GB2497135A - Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection - Google Patents

Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection Download PDF

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Publication number
GB2497135A
GB2497135A GB1120774.3A GB201120774A GB2497135A GB 2497135 A GB2497135 A GB 2497135A GB 201120774 A GB201120774 A GB 201120774A GB 2497135 A GB2497135 A GB 2497135A
Authority
GB
United Kingdom
Prior art keywords
text
pixel
intensity
optical detector
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GB1120774.3A
Other languages
English (en)
Other versions
GB201120774D0 (en
Inventor
Stephen Sharples
Roger Light
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Nottingham
Original Assignee
University of Nottingham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Nottingham filed Critical University of Nottingham
Priority to GB1120774.3A priority Critical patent/GB2497135A/en
Publication of GB201120774D0 publication Critical patent/GB201120774D0/en
Priority to CN201280066613.4A priority patent/CN104204774B/zh
Priority to EP12821119.0A priority patent/EP2786123A1/en
Priority to PCT/GB2012/052965 priority patent/WO2013079960A1/en
Priority to JP2014543976A priority patent/JP6193875B2/ja
Priority to US14/362,392 priority patent/US9733177B2/en
Publication of GB2497135A publication Critical patent/GB2497135A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/10—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/16—Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void using electric radiation detectors
    • G01J1/1626—Arrangements with two photodetectors, the signals of which are compared
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01H—MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H9/00—Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves by using radiation-sensitive means, e.g. optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06113—Coherent sources; lasers
    • G01N2201/0612—Laser diodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/067—Electro-optic, magneto-optic, acousto-optic elements
    • G01N2201/0675—SLM

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
GB1120774.3A 2011-12-02 2011-12-02 Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection Withdrawn GB2497135A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GB1120774.3A GB2497135A (en) 2011-12-02 2011-12-02 Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection
CN201280066613.4A CN104204774B (zh) 2011-12-02 2012-11-30 用于光学评估的方法和系统以及光学检测器
EP12821119.0A EP2786123A1 (en) 2011-12-02 2012-11-30 Method and system for optical evaluation, and optical detector
PCT/GB2012/052965 WO2013079960A1 (en) 2011-12-02 2012-11-30 Method and system for optical evaluation, and optical detector
JP2014543976A JP6193875B2 (ja) 2011-12-02 2012-11-30 光学評価のための方法およびシステム、ならびに光学検出器
US14/362,392 US9733177B2 (en) 2011-12-02 2012-11-30 Method and system for optical evaluation, and optical detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1120774.3A GB2497135A (en) 2011-12-02 2011-12-02 Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection

Publications (2)

Publication Number Publication Date
GB201120774D0 GB201120774D0 (en) 2012-01-11
GB2497135A true GB2497135A (en) 2013-06-05

Family

ID=45509079

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1120774.3A Withdrawn GB2497135A (en) 2011-12-02 2011-12-02 Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection

Country Status (6)

Country Link
US (1) US9733177B2 (enExample)
EP (1) EP2786123A1 (enExample)
JP (1) JP6193875B2 (enExample)
CN (1) CN104204774B (enExample)
GB (1) GB2497135A (enExample)
WO (1) WO2013079960A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2497135A (en) * 2011-12-02 2013-06-05 Univ Nottingham Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection
US20180172644A1 (en) * 2015-06-18 2018-06-21 Socpra Sciences Et Génie S.E.C. Method and system for acoustically scanning a sample
JP6872450B2 (ja) 2017-07-25 2021-05-19 株式会社日立製作所 レーザ変位計と、それを用いたレーザ超音波検査装置
US11169026B2 (en) * 2018-11-30 2021-11-09 Munro Design & Technologies, Llc Optical measurement systems and methods thereof

Citations (4)

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Publication number Priority date Publication date Assignee Title
US4032801A (en) * 1975-10-10 1977-06-28 Honeywell Inc. Electromagnetic radiation intensity comparator apparatus
WO2003049018A1 (en) * 2001-12-05 2003-06-12 Em Microelectronic-Marin Sa Method and sensing device for motion detection in an optical pointing device, such as an optical mouse
US20060138306A1 (en) * 2004-12-27 2006-06-29 Gil Afriat Method and sensing device for motion detection in an optical pointing device, such as an optical mouse
US20090140981A1 (en) * 2002-12-05 2009-06-04 Atlab Inc. Image sensor and optical pointing system

