GB2447254B - A photon detector - Google Patents

A photon detector

Info

Publication number
GB2447254B
GB2447254B GB0704007A GB0704007A GB2447254B GB 2447254 B GB2447254 B GB 2447254B GB 0704007 A GB0704007 A GB 0704007A GB 0704007 A GB0704007 A GB 0704007A GB 2447254 B GB2447254 B GB 2447254B
Authority
GB
United Kingdom
Prior art keywords
photon detector
photon
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB0704007A
Other languages
English (en)
Other versions
GB0704007D0 (en
GB2447254A (en
Inventor
Zhiliang Yuan
Andrew James Shields
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Europe Ltd
Original Assignee
Toshiba Research Europe Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to GB0704007A priority Critical patent/GB2447254B/en
Application filed by Toshiba Research Europe Ltd filed Critical Toshiba Research Europe Ltd
Publication of GB0704007D0 publication Critical patent/GB0704007D0/en
Priority to PCT/GB2008/000722 priority patent/WO2008104799A1/en
Priority to US12/529,495 priority patent/US8891979B2/en
Priority to JP2009551272A priority patent/JP4977213B2/ja
Publication of GB2447254A publication Critical patent/GB2447254A/en
Application granted granted Critical
Publication of GB2447254B publication Critical patent/GB2447254B/en
Priority to JP2011162998A priority patent/JP5492152B2/ja
Priority to JP2011288028A priority patent/JP5591788B2/ja
Priority to US13/421,023 priority patent/US8811829B2/en
Priority to US14/517,471 priority patent/US9377356B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
    • H04L9/08—Key distribution or management, e.g. generation, sharing or updating, of cryptographic keys or passwords
    • H04L9/0816—Key establishment, i.e. cryptographic processes or cryptographic protocols whereby a shared secret becomes available to two or more parties, for subsequent use
    • H04L9/0852—Quantum cryptography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • H01L31/107—
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/60—Receivers
    • H04B10/66—Non-coherent receivers, e.g. using direct detection
    • H04B10/69—Electrical arrangements in the receiver
    • H04B10/697—Arrangements for reducing noise and distortion
    • H04L9/0883—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/225—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4446—Type of detector
    • G01J2001/446—Photodiode
    • G01J2001/4466—Avalanche

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Optical Communication System (AREA)
GB0704007A 2007-03-01 2007-03-01 A photon detector Active GB2447254B (en)

Priority Applications (8)

Application Number Priority Date Filing Date Title
GB0704007A GB2447254B (en) 2007-03-01 2007-03-01 A photon detector
PCT/GB2008/000722 WO2008104799A1 (en) 2007-03-01 2008-02-29 A photon detector
US12/529,495 US8891979B2 (en) 2007-03-01 2008-02-29 Photon detector
JP2009551272A JP4977213B2 (ja) 2007-03-01 2008-02-29 光子検出器
JP2011162998A JP5492152B2 (ja) 2007-03-01 2011-07-26 光子検出器
JP2011288028A JP5591788B2 (ja) 2007-03-01 2011-12-28 光子検出器
US13/421,023 US8811829B2 (en) 2007-03-01 2012-03-15 Photon detector
US14/517,471 US9377356B2 (en) 2007-03-01 2014-10-17 Photon detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0704007A GB2447254B (en) 2007-03-01 2007-03-01 A photon detector

Publications (3)

Publication Number Publication Date
GB0704007D0 GB0704007D0 (en) 2007-04-11
GB2447254A GB2447254A (en) 2008-09-10
GB2447254B true GB2447254B (en) 2009-10-14

Family

ID=37965765

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0704007A Active GB2447254B (en) 2007-03-01 2007-03-01 A photon detector

Country Status (4)

Country Link
US (3) US8891979B2 (https=)
JP (3) JP4977213B2 (https=)
GB (1) GB2447254B (https=)
WO (1) WO2008104799A1 (https=)

