GB2366072B - Mass spectrometer with multipole rod type ion lens - Google Patents

Mass spectrometer with multipole rod type ion lens

Info

Publication number
GB2366072B
GB2366072B GB0113312A GB0113312A GB2366072B GB 2366072 B GB2366072 B GB 2366072B GB 0113312 A GB0113312 A GB 0113312A GB 0113312 A GB0113312 A GB 0113312A GB 2366072 B GB2366072 B GB 2366072B
Authority
GB
United Kingdom
Prior art keywords
mass spectrometer
type ion
rod type
ion lens
multipole rod
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0113312A
Other languages
English (en)
Other versions
GB0113312D0 (en
GB2366072A (en
Inventor
Hiroaki Waki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of GB0113312D0 publication Critical patent/GB0113312D0/en
Publication of GB2366072A publication Critical patent/GB2366072A/en
Application granted granted Critical
Publication of GB2366072B publication Critical patent/GB2366072B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/067Ion lenses, apertures, skimmers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/062Ion guides
    • H01J49/063Multipole ion guides, e.g. quadrupoles, hexapoles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/062Ion guides
    • H01J49/065Ion guides having stacked electrodes, e.g. ring stack, plate stack

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
GB0113312A 2000-06-07 2001-06-01 Mass spectrometer with multipole rod type ion lens Expired - Fee Related GB2366072B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000170595A JP4581184B2 (ja) 2000-06-07 2000-06-07 質量分析装置

Publications (3)

Publication Number Publication Date
GB0113312D0 GB0113312D0 (en) 2001-07-25
GB2366072A GB2366072A (en) 2002-02-27
GB2366072B true GB2366072B (en) 2004-09-29

Family

ID=18673287

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0113312A Expired - Fee Related GB2366072B (en) 2000-06-07 2001-06-01 Mass spectrometer with multipole rod type ion lens

Country Status (3)

Country Link
US (1) US6576898B2 (ja)
JP (1) JP4581184B2 (ja)
GB (1) GB2366072B (ja)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU6653296A (en) * 1995-08-11 1997-03-12 Mds Health Group Limited Spectrometer with axial field
JP2004014177A (ja) * 2002-06-04 2004-01-15 Shimadzu Corp 質量分析装置
AU2003257338A1 (en) * 2002-08-19 2004-03-03 Mds Inc., D.B.A. Mds Sciex Quadrupole mass spectrometer with spatial dispersion
US6730904B1 (en) * 2003-04-30 2004-05-04 Varian, Inc. Asymmetric-field ion guiding devices
JP4162138B2 (ja) * 2003-10-27 2008-10-08 株式会社リガク 昇温脱離ガス分析装置
JP2007287365A (ja) * 2006-04-13 2007-11-01 Jeol Ltd 多極子レンズ及び多極子レンズの製造方法
WO2008117333A1 (ja) 2007-03-23 2008-10-02 Shimadzu Corporation 質量分析装置
WO2008136040A1 (ja) 2007-04-17 2008-11-13 Shimadzu Corporation 質量分析装置
JP4816792B2 (ja) * 2007-04-17 2011-11-16 株式会社島津製作所 質量分析装置
US8658969B2 (en) 2008-03-05 2014-02-25 Shimadzu Corporation Mass spectrometer
JP5141505B2 (ja) * 2008-11-14 2013-02-13 株式会社島津製作所 イオンガイド及びそれを備えた質量分析装置
DE102010001349B9 (de) * 2010-01-28 2014-08-28 Carl Zeiss Microscopy Gmbh Vorrichtung zum Fokussieren sowie zum Speichern von Ionen
US8822915B2 (en) 2010-06-24 2014-09-02 Shimadzu Corporation Atmospheric pressure ionization mass spectrometer
EP2587521B1 (en) 2010-06-24 2019-06-19 Shimadzu Corporation Atmospheric-pressure ionization mass-spectrometer
EP2828880B1 (en) 2012-03-23 2021-04-28 Micromass UK Limited Ion guide construction method
GB201608476D0 (en) 2016-05-13 2016-06-29 Micromass Ltd Ion guide
JP6354874B1 (ja) * 2017-01-31 2018-07-11 住友大阪セメント株式会社 光変調器
GB201810824D0 (en) 2018-06-01 2018-08-15 Micromass Ltd An outer source assembly and associated components
EP3889997A4 (en) * 2018-11-29 2022-04-20 Shimadzu Corporation MASS SPECTROMETRY
CN111755315B (zh) * 2020-07-07 2023-02-24 湘潭大学 一种提高离子迁移谱灵敏度和分辨率的装置及其方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2178893A (en) * 1985-06-22 1987-02-18 Finnigan Mat Gmbh Charged particle lens
GB2341270A (en) * 1998-09-02 2000-03-08 Shimadzu Corp Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59194338A (ja) * 1983-04-19 1984-11-05 Seiko Instr & Electronics Ltd 四重極分析管
JPS60140356U (ja) * 1984-02-28 1985-09-17 日本電子株式会社 質量分析装置
JPS6241664U (ja) * 1985-08-30 1987-03-12
JPS63155547A (ja) * 1986-12-18 1988-06-28 Seiko Instr & Electronics Ltd 四重極質量分析計の分析管
JPH0624105B2 (ja) * 1987-11-20 1994-03-30 株式会社日立製作所 多重極レンズ
GB9001283D0 (en) 1990-01-19 1990-03-21 Associated Asphalt Co Ltd Apparatus for applying preformed ribs of a thermoplastics material to a line marking on a road surface
JPH03100353U (ja) * 1990-01-30 1991-10-21
JP2536980Y2 (ja) * 1990-09-20 1997-05-28 株式会社島津製作所 質量分析計
JP2713692B2 (ja) * 1994-09-07 1998-02-16 株式会社日立製作所 イオン打込み装置
US5596193A (en) * 1995-10-11 1997-01-21 California Institute Of Technology Miniature quadrupole mass spectrometer array
JPH1097838A (ja) * 1996-07-30 1998-04-14 Yokogawa Analytical Syst Kk 誘導結合プラズマ質量分析装置
JPH10172507A (ja) * 1996-12-13 1998-06-26 Shimadzu Corp 四重極質量分析装置
JP3379485B2 (ja) * 1998-09-02 2003-02-24 株式会社島津製作所 質量分析装置
US6239429B1 (en) * 1998-10-26 2001-05-29 Mks Instruments, Inc. Quadrupole mass spectrometer assembly
JP3596375B2 (ja) * 1999-09-30 2004-12-02 株式会社島津製作所 大気圧イオン化質量分析装置
JP3489539B2 (ja) * 2000-05-25 2004-01-19 株式会社島津製作所 質量分析装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2178893A (en) * 1985-06-22 1987-02-18 Finnigan Mat Gmbh Charged particle lens
GB2341270A (en) * 1998-09-02 2000-03-08 Shimadzu Corp Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes

Also Published As

Publication number Publication date
US6576898B2 (en) 2003-06-10
JP4581184B2 (ja) 2010-11-17
JP2001351563A (ja) 2001-12-21
GB0113312D0 (en) 2001-07-25
US20010054688A1 (en) 2001-12-27
GB2366072A (en) 2002-02-27

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20190601