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US3700903A (en) * 1970-12-09 1972-10-24 Zenith Radio Corp Optical detecting systems for sensing variations in the lateral motion of light rays
JPS6036922A (ja) 1983-08-10 1985-02-26 Hitachi Ltd 遠隔振動測定装置
US4567769A (en) * 1984-03-08 1986-02-04 Rockwell International Corporation Contact-free ultrasonic transduction for flaw and acoustic discontinuity detection
FR2620823B1 (fr) * 1987-09-17 1990-08-17 Centre Tech Ind Papier Dispositif pour determiner en continu un indice d'etat de surface d'un materiau en feuille en mouvement
US5013919A (en) 1989-10-17 1991-05-07 Grumman Aerospace Corporation Detector element signal comparator system
JP3371526B2 (ja) * 1994-03-31 2003-01-27 日産自動車株式会社 塗装面状態検出装置および塗装面状態検出方法
US6097477A (en) * 1994-05-27 2000-08-01 American Research Corporation Of Virginia Laser speckle strain and deformation sensor using linear array image cross-correlation method for specifically arranged triple-beam triple-camera configuration
US5585921A (en) * 1995-03-15 1996-12-17 Hughes Aircraft Company Laser-ultrasonic non-destructive, non-contacting inspection system
US6144685A (en) * 1996-01-23 2000-11-07 Fuji Xerox Co., Ltd. Two-dimensional surface emitting laser array, two-dimensional surface emitting laser beam scanner, two-dimensional surface emitting laser beam recorder, and two-dimensional surface emitting laser beam recording method
US5760904A (en) * 1996-07-26 1998-06-02 General Electric Company Method and system for inspecting a surface of an object with laser ultrasound
US6075603A (en) * 1997-05-01 2000-06-13 Hughes Electronics Corporation Contactless acoustic sensing system with detector array scanning and self-calibrating
US6115127A (en) * 1997-11-17 2000-09-05 Institute Of Paper Science And Technology Non-contact measurements of ultrasonic waves on paper webs using a photorefractive interferometer
EP1301028A1 (en) * 2001-10-05 2003-04-09 STMicroelectronics Limited Improvements in or relating to CMOS Image sensors
US6590610B2 (en) * 2001-12-10 2003-07-08 Motorola, Inc. Digital double sampling in time integrating pixel sensors
US7088455B1 (en) * 2002-04-08 2006-08-08 Providence Health Systems —Oregon Methods and apparatus for material evaluation using laser speckle
US7324665B2 (en) * 2002-09-16 2008-01-29 Massachusetts Institute Of Technology Method of multi-resolution adaptive correlation processing
US7089796B2 (en) * 2004-03-24 2006-08-15 Hrl Laboratories, Llc Time-reversed photoacoustic system and uses thereof
JP3908751B2 (ja) * 2004-04-30 2007-04-25 株式会社東芝 音響電気変換素子
US7397596B2 (en) * 2004-07-28 2008-07-08 Ler Technologies, Inc. Surface and subsurface detection sensor
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GB0513756D0 (en) * 2005-07-06 2005-08-10 Univ Nottingham Spatially resolved acoustic spectroscopy imaging
IL174713A0 (en) * 2006-04-02 2007-05-15 Abraham Aharoni System and method for optical sensing of surface motions
IL176694A0 (en) * 2006-07-04 2006-10-31 Univ Ramot Method and device for low light level imaging
US8042397B2 (en) * 2007-05-16 2011-10-25 The Boeing Company Damage volume and depth estimation
CN101055265B (zh) 2007-05-16 2010-05-19 南京大学 功能梯度材料的表面和近表面分层层析方法
WO2009008010A2 (en) * 2007-07-12 2009-01-15 Defence Research And Development Organisation Method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a detector
JP5058109B2 (ja) * 2008-09-19 2012-10-24 新日本製鐵株式会社 レーザ超音波法による材料中の縦波と横波の音速の計測方法及び装置
US8616062B2 (en) * 2010-02-16 2013-12-31 Hitachi-Ge Nuclear Energy, Ltd. Ultrasonic inspection system and ultrasonic inspection method
GB2497135A (en) * 2011-12-02 2013-06-05 Univ Nottingham Optical detector with a plurality of pixel pairs for laser ultrasonic surface inspection

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4032801A (en) * 1975-10-10 1977-06-28 Honeywell Inc. Electromagnetic radiation intensity comparator apparatus
WO2003049018A1 (en) * 2001-12-05 2003-06-12 Em Microelectronic-Marin Sa Method and sensing device for motion detection in an optical pointing device, such as an optical mouse
US20090140981A1 (en) * 2002-12-05 2009-06-04 Atlab Inc. Image sensor and optical pointing system
US20060138306A1 (en) * 2004-12-27 2006-06-29 Gil Afriat Method and sensing device for motion detection in an optical pointing device, such as an optical mouse

Also Published As

Publication number Publication date
JP2015505362A (ja) 2015-02-19
CN104204774A (zh) 2014-12-10
US9733177B2 (en) 2017-08-15
US20150260640A1 (en) 2015-09-17
WO2013079960A1 (en) 2013-06-06
GB201120774D0 (en) 2012-01-11
JP6193875B2 (ja) 2017-09-06
CN104204774B (zh) 2017-06-09
EP2786123A1 (en) 2014-10-08

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