GB826004A - Improvements relating to apparatus for the testing of optical systems - Google Patents

Improvements relating to apparatus for the testing of optical systems

Info

Publication number
GB826004A
GB826004A GB138155A GB138155A GB826004A GB 826004 A GB826004 A GB 826004A GB 138155 A GB138155 A GB 138155A GB 138155 A GB138155 A GB 138155A GB 826004 A GB826004 A GB 826004A
Authority
GB
United Kingdom
Prior art keywords
focused
lens
mirror
point
beams
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB138155A
Inventor
James Dyson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Priority to GB138155A priority Critical patent/GB826004A/en
Publication of GB826004A publication Critical patent/GB826004A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02034Interferometers characterised by particularly shaped beams or wavefronts
    • G01B9/02038Shaping the wavefront, e.g. generating a spherical wavefront
    • G01B9/02039Shaping the wavefront, e.g. generating a spherical wavefront by matching the wavefront with a particular object surface shape
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00Measuring instruments characterised by the use of optical techniques
    • G01B9/02Interferometers
    • G01B9/02015Interferometers characterised by the beam path configuration
    • G01B9/02017Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
    • G01B9/02019Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different points on same face of object
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005Testing of reflective surfaces, e.g. mirrors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

826,004. Optical apparatus. ASSOCIATED ELECTRICAL INDUSTRIES Ltd. Jan. 17, 1956 [Jan. 17, 1955], No. 1381/55. Class 97(1) Apparatus for inspecting optical systems comprises means for producing two beams of light plane polarized at right angles and projecting said beams into a system to be tested in such a manner that one of the beams is distributed over the whole surface or cross-section of the system and the other beam is focused on to a small area of the cross-section of the system, and means for combining the two beams emerging from the system to produce an interference fringe pattern, the arrangement being such that irregularities of the system under test cause distortion of the fringe system. Fig. 1 shows. an arrangement for testing a concave spherical mirror 7. At the centre of curvature of the mirror 7 is placed a triplet lens 3, 4, 5 and a lens 10, the central lens 4 of the triplet being birefringent with its optic axis in the plane of the lens, the triplet having zero power for the extraordinary beam but being converging for the ordinary beam. A beam of light 1 plane polarized at 45 degrees to the optic axis of the birefringent lens is divided into two beams of equal intensity. The extraordinary beam is focused by the lens 10 at the pole 8 of the mirror and is returned to the lenses as an ordinary beam after double passage through a greater wave plate 9 and is therefore focused by the lenses at a point 11. The ordinary beam is focused by the lenses at a point 6 thence it diverges to cover the whole mirror 7 and to be returned thereby as an extraordinary beam after double passage through the photo 9 to be also focused at the point 11. An analyser is placed in the combined beams at point 11 to enable interference to take place or the reflector 2 may be multilayer to act as as analyser. Fig. 5 shows a second system for testing a concave spherical mirror 9. A narrower collimated beam 1 is divided by a polarizing reflector into a plane-polarized reflected beam incident at 17 on the mirror 9 and a transmitted beam polarized at right-angles thereto and focused by a lens 7 at the centre of curvature 8 of the mirror after reflection at reflectors 4, 5, 6. The beam focused at 8 diverges to reach the whole aperture of the mirror, is reflected back thereby to the point 8 and then focused by the lens 7 at a point 11 at which the beam reflected at point 17 is also focused, an analyser 12 being provided in the combined beams. The device may also be used to test a positive or negative lens, a suitable mirror being provided to return the light through the system.
GB138155A 1955-01-17 1955-01-17 Improvements relating to apparatus for the testing of optical systems Expired GB826004A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB138155A GB826004A (en) 1955-01-17 1955-01-17 Improvements relating to apparatus for the testing of optical systems

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB138155A GB826004A (en) 1955-01-17 1955-01-17 Improvements relating to apparatus for the testing of optical systems

Publications (1)

Publication Number Publication Date
GB826004A true GB826004A (en) 1959-12-23

Family

ID=9721027

Family Applications (1)

Application Number Title Priority Date Filing Date
GB138155A Expired GB826004A (en) 1955-01-17 1955-01-17 Improvements relating to apparatus for the testing of optical systems

Country Status (1)

Country Link
GB (1) GB826004A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110274545A (en) * 2019-06-28 2019-09-24 爱丁堡(南京)光电设备有限公司 Shaven head, measurer for thickness and the measurement method of luminous point differential type contactless element thickness measure
CN117347317A (en) * 2023-12-06 2024-01-05 常州微亿智造科技有限公司 Large-depth spectrometer for frequency domain optical coherence tomography system and application thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110274545A (en) * 2019-06-28 2019-09-24 爱丁堡(南京)光电设备有限公司 Shaven head, measurer for thickness and the measurement method of luminous point differential type contactless element thickness measure
CN117347317A (en) * 2023-12-06 2024-01-05 常州微亿智造科技有限公司 Large-depth spectrometer for frequency domain optical coherence tomography system and application thereof
CN117347317B (en) * 2023-12-06 2024-03-08 常州微亿智造科技有限公司 Large-depth spectrometer for frequency domain optical coherence tomography system and application thereof

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