GB894953A - Device for inspecting reflective surfaces having a rectilinear generatrix - Google Patents

Device for inspecting reflective surfaces having a rectilinear generatrix

Info

Publication number
GB894953A
GB894953A GB3842760A GB3842760A GB894953A GB 894953 A GB894953 A GB 894953A GB 3842760 A GB3842760 A GB 3842760A GB 3842760 A GB3842760 A GB 3842760A GB 894953 A GB894953 A GB 894953A
Authority
GB
United Kingdom
Prior art keywords
schafer
mirrors
lens
line
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3842760A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GEORG SCHAEFER JR
OTTO SCHAEFER JR
Original Assignee
GEORG SCHAEFER JR
OTTO SCHAEFER JR
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GEORG SCHAEFER JR, OTTO SCHAEFER JR filed Critical GEORG SCHAEFER JR
Publication of GB894953A publication Critical patent/GB894953A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Textile Engineering (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

894,953. Optical testing apparatus; microscopes. SCHAFER, G., SCHAFER, O., SCHAFER, jun. G., and SCHAFER, jun. O., [trading as KUGELFISCHER G. SCHAFER & CO.]. Nov. 9, 1960 [Nov. 23, 1959], No. 38427/60. Class 97(1). [Also in Group XL(b)] A device for inspecting, for surface defects, a reflective surface generated by straight lines, e.g. a plane or a cylindrical surface, including a lens or the objective of a microscope, in which a beam from a light source is directed from above towards the surface over which it moves and from which it is then reflected, comprises a system of mirrors directing the beam along a line parallel to the linear generatrix of the surface before it is directed on to said surface, and the mirrors are arranged in relation to the light source and the surface under inspection in such a manner that the total length of the path of the light beam between the surface under inspection and the lens or objective of the microscope is maintained constant, and that the light beam always strikes the surface under inspection at the same angle. The reflected beam may be directed to a photo-electric cell detecting the variations of reflectivity of the surface, or the reflected beam may be viewed directly via the objective of the microscope. As shown, the beam 2 from a light source 1 is passed by a half-silvered mirror 3 and lens 4 to a pair of mirrors 5, 5 which are at right angles to each other. To scan a line on the surface 6, the mirrors 5 are moved in the direction of the arrows 7, and in all positions, the length of the path from the lens 4 to the surface 6 is invariable. The reflected beam is passed from the mirror 3 over the path 9 to a photo-cell 8, or may be viewed directly. A line on the surface is scanned by movement of the mirrors 5 through a distance equal to half the length of the line, and the surface is scanned by giving it movement transversely of the surface generating lines.
GB3842760A 1959-11-23 1960-11-09 Device for inspecting reflective surfaces having a rectilinear generatrix Expired GB894953A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEK39245A DE1176398B (en) 1959-11-23 1959-11-23 Optical device for testing reflective surfaces with a straight generator

Publications (1)

Publication Number Publication Date
GB894953A true GB894953A (en) 1962-04-26

Family

ID=7221650

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3842760A Expired GB894953A (en) 1959-11-23 1960-11-09 Device for inspecting reflective surfaces having a rectilinear generatrix

Country Status (2)

Country Link
DE (1) DE1176398B (en)
GB (1) GB894953A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5015096A (en) * 1986-10-10 1991-05-14 Kowalski Frank V Method and apparatus for testing optical components

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1773965B1 (en) * 1968-08-01 1971-03-25 Leitz Ernst Gmbh DEVICE FOR GENERATING A SWINGING LIGHT BEAM
DE3446354A1 (en) * 1984-12-19 1986-06-26 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch OPTOELECTRONIC COMPARATIVE DEVICE FOR STRUCTURES ON LEVEL SURFACES OR FOR FLAT STRUCTURES

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1036537B (en) * 1956-07-18 1958-08-14 Licentia Gmbh Arrangement for observation of running paths

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5015096A (en) * 1986-10-10 1991-05-14 Kowalski Frank V Method and apparatus for testing optical components

Also Published As

Publication number Publication date
DE1176398B (en) 1964-08-20

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