GB2366072B - Mass spectrometer with multipole rod type ion lens - Google Patents
Mass spectrometer with multipole rod type ion lensInfo
- Publication number
- GB2366072B GB2366072B GB0113312A GB0113312A GB2366072B GB 2366072 B GB2366072 B GB 2366072B GB 0113312 A GB0113312 A GB 0113312A GB 0113312 A GB0113312 A GB 0113312A GB 2366072 B GB2366072 B GB 2366072B
- Authority
- GB
- United Kingdom
- Prior art keywords
- mass spectrometer
- type ion
- rod type
- ion lens
- multipole rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000170595A JP4581184B2 (ja) | 2000-06-07 | 2000-06-07 | 質量分析装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0113312D0 GB0113312D0 (en) | 2001-07-25 |
GB2366072A GB2366072A (en) | 2002-02-27 |
GB2366072B true GB2366072B (en) | 2004-09-29 |
Family
ID=18673287
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0113312A Expired - Fee Related GB2366072B (en) | 2000-06-07 | 2001-06-01 | Mass spectrometer with multipole rod type ion lens |
Country Status (3)
Country | Link |
---|---|
US (1) | US6576898B2 (ja) |
JP (1) | JP4581184B2 (ja) |
GB (1) | GB2366072B (ja) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU6653296A (en) * | 1995-08-11 | 1997-03-12 | Mds Health Group Limited | Spectrometer with axial field |
JP2004014177A (ja) * | 2002-06-04 | 2004-01-15 | Shimadzu Corp | 質量分析装置 |
AU2003257338A1 (en) * | 2002-08-19 | 2004-03-03 | Mds Inc., D.B.A. Mds Sciex | Quadrupole mass spectrometer with spatial dispersion |
US6730904B1 (en) * | 2003-04-30 | 2004-05-04 | Varian, Inc. | Asymmetric-field ion guiding devices |
JP4162138B2 (ja) * | 2003-10-27 | 2008-10-08 | 株式会社リガク | 昇温脱離ガス分析装置 |
JP2007287365A (ja) * | 2006-04-13 | 2007-11-01 | Jeol Ltd | 多極子レンズ及び多極子レンズの製造方法 |
WO2008117333A1 (ja) | 2007-03-23 | 2008-10-02 | Shimadzu Corporation | 質量分析装置 |
WO2008136040A1 (ja) | 2007-04-17 | 2008-11-13 | Shimadzu Corporation | 質量分析装置 |
JP4816792B2 (ja) * | 2007-04-17 | 2011-11-16 | 株式会社島津製作所 | 質量分析装置 |
US8658969B2 (en) | 2008-03-05 | 2014-02-25 | Shimadzu Corporation | Mass spectrometer |
JP5141505B2 (ja) * | 2008-11-14 | 2013-02-13 | 株式会社島津製作所 | イオンガイド及びそれを備えた質量分析装置 |
DE102010001349B9 (de) * | 2010-01-28 | 2014-08-28 | Carl Zeiss Microscopy Gmbh | Vorrichtung zum Fokussieren sowie zum Speichern von Ionen |
US8822915B2 (en) | 2010-06-24 | 2014-09-02 | Shimadzu Corporation | Atmospheric pressure ionization mass spectrometer |
EP2587521B1 (en) | 2010-06-24 | 2019-06-19 | Shimadzu Corporation | Atmospheric-pressure ionization mass-spectrometer |
EP2828880B1 (en) | 2012-03-23 | 2021-04-28 | Micromass UK Limited | Ion guide construction method |
GB201608476D0 (en) | 2016-05-13 | 2016-06-29 | Micromass Ltd | Ion guide |
JP6354874B1 (ja) * | 2017-01-31 | 2018-07-11 | 住友大阪セメント株式会社 | 光変調器 |
GB201810824D0 (en) | 2018-06-01 | 2018-08-15 | Micromass Ltd | An outer source assembly and associated components |
EP3889997A4 (en) * | 2018-11-29 | 2022-04-20 | Shimadzu Corporation | MASS SPECTROMETRY |
CN111755315B (zh) * | 2020-07-07 | 2023-02-24 | 湘潭大学 | 一种提高离子迁移谱灵敏度和分辨率的装置及其方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2178893A (en) * | 1985-06-22 | 1987-02-18 | Finnigan Mat Gmbh | Charged particle lens |
GB2341270A (en) * | 1998-09-02 | 2000-03-08 | Shimadzu Corp | Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS59194338A (ja) * | 1983-04-19 | 1984-11-05 | Seiko Instr & Electronics Ltd | 四重極分析管 |
JPS60140356U (ja) * | 1984-02-28 | 1985-09-17 | 日本電子株式会社 | 質量分析装置 |
JPS6241664U (ja) * | 1985-08-30 | 1987-03-12 | ||
JPS63155547A (ja) * | 1986-12-18 | 1988-06-28 | Seiko Instr & Electronics Ltd | 四重極質量分析計の分析管 |
JPH0624105B2 (ja) * | 1987-11-20 | 1994-03-30 | 株式会社日立製作所 | 多重極レンズ |
GB9001283D0 (en) | 1990-01-19 | 1990-03-21 | Associated Asphalt Co Ltd | Apparatus for applying preformed ribs of a thermoplastics material to a line marking on a road surface |
JPH03100353U (ja) * | 1990-01-30 | 1991-10-21 | ||
JP2536980Y2 (ja) * | 1990-09-20 | 1997-05-28 | 株式会社島津製作所 | 質量分析計 |
JP2713692B2 (ja) * | 1994-09-07 | 1998-02-16 | 株式会社日立製作所 | イオン打込み装置 |
US5596193A (en) * | 1995-10-11 | 1997-01-21 | California Institute Of Technology | Miniature quadrupole mass spectrometer array |
JPH1097838A (ja) * | 1996-07-30 | 1998-04-14 | Yokogawa Analytical Syst Kk | 誘導結合プラズマ質量分析装置 |
JPH10172507A (ja) * | 1996-12-13 | 1998-06-26 | Shimadzu Corp | 四重極質量分析装置 |
JP3379485B2 (ja) * | 1998-09-02 | 2003-02-24 | 株式会社島津製作所 | 質量分析装置 |
US6239429B1 (en) * | 1998-10-26 | 2001-05-29 | Mks Instruments, Inc. | Quadrupole mass spectrometer assembly |
JP3596375B2 (ja) * | 1999-09-30 | 2004-12-02 | 株式会社島津製作所 | 大気圧イオン化質量分析装置 |
JP3489539B2 (ja) * | 2000-05-25 | 2004-01-19 | 株式会社島津製作所 | 質量分析装置 |
-
2000
- 2000-06-07 JP JP2000170595A patent/JP4581184B2/ja not_active Expired - Lifetime
-
2001
- 2001-05-29 US US09/865,690 patent/US6576898B2/en not_active Expired - Lifetime
- 2001-06-01 GB GB0113312A patent/GB2366072B/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2178893A (en) * | 1985-06-22 | 1987-02-18 | Finnigan Mat Gmbh | Charged particle lens |
GB2341270A (en) * | 1998-09-02 | 2000-03-08 | Shimadzu Corp | Mass spectrometer having ion lens composed of plurality of virtual rods comprising plurality of electrodes |
Also Published As
Publication number | Publication date |
---|---|
US6576898B2 (en) | 2003-06-10 |
JP4581184B2 (ja) | 2010-11-17 |
JP2001351563A (ja) | 2001-12-21 |
GB0113312D0 (en) | 2001-07-25 |
US20010054688A1 (en) | 2001-12-27 |
GB2366072A (en) | 2002-02-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20190601 |