GB2469914B - Gate drive circuitry for non-isolated gate semiconductor devices - Google Patents

Gate drive circuitry for non-isolated gate semiconductor devices

Info

Publication number
GB2469914B
GB2469914B GB1006917.7A GB201006917A GB2469914B GB 2469914 B GB2469914 B GB 2469914B GB 201006917 A GB201006917 A GB 201006917A GB 2469914 B GB2469914 B GB 2469914B
Authority
GB
United Kingdom
Prior art keywords
semiconductor devices
drive circuitry
gate
isolated
gate drive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1006917.7A
Other languages
English (en)
Other versions
GB201006917D0 (en
GB2469914A (en
Inventor
Antonio Caiafa
Jeffrey Joseph Nasadoski
John Stanley Glaser
Juan Antonio Sabate
Richard Alfred Beupre
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of GB201006917D0 publication Critical patent/GB201006917D0/en
Publication of GB2469914A publication Critical patent/GB2469914A/en
Application granted granted Critical
Publication of GB2469914B publication Critical patent/GB2469914B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/06Modifications for ensuring a fully conducting state
    • H03K17/063Modifications for ensuring a fully conducting state in field-effect transistor switches
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/12Modifications for increasing the maximum permissible switched current
    • H03K17/122Modifications for increasing the maximum permissible switched current in field-effect transistor switches
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/14Modifications for compensating variations of physical values, e.g. of temperature
    • H03K17/145Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/6877Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors the control circuit comprising active elements different from those used in the output circuit
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K2017/6875Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors using self-conductive, depletion FETs
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K2217/00Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0036Means reducing energy consumption
GB1006917.7A 2009-04-27 2010-04-26 Gate drive circuitry for non-isolated gate semiconductor devices Active GB2469914B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US17320109P 2009-04-27 2009-04-27
US12/495,048 US7915944B2 (en) 2009-04-27 2009-06-30 Gate drive circuitry for non-isolated gate semiconductor devices

Publications (3)

Publication Number Publication Date
GB201006917D0 GB201006917D0 (en) 2010-06-09
GB2469914A GB2469914A (en) 2010-11-03
GB2469914B true GB2469914B (en) 2012-04-04

Family

ID=42991589

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1006917.7A Active GB2469914B (en) 2009-04-27 2010-04-26 Gate drive circuitry for non-isolated gate semiconductor devices

Country Status (5)

Country Link
US (1) US7915944B2 (enExample)
JP (1) JP5010708B2 (enExample)
CA (1) CA2700013C (enExample)
DE (1) DE102010016611B4 (enExample)
GB (1) GB2469914B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2447988B1 (en) * 2010-11-02 2015-05-06 GE Energy Power Conversion Technology Limited Power electronic device with edge passivation
US8625743B1 (en) 2011-04-28 2014-01-07 General Electric Company Inverse pulse control for eddy current abatement
US8896182B2 (en) 2012-04-05 2014-11-25 General Electric Corporation System for driving a piezoelectric load and method of making same
FR2990312B1 (fr) * 2012-05-03 2015-05-15 Alstom Transport Sa Un dispositif comportant un composant electronique avec une grande vitesse de commutation
US8958217B2 (en) 2012-06-15 2015-02-17 General Electric Company System for driving a piezoelectric load and method of making same
US9389288B2 (en) 2012-09-14 2016-07-12 General Electric Company System and method for maintaining soft switching condition in a gradient coil driver circuit
US8917135B2 (en) 2013-05-14 2014-12-23 Infineon Technologies Austria Ag Circuit with a plurality of diodes and method for controlling such a circuit
US9231565B2 (en) 2013-05-14 2016-01-05 Infineon Technologies Austria Ag Circuit with a plurality of bipolar transistors and method for controlling such a circuit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030179021A1 (en) * 2002-03-22 2003-09-25 Siemens Aktiengesellschaft Drive control circuit for a junction field-effect transistor
US7233191B2 (en) * 2004-05-18 2007-06-19 Richtek Technology Corp. JFET driver circuit and JFET driving method
WO2007137569A1 (de) * 2006-05-31 2007-12-06 Technische Universität Chemnitz Schaltungsanordnung und verfahren zur gate- ansteuerung eines sperrschicht-feldeffekttransistors