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JP4883273B2 (ja) * 2006-01-11 2012-02-22 日本電気株式会社 乱数品質管理装置および管理方法
GB2447254B (en) 2007-03-01 2009-10-14 Toshiba Res Europ Ltd A photon detector
GB2456149B (en) 2008-01-03 2012-05-30 Toshiba Res Europ Ltd A photon detection system and a method of photon detection
JPWO2010029638A1 (ja) * 2008-09-12 2012-02-02 三菱電機株式会社 光子検出器
GB2466299B (en) * 2008-12-19 2012-06-13 Toshiba Res Europ Ltd A photon detector, a method of photon detection and a conditioning circuit
JP5383327B2 (ja) * 2009-06-08 2014-01-08 三菱電機株式会社 光子検出器、それを用いた量子暗号通信装置、及び、光子検出方法
GB2475235B (en) 2009-11-09 2014-01-08 Toshiba Res Europ Ltd A photon detector
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JP6355458B2 (ja) * 2014-07-03 2018-07-11 三菱電機株式会社 光子検出装置
KR101685494B1 (ko) 2014-10-24 2016-12-13 한국과학기술연구원 단일 광자 검출 장치 및 단일 광자 검출 방법
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US11212011B2 (en) * 2017-07-07 2021-12-28 The Regents Of The University Of California System and method for receiver sensitivity improvement
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CN110118598B (zh) * 2018-02-07 2024-07-02 科大国盾量子技术股份有限公司 用于雪崩光电二极管的延时电路及集成单光子检测电路
US11808700B2 (en) 2018-06-15 2023-11-07 Quantum-Si Incorporated Data acquisition control for advanced analytic instruments having pulsed optical sources
US10379420B1 (en) 2019-03-22 2019-08-13 Psiquantum, Corp. Clock generation for a photonic quantum computer to convert electrical pulses into a plurality of clock signals
JP7344667B2 (ja) 2019-04-18 2023-09-14 キヤノン株式会社 撮像素子及びその制御方法、及び撮像装置
CA3142922A1 (en) 2019-06-14 2020-12-17 Quantum-Si Incorporated Sliced grating coupler with increased beam alignment sensitivity
KR102272597B1 (ko) * 2019-10-24 2021-07-06 한국표준과학연구원 광자 검출 장치
KR20220137027A (ko) 2020-01-14 2022-10-11 퀀텀-에스아이 인코포레이티드 진폭 변조 레이저
US11552200B2 (en) * 2020-08-03 2023-01-10 Texas Instruments Incorporated Avalanche photodiode gain control comprising a bias circuit having a second avalanche photodiode
KR102917416B1 (ko) * 2020-10-14 2026-01-26 주식회사 케이티 단일 광자 검출 장치 및 구동 방법
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CN112880827B (zh) * 2021-01-12 2023-06-16 上海医勒希科技有限公司 光子检测系统与方法
CN113055098B (zh) * 2021-03-15 2022-03-08 电子科技大学 一种光通信波段的频域复用宣布式单光子源
CN113340420B (zh) * 2021-08-05 2021-11-02 国开启科量子技术(北京)有限公司 单光子探测模块性能指标标定装置及校准方法
CN113588103B (zh) 2021-08-18 2022-07-29 国开启科量子技术(北京)有限公司 用于提取雪崩信号的方法和装置
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Also Published As

Publication number Publication date
JP5492152B2 (ja) 2014-05-14
JP5591788B2 (ja) 2014-09-17
WO2008104799A1 (en) 2008-09-04
US8891979B2 (en) 2014-11-18
GB0704007D0 (en) 2007-04-11
GB2447254A (en) 2008-09-10
JP2010520447A (ja) 2010-06-10
US9377356B2 (en) 2016-06-28
US20150034808A1 (en) 2015-02-05
JP4977213B2 (ja) 2012-07-18
US8811829B2 (en) 2014-08-19
JP2012098299A (ja) 2012-05-24
US20120230702A1 (en) 2012-09-13
US20100111305A1 (en) 2010-05-06
JP2011252919A (ja) 2011-12-15

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