 (en) * 1991-07-24 1991-09-11 Nat Res Dev Probes
GB9117974D0 (en) * 1991-08-20 1991-10-09 Renishaw Metrology Ltd Non-contact trigger probe
JPH0792373B2 (ja) * 1991-09-25 1995-10-09 株式会社ミツトヨ タッチ信号プローブ
JP3279317B2 (ja) * 1991-11-09 2002-04-30 レニショウ メタロジィ リミテッド 接触プローブ
DE4217641C2 (de) * 1992-05-28 1997-07-17 Wolfgang Madlener Tastkopf zum dreidimensionalen Antasten von Werkstücken
EP0605140B2 (en) * 1992-12-24 2002-10-09 Renishaw plc Touch probe and signal processing circuit therefor
DE4325743C1 (de) * 1993-07-31 1994-09-08 Heidenhain Gmbh Dr Johannes Mehrkoordinaten-Tastkopf
GB9423176D0 (en) * 1994-11-17 1995-01-04 Renishaw Plc Touch probe
IT1299955B1 (it) * 1998-04-06 2000-04-04 Marposs Spa Testa per il controllo di dimensioni lineari di pezzi.
US6430828B1 (en) * 1998-04-17 2002-08-13 Electronic Measuring Devices, Inc. Coordinate positioning apparatus with indexable stylus, components thereof, and method of using it
GB9907643D0 (en) * 1999-04-06 1999-05-26 Renishaw Plc Measuring probe
US6718647B2 (en) * 2000-06-14 2004-04-13 Renishaw Plc Force sensing probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113937593A (zh) * 2021-09-23 2022-01-14 吾拾微电子(苏州)有限公司 一种探针卡针脚修复整形装置

Also Published As

Publication number Publication date
DE60015465D1 (de) 2004-12-09
US20020174556A1 (en) 2002-11-28
JP2002541444A (ja) 2002-12-03
US7146741B2 (en) 2006-12-12
JP2007183294A (ja) 2007-07-19
EP1086352A1 (en) 2001-03-28
EP1086352B1 (en) 2004-11-03
US6430833B1 (en) 2002-08-13
JP5210536B2 (ja) 2013-06-12
WO2000060307A1 (en) 2000-10-12
DE60015465T2 (de) 2005-03-24
EP1505362B1 (en) 2015-11-18
JP4726303B2 (ja) 2011-07-20
EP1505362A1 (en) 2005-02-09

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)