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JPS62144564A (ja) * 1985-12-18 1987-06-27 Fuji Electric Co Ltd 静電誘導形トランジスタのゲ−ト駆動回路
JP3334290B2 (ja) * 1993-11-12 2002-10-15 株式会社デンソー 半導体装置
US5532896A (en) * 1994-04-26 1996-07-02 Coussens; Eugene Distributed silicon controlled rectifiers for ESD protection
US6628564B1 (en) * 1998-06-29 2003-09-30 Fujitsu Limited Semiconductor memory device capable of driving non-selected word lines to first and second potentials
US6392859B1 (en) * 1999-02-14 2002-05-21 Yazaki Corporation Semiconductor active fuse for AC power line and bidirectional switching device for the fuse
US6515534B2 (en) * 1999-12-30 2003-02-04 Intel Corporation Enhanced conductivity body biased PMOS driver
US6650520B2 (en) * 2001-10-26 2003-11-18 Koninklijke Philips Electronics N.V. Power supply reverse bias protection circuit for protecting both analog and digital devices coupled thereto
DE10212863B4 (de) * 2002-03-22 2006-06-08 Siemens Ag Ansteuerschaltung für einen Sperrschicht-Feldeffekttransistor
KR101042148B1 (ko) * 2004-05-08 2011-06-16 페어차일드코리아반도체 주식회사 기판 순환 전류가 억제되는 전력용 반도체 소자 및 그 제조 방법
JP4843253B2 (ja) * 2005-05-23 2011-12-21 株式会社東芝 電力用半導体装置
JP4600180B2 (ja) * 2005-06-27 2010-12-15 株式会社日立製作所 電界効果型パワー半導体素子を用いた半導体回路
DE102005030831B3 (de) 2005-07-01 2006-06-14 Siemens Ag Gate-Ansteuerschaltung für einen Sperrschicht-Feldeffekttransistor
US20070146020A1 (en) * 2005-11-29 2007-06-28 Advanced Analogic Technologies, Inc High Frequency Power MESFET Gate Drive Circuits
JP4804142B2 (ja) * 2005-12-21 2011-11-02 東洋電機製造株式会社 高速ゲート駆動回路
US20080054984A1 (en) * 2006-08-31 2008-03-06 International Rectifier Corporation High voltage gate driver ic with ramp driver
US7782118B2 (en) * 2007-04-30 2010-08-24 Northrop Grumman Systems Corporation Gate drive for wide bandgap semiconductor device
CN101675394A (zh) * 2007-05-03 2010-03-17 帝斯曼方案公司 自适应功率管理方法和系统
US7851947B2 (en) * 2007-11-05 2010-12-14 Qualcomm, Incorporated Methods and apparatuses for selectable voltage supply
TWI357211B (en) * 2008-04-18 2012-01-21 Realtek Semiconductor Corp Leakage current preventing circuit and semiconduct
JP5258490B2 (ja) * 2008-10-02 2013-08-07 ルネサスエレクトロニクス株式会社 半導体集積回路及びそれを用いたicカード
JP2010129768A (ja) * 2008-11-27 2010-06-10 Toshiba Corp 半導体装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030179021A1 (en) * 2002-03-22 2003-09-25 Siemens Aktiengesellschaft Drive control circuit for a junction field-effect transistor
US7233191B2 (en) * 2004-05-18 2007-06-19 Richtek Technology Corp. JFET driver circuit and JFET driving method
WO2007137569A1 (de) * 2006-05-31 2007-12-06 Technische Universität Chemnitz Schaltungsanordnung und verfahren zur gate- ansteuerung eines sperrschicht-feldeffekttransistors

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"A New, Universal and Fast Switching Gate-Drive-Concept for SiC-JFETs based on Current Source Principle", POWER ELECTRONICS SPECIALISTS CONFERENCE, 2006 (IEEE), pp 2640-2645 (Domes and Werner et al). *

Also Published As

Publication number Publication date
CA2700013C (en) 2012-10-09
US20100271081A1 (en) 2010-10-28
CA2700013A1 (en) 2010-10-27
JP5010708B2 (ja) 2012-08-29
US7915944B2 (en) 2011-03-29
JP2010259324A (ja) 2010-11-11
DE102010016611A1 (de) 2010-10-28
GB201006917D0 (en) 2010-06-09
GB2469914A (en) 2010-11-03
DE102010016611B4 (de) 2012-05-31

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