GB2495260B - X-ray diffraction method and portable x-ray diffraction apparatus using same - Google Patents

X-ray diffraction method and portable x-ray diffraction apparatus using same

Info

Publication number
GB2495260B
GB2495260B GB1301244.8A GB201301244A GB2495260B GB 2495260 B GB2495260 B GB 2495260B GB 201301244 A GB201301244 A GB 201301244A GB 2495260 B GB2495260 B GB 2495260B
Authority
GB
United Kingdom
Prior art keywords
ray diffraction
portable
same
diffraction method
diffraction apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB1301244.8A
Other languages
English (en)
Other versions
GB2495260A (en
GB201301244D0 (en
Inventor
Nakano Asao
Ueji Yoshinori
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rigaku Denki Co Ltd
Rigaku Corp
Original Assignee
Rigaku Denki Co Ltd
Rigaku Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd, Rigaku Corp filed Critical Rigaku Denki Co Ltd
Publication of GB201301244D0 publication Critical patent/GB201301244D0/en
Publication of GB2495260A publication Critical patent/GB2495260A/en
Application granted granted Critical
Publication of GB2495260B publication Critical patent/GB2495260B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/301—Accessories, mechanical or electrical features portable apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB1301244.8A 2010-07-28 2011-07-28 X-ray diffraction method and portable x-ray diffraction apparatus using same Expired - Fee Related GB2495260B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010169338A JP5788153B2 (ja) 2010-07-28 2010-07-28 Ｘ線回折方法及びそれを用いた可搬型ｘ線回折装置
PCT/JP2011/067278 WO2012014982A1 (ja) 2010-07-28 2011-07-28 Ｘ線回折方法及びそれを用いた可搬型ｘ線回折装置

Publications (3)

Publication Number Publication Date
GB201301244D0 GB201301244D0 (en) 2013-03-06
GB2495260A GB2495260A (en) 2013-04-03
GB2495260B true GB2495260B (en) 2016-11-02

Family

ID=45530182

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1301244.8A Expired - Fee Related GB2495260B (en) 2010-07-28 2011-07-28 X-ray diffraction method and portable x-ray diffraction apparatus using same

Country Status (6)

Country Link
US (1) US9518940B2 (enExample)
JP (1) JP5788153B2 (enExample)
CN (1) CN103026215B (enExample)
DE (1) DE112011102492T5 (enExample)
GB (1) GB2495260B (enExample)
WO (1) WO2012014982A1 (enExample)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5695589B2 (ja) * 2012-03-02 2015-04-08 株式会社リガク Ｘ線強度補正方法およびｘ線回折装置
CN102625555A (zh) * 2012-04-05 2012-08-01 无锡日联科技有限公司 一种可用于连续工作状态下的物理聚焦微焦点x射线源
KR20140145682A (ko) * 2013-06-13 2014-12-24 삼성전자주식회사 엑스선 영상 장치 및 그 제어방법
US10161887B2 (en) * 2015-01-20 2018-12-25 United Technologies Corporation Systems and methods for materials analysis
CN104897705B (zh) * 2015-06-26 2019-05-21 北京师范大学 一种识别液体种类的x射线衍射谱仪与方法
KR101867318B1 (ko) * 2016-11-23 2018-06-15 (주)이림전자 휴대용 엑스레이장치의 엑스레이 모듈 어셈블리
JP6776181B2 (ja) * 2017-05-31 2020-10-28 株式会社神戸製鋼所 応力測定方法
WO2019117276A1 (ja) * 2017-12-15 2019-06-20 株式会社堀場製作所 放射線検出器及び放射線検出装置
EP3885748A4 (en) * 2018-11-22 2022-10-19 Rigaku Corporation SAMPLE HOLDER OF A SINGLE-CRYSTAL X-RAY STRUCTURAL ANALYSIS DEVICE, SAMPLE HOLDER UNIT AND OCCLUSION METHOD

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000146872A (ja) * 1998-11-17 2000-05-26 Rigaku Corp Ｘ線回折装置
JP2000314709A (ja) * 1999-04-30 2000-11-14 Agency Of Ind Science & Technol 結晶構造データと構成元素データを同時に計測するシステム及び方法
JP2002350373A (ja) * 2001-05-29 2002-12-04 Seiko Instruments Inc 複合ｘ線分析装置
JP2007501395A (ja) * 2003-08-04 2007-01-25 エックス−レイ オプティカル システムズ インコーポレーテッド 角度位置を固定したＸ線源及びＸ線検出器を使用するｉｎ−ｓｉｔｕＸ線回折システム
US20090274274A1 (en) * 2008-05-01 2009-11-05 Bruker Axs, Inc. Handheld two-dimensional x-ray diffractometer

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2852682B2 (ja) * 1990-03-19 1999-02-03 マツダ株式会社 セラミック部品の強度測定法
US5497008A (en) * 1990-10-31 1996-03-05 X-Ray Optical Systems, Inc. Use of a Kumakhov lens in analytic instruments
JP2001194325A (ja) * 2000-01-06 2001-07-19 Ours Tex Kk Ｘ線分析装置および方法
US6697453B1 (en) * 2002-02-08 2004-02-24 Metscan Technologies, Llc Portable X-ray diffractometer
JP3912606B2 (ja) 2004-10-26 2007-05-09 株式会社リガク Ｘ線薄膜検査装置と、プロダクトウエーハの薄膜検査装置およびその方法
US7321652B2 (en) * 2005-09-15 2008-01-22 Jordan Valley Semiconductors Ltd. Multi-detector EDXRD
WO2008097345A2 (en) * 2006-08-10 2008-08-14 X-Ray Optical Systems, Inc. Wide parallel beam diffraction imaging method and system
EP2260294A4 (en) * 2008-02-25 2012-02-08 X Ray Optical Sys Inc SAMPLE MODULE WITH SAMPLE FLOWS WINDOW SPLIT, FOR X-RAY ANALYSIS SYSTEM
JP5150316B2 (ja) * 2008-03-12 2013-02-20 理研計器株式会社 エックス線分析装置用支持台
GB0807474D0 (en) * 2008-04-24 2008-12-03 Durham Scient Crystals Ltd Determination of Composition of Liquids
JP2012013423A (ja) * 2010-06-29 2012-01-19 Nippon Steel Corp Ｘ線応力測定装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000146872A (ja) * 1998-11-17 2000-05-26 Rigaku Corp Ｘ線回折装置
JP2000314709A (ja) * 1999-04-30 2000-11-14 Agency Of Ind Science & Technol 結晶構造データと構成元素データを同時に計測するシステム及び方法
JP2002350373A (ja) * 2001-05-29 2002-12-04 Seiko Instruments Inc 複合ｘ線分析装置
JP2007501395A (ja) * 2003-08-04 2007-01-25 エックス−レイ オプティカル システムズ インコーポレーテッド 角度位置を固定したＸ線源及びＸ線検出器を使用するｉｎ−ｓｉｔｕＸ線回折システム
US20090274274A1 (en) * 2008-05-01 2009-11-05 Bruker Axs, Inc. Handheld two-dimensional x-ray diffractometer

Also Published As

Publication number Publication date
GB2495260A (en) 2013-04-03
DE112011102492T5 (de) 2013-07-25
CN103026215B (zh) 2016-08-31
JP5788153B2 (ja) 2015-09-30
JP2012032164A (ja) 2012-02-16
US9518940B2 (en) 2016-12-13
CN103026215A (zh) 2013-04-03
WO2012014982A1 (ja) 2012-02-02
GB201301244D0 (en) 2013-03-06
US20130129051A1 (en) 2013-05-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20